| TOPCON Corporation Patent applications |
| Patent application number | Title | Published |
|---|
| 20130152413 | ELECTRONIC LEVEL AND LEVELING ROD FOR ELECTRONIC LEVEL - A leveling rod for electronic level for easily expanding a measurable range for long/short distance measurements without inaccuracy even when mixed and used with a conventional level, has a first pattern having a grayscale of predetermined rules for a first distance range measurement, and a second pattern enlarged/reduced with respect to a pattern with the inverted grayscale of the first pattern for a second distance range measurement different from the first distance range. An electronic level includes a height measuring device measuring a collimation point height from an output signal from a line sensor for correspondence to the first pattern, a grayscale inverting device inverting the grayscale of the output signal from the line sensor for correspondence to the second pattern, and a height correcting device correcting the height measured by the height measuring device according to a reduction scale of the second pattern with respect to the first pattern. | 06-20-2013 |
| 20120127279 | IMAGE PHOTOGRAPHING DEVICE AND METHOD FOR THREE-DIMENSIONAL MEASUREMENT - An image photographing device for three-dimensional measurement is provided that enables efficient photographing with just sufficient images in a case that a photographer uses a single camera to photograph while moving. An image photographing device | 05-24-2012 |
| 20090039274 | SURFACE CONTAMINATION ANALYZER FOR SEMICONDUCTOR WAFERS, METHOD USED THEREIN AND PROCESS FOR FABRICATING SEMICONDUCTOR DEVICE - A semiconductor wafer is radiated with an electron beam so that the inelastic scattering takes place in the narrow region, and current flows out from the narrow region; the amount of current is dependent on the substance or substances in the narrow region so that the analyst evaluates the degree of contamination on the basis of the substance or substances specified in the narrow region. | 02-12-2009 |
