SII NANOTECHNOLOGY INC.
SII NANOTECHNOLOGY INC. Patent applications | ||
Patent application number | Title | Published |
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20130180019 | PROBE SHAPE EVALUATION METHOD FOR A SCANNING PROBE MICROSCOPE - Provided is a method of evaluating a probe tip shape in a scanning probe microscope, including: measuring the probe tip shape by a probe shape test sample having a needle-like structure; determining radii of cross-sections at a plurality of distances from the apex; and calculating, based on the distances and the radii, a radios of curvature when the probe tip shape is approximated by a circle. | 07-11-2013 |
20130175446 | METHOD AND APPARATUS FOR PREPARING LAMELLA - Provided is a lamella preparation apparatus including an EB column ( | 07-11-2013 |