ISC CO., LTD. Patent applications |
Patent application number | Title | Published |
20150355233 | TEST SOCKET AND SOCKET BODY - The present invention relates to a test socket, and more specifically, to a test socket for electrically connecting a terminal of a test target device with a pad of a test device, comprising: a socket guide provided with a center hole at the center thereof so as to enable the terminal of the test target device to pass through and a guide protrusion provided to the lower surface thereof; and a socket body arranged between the socket guide and the test device, wherein the socket body comprises: a conductive region provided with a connection part arranged at a location corresponding to the terminal of the test target device so as to electrically connect the terminal of the test target device with the pad of the test device; and a supporting region for extending from a circumference of the conductive region and supporting the conductive region, and the supporting region comprises: a guide hole for receiving the guide protrusion so as to determine the location of the socket body with respect to the test device, and an elastic pressing part for elastically pressing the guide protrusion stored in the guide hole to one inner side surface of the guide hole. | 12-10-2015 |
20150293147 | TEST SOCKET HAVING HIGH-DENSITY CONDUCTIVE UNIT, AND METHOD FOR MANUFACTURING SAME - The present invention relates to a test socket having a high-density conductive unit, and to a method for manufacturing same, whereby an elastic conductive sheet is arranged at a position corresponding to the terminal of the device, and includes a first conductive unit arranged in the thickness direction of an elastic material and an insulating support unit for supporting the first conductive unit. A support sheet is attached to the elastic conductive sheet and has through-holes corresponding to the terminal of the device. A second conductive unit is arranged in the through-holes of the support sheet in the thickness direction in an elastic material. | 10-15-2015 |
20150153387 | TEST SOCKET INCLUDING CONDUCTIVE PARTICLES IN WHICH THROUGH-HOLES ARE FORMED AND METHOD FOR MANUFACTURING SAME - The present invention relates to a test socket that is disposed between a blood test device and a test apparatus to electrically connect a terminal of the blood test device and a pad of the test apparatus with each other. Conduction units that are arranged at positions corresponding to the terminal of the blood test device and show conductivity in a thickness direction have: conduction units that are arranged in such a manner that multiple conductive particles are arranged in the thickness direction in an elastic insulating material; and an insulating support unit that supports and insulates each of the conduction units. The conductive particles are provided with through-holes bored through one surface and another surface other than the one surface, and the through-holes are filled with the elastic insulating material. | 06-04-2015 |
20140320159 | PROBE MEMBER FOR POGO PIN - Provided is a probe member for a pogo pin, which is used for testing a semiconductor device, and at least a portion of which is inserted into a cylindrical body to be supported by an elastic member and an upper end of which contacts a terminal of the semiconductor device. | 10-30-2014 |
20130285692 | TEST SOCKET INCLUDING ELECTRODE SUPPORTING PORTION AND METHOD OF MANUFACTURING TEST SOCKET - The test socket includes: an elastic conductive sheet including a conductive portion and an insulating supporting portion; a sheet type connector including an electrode portion that is disposed on the conductive portion and is formed of a metal, and a sheet member that supports the electrode portion, wherein the sheet member comprises a cut portion formed by cutting at least a portion of the sheet member between adjacent electrode portions; and an electrode supporting portion including an upper supporting portion that contacts an upper edge of the electrode portion to support the electrode portion and exposes an upper center portion of the electrode portion to be open and an electrode supporting portion including a connection supporting portion that connects the upper supporting portion and the insulating supporting portion. | 10-31-2013 |