| Patent application number | Description | Published |
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| 20080206099 | MAGNETIC SEPARATOR AND ANALYZER USING THE SAME - An analyzer which collects magnetic particles for immunological analysis includes a magnetic separator adapted to efficiently separate within a short time a reaction product formed by bonding substances such as an object to be measured and the magnetic particles, and a nonmagnetic component other than the reaction product, from a liquid mixture in a vessel of the magnetic separator To perform the separation, a magnet complex having multiple magnets and magnetic materials stacked in alternate form so that magnetic pole pieces on opposed sides of each magnet are homopolar, is disposed outside the vessel that holds a liquid in which the magnetic particles are suspended. | 08-28-2008 |
| 20090060792 | AUTOMATIC ANALYZER - An automatic analyzer includes a B/F separator including a reaction vessel holding unit provided with magnets disposed around a reaction vessel held on the reaction vessel holding unit, a rotating device for rotating the reaction vessel holding unit holding the reaction vessel about an axis of rotation aligned with the center axis of the reaction vessel or an axis of rotation parallel to and separated by a distance from the center axis of the reaction vessel. Both magnetic force and centrifugal force are exerted simultaneously on a specimen contained in a reaction vessel to capture magnetic particles contained in the liquid contained in the reaction vessel at a high capturing efficiency. | 03-05-2009 |
| 20120315190 | AUTOMATIC ANALYSIS DEVICE - There is provided a data processing method that reduces influences of air bubbles and dirt while maintaining changes in light amounts. Two scattering light photoreceivers are disposed in the forward direction. A photoreceiver | 12-13-2012 |
| 20130243657 | AUTOMATIC ANALYZING APPARATUS - An automatic analyzing apparatus which can make an adjustment to a target temperature so as to stabilize the light intensity of an LED and also can make the adjustment to that temperature in a short time is provided. The automatic analyzing apparatus in which an LED is used for a light source | 09-19-2013 |
| 20130302212 | AUTOMATIC ANALYZER - The invention provides an automatic analyzer having a scattered-light detecting optical system in which a light source is disposed at an angle with respect to a plane of a reaction vessel. This reduces the amount of a sample-reagent mix required for an analysis, thereby reducing the running cost of reagents as well, and also allows relatively free design of reaction vessels in terms of their sizes and shapes. The automatic analyzer includes: a reaction vessel in which a sample is caused to react with a reagent; a reaction disk on which to place reaction vessels in the form of a circle; a reaction disk rotating mechanism for rotating the reaction disk; a light source for radiating light to be measured onto one of the reaction vessels; and a photodetector for detecting transmissive light radiated from the light source and passing through a sample-reagent mix in the one of the reaction vessels. The automatic analyzer further includes an optical system for causing the light source to radiate light onto one of the reaction vessels at an angle with respect to a plane of the one of the reaction vessels. | 11-14-2013 |
| Patent application number | Description | Published |
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| 20090039264 | ELECTRON MICROSCOPE - Disclosed herein are a method for applying, while a charged particle beam is in a state being irradiated toward the sample, a voltage to the sample so that the charged particle beam does not reach the sample (hereafter such state may be referred to as a mirror state) and detecting information on a potential of a sample using a signal obtained then, and a device for automatically adjusting conditions of the device based on the result of measuring. | 02-12-2009 |
| 20090272899 | Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus - An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application. | 11-05-2009 |
| 20110278454 | SCANNING ELECTRON MICROSCOPE - A scanning electron microscope having a charged particle beam that when in a state being irradiated toward a sample, a voltage is applied to the sample so that the charged particle beam does not reach the sample. The scanning electron microscope also detects information on a potential of a sample using a signal obtained, and a device for automatically adjusting conditions based on the result of measuring. | 11-17-2011 |
| 20120061566 | SCANNING ELECTRON MICROSCOPE - An object of the present invention is to provide a scanning electron microscope suitable for monitoring apparatus conditions of the microscope itself, irrespective of the presence of charge-up, specimen inclination, and the like. In order to achieve the object, proposed is a scanning electron microscope including a function to monitor the apparatus conditions on the basis of information obtained with an electron beam reflected before reaching a specimen. Specifically, for example, while applying a negative voltage to the specimen to reflect the electron beam before the electron beam reaches the specimen, and simultaneously supplying a predetermined signal to a deflector for alignment, the scanning electron microscope monitors changes of the detected positions of the reflected electrons of the electron beam. If the above-mentioned predetermined signal is under the condition where an alignment is properly performed, the changes of the detected positions of the electrons reflect deviation of an axis. | 03-15-2012 |
