Patent application number | Description | Published |
20130183836 | METHOD OF FORMING THROUGH-SILICON VIA USING LASER ABLATION - Methods of forming through-silicon vias by using laser ablation. A method includes, laser drilling to form a plurality of grooves by irradiating a laser beam onto an upper surface of a silicon wafer, and grinding a lower surface of the silicon wafer to form a plurality of through-silicon vias by exposing the grooves on the lower surface of the silicon wafer. | 07-18-2013 |
20130193131 | OPTICAL PYROMETER AND APPARATUS FOR PROCESSING SEMICONDUCTOR BY EMPLOYING THE SAME - An optical pyrometer includes a receiving part having a receiving end for receiving light radiation of a heating unit, and a case part covering the receiving part, except for the receiving end of the receiving part, wherein a cross-sectional area of the receiving end of the receiving part perpendicular to a lengthwise direction of the receiving end of the receiving part decreases toward an end portion of the receiving end of the receiving part. | 08-01-2013 |
20140285815 | APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE - An apparatus for measurement of a three-dimensional (3D) shape includes a lens unit transmitting slit beams to a plurality of measurement objects, a light source unit irradiating the plurality of slit beams to the lens unit at different angles, an imaging unit obtaining images of the plurality of measurement objects formed by the slit beams irradiated on the plurality of measurement objects, and a calculation processing unit generating information regarding a 3D shape of the plurality of measurement objects from the images obtained by the imaging unit. | 09-25-2014 |
20140320781 | LIGHT SOURCE UNIT AND DISPLAY DEVICE INCLUDING THE SAME - A light source unit including a light emitting device emitting light and an optical device including a first surface having an incident surface, through which light from the light emitting device is incident, and a second surface through the incident light is outwardly emitted, wherein the first surface has a recess recessed toward the second surface and forming the incident surface, and the second surface protrudes in a dome shape from an edge of the first surface, the second surface having a concave portion depressed toward a planar portion in a center of the first surface, and the incident surface includes the planar portion at a top portion of the recess and a curved portion, the planar portion and the curved portion forming an opening, the curved portion extending between the planar portion and a portion of the first surface outside the incident surface may be provided. | 10-30-2014 |
20150354786 | LIGHT SOURCE MODULE, LIGHTING DEVICE, AND LIGHTING SYSTEM - A are provided a light source module. The light source module including a light emitting device configured to emit light in a light emitting direction; and an optical device including a first surface disposed over the light emitting device and having a groove recessed in the light emitting direction in a central portion through which an optical axis of the optical device passes, and a second surface disposed opposite to the first surface and configured to refract light incident through the groove to be emitted to the outside. The optical device includes a plurality of ridges disposed on the second surface and periodically arranged in a direction from the optical axis to an edge of the optical device connected to the first surface. | 12-10-2015 |
20150355053 | METHOD OF INSPECTING A LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING A LIGHT SOURCE MODULE, AND APPARATUS FOR INSPECTING A LIGHT SOURCE MODULE - A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided. | 12-10-2015 |
20150377453 | LIGHT EMITTING MODULE - A light emitting module includes a light emitting unit including a plurality of light sources, a reflection unit disposed on the light emitting unit and configured to reflect light emitted from the light emitting unit, and a lens unit disposed on an optical path of the light reflected by the reflection unit. The reflection unit includes a plurality of reflection holes corresponding to the plurality of light sources and having inner walls which are provided as reflective surfaces. A depth of a reflection hole distant from an optical axis of the lens unit is greater than a depth of a reflection hole adjacent to the optical axis of the lens unit. | 12-31-2015 |
20160033108 | LENS FOR LIGHT EMITTER, LIGHT SOURCE MODULE, LIGHTING DEVICE, AND LIGHTING SYSTEM - There is provided a lens for a light emitter which includes: a bottom surface; an incident surface connected to the bottom surface at a central region of the bottom surface and disposed on or above a light source to allow light emitted from the light source to be made incident thereto and travel in an interior of the lens; and an output surface connected to the bottom surface at an edge of the bottom surface and configured to allow the light which has traveled in the interior of the lens to be emitted outwardly therefrom, wherein the central region of the bottom surface protrudes with respect to the other region of the bottom surface. | 02-04-2016 |