Patent application number | Description | Published |
20080298740 | Integrated Optical Waveguide Sensors With Reduced Signal Modulation - The invention provides an integrated optical waveguide sensor module ( | 12-04-2008 |
20090014658 | Solid-state photodetector pixel and photodetecting method - A pixel is formed in a semiconductor substrate (S) with a plane surface for use in a photodetector. It comprises an active region for converting incident light (In) into charge carriers, photogates (PGL, PGM, PGR) for generating a lateral electric potential (Φ(x)) across the active region, and an integration gate (IG) for storing charge carriers generated in the active region and a dump site (Ddiff). The pixel further comprises separation-enhancing means (SL) for additionally enhancing charge separation in the active region and charge transport from the active region to the integration gate (IG). The separation-enhancing means (SL) are for instance a shield layer designed such that for a given lateral electric potential (Φ(x)), the incident light (In) does not impinge on the section from which the charge carriers would not be transported to the integration gate (IG). | 01-15-2009 |
20110101241 | Solid-State Photodetector Pixel and Photodetecting Method - A pixel is formed in a semiconductor substrate (S) with a plane surface for use in a photodetector. It comprises an active region for converting incident light (In) into charge carriers, photogates (PGL, PGM, PGR) for generating a lateral electric potential (Φ(x)) across the active region, and an integration gate (IG) for storing charge carriers generated in the active region and a dump site (Ddiff). The pixel further comprises separation-enhancing means (SL) for additionally enhancing charge separation in the active region and charge transport from the active region to the integration gate (IG). The separation-enhancing means (SL) are for instance a shield layer designed such that for a given lateral electric potential (Φ(x)), the incident light (In) does not impinge on the section from which the charge carriers would not be transported to the integration gate (IG). | 05-05-2011 |
Patent application number | Description | Published |
20090299723 | MONITORING PHYSICAL PARAMETERS IN AN EMULATION ENVIRONMENT - A method and system is disclosed for monitoring and viewing physical parameters while the emulator is emulating a design. Additionally, the parameters are in real time or substantially real time, such as after a periodic update. In one embodiment, a monitoring portion of the emulator periodically monitors the emulator boards and power supplies for physical information. The physical information is communicated to a workstation for communication to a user. For example, the workstation can display the physical information in a graphical user interface (GUI) that shows which boards are plugged in the system and which slots are empty. In yet another aspect, the user can select a particular board in the system and view communication information, such as data errors, status, link errors, global errors, etc. In a further aspect, power supply information can be viewed, such as current and voltage levels, air temperature, fan speed, board temperatures at particular points, etc. In another aspect, the IC layout on a board can be viewed with a graphical presentation of which ICs are malfunctioning. Even further, the sections within a particular IC can be viewed with a graphical presentation of sections within the IC that are malfunctioning. | 12-03-2009 |
20110119045 | MONITORING PHYSICAL PARAMETERS IN AN EMULATION ENVIRONMENT - A method and system is disclosed for monitoring and viewing physical parameters while the emulator is emulating a design. Additionally, the parameters are in real time or substantially real time, such as after a periodic update. In one embodiment, a monitoring portion of the emulator periodically monitors the emulator boards and power supplies for physical information. The physical information is communicated to a workstation for communication to a user. For example, the workstation can display the physical information in a graphical user interface (GUI) that shows which boards are plugged in the system and which slots are empty. In yet another aspect, the user can select a particular board in the system and view communication information, such as data errors, status, link errors, global errors, etc. In a further aspect, power supply information can be viewed, such as current and voltage levels, air temperature, fan speed, board temperatures at particular points, etc. In another aspect, the IC layout on a board can be viewed with a graphical presentation of which ICs are malfunctioning. Even further, the sections within a particular IC can be viewed with a graphical presentation of sections within the IC that are malfunctioning. | 05-19-2011 |
20120226488 | MONITORING PHYSICAL PARAMETERS IN AN EMULATION ENVIRONMENT - A method and system is disclosed for monitoring and viewing physical parameters while the emulator is emulating a design. Additionally, the parameters are in real time or substantially real time, such as after a periodic update. In one embodiment, a monitoring portion of the emulator periodically monitors the emulator boards and power supplies for physical information. The physical information is communicated to a workstation for communication to a user. For example, the workstation can display the physical information in a graphical user interface (GUI) that shows which boards are plugged in the system and which slots are empty. In yet another aspect, the user can select a particular board in the system and view communication information, such as data errors, status, link errors, global errors, etc. | 09-06-2012 |