Patent application number | Description | Published |
20120294421 | X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD - An X-ray imaging apparatus acquiring a differential phase contrast image of a test object without using a light-shielding mask for X-ray. The apparatus includes an X-ray source, a splitting element configured to spatially divide an X-ray emitted from an X-ray source and a scintillator configured to emit light when a divided X-ray beam divided at the splitting element is incident on the scintillator. The apparatus also includes a light-transmission limiting unit configured to limit transmitting amount of the light emitted from the scintillator and a plurality of light detectors each configured to detect the amount of light that has transmitted through the light-transmission limiting unit. The light-transmission limiting unit is configured such that a light intensity detected at each of the light detectors changes in response to a change in an incident position of the X-ray beam. | 11-22-2012 |
20120319015 | GLASS COMPOSITION AND OPTICAL DEVICE - There is provided a glass composition containing an oxide containing Lu, Si, and Al, in which the composition of the glass composition lies within a compositional region of a ternary composition diagram of Lu, Si, and Al in terms of cation percent, the compositional region being defined by the following six points:
| 12-20-2012 |
20120321042 | X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD - Provided is an X-ray imaging apparatus and an X-ray imaging method that offer an alternative for a refraction contrast method. | 12-20-2012 |
20130039466 | X-RAY IMAGING APPARATUS - To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays. | 02-14-2013 |
20130108020 | X-RAY APPARATUS AND X-RAY MEASURING METHOD | 05-02-2013 |
20150153290 | X-RAY APPARATUS AND METHOD OF MEASURING X-RAYS - An X-ray apparatus and an X-ray measuring method which are capable of obtaining object information including information about scattering of X-rays by an object are provided. The X-ray apparatus includes a detector configured to detect an intensity of an X-ray beam passed through an object. The detector includes a first pixel and a second pixel different from the first pixel. The apparatus is configured such that when the object is not disposed in an optical path of the X-ray beam, the center of an intensity distribution of the X-ray beam applied to the detector does not coincide with a boundary between the first and second pixels. | 06-04-2015 |
20150160141 | X-RAY APPARATUS AND X-RAY MEASUREMENT METHOD - The invention provides an X-ray apparatus and an X-ray measurement method that can increase sensitivity to a positional shift of an X-ray as compared with related art. | 06-11-2015 |
20150179293 | X-RAY DEVICE AND X-RAY MEASUREMENT METHOD - The present invention provides an X-ray device and an X-ray measurement method which can acquire a scattering contrast image of an object. | 06-25-2015 |