Suzuyama
Akihiro Suzuyama, Tokyo JP
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20150204560 | ENVIRONMENTAL PARAMETER SETTING AIDING DEVICE AND METHOD - An environmental parameter setting aiding device includes: a data acquiring system that acquires, and saves as environmental parameter information, a current parameter value of an environmental parameter of an air conditioning controlling system, and acquires, and saves as complaint information, complaints from various occupants indicating perceptions that a temperature environment, using the parameter value, is too hot or too cold; a complaint proportion calculating portion that calculates, from the complaint information that has been stored, a complaint proportion, indicating a proportion of perceptions of being too hot or too cold, for each individual parameter value; a parameter value selecting portion that selects, as a recommended parameter value, the parameter value wherein the complaint proportion is nearest to 50%; and an aid screen displaying portion that presents the recommended value in an aid screen. | 07-23-2015 |
Shigefumi Suzuyama, Chiryu-Shi JP
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20110265615 | INTERNAL MACHINING APPARATUS FOR HOLLOW WORKPIECE - In an internal machining apparatus for machining an internal surface of a hollow workpiece, a machining unit holding a cutting blade is configured to be inserted into the hollow workpiece. A pair of unit holding arbors which are capable of non-rotatably holding the machining unit, inserted in the hollow workpiece, at both sides thereof are respectively supported by a work head and a foot stock to advance and retract in an axial direction thereof. A turning mechanism is provided to be supplied with a drive power transmitted through the interior of one of the unit holding arbors for turning the cutting blade held on the machining unit about an axis orthogonal to an axis of the unit holding arbors. | 11-03-2011 |
Shigefumi Suzuyama, Toyota-Shi JP
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20130268108 | MACHINE TOOL - A machine tool includes a controller including a storage unit that stores correction history data including correction amounts of the positions of tools input from a worker and time when the correction amounts are input, in association with the tools; and a display device that can display a time-based graph showing a relationship between the time and the correction amount for each tool. | 10-10-2013 |
Shigeru Suzuyama, Fukuoka JP
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20090207742 | FRAME TRANSMISSION DEVICE AND LOOP JUDGING METHOD - A frame transmission device having a port for transmitting and receiving a frame and a learning table for storing a transmission source address included in the frame received at the port and the receiving port in association with each other includes: a port detector for detecting whether learning data coincident with the transmission source address included in the frame received at the port is stored in the learning table; a port judging unit for comparing a port learned in the learning data detected by the port detector to the receiving port; and a loop judging unit for judging on the basis of a time lapse from the storage of the learning data whether the frame is in a loop or not when the port learned in the learning data is not coincident with the receiving port. | 08-20-2009 |
Takeshi Suzuyama, Oyama-Shi JP
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20080290499 | Semiconductor device - A semiconductor device is disclosed that includes a ceramic substrate having first and second surfaces, a semiconductor element, a radiator, and an interposed portion located between the second surface and the radiator. The interposed portion has coupling regions that couple the second surface to the radiator, and non-coupling regions that do not couple the second surface to the radiator. Each non-coupling region is formed as an elongated groove. In the group of the non-coupling regions, the width of the outermost non-coupling region in the interposed portion is greater than the width of the innermost non-coupling region in the interposed portion. Regarding an adjacent pair of the non-coupling regions in the width direction, the width of the outer non-coupling region is greater than or equal to the width of the inner non-coupling region. | 11-27-2008 |