Patent application number | Description | Published |
20110001982 | OPTICAL IMAGING APPARATUS AND METHOD - The present invention relates to an optical imaging apparatus and a method, and more particularly to an optical imaging apparatus and a method with short coherence length optical source. The apparatus comprises an optical source with a plurality of outputs for providing a reference light and a sample light; a sample probe module for leading the sample light to a sample, and leading an information light out; an interference module for leading the reference light to a photo detector, and leading the information light to the photo detector; and a signal processing unit electrically coupled to the photo detector; wherein the reference light and the information light are superimposed on the photo detector, an interference light pattern is detected by the photo detector, and a signal that represents the interference light pattern is transmitted to said signal processing unit for analyzing the spatial information of the sample. | 01-06-2011 |
20110037986 | INTERFERENCE MEASURING APPARATUS AND MEASURING METHOD THEREOF - The present invention discloses an interference measuring apparatus, which comprises a light source module, a beam splitter, a first lens module, a reflecting module, a second lens module, and a detection device. A light beam generated from the light source module can be projected on the beam splitter. The beam splitter splits the light beam to generate a first light beam and a second light beam, wherein the first light beam passes through the first lens module and then projects onto the reflecting module, and the second light beam passes through the second lens module and projects onto an object. Furthermore, the first light beam and the second light beam are reflected by the reflecting module and the object, respectively, then both the first light beam and the second light beam are leaded to the detection device to form an interference pattern for obtaining the contours and internal cross-sectional image of the object. | 02-17-2011 |
20110128611 | WHITE LIGHT SOURCE WITH CRYSTAL FIBER AND METHOD FOR COLOR TEMPERATURE TUNING THEREOF - The present invention relates to a white light source, and particularly to a white light source with crystal fiber and a method for color temperature tuning thereof. The white light source of the present invention comprises a pumping source for providing a first-color light, and a gradient index lens for coupling the first-color light into a crystal fiber. The crystal fiber absorbs a portion of the first-color light and generates a second-color light and a third-color light, and a white light with high color rendering index can be obtained. The crystal fiber is made of a first rare earth element oxide and a second rare earth element oxide co-doped yttrium aluminum garnet. The color temperature of the white light can be tuned by adjusting the position of the focus of the pumping light on the end section of the crystal fiber. | 06-02-2011 |
20110235048 | APPARATUS FOR LOW COHERENCE OPTICAL IMAGING - The present invention relates to an apparatus for low coherence optical imaging, and more particularly to an apparatus for low coherence optical imaging which can obtain the information of the different depths of a sample simultaneously. The apparatus comprises a phase transformation unit or a beam shift unit. The phase transformation unit or beam shift unit transforms and reflects the reference light, such that the reflected reference light comprises different phases at the different positions of a cross-section. When the reference light and a information light from the sample are superimposed on a photo detector, the information of the different depths of the sample is obtained. By using the apparatus of the present invention, the elements, the volume, and the cost of the apparatus are reduced. Because of only two-dimensional scanning is required, the scanning rate is improved. | 09-29-2011 |
20120212736 | CRYSTAL FIBER, RAMAN SPECTROMETER USING THE SAME AND DETECTION METHOD THEREOF - The invention relates to a crystal fiber, a Raman spectrometer using the same and a inspection method thereof. The crystal fiber comprises a sapphire crystal is doped with two transition metals having different concentrations. An excitation light beam at a specific wavelength can propagate along the crystal fiber to generate a narrow-band light beam and a wide-band light beam to project on a specimen. Raman scattered light is emitted from the specimen. The wavelength of the Raman scattered light falls within the wavelength range of the wide-band light beam so that the wide-band light beam is enhanced at some characteristic wavelengths to facilitate Raman spectroscopy. | 08-23-2012 |
20120293805 | INTERFERENCE MEASURING APPARATUS AND MEASURING METHOD THEREOF - An interference measuring apparatus comprises a light source module, a beam splitter, a first lens module, a reflecting module, a second lens module, and a detection device. A light beam generated from the light source module can be projected on the beam splitter. The beam splitter splits the light beam to generate a first light beam and a second light beam. The first light beam passes through the first lens module and then projects onto the reflecting module, and the second light beam passes through the second lens module and projects onto an object. Furthermore, the first light beam and the second light beam are reflected by the reflecting module and the object, respectively, then both the first light beam and the second light beam are leaded to the detection device to form an interference pattern for obtaining the contours and internal cross-sectional image of the object. | 11-22-2012 |
20130100457 | APPARATUS FOR LOW COHERENCE OPTICAL IMAGING - The present invention relates to an apparatus for low coherence optical imaging, and more particularly to an apparatus for low coherence optical imaging which can obtain the information of the different depths of a sample simultaneously. The apparatus comprises a phase transformation unit or a beam shift unit. The phase transformation unit or beam shift unit transforms and reflects the reference light, such that the reflected reference light comprises different phases at the different positions of a cross-section. When the reference light and a information light from the sample are superimposed on a photo detector, the information of the different depths of the sample is obtained. By using the apparatus of the present invention, the elements, the volume, and the cost of the apparatus are reduced. Because of only two-dimensional scanning is required, the scanning rate is improved. | 04-25-2013 |
20140060420 | Ti: SAPPHIRE CRYSTAL FIBER, MANUFACTURING METHOD THEREOF, AND WIDE BAND LIGHT SOURCE USING THE SAME - The present invention relates to a crystal fiber, and more particularly to a Ti: sapphire crystal fiber, a manufacturing method thereof, and a wide band light source with the same. The Ti: sapphire single crystal is grown by means of laser-heated pedestal growth (LHPG) method into a crystal fiber of a predetermined diameter. The as-grown crystal fiber is annealed for enhancing its fluorescence and reducing the infra-red residual absorption. The annealed crystal fiber is inserted into a glass capillary and is grown into a single-clad crystal fiber. The wide band light source comprises: a pumping source for providing a pumping light; a single-clad Ti: sapphire crystal fiber for absorbing the pumping light and emitting the wide band light. | 03-06-2014 |
20140072010 | Ti: SAPPHIRE CRYSTAL FIBER, MANUFACTURING METHOD THEREOF, AND WIDE BAND LIGHT SOURCE USING THE SAME - The present invention relates to a crystal fiber, and more particularly to a Ti: sapphire crystal fiber, a manufacturing method thereof, and a wide band light source with the same. The Ti: sapphire single crystal is grown by means of laser-heated pedestal growth (LHPG) method into a crystal fiber of a predetermined diameter. The as-grown crystal fiber is annealed for enhancing its fluorescence and reducing the infra-red residual absorption. The annealed crystal fiber is inserted into a glass capillary and is grown into a single-clad crystal fiber. The wide band light source comprises: a pumping source for providing a pumping light; a single-clad Ti: sapphire crystal fiber for absorbing the pumping light and emitting the wide band light. | 03-13-2014 |
20140079363 | DOUBLE CLADDING CRYSTAL FIBER AND MANUFACTURING METHOD THEREOF - The present invention relates to a double cladding crystal fiber and manufacturing method thereof, in which growing an YAG or a sapphire into a single crystal fiber by LHPG method, placing the single crystal fiber into a glass capillary for inner cladding, placing the single crystal fiber together with the glass capillary for inner cladding into a glass capillary for outer cladding in unison, heating the glass capillary for inner cladding and outer cladding by the LHPG method to attach to the outside of the single crystal fiber, and thus growing into a double cladding crystal fiber. When the present invention is applied to high power laser, by using the cladding pumping scheme, the high power pumping laser is coupled to the inner cladding layer, so the problems of heat dissipation and the efficiency impairment due to energy transfer up-conversion of high power laser are mitigated. | 03-20-2014 |
20140333934 | SCAN LENS, INTERFEROMETRIC MEASURING DEVICE USING SAME - A scan lens and an interferometric measuring device using the scan lens are disclosed. The scan lens includes a lens set, a beam splitter, and a reflector disposed between the lens set and the beam splitter. During application the applied light beam passes through the lens set of the interferometric measuring device to fall upon the beam splitter where the light beam that passes through the beam splitter is defined as a first light beam and the light beam that is reflected by the beam splitter is defined as a second light beam. The first light beam is projected onto the test object. The second light beam is projected onto the reflector. The second light beam reflected by the reflector and the first light beam reflected or scattered by the test object will interfere with each other to form interference patterns for measuring the test object. | 11-13-2014 |