Raghav
Raghav Babulnath, San Jose, CA US
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20140303921 | DYNAMIC DESIGN ATTRIBUTES FOR WAFER INSPECTION - Methods and systems for dynamic design attributes for wafer inspection are provided. One method includes, at run time of a wafer inspection recipe, prompting a user of a wafer inspection tool on which the wafer inspection recipe is performed for information for a design based binning (DBB) process. The information includes one or more formulae for calculating design attributes from a design for a wafer. The design attributes are used to bin the defects in the DBB process. The method also includes performing inspection of a wafer according to an updated wafer inspection recipe. Performing the inspection includes binning defects detected on the wafer according to the DBB process in the updated wafer inspection recipe. | 10-09-2014 |
20140307947 | Design Based Sampling and Binning for Yield Critical Defects - Methods and systems for design based sampling and binning for yield critical defects are provided. One method includes aligning each image patch in each inspection image frame generated for a wafer by an optical subsystem of an inspection system to design information for the wafer. The method also includes deriving multiple layer design attributes at locations of defects detected in the image patches. In addition, the method includes building a decision tree with the multiple layer design attributes. The decision tree is used to separate the defects into bins with different yield impacts on a device being formed on the wafer. The method also includes binning the defects with the decision tree. | 10-16-2014 |
20150120220 | Detecting IC Reliability Defects - Methods and systems for detecting reliability defects on a wafer are provided. One method includes acquiring output for a wafer generated by an inspection system. The method also includes determining one or more geometric characteristics of one or more patterned features formed on the wafer based on the output. In addition, the method includes identifying which of the one or more patterned features will cause one or more reliability defects in a device being formed on the wafer based on the determined one or more characteristics. | 04-30-2015 |
Raghav Baleedpalli, Hyderabad IN
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20120290529 | SYSTEMS AND METHODS FOR UPDATING A DATABASE AND HANDLING INTERRUPTIONS - A system and method for updating a database by a data loader management unit (DLMU) is provided. The method may include, but is not limited to, determining if a partial database download is stored in a memory of the DLMU, determining, if a version of the partial database download matches a version of the database stored on a database upgrade server, initiating, if the version associated with the partial database download matches the version of the database store on the database upgrade server, a download session to resume the download of the version of the database from the database upgrade server, and initiating, if the version associated with the partial database download does not match the version of the database store on the database upgrade server, a download session to being downloading the version of the database from the database upgrade server. | 11-15-2012 |
Raghav Boinepalli, Santa Clara, CA US
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20090222316 | METHOD TO TAG ADVERTISER CAMPAIGNS TO ENABLE SEGMENTATION OF UNDERLYING INVENTORY - A method and system for enabling segmentation of advertising inventory for an advertisement campaign includes capturing a plurality of requirements for an advertisement campaign. The campaign requirements include a descriptive tag that uniquely identifies the advertisement campaign. The requirements include a plurality of campaign attributes that define the requirements of the advertisement campaign including target audience and advertisement campaign objective. A tag inventory, with a plurality of descriptive tags and a plurality of advertisement bookings associated with one or more of the descriptive tags, is analyzed based on the captured advertisement campaign requirements. A recommended suggestion of bookings based on the analysis is presented. The recommended suggestion of bookings matches at least a portion of the campaign attributes. A media plan is finalized for the advertisement campaign based on a response received for the recommended suggestion of bookings, the response defines the relevancy of the recommended suggestion of bookings. | 09-03-2009 |
Raghav Mahalingham, Austin, TX US
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20150117019 | LAMP WITH HEAT SINK AND ACTIVE COOLING DEVICE - A lamp comprising a light source comprising at least one solid state emitter. The lamp comprises a heat sink body in thermal communication with said light source. At least one air flow nozzle is present in the lamp to direct air flow across at least a portion of the heat sink body. The lamp further comprises an active cooling device, in which the active cooling device is in fluid communication with the at least one air flow nozzle and is configured to provide a flow of air to the at least one air flow nozzle. The lamp further comprises driver electronics configured to provide power to each of the light source and the active cooling device, wherein the driver electronics are remote from the active cooling device. | 04-30-2015 |
Raghav Nirwani, Hyderabad IN
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20090150275 | VERIFYING WHETHER A SOFTWARE PACKAGE CALCULATING EFC USED FOR DETERMINING FEDERAL STUDENT FINANCIAL AID IS IMPLEMENTED ACCORDING TO A SPECIFICATION - A digital processing system verifies whether a software package designed to calculate EFC is implemented in compliance with a specification provided by the US Federal Government for a specific year. In one embodiment, a set of sample ISIRs provided by the US Federal Government is received, with each sample ISIR containing the details of a student and a corresponding expected set of EFC values pre-calculated based on the specification for that specific year. The digital processing system then sends the details of the student contained in a sample ISIR to the software package (being verified) and in response, receives the corresponding calculated values of the EFC calculated by the software package based on the details of the student. The calculated values of the EFC and the expected values of the EFC are then compared to determine if the software package is implemented in compliance with the specification. | 06-11-2009 |
Raghav Vanga, Houghton, MI US
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20090060411 | PLANAR MAGNETIZATION LATCHING IN MAGNETO-OPTIC FILMS - A latching magnetic structure in the resonant cavity of magneto-photonic crystal films with in-plane magnetization. Also disclosed is a method for the fabrication and observation of a latching magnetic structure. | 03-05-2009 |