Patent application number | Description | Published |
20130099113 | IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS - In a mass spectrometer or gas chromatograph/mass spectrometer system, a conditioning gas such as, for example, hydrogen is added to condition or clean one or more components or regions of the mass spectrometer such as the ion source. The conditioning gas may be added upstream of the mass spectrometer such as, for example, into a sample inlet or a chromatographic column, or may be added directly into the mass spectrometer. The conditioning gas may be added off-line, when the mass spectrometer is not analyzing a sample, or on-line during sample analysis. When added on-line, the conditioning gas may be mixed with a carrier gas such as, for example, helium. In another embodiment, the conditioning gas also serves as the carrier gas through the column; another gas such as, for example, helium may be added to the carrier gas stream. | 04-25-2013 |
20140260540 | SAMPLE INLET WITH MULTI-CAPILLARY LINER FOR GAS CHROMATOGRAPHY - A gas chromatograph (GC) inlet device includes a multi-capillary liner capable of separating components of a sample matrix prior to injecting the sample into an analytical GC column. The device is switchable between different modes, such as a normal injection modes, splitless modes, split modes, a backflush modes, and cut modes. | 09-18-2014 |
20140374583 | ELECTRON IONIZATION (EI) UTILIZING DIFFERENT EI ENERGIES - Mass spectrometry is performed utilizing an electron ionization (EI) source. The EI source ionizes a sample at different electron energies, including below and above 70 eV. The EI source may be utilized for soft ionization as well as hard ionization. The value of the electron energy may be selected so as to favor the formation of molecular ions or other ions of high analytical value. The ion source may be an axial ion source. | 12-25-2014 |
20140375209 | AXIAL MAGNETIC ION SOURCE AND RELATED IONIZATION METHODS - An ion source is configured for electron ionization and produces coaxial electron and ion beams. The ion source includes an ionization chamber along an axis, a magnet assembly configured for generating an axial magnetic field in the ionization chamber, an electron source, and a lens assembly configured for directing the ion beam out from the ionization chamber along the axis, reflecting the electron beam back toward the electron source, and transmitting higher energy ions out from the ion source while reflecting lower energy ions toward a lens element for neutralization. | 12-25-2014 |