Patent application number | Description | Published |
20080250881 | Sample carrier and sample holder - The invention relates to a composite structure of a sample carrier | 10-16-2008 |
20080283768 | Transfer mechanism for transferring a specimen - The invention relates to a transfer mechanism for transferring a specimen ( | 11-20-2008 |
20100108907 | CHARGED-PARTICLE OPTICAL SYSTEM WITH DUAL LOADING OPTIONS - A charged-particle optical system ( | 05-06-2010 |
20100148064 | X-RAY DETECTOR FOR ELECTRON MICROSCOPE - Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt. | 06-17-2010 |
20100230609 | SAMPLE CARRIER FOR SAMPLE HOLDER - The invention relates to a composite structure of a sample carrier | 09-16-2010 |
20110097706 | MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID - The invention relates to a micro-reactor for observing small particles, cells, bacteria, viruses or protein molecules in a fluid. The micro-reactor shows a first channel formed between two layers for containing the fluid, with an inlet and an outlet, the two layers separated by a first distance. A likewise second channel with an inlet and an outlet is placed adjacent to the first channel. A gap connects the first channel and the second channel, at the gap at least one layer showing a window transparent to the method of inspection and at the window the two layers being separated by a very small distance of, for example, 1 μm or less. | 04-28-2011 |
20120074333 | X-ray Detector for Electron Microscope - Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt. | 03-29-2012 |
20120128028 | Method of Measuring the Temperature of a Sample Carrier in a Charged Particle-Optical Apparatus - A method of determining the temperature of a sample carrier in a charged particle-optical apparatus, characterized in that the method comprises the observation of the sample carrier with a beam of charged particles, the observation giving information about the temperature of the sample carrier. The invention is based on the insight that a charged particle optical apparatus, such as a TEM, STEM, SEM or FIB, can be used to observe temperature related changes of a sample carrier. The changes may be mechanical changes (e.g. of a bimetal), crystallographic changes (e.g. of a perovskite), and luminescent changes (in intensity or decay time). In a preferred embodiment the sample carrier shows two bimetals, showing metals with different thermal expansion coefficients, bending in opposite directions. The distance between the two bimetals is used as a thermometer. | 05-24-2012 |
20130213439 | Holder Assembly for Cooperating with an Environmental Cell and an Electron Microscope - A holder assembly comprises a first and a separable second part, the first part detachable from the second part, the first part comprising a tube and an environmental cell interface and the second part comprising an electron microscope interface, as a result of which the first part can be cleaned at high temperatures without exposing the second part to said high temperature. | 08-22-2013 |
20130240731 | X-RAY DETECTOR FOR ELECTRON MICROSCOPE - Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt. | 09-19-2013 |
20140077080 | X-ray Detector for Electron Microscope - Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt. | 03-20-2014 |
20140319347 | Mounting structures for multi-detector electron microscopes - A detector support for an electron microscope including a detector support ring and flexible elements, wherein a first end of each of the flexible elements is connected to the support ring, and wherein the detector support ring and the flexible elements are configured to support at least two detectors in a circumferential arrangement around an optical axis of the electron microscope such that an optical axis of each of the at least two detectors intersects the optical axis of the electron microscope and a target point of the at least two detectors is maintained relatively constant over a temperature change. | 10-30-2014 |