Patent application number | Description | Published |
20080239404 | IMAGE FORMING APPARATUS AND IMAGE FORMING METHOD - A method and apparatus are provided for forming an image on a surface of medium having variable surface attributes affecting image formation. The image forming apparatus includes an image forming unit configured to form images on a surface on which images are to be formed, including a plurality of areas with different attributes, in a medium for forming images, on the basis of input image information, and a determination unit configured to determine, for the plurality of areas, conditions for forming images or positions in which images are formed. The image forming unit forms images on the basis of conditions for forming images or positions in which images are formed determined by the determination unit. | 10-02-2008 |
20080251997 | INFORMATION DETECTING DEVICE, SHEET MATERIAL PROCESSING APPARATUS EQUIPPED WITH INFORMATION DETECTING DEVICE, AND SIGNAL OUTPUT DEVICE - Disclosed is an information detecting device capable of reducing fluctuation in detection accuracy. A recording sheet P transported through a transport path comes into contact with a displacing member, and, in this state, a motor is driven to rotate a cam, and the resilient force of a coil spring causes a pressurizing member to collide with the recording sheet P. The impact force at that time is detected by a detection sensor, and transmitted to a sheet material information obtaining means. Then, on the basis of the detection result, it is possible to detect the type, density, thickness, surface irregularities, etc. of the recording sheet P. At this time, the recording sheet P is in contact with the displacing member, whereby it is possible to reduce fluctuation in detection accuracy due to positional deviation of the recording sheet P. | 10-16-2008 |
20090007630 | SHEET MATERIAL DISCRIMINATION APPARATUS, SHEET MATERIAL INFORMATION OUTPUT APPARATUS, AND IMAGE FORMING APPARATUS - Provided is a sheet material discrimination apparatus including: an impact force applying member for colliding with the surface of a sheet material, an impact force receiving member for receiving the impact force applying member through the sheet material, a detecting unit for outputting an electric signal corresponding to an impact force received by the impact force receiving member, and a cushioning material for absorbing the impact force transmitted to the detecting unit, wherein a support member having a bending rigidity higher than the bending rigidity of the detecting unit with respect to the impact force is arranged between the detecting unit and the cushioning material. | 01-08-2009 |
20090238624 | SHEET MATERIAL INFORMATION DETECTION APPARATUS, SHEET MATERIAL PROCESSING APPARATUS, AND SHEET MATERIAL INFORMATION DETECTION METHOD - A motion member ( | 09-24-2009 |
20100217539 | MULTI-FUNCTIONAL SENSOR AND METHOD OF SENSING - A multi-functional sensor for deriving information on a recording sheet material comprising an impact-applying unit for applying an external mechanical force onto the recording sheet material, a signal-detecting unit for detecting a signal of response of the recording sheet material to the external mechanical force, a signal-processing unit for processing the signal, and a signal-judging unit for deriving a property of the recording sheet material by comparison of a signal from the signal-detecting unit or the signal processing unit with information memorized preliminarily, wherein the signal-processing unit comprises a separation section for separating the signal from the signal-detecting unit into output signals on the properties of the recording sheet material, and a processing section for deriving, by statistical treatment, a correlation equation showing a correlation between the separated output signal and the properties of the recording sheet material. | 08-26-2010 |
20110062441 | SEMICONDUCTOR DEVICE AND DISPLAY APPARATUS - Provided is a semiconductor device including a semiconductor element including at least a semiconductor as a component characterized by including: a mechanism for irradiating the semiconductor with light having a wavelength longer than an absorption edge wavelength of the semiconductor; and a dimming mechanism, provided in a part of an optical path through which the light passes, for adjusting at least one factor selected from an intensity, irradiation time and the wavelength of the light, wherein a threshold voltage of the semiconductor element is varied by the light adjusted by the dimming mechanism. | 03-17-2011 |
20110065216 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE OR APPARATUS, AND APPARATUS FOR MANUFACTURING THE SAME - A method for manufacturing a semiconductor device or apparatus having at least a semiconductor as a component, characterized by including irradiating the semiconductor with light having a longer wavelength than the absorption edge wavelength of the semiconductor to change the threshold voltage of the semiconductor device or apparatus, and checking the threshold voltage of the semiconductor device or apparatus, after or during irradiation with the light, to determine whether the threshold voltage is in a predetermined range, during manufacturing the semiconductor device or apparatus. | 03-17-2011 |
20110076790 | METHOD FOR CONTROLLING THRESHOLD VOLTAGE OF SEMICONDUCTOR ELEMENT - A method for controlling the threshold voltage of a semiconductor element having at least a semiconductor as a component is characterized in including a process to measure one of a threshold voltage and a characteristic value serving as an index for the threshold voltage; a process to determine one of the irradiation intensity, irradiation time, and wavelength of the light for irradiating the semiconductor based on one of the measured threshold voltage and the measured characteristic value serving as the index for the threshold voltage; and a process to irradiate light whose one of the irradiation intensity, irradiation time, and wavelength has been determined onto the semiconductor; wherein the light irradiating the semiconductor is a light having a longer wavelength than the wavelength of the absorption edge of the semiconductor, and the threshold voltage is changed by the irradiation of the light. | 03-31-2011 |
20110092016 | METHOD OF TREATING SEMICONDUCTOR ELEMENT - In a method of treating a semiconductor element which at least includes a semiconductor, a threshold voltage of the semiconductor element is changed by irradiating the semiconductor with light with a wavelength longer than an absorption edge wavelength of the semiconductor. The areal density of in-gap states in the semiconductor is 10 | 04-21-2011 |