Patent application number | Description | Published |
20120077063 | ELECTRICAL SYSTEM - An electrical system, including an energy storage, in particular an electrochemical energy storage, has at least one cell having an anode, a cathode, and a fluid electrolyte, which allows a current flow from the anode to the cathode. The cell has at least two openings, the openings being connected by a connector for the circulatory conveyance of the electrolyte. The safety and the longevity of an energy storage are improved in this way. | 03-29-2012 |
20130298387 | METHOD FOR PRODUCING AN ENERGY CELL AND APPARATUS FOR CARRYING OUT SAME - A method for producing an energy cell, in particular an energy storage cell or battery, having the steps of: arranging a plurality of films of the energy cell at a processing location, and cutting the plurality of films in one operation, wherein the cutting of the films is carried out by a laser beam, and wherein the laser beam is guided in a liquid. Also an apparatus for producing an energy cell. | 11-14-2013 |
20140287303 | ELECTRODE AND METHOD FOR MANUFACTURING AN ELECTRODE - A method for manufacturing an electrode, including: a) providing a dry active material mixture; b) providing a preformed current collector; and c) applying the dry active material mixture onto at least one subregion of the current collector to form an active material layer. A method of this kind offers a particularly cost-effective way of manufacturing an electrode in a particularly defined manner and without unrectifiable rejects. Also described is a related electrode. | 09-25-2014 |
20140287304 | ELECTRODE AND METHOD FOR MAUFACTURING THE SAME - An electrode for an electrochemical energy store, having at least two adjacently situated active material layers, the at least two active material layers having at least one active material and at least one conductive additive, the at least two active material layers furthermore having a gradient with respect to one another in terms of the active material concentration, the at least two active material layers furthermore having a gradient with respect to one another in terms of the conductive additive concentration, and the gradient in terms of the active material concentration and the gradient in terms of the conductive additive concentration being developed to run in opposite directions. An electrode of this kind also allows for a good high-current capability and a good storage capacity. Also described is a method for manufacturing an electrode of this kind. | 09-25-2014 |
20140287318 | ELECTRODE AND METHOD FOR MANUFACTURING AN ELECTRODE - A method for manufacturing an electrode, including the following method steps: providing an active material mixture containing solvent; providing a preformed current collector; applying the solvent-containing, active material mixture to at least a partial region of the current collector to form an active material layer; and drying the active material layer. Such a method provides a particularly cost-effective manner of being able to manufacture an electrode without waste. Also described is an electrode. | 09-25-2014 |
Patent application number | Description | Published |
20090224174 | Calibration device and laser scanning microscope with such a calibration device - A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it. | 09-10-2009 |
20090296207 | Laser scanning microscope and its operating method - Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined. | 12-03-2009 |
20100097694 | METHOD AND ARRANGEMENT FOR CONTROLLED ACTUATION OF A MICROSCOPE, IN PARTICULAR OF A LASER SCANNING MICROSCOPE - Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the first illumination light. | 04-22-2010 |
20100225910 | CONFIGURATION OF A LASER SCANNING MICROSCOPE FOR RASTER IMAGE CORRELATION SPECTROSCOPY MEASUREMENT AND METHOD FOR CONDUCTING AND EVALUATING SUCH A MEASUREMENT - 1.1. Method for the configuration a laser scanning microscope for a raster image correlation spectroscopy measurement and method for carrying out and evaluating a measurement of this kind. 2.1. Manual setting of the scan parameters for a raster image correlation spectroscopy measurement (RICS) is complicated because the effects of setting a certain parameter are not apparent due to the complex interaction between the various parameters and also depend on the physical-technical properties of the microscope. By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a RICS measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. 2.2. According to the invention, for a raster image correlation spectroscopy measurement, a best value for a sampling value is determined and is specified for a subsequent scanning process on a sample. In order to carry out or evaluate a RICS measurement, sampling values are acquired or a correlation is determined exclusively in a sample region within which a pixel time (ΔP) changes along a harmonically controlled scan axis (X) by less than, or at most by, a predetermined or predeterminable value. 2.3. The invention is preferably used in laser scanning microscopes. | 09-09-2010 |
20110267688 | Microscopy Method and Microscope With Enhanced Resolution - Method for enhancing the resolution of a microscope during the detection of an illuminated specimen and a microscope for carrying out the method, wherein in a first position, an illumination pattern is generated on the specimen, the resolution of which is preferably within the range of the attainable optical resolution of the microscope or higher, wherein a relative movement, preferably perpendicular to the direction of illumination, from a first into at least one second position of the illumination pattern on the specimen is generated at least once between the detection and the illumination pattern with a step width smaller than the resolution limit of the microscope and detection and storage of the detection signals take place both in the first and in the second position. | 11-03-2011 |
20120268749 | LASER SCANNING MICROSCOPE AND ITS OPERATING METHOD - Laser scanning microscope and its operating method in which at least two first and second scanning systems activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, The scanning fields created by the light distributions on the sample mutually overlap to create a reference pattern on the sample with one of the light distributions, which is then captured and used to create the overlap using the second light distribution and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined. | 10-25-2012 |
20120319007 | LUMINESCENCE MICROSCOPY - A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample. | 12-20-2012 |
20130307959 | LASER SCANNING MICROSCOPE AND ITS OPERATING METHOD - Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined. | 11-21-2013 |
20130314758 | LIGHT SCANNING MICROSCOPE AND MICROSCOPY METHOD - A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector. | 11-28-2013 |
20140146376 | Light microscope and microscopy method - A light microscope having a specimen plane, in which a specimen to be examined is positioned, having a light source to emit illuminating light, having optical imaging means to convey the illuminating light into the specimen plane, having a first scanning means, with which an optical path of the illuminating light and the specimen can be moved relative to each other to produce an illumination scanning movement of the illuminating light relative to the specimen, having a detector means to detect specimen light coming from the specimen and having electronic means to produce an image of the specimen based on the specimen light detected by the detector means at different specimen regions. A second scanning means is present, with which it can be adjusted which specimen region can be imaged on a determined detector element. | 05-29-2014 |
20140291484 | MICROSCOPE WITH STRUCTURED ILLUMINATION - A microscope and a method of microscopy that uses structured illumination, involving imaging a grid structure or periodic light distribution on a sample, wherein by displacing the image of the grid structure, imaging is carried out under different phase positions, and a high-resolution sample image is calculated from the recorded images, characterized in that the grid structure or light distribution is generated by using at least two phase grids arranged one in front of the other, and different orientations of the light distribution perpendicular to the illumination direction are generated by displacing the phase grids relative to one another, with displacement, imaging and calculation being carried out for different orientations. | 10-02-2014 |
20140293037 | OPTICAL MICROSCOPE AND METHOD FOR EXAMINING A MICROSCOPIC SAMPLE - An optical microscope includes a first mask that has transmission regions that are separated from one another for the simultaneous generation of a plurality of illumination light beams from illumination light, for example, a first scanning device for generating a scanning motion of the illumination light beams and a sample holder. The optical microscope also includes a second mask with transmission regions separated from one another, which transmission regions are smaller than the transmission regions of the first mask in order to clip the illumination light beams, such that, through the scanning motion of the first scanning device, each of the illumination light beams can be successively passed onto different transmission regions of the second mask, and a second scanning device is provided for generating a scanning motion between the clipped illumination light beams and the sample holder. A method for examining a microscopic sample is also provided. | 10-02-2014 |
20150054937 | Light microscope and method for image recording using a light microscope - The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope. | 02-26-2015 |
20150077842 | HIGH-RESOLUTION SCANNING MICROSCOPY - A microscope and method for high resolution scanning microscopy of a sample, having: an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions is also provided. An evaluation device for the purpose of evaluating a diffraction structure of the single image for the scan positions is provided. The detector device has a detector array which has pixels and which is larger than the single image. At least one phase mask with a variable lateral profile of the phase influence is included in or near to the objective pupil, or in a plane which is conjugated to the objective pupil, for generating a spatial distribution of the illumination light and/or the detection light perpendicular to the optical axis, and/or in the direction of the optical axis. | 03-19-2015 |
20150085099 | High-Resolution Scanning Microscopy - Microscope and method for high resolution scanning microscopy of a sample, wherein
| 03-26-2015 |