Natsuhara, JP
Katsuya Natsuhara, Toyonaka-Shi JP
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20130005671 | PEST CONTROL COMPOSITION - Disclosed is a pest control composition having an excellent controlling effect on pests, which comprises etoxazole and a compound represented by the formula (I): wherein, R | 01-03-2013 |
Katsuya Natsuhara, Osaka JP
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20100099692 | HARMFUL ORGANISM CONTROL COMPOSITION - This invention provides a harmful organism control composition having an excellent harmful organism control effect and comprising as an effective ingredient the following 4-(2-butynyloxy)-5-fluoro-6-(3,5-dimethylpiperidino)-pyrimidine (X): | 04-22-2010 |
20100137314 | HARMFUL ORGANISM CONTROL COMPOSITION - This invention provides a harmful organism control composition comprising as an effective ingredient the following 4-(2-chlorobenzyl)-6-(2-butynyloxy)pyrimidine (X): | 06-03-2010 |
20110178109 | PEST CONTROL COMPOSITION AND PEST CONTROL METHOD - A pest controlling composition comprising, as active ingredients, a pyrimidine compound represented by Formula (1): | 07-21-2011 |
20110195984 | PEST CONTROL COMPOSITION AND PEST CONTROL METHOD - A pest controlling composition comprising, as active ingredients, a pyrimidine compound represented by Formula (1) and an anthranilamide compound represented by Formula (2). | 08-11-2011 |
Katsuya Natsuhara, Tokyo JP
Patent application number | Description | Published |
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20140187778 | PEST CONTROL COMPOSITION - Disclosed is a pest control composition having an excellent controlling effect on pests, which comprises etoxazole and fenazaquin. | 07-03-2014 |
20140287011 | ARTHROPOD PEST CONTROL COMPOSITION - Disclosed is an arthropod pest control composition comprising 2-(2,6-difluorophenyl)-4-[4-(1,1-dimethylethyl)-2-ethoxyphenyl]-4,5-dihydrooxazole and an inert carrier, wherein the volume median diameter of 2-(2,6-difluorophenyl)-4-[4-(1,1-dimethylethyl)-2-ethoxyphenyl]-4,5-dihydrooxazole is from 1.5 to 5.9 | 09-25-2014 |
Keiichi Natsuhara, Tokyo JP
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20160141740 | TWO-PORT TRIPLATE-LINE/WAVEGUIDE CONVERTER - A two-port triplate-line/waveguide converter in one embodiment of this invention is provided with a rectangular waveguide and two probes that connect to central conductors of separate trip late lines via slits, said slits being formed separately on two opposing inside walls of the rectangular waveguide and lying on an imaginary straight line that is perpendicular to said inside walls. The two probes, the tips of which are bent inside the rectangular waveguide, constitute monopole antennas with the aforementioned inside walls functioning as the ground planes thereof. | 05-19-2016 |
20160141741 | FEED LINE - A feed line in the form of a trip late line that runs from a waveguide/triplate-line converter coupled to a radio to a plurality of patch antennas in a cluster pattern. The width and length of a section of said feed line between the waveguide/triplate-line converter and the branch point nearest thereto are set such that the impedance of said section directly matches the parallel combination of the impedances of branches beyond said branch point and the loss in said section is kept to or below a predetermined upper limit. | 05-19-2016 |
Kenji Natsuhara, Nagoya-Shi JP
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20090046301 | THREE-DIMENSIONAL COLOR AND SHAPE MEASURING DEVICE - A three-dimensional color and shape measuring device is provided to measure a color and a three-dimensional shape of an object to be measured with accuracy. A three-dimensional color and shape measuring device measures a color and a three-dimensional shape of an object to be measured based on an image signal acquired by picking up an image of the object to be measured by the same image pick-up part. The three-dimensional color and shape measuring device includes: a correction part which is configured to convert the image signal into a color measuring image signal by a first correction in accordance with a first gray scale characteristic and to convert the image signal into a shape-measuring image signal by a second correction in accordance with a second gray scale characteristic; and a color and shape extracting part which is configured to restore a three-dimensional image of the object to be measured by using a three-dimensional model on which a three-dimensional shape of the object to be measured is restored based on the shape-measuring image signal and a color of the object to be measured restored based on the color-measuring image signal. | 02-19-2009 |
Masuhiro Natsuhara, Itami-Shi JP
Patent application number | Description | Published |
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20080277841 | Ceramic base material - A ceramic base material that is reduced in distortion caused by high-temperature heat treatment. A ceramic base material having sintering agents and satisfying the following formula: | 11-13-2008 |
20090045829 | Wafer holder for wafer prober and wafer prober equipped with same - It is an object of the present invention to provide a wafer prober wafer holder that is highly rigid and increases the heat insulating effect, thereby improving positional accuracy, thermal uniformity, and chip temperature ramp-up and cooling rates, as well as a wafer prober device equipped therewith. | 02-19-2009 |
20090050621 | Wafer holder, heater unit used for wafer prober having the wafer holder, and wafer prober having the heater unit - A wafer holder that prevents positional deviation of the wafer mounted on the wafer-mounting surface of a chuck top and enables better thermal uniformity of the wafer, as well as a heater unit including the wafer holder and a wafer prober mounting these are provided. The wafer holder has a chuck top mounting and fixing the wafer and a supporter supporting the chuck top, and the chuck top has water absorption of at least 0.01% and preferably at least 0.1%. Preferable material of the chuck top is a composite of metal and ceramics, and particularly, a composite of aluminum and silicon carbide, or a composite of silicon and silicon carbide. | 02-26-2009 |
20090142479 | Method of Manufacturing Semiconductor Device-Fabrication Wafer Holder - Wafer holder and semiconductor manufacturing equipment in which the holder is installed, the wafer holder having a wafer-carrying surface, wherein incidence of warping and cracking when the wafer holder is heated is slight. In the wafer holder having a wafer-carrying surface, electrical circuitry consisting of one or more sinter laminae is formed on the face or in the interior of the wafer holder; and by rendering pores present in the circuitry, the incidence of warping and cracking can be made very slight. The electrical circuitry is preferably any of an electrode circuit for an electrostatic chuck, a resistive-heating-element circuit, an RF-power electrode circuit, and a high-voltage-generating electrode circuit. | 06-04-2009 |
20100242844 | HOLDER FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT - A holder for semiconductor manufacturing equipment is provided, in which electrical leakage and sparks do not occur across the electrode terminals and lead wires to supply power to a resistive heating element embedded in a holder, and the thermal uniformity in the holder is within ±1.0%. | 09-30-2010 |
Masuhiro Natsuhara, Hyogo JP
Patent application number | Description | Published |
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20090126903 | HEAT TRANSFER MEMBER, CONVEX STRUCTURAL MEMBER, ELECTRONIC APPARATUS, AND ELECTRIC PRODUCT - A heat transfer member ( | 05-21-2009 |
20090283034 | WAFER HOLDER, MANUFACTURING METHOD THEREOF AND SEMICONDUCTOR MANUFACTURING APPARATUS - A wafer holder is provided that can be used in wafer processes at room temperature or lower and that is particularly suited for use in a CVD apparatus. | 11-19-2009 |