Patent application number | Description | Published |
20090117252 | BEVERAGE PACKED IN CONTAINER - Provided is a packaged non-tea beverage, excellent in the storage stability of the flavor, color tone and content of catechins. The packaged non-tea beverage, which includes a purified green tea extract having a ratio of gallate-type catechins in non-polymer catechins of less than 50% by mass, contains (A) 0.072 to 1.2% by mass of non-polymer catechins and (B) 0.001 to 12 mg/100 mL of gallic acid. | 05-07-2009 |
20100267681 | FAT OR OIL COMPOSITION - A fat or oil composition containing the following ingredients (A) and (B):
| 10-21-2010 |
20110129141 | CIRCUIT PATTERN EXAMINING APPARATUS AND CIRCUIT PATTERN EXAMINING METHOD - Provided is an examination technique to detect defects with high sensitivity at an outer-most repeative portion of a memory mat of a semiconductor device and even in a peripheral circuit having no repetitiveness. | 06-02-2011 |
20110188735 | METHOD AND DEVICE FOR DEFECT INSPECTION - Provided are a method and a device for defect inspection, wherein, in a state where a few DOIs exist in a large number of nuisances, a classification performance can be improved by a few appropriate defect instructions and a high classification performance is ensured while mitigating the burden of user's defect instructions. The method and device for defect inspection is characterized by repeating extraction of one or more defects from a plurality of defects detected by imaging a sample, instruction of a classification class of the extracted defects, and calculation of a classification criterion and a classification performance from the image information and classification class of the defects, and determining, based on the finally obtained classification criterion, the classification class of the unknown defects. This makes it possible to improve a classification performance by a few appropriate defect instructions and ensure a high classification performance while mitigating the burden of user's defect instructions. | 08-04-2011 |
20120026317 | Inspection Apparatus and Method for Producing Image for Inspection - In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit. | 02-02-2012 |
20120040075 | PACKAGE DRINK - To provide a packaged high-catechin beverage in which a low-caffeine green tea extract is added. | 02-16-2012 |
20130070078 | METHOD AND DEVICE FOR TESTING DEFECT USING SEM - In performing a programmed-point inspection of a circuit pattern using a review SEM, stable inspection can be performed while suppressing the generation of a false report even when a variation in a circuit pattern to be inspected is large. SEM images that are obtained by sequentially imaging a predetermined circuit pattern using the review SEM are stored into a storage unit. Images that meet a set condition are selected from the stored SEM images, and averaged to create an average image (GP image). By performing pattern check by GP comparison using this GP image, an inspection can be performed while suppressing the generation of a false report even when a variation in the circuit patterns is large. | 03-21-2013 |
20130108147 | INSPECTION METHOD AND DEVICE THEREFOR | 05-02-2013 |
20130119250 | DEFECT INSPECTION METHOD, AND DEVICE THEREOF - A conventional pattern inspection, which compares an image to be inspected with a reference image and subjects the resulting difference value to the defect detection using the threshold of defect determination, has difficulty in highly-sensitive inspection. Because defects occur only in specific circuit pattern sections, false reports occur in the conventional pattern inspections which are not based on the position. Disclosed are a defect inspection method and a device thereof which perform a pattern inspection by acquiring a GP image in advance, designating a place to be inspected and a threshold map to the GP image on the GUI, setting the identification reference of the defects, next acquiring the image to be inspected, applying the identification reference to the image to be inspected, and identifying the defects with the identification reference, thereby enabling the highly-sensitive inspection. | 05-16-2013 |
20130234019 | GLOBAL ALIGNMENT USING MULTIPLE ALIGNMENT PATTERN CANDIDATES - In order to provide a technique for performing global alignment (detecting position shift and rotation of a wafer) stably and automatically using an optical microscope, as a pattern for global alignment, multiple alignment pattern candidates are calculated ( | 09-12-2013 |
20140210988 | Inspection Apparatus and Method for Producing Image for Inspection - In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit. | 07-31-2014 |