Patent application number | Description | Published |
20100079317 | METHOD AND APPARATUS FOR TESTING DATA CONVERTER - A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided. | 04-01-2010 |
20100079318 | DATA CONVERSION CIRCUITRY AND METHOD THEREFOR - A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided. | 04-01-2010 |
20100079319 | DATA CONVERSION CIRCUITRY AND METHOD THEREFOR - A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided. | 04-01-2010 |
20100079325 | DATA CONVERSION CIRCUITRY AND METHOD THEREFOR - A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided. | 04-01-2010 |
20100079327 | DATA CONVERSION CIRCUITRY AND METHOD THEREFOR - A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided. | 04-01-2010 |
20100320997 | METHOD AND CIRCUIT FOR MEASURING QUIESCENT CURRENT - A measurement circuit and method for measuring a quiescent current of a circuit under test are provided. The measurement circuit comprises: a comparator having a first input terminal for receiving a reference voltage, a second input terminal coupled to the circuit under test, and an output terminal; a current source having a first terminal coupled to a first power supply voltage terminal, and a second terminal for providing a current to the circuit under test; a first switch having a first terminal coupled to the second terminal of the current source, a second terminal coupled to the circuit under test, and a control terminal coupled to the output terminal of the comparator; and a first counter having a first input terminal coupled to the output terminal of the comparator, a second input terminal for receiving a clock signal, and an output terminal for providing a first counter value associated with the quiescent current. | 12-23-2010 |
20120256774 | METHOD AND APPARATUS FOR SELF-TEST OF SUCCESSIVE APPROXIMATION REGISTER (SAR) A/D CONVERTER - A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC. | 10-11-2012 |
20130249723 | METHOD AND APPARATUS FOR SELF-TEST OF SUCCESSIVE APPROXIMATION REGISTER (SAR) A/D CONVERTER - A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC. | 09-26-2013 |
20140132240 | TEMPERATURE DEPENDENT TIMER CIRCUIT - A timer to provide pulses at a comparator output wherein a frequency of the pulses is dependent on temperature, wherein providing each pulse includes biasing a first input of the comparator at a voltage and operating a transistor in a subthreshold region of operation to change the voltage of the first input of a comparator at a rate dependent upon temperature. The output of the comparator changes state when the voltage of the first input crosses a voltage of a second input of the comparator. | 05-15-2014 |