Patent application number | Description | Published |
20100001762 | DOMAIN CROSSING CIRCUIT AND METHOD - A domain crossing circuit for reducing current consumption includes an internal counter to count an internal clock in response to the release of a reset signal, outputting an internal code, a replica delay unit to delay the reset signal as much as a timing difference between the internal clock and an external clock, outputting a delayed reset signal, an external counter to count the external clock in response to the release of the delayed reset signal outputted from the replica delay unit, outputting an external code, and an internal signal generation unit to convert an external signal to an internal signal using the internal code and the external code. | 01-07-2010 |
20100250994 | DATA PATTERN DETECTING CIRCUIT AND OUTPUT DRIVER INCLUDING THE SAME - Disclosed is an output driver capable of solving problems that occur when outputting the same data successively by using a data pattern detecting circuit. The data pattern detecting circuit includes a first data storage unit configured to receive data of a first line and store the received data until a next data is inputted through the first line, a second data storage unit configured to receive data of a second line and store the received data until a next data is inputted through the second line, and a detection signal output unit configured to activate a pattern detection signal when data stored in the first data storage unit and data stored in the second data storage unit have the same logic level. | 09-30-2010 |
20100315157 | SEMICONDUCTOR DEVICE - A semiconductor device is capable of generating an internal voltage having a voltage level that is dependent on an external power supply voltage. The semiconductor device includes an internal voltage generation unit configured to generate a plurality of internal voltages having different voltage levels by using an external power supply voltage, a voltage level detection unit configured to detect a voltage level of the external power supply voltage, and a selection unit configured to selectively output one of the internal voltages in response to a detection result of the voltage level detection unit. | 12-16-2010 |
20110006823 | SIGNAL DELAY CIRCUIT, CLOCK TRANSFER CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE HAVING THE SAME - A signal delay circuit including a clock transfer control circuit configured to transmit or block a clock signal, and a pulse signal generation circuit configured to delay a first pulse signal in response to the transmitted clock signal to generate a second pulse signal which has a longer active period than the first pulse signal. | 01-13-2011 |
20110187427 | LATENCY CONTROL CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME - A latency control circuit includes a delay unit configured to delay an input signal for a delay corresponding to a phase difference between an external clock and an internal clock and generate a delayed input signal, a delay information generation unit configured to generate a delay information based on a latency information and a delay amount of the input signal caused by a chip including the latency control circuit, a shift unit configured to shift the delayed input signal for a time period corresponding to the delay information in synchronism with the internal clock and an asynchronous control unit configured to selectively control the shift unit to output the delayed input signal without performing a shift operation. | 08-04-2011 |
20120269014 | DELAY CONTROL CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME - A delay control circuit includes a delay locked loop configured to delay an external clock by a first delay amount and generate an internal clock, a first delay unit configured to delay an input signal by a first delay amount, a first replica delay unit having a replica delay amount corresponding to a modeled delay amount of a system, a delay control unit configured to control the replica delay amount in response to a latency of an input signal, a measurement unit configured to measure the first delay amount and the controlled replica delay amount and generate path information, an operation unit configured to generate delay information in response to the latency of the input signal and the path information, and a latency delay unit configured to delay the delayed input signal of the first delay unit by the delay information and generate a latency signal. | 10-25-2012 |
20120280737 | SIGNAL DELAY CIRCUIT, CLOCK TRANSFER CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE HAVING THE SAME - A signal delay circuit including a clock transfer control circuit configured to transmit or block a clock signal, and a pulse signal generation circuit configured to delay a first pulse signal in response to the transmitted clock signal to generate a second pulse signal which has a longer active period than the first pulse signal. | 11-08-2012 |
20150077178 | SEMICONDUCTOR DEVICE - A semiconductor device is capable of generating an internal voltage having a voltage level that is dependent on an external power supply voltage. The semiconductor device includes an internal voltage generation unit configured to generate a plurality of internal voltages having different voltage levels by using an external power supply voltage, a voltage level detection unit configured to detect a voltage level of the external power supply voltage, and a selection unit configured to selectively output one of the internal voltages in response to a detection result of the voltage level detection unit. | 03-19-2015 |