Patent application number | Description | Published |
20090212701 | IMAGE DISPLAY APPARATUS - An image display apparatus includes at least one electron-emitting device, at least one wiring arranged to apply a voltage to the electron-emitting device, a getter disposed on the wiring, and an insulating layer interposed between the getter and wiring. The getter has penetrating portions formed in a part thereof corresponding to a region where an image is displayed in the image display apparatus. The penetrating portions are at least one opening, and an area of an inner wall surface of the getter facing the opening is substantially the same as or larger than an area of the opening. | 08-27-2009 |
20090291611 | MANUFACTURING METHODS OF AIRTIGHT CONTAINER AND IMAGE DISPLAY APPARATUS - Provided is a manufacturing method of an airtight container, comprising: an electron beam irradiation process for irradiating an electron beam to a non-evaporable type getter that has not been activated so as not to activate the non-evaporable type getter; and a sealing process for sealing a seal portion after the electron beam irradiation process, and thereby forming the airtight container. | 11-26-2009 |
20130270432 | TIME-OF-FLIGHT MASS SPECTROMETER - A time-of-flight mass spectrometer includes a holder that holds a sample, an irradiation unit that irradiates a surface of the sample with primary ions, an extractor electrode that opposes the sample, and an ion detector that detects a secondary ion emitted from the surface of the sample in accordance with a time of flight of the secondary ion. The surface of the sample has first and second positions, and the irradiation unit and the holder are disposed so that the primary ions are obliquely incident upon the surface of the sample. A primary ion reaches the first position before another primary ion reaches the second position. A potential gradient generator generates a potential gradient so that a potential difference between the second position and the extractor electrode is larger than a potential difference between the first position and the extractor electrode. | 10-17-2013 |
20140110244 | SUPERSONIC BEAM APPARATUS AND CLUSTER ION BEAM FORMING METHOD - Provided is a supersonic beam apparatus including a nozzle for injecting a gas at a supersonic velocity into a vacuum; a skimmer arranged at a downstream of the nozzle; and an ionization part for ionizing a particle in a supersonic beam formed by the skimmer from the gas injected from the nozzle to form a cluster ion beam, wherein a set position of the skimmer is one of a maximum position where an amount of cluster generation in a relationship of the amount of cluster generation with respect to a distance between the nozzle and the skimmer is maximized and a position closer to the nozzle than the maximum position. | 04-24-2014 |
20140138533 | ION MASS SELECTOR, ION IRRADIATION DEVICE, SURFACE ANALYSIS DEVICE, AND ION MASS SELECTING METHOD - A time-of-flight mass selector includes a first ion lens for converging ions, a flight tube into which ions which enter from the first ion lens are introduced, the flight tube having equipotential space therein, a second ion lens for converging ions having passed through the flight tube, and a chopper for a gate for pulsing the ions converged by the second ion lens. | 05-22-2014 |
20140239173 | MASS SPECTROMETER - In order to solve a problem in a mass spectrometry that a distribution of an emitted ion and a substance distribution on the measurement object surface are different from each other, which is due to a shaded portion of a irregular surface which falls under a shadow of primary beam, a primary ion optical system of the present apparatus includes a deflection unit configured to deflect the primary ion in such a manner that the primary ion intersects a flight space of the secondary ion in the course of flight. | 08-28-2014 |
20140252225 | MASS SELECTOR, AND ION GUN, ION IRRADIATION APPARATUS AND MASS MICROSCOPE - When a time-of-flight mass selector having a chopper using a deflector selects the masses of the ions, an ion beam is deflected. As a result, at least a part of the ion beams diagonally pass through an aperture electrode with respect to the axis. Accordingly, there has been a problem that a position on an object irradiated with a cluster ion beam, results in moving. This mass selector includes: a flight tube having an equipotential space that makes a charged substance fly therein; a deflector that is installed in a downstream side with respect to the flight tube in a direction in which the charged substance flies; a first aperture electrode that is installed in a downstream side with respect to the deflector in a direction in which the charged substance flies; and a second aperture electrode that is installed in between the deflector and the first aperture electrode. | 09-11-2014 |
20140353504 | LIGHT SOURCE ADJUSTMENT UNIT, OPTICAL MEASUREMENT DEVICE, SUBJECT INFORMATION OBTAINING SYSTEM, AND WAVELENGTH ADJUSTMENT PROGRAM - An optical measurement device includes a light source unit including a first laser light source configured to emit a laser beam having a first wavelength and a second laser light source configured to emit a laser beam having a second wavelength, a measurement wave number setting unit, and a light source adjustment unit configured to adjust at least one of the first wavelength and the second wavelength such that a difference between or a sum of a first wave number corresponding to the first wavelength and a second wave number corresponding to the second wavelength matches a measurement wave number set through the measurement wave number setting unit. | 12-04-2014 |
20140355824 | SPECTRAL IMAGE DATA PROCESSING APPARATUS AND TWO-DIMENSIONAL SPECTRAL APPARATUS - A spectral image data processing apparatus which conducts multivariate analysis on spectral image data of a sample, including: a region setting unit configured to set a region of interest for performing multivariate analysis in a sample in which a difference needs to be distinguished, the region of interest being set in accordance with spectral image data of the sample; and an analysis unit configured to perform the multivariate analysis with spectral image data inside the region of interest and spectral image data of region of non-interest which is a region other than the region of interest being distinguished from each other. | 12-04-2014 |
20140374585 | ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND SECONDARY ION MASS SPECTROMETRY METHOD - The present invention provides an ion group irradiation device for irradiating a sample with an ion group, comprising: an ion group selecting unit configured to select, from ions released from an ion source, at least two ion groups formed of ions having different average masses; and a primary ion irradiation unit configured to irradiate the sample with the at least two ion groups selected by the ion group selecting unit, wherein the ion group selecting unit selects at least one ion group and further selects the at least two ion groups from each of the selected at least one ion group. | 12-25-2014 |
20140374586 | ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND SECONDARY ION MASS SPECTROMETRY METHOD - Provided is an ion group irradiation device for facilitating the distinction of peaks in secondary ion mass spectra. The ion group irradiation device for irradiating a sample with an ion group includes an ion source for generating ions, an ion group selecting unit configured to select, from the ions released from the ion source, two or more ion groups formed of ions having different average masses, and a primary ion irradiation unit configured to irradiate the sample with the two or more ion groups. Further, an atom species or a molecule species of the ions forming the two or more ion groups is common between ion groups. | 12-25-2014 |
20140374587 | ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER - The present invention provides an ion group irradiation device which includes: an ion source which generates an ion; and an ion group selecting unit which selects an ion group containing a cluster ion from ions released from the ion source, in an ion group irradiation device for irradiating a sample with the ion group, wherein the ion source has a pressure gradient forming unit for changing a pressure with which a material of the cluster ion is jetted, with time, the ion group selecting unit has a chopper which performs a chopping operation of selecting the ion group by passing and blocking the cluster ions in a traveling direction by the opening and closing of the chopper, and the chopper performs two or more times of the chopping operations per one time of a pressure gradient forming operation by the pressure gradient forming unit. | 12-25-2014 |
20140379306 | SPECTRAL DATA PROCESSING APPARATUS, SPECTRAL DATA PROCESSING METHOD, AND RECORDING MEDIUM - A spectral data processing apparatus includes an analyzer configured to perform principal component analysis of spectral data acquired for each of a plurality of regions of a sample, wherein the analyzer obtains an eigenvector by performing the principal component analysis of first spectral data of a first region out of the plurality of regions, and performs the principal component analysis of second spectral data of a second region different from the first region out of the plurality of regions using the obtained eigenvector. | 12-25-2014 |