Patent application number | Description | Published |
20080281543 | INSPECTION SYSTEM AND METHODS WITH AUTOCOMPENSATION FOR EDGE BREAK GAUGING ORIENTATION - A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature. | 11-13-2008 |
20080314878 | APPARATUS AND METHOD FOR CONTROLLING A MACHINING SYSTEM - An apparatus for controlling a machining system is provided. The apparatus include an optical unit configured to capture an image of an object based upon radiation generated from the object and an image processing unit configured to process the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object. The apparatus also includes a process model configured to establish target values for the parameters associated with the manufacture or repair of the object based upon process parameters for the machining system and a controller configured to control the process parameters for the machining system based upon the estimated and target values of the parameters associated with the manufacture or repair of the object. | 12-25-2008 |
20090067704 | METHOD AND SYSTEM FOR MEASUREMENT OF A CUTTING TOOL - A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented. | 03-12-2009 |
20090082899 | CALIBRATION ASSEMBLY FOR AN INSPECTION SYSTEM - A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system. | 03-26-2009 |
20090095907 | PYOELECTRIC DETECTION SYSTEMS AND METHODS OF MAKING THE SAME - Infrared radiation detection systems and methods of making the same are provided. In one embodiment, the radiation detection system comprises: a housing having an open end exposed to a radiation emitting object; a detector positioned in the housing, the detector comprising a radiation sensing material for detecting infrared radiation, the radiation sensing material having a portion removed by etching or coated by a mask such that only a region of the radiation sensing material is capable of detecting the infrared radiation; and a lens positioned in the housing for transmitting infrared radiation from the object to the detector. | 04-16-2009 |
20100079769 | METHOD AND SYSTEM FOR PARAMETER EXTRACTION OF A CUTTING TOOL - A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented. | 04-01-2010 |
20100140236 | LASER MACHINING SYSTEM AND METHOD - A laser machining system comprises a laser configured to generate a laser output for forming a molten pool on a substrate, a nozzle configured to supply a growth material to the molten pool for depositing the material on the substrate, and an optical unit configured to capture a plurality of grayscale images comprising temperature data during the laser deposition process, wherein the grayscale images correspond to respective ones of a plurality of radiation beams with different desired wavelengths. Further, the laser machining system comprises an image-processing unit configured to process the grayscale images to retrieve the temperature data according to linear relationships between temperatures in the laser deposition process and the corresponding grayscales of the respective images. A laser machining method is also presented. | 06-10-2010 |
20100280649 | METHOD AND SYSTEM FOR GASH PARAMETER EXTRACTION OF A CUTTING TOOL - A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented. | 11-04-2010 |
20100296104 | INSPECTION SYSTEM AND METHOD WITH MULTI-IMAGE PHASE SHIFT ANALYSIS - An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented. | 11-25-2010 |
20110064282 | METHOD AND SYSTEM FOR CONTACTLESS FINGERPRINT DETECTION AND VERIFICATION - This invention provides a method for contactless fingerprint detection and verification comprising illuminating a fingerprint and directing a reflected light through an imaging system using liquid crystal panels and birefringent elements to polarize the light. A plurality of polarized images are captured and used to calculate the depth of structural features on the fingertip. A means to generate a two-dimensional rolled equivalent image of the fingerprint is also provided which may then be used for verification and authentication. The invention also provides an imaging system for carrying out the method. | 03-17-2011 |
20110205348 | SYSTEM AND METHOD FOR PERFORMING AN EXTERNAL INSPECTION ON A WIND TURBINE ROTOR BLADE - A system and method for performing an external inspection on a rotor blade of a wind turbine are disclosed. The system may generally include a frame configured to extend at least partially around an outer perimeter of the rotor blade and a sensing device coupled to the frame. Additionally, first and second spacer arms may extend from the frame. The first spacer arm may be configured to contact a pressure side surface of the rotor blade. The second spacer arm may be configured to contact a suction side surface of the rotor blade. | 08-25-2011 |
20110310218 | MULTI-RESOLUTION OPTICAL SYSTEM AND METHOD OF FABRICATING SAME - A multi-resolution lens system includes a relay lens configured to be directed toward a field-of-view (FOV) and receive a first plurality of image photons emanating from the FOV, a high-resolution lens positioned to receive a second plurality of image photons from the FOV and to pass the second plurality of image photons toward the relay lens, and a shutter device positioned to receive over an area thereof the image photons of the FOV that pass through the relay lens, and simultaneously receive overlaid on a portion of the area thereof the image photons from the portion of the FOV that pass through the high-resolution lens and toward the relay lens. | 12-22-2011 |
20110317909 | TOOL WEAR QUANTIFICATION SYSTEM AND METHOD - A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device. | 12-29-2011 |
20120074109 | METHOD AND SYSTEM FOR SCRIBING A MULTILAYER PANEL - The present invention provides method of scribing a multilayer panel. The method comprises (a) providing a multilayer panel comprising a substrate layer, a transparent conductive layer disposed thereupon, a first semiconducting layer disposed upon the transparent conductive layer; (b) configuring the multilayer panel relative to a laser machining device, the machining device comprising a laser head and an optical sensor; (c) inducing a motion of the laser head relative to the multilayer panel such that a laser beam contacts the panel along a transverse line across the panel, the laser beam incident upon the panel having sufficient energy to ablate one or more layers of the multilayer panel within a zone irradiated by the laser beam irradiated to provide a scribed panel; (d) simultaneously irradiating the scribed panel with a first light source; and (e) detecting the light emerging from the scribed panel at the optical sensor in real time. Also provided is a system for scribing a multilayer panel. | 03-29-2012 |
20120076369 | SYSTEM AND METHOD FOR CONTACTLESS MULTI-FINGERPRINT COLLECTION - A system and method for contactless multi-fingerprint collection is disclosed. The contactless multi-fingerprint collection system includes an imaging volume, a user interface configured to provide feedback to the subject regarding a proximity of a hand to a desired imaging location within the imaging volume, and at least one image capture device to capture images of each of the plurality of fingerprints at each of at least two different depths from the fingerprints. The contactless multi-fingerprint collection system also includes a processor coupled to the at least one image capture device that is programmed to generate a composite image and a contour map of each of the plurality of fingerprints from the images captured at the at least two different depths and generate a two-dimensional rolled equivalent image of each of the plurality of fingerprints from the composite image and the contour map. | 03-29-2012 |
20120147383 | MEASUREMENT SYSTEMS AND METHODS - A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented. | 06-14-2012 |
20120149281 | DISTANCE MEASUREMENT SYSTEMS AND METHODS - A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented. | 06-14-2012 |
20120154560 | OPTICAL SYSTEM FOR INSPECTING POROUS SUBSTRATES - An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate. | 06-21-2012 |
20120163930 | CUTTING TOOL ABNORMALITY SENSING APPARATUS - A cutting tool abnormality sensing apparatus is disclosed. The apparatus includes an image pickup device for taking individual images of teeth of the cutting tool. The apparatus further includes a triggering mechanism for triggering the image pickup device each time a tooth passes along a field of view of the image pickup device. One or more light sources are provided to illuminate the cutting tool. Further, the apparatus includes an image processor to process one or more criteria in the individual images for quantifying an extent of abnormality in the cutting tool. | 06-28-2012 |
20120166102 | METHOD AND SYSTEM FOR ONLINE CREEP MONITORING - A method and system for monitoring creep in a moving object are provided. The creep monitoring system includes a creep sensor assembly formed onto a surface of an object rotatable about an axis, the creep sensor assembly includes at least one of an image pattern and a radio frequency interrogatable circuit. The creep monitoring system also includes an online monitoring system communicatively coupled to the creep sensor assembly. The online monitoring system configured to collect information from the creep sensor assembly relative to an amount and a rate of creep of the object. The creep monitoring system also includes a processor programmed to receive the information, correct the information for movement of the creep sensor assembly during the collection, and determine a creep rate, a crack presence, and a temperature of the object simultaneously. | 06-28-2012 |
20120188560 | SYSTEM ASPECTS FOR A PROBE SYSTEM THAT UTILIZES STRUCTURED-LIGHT - A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided. | 07-26-2012 |
20120250159 | Method and apparatus for forming multiple images - Disclosed are method and apparatus for forming multiple images of an object comprising a plurality of depth segments. An optical system comprises an infinity optical subsystem and a multi-image optical subsystem. The infinity optical subsystem is configured to receive light from the object and form a first image focussed at infinity. A multi-image optical subsystem is configured to receive the first image and form multiple images via multiple focussing lenses. Each multiple image can correspond to a different depth segment. A portion of the light from the first image can also be filtered before entering a focussing lens. Multiple images under different filtering conditions, corresponding to different depth segments or to the same depth segment, can be formed. | 10-04-2012 |
20120250947 | APPARATUS AND METHOD FOR CONTACTLESS HIGH RESOLUTION HANDPRINT CAPTURE - A system and method for contactless handprint capture is disclosed that includes an image capture device to capture whole handprint images of a subject hand at each of a plurality of different focal distances, with the image capture device including an imaging camera and an electro-optics arrangement having a plurality of light modulating elements and polarization sensitive optical elements having differing optical path lengths based on polarization states. A control system is coupled to the image capture device to cause the device to capture the handprint images at each of the different focal distances, with each handprint image having a depth-of-focus that overlaps with a depth-of-focus of handprint images at adjacent focal distances such that redundant handprint image data is captured. The control system registers each handprint image with positional data and creates a composite handprint image from the handprint images captured at the different focal distances. | 10-04-2012 |
20130057650 | OPTICAL GAGE AND THREE-DIMENSIONAL SURFACE PROFILE MEASUREMENT METHOD - An optical gage ( | 03-07-2013 |
20130083386 | Optical Imaging System and Method, and Aperture Stop Assembly and Aperture Element - An optical imaging system includes a birefringent element, a light modulating element, and a polarizer element. The birefringent element is configured for decomposing un-polarized light into first linear polarized light and second linear polarized light under different refractive indexes to respectively form a first focal length and a second focal length in the optical imaging system. The light modulating element is configured for modulating a state of polarization of the first and second linear polarized light in response to control signals. The polarizer element is configured for filtering out one of the modulated first and second linear polarized light for creating a single image. | 04-04-2013 |
20130141538 | SYSTEM AND METHOD FOR DEPTH FROM DEFOCUS IMAGING - An imaging system includes a positionable device configured to axially shift an image plane, wherein the image plane is generated from photons emanating from an object and passing through a lens, a detector plane positioned to receive the photons of the object that pass through the lens, and a computer programmed to characterize the lens as a mathematical function, acquire two or more elemental images of the object with the image plane of each elemental image at different axial positions with respect to the detector plane, determine a focused distance of the object from the lens, based on the characterization of the lens and based on the two or more elemental images acquired, and generate a depth map of the object based on the determined distance. | 06-06-2013 |
20130194567 | SYSTEM AND METHOD FOR WIND TURBINE BLADE INSPECTION - A system for inspection of a blade of a wind turbine in operation is provided. The system comprises a light projection unit, an imaging unit and a processing unit. The light projection unit generates and projects a light pattern towards a blade of a wind turbine in operation. The imaging unit captures a plurality of scanning light patterns on the blade of the wind turbine during rotation of the blade. The processing unit is configured to process the plurality of the captured d light patterns from the imaging unit for inspection of deflection of the blade. A method for inspection of a blade of a wind turbine in operation is also presented. | 08-01-2013 |
20130271763 | INSPECTION DEVICE AND METHOD THEREOF - An optical system configured to visually inspect a target having a variable position with respect to the optical system is provided. The optical system includes a polarizer configured to convert an incident light reflected or diffused from the target into linearly polarized light; a light modulating element configured to modulate a polarization state of the linearly polarized light in response to control signals; and a lens group comprising at least one birefringent element, the birefringent element configured to refract or reflect the modulated linearly polarized light with a first polarization state under a first refraction index to enable inspection of the target at a first object position, and the birefringent element further configured to refract or reflect the modulated linearly polarized light with a second polarization state under a second refraction index to enable inspection of the target at a second object position. | 10-17-2013 |
20130286157 | MULTI-RESOLUTION OPTICAL SYSTEM AND METHOD OF FABRICATING SAME - A multi-resolution lens system includes a relay lens configured to be directed toward a field-of-view (FOV) and receive a first plurality of image photons emanating from the FOV, a high-resolution lens positioned to receive a second plurality of image photons from the FOV and to pass the second plurality of image photons toward the relay lens, and a shutter device positioned to receive over an area thereof the image photons of the FOV that pass through the relay lens, and simultaneously receive overlaid on a portion of the area thereof the image photons from the portion of the FOV that pass through the high-resolution lens and toward the relay lens. | 10-31-2013 |
20130300855 | SYSTEM AND METHOD FOR PERFORMING AN INTERNAL INSPECTION ON A WIND TURBINE ROTOR BLADE | 11-14-2013 |
20140044323 | SYSTEM AND METHOD FOR CONTACTLESS MULTI-FINGERPRINT COLLECTION - A system and method for contactless multi-fingerprint collection is disclosed. The contactless multi-fingerprint collection system includes an imaging volume, a user interface configured to provide feedback to the subject regarding a proximity of a hand to a desired imaging location within the imaging volume, and at least one image capture device to capture images of each of the plurality of fingerprints at each of at least two different depths from the fingerprints. The contactless multi-fingerprint collection system also includes a processor coupled to the at least one image capture device that is programmed to generate a composite image and a contour map of each of the plurality of fingerprints from the images captured at the at least two different depths and generate a two-dimensional rolled equivalent image of each of the plurality of fingerprints from the composite image and the contour map. | 02-13-2014 |
20140238119 | METHOD FOR OBTAINING EDGE PREP PROFILES OF CUTTING TOOLS - A method for obtaining an edge prep profile of a cutting tool with a point sensor. The method includes: (a) scanning edge points of the cutting tool, including a target edge point on a target edge, with the point sensor, by rotating the cutting tool around its axis, to generate a first point cloud; (b) repositioning the point sensor and cutting tool relative to each other based on the location and orientation information of the target edge point, such that the sensor focus is at a region of interest containing the target edge point; and (c) scanning the region of interest using the point sensor to generate a second point cloud. The first point cloud includes location and orientation information of the target edge point. The second point cloud includes information for edge profile analysis. | 08-28-2014 |
20140278211 | Methods and Systems for Enhanced Tip-Tracking and Navigation of Visual Inspection Devices - A computer-implemented system for enhanced tip-tracking and navigation of visual inspection devices includes a visual inspection device. The system further includes a plurality of spatially sensitive fibers. The system includes a computing device. The computing device includes a memory device and a processor. The system includes a storage device. The storage device includes an engineering model representing the physical asset. The computing device is configured receive an insertion location from the visual inspection device. The computing device is configured to receive fiber information associated with the visual inspection device. The computing device is configured to determine the real-time location of the visual inspection device using the fiber information. The computing device is configured to identify the real-time location of the visual inspection device with respect to the engineering model. The computing device is configured to navigate the visual inspection device from a first location to a second location. | 09-18-2014 |