Patent application number | Description | Published |
20100283518 | DELAY APPARATUS OF SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF CONTROLLING THE SAME - A delay apparatus of a semiconductor integrated circuit includes a control signal generating unit configured to generate a block control signal and a unit control signal in response to a delay control signal; a plurality of delay blocks, connected in series to each other, and configured to generate a delay clock signal by delaying an input clock signal, wherein each of the delay blocks includes a predetermined number of unit delayers, and the plurality of the delay blocks are configured to be selectively activated in response to the block control signal; and a minute delay unit including a predetermined number of unit delayers and configured to generate an output clock signal by delaying the delay clock signal by adjusting an activation number of the provided unit delayers in response to the unit control signal. | 11-11-2010 |
20100290306 | CIRCUIT AND METHOD FOR SHIFTING ADDRESS - A circuit for shifting an address includes a shift cell block configured to sequentially shift address signals in response to shift control signals and a control cell block configured to generate the shift control signals for activating the shift cell block in a column unit using sequentially shifted read commands or write commands. | 11-18-2010 |
20110102006 | CIRCUIT AND METHOD FOR TESTING SEMICONDUCTOR APPARATUS - A circuit for testing a semiconductor apparatus includes a test voltage applying unit configured to apply a test voltage to a first end of a through-silicon via (TSV) in response to a test mode signal and a detecting unit configured to be connected to a second end of the TSV and detect a current outputted from the second end of the TSV. | 05-05-2011 |
20110102065 | SEMICONDUCTOR APPARATUS AND CHIP SELECTION METHOD THEREOF - A semiconductor apparatus having a plurality of stacked chips includes: a plurality of latch units, each of which is disposed in a corresponding one of the plurality of chips and is configured to latch a clock signal and a frequency-divided signal at mutually different points of time to generate an chip identification signal of the corresponding one of the plurality of chips; and a plurality of chip selection signal generating units, each of which is disposed in the corresponding one of the plurality of chips and is configured to compare the chip identification signal of the corresponding one of the plurality of chips with a chip selection identification signal to generate a chip selection signal of the corresponding one of the plurality of chips, wherein the chip selection signal is configured to enable the corresponding one of the plurality of chips when the chip identification signal matches the chip selection identification signal. | 05-05-2011 |
20110102066 | SEMICONDUCTOR APPARATUS AND CHIP SELECTION METHOD THEREOF - A semiconductor apparatus having a plurality of stacked chips includes: a through silicon via (TSV) configured to couple the plurality of chips together and configured to be coupled in series to a plurality of voltage drop units; a plurality of signal conversion units, each of which is configured to convert a voltage outputted from the voltage drop unit of the corresponding one of the plurality of chips to a digital code signal and provide the digital code signal as chip identification signal of the corresponding one of the plurality of chips; and a plurality of chip selection signal generating units, each of which is configured to compare the chip identification signal with a chip selection identification signal to generate a chip selection signal of the corresponding one of the plurality of chips. | 05-05-2011 |
20110103156 | DATA INPUT/OUTPUT CIRCUIT AND SEMICONDUCTOR MEMORY APPARATUS HAVING THE SAME - A data input/output circuit includes a rank selecting section and a data input/output section. The rank selecting section is selectively connected to one of the first and second ranks in response to a chip selection signal, and outputs data to a connected rank or receives data from the connected rank. The data input/output section outputs the data transmitted from the rank selecting section through a data pad to an external device during a read operation, and outputs the data inputted to the data pad to the rank selecting section during a write operation. | 05-05-2011 |
20110188324 | SEMICONDUCTOR MEMORY APPARATUS - A semiconductor memory apparatus includes a first data input/output line configured to transmit data from a first memory bank; a second data input/output line configured to transmit the data from the first memory bank; a first data output section configured to align and output data transmitted through the first data input/output line based on an input/output mode; and a second data output section configured to align and output either data transmitted through the first input/output line or the second data input/output line based on the input/output mode and an address signal. | 08-04-2011 |
20120154008 | SEMICONDUCTOR APPARATUS - A semiconductor apparatus may include a master chip, first to n | 06-21-2012 |
20120176849 | SEMICONDUCTOR APPARATUS AND MEMORY SYSTEM INCLUDING THE SAME - A semiconductor memory apparatus includes one or more semiconductor chips configured to have predetermined capacity and structure; and a signal level control unit configured to control levels of external signals, which are input to the one or more semiconductor chips, in order to realize various capacities and structures using the one or more semiconductor chips. | 07-12-2012 |
20120194243 | SEMICONDUCTOR APPARATUS AND REPAIR METHOD THEREOF - A semiconductor apparatus includes a signal transmission block and signal reception blocks. The signal transmission block is disposed in a first chip and configured to transmit fuse information in synchronization with transmission control signals. The signal reception blocks are respectively disposed in the first chip and a second chip and configured to receive the fuse information in synchronization with reception control signals. | 08-02-2012 |