Patent application number | Description | Published |
20130336059 | BLOCK LEVEL GRADING FOR RELIABILITY AND YIELD IMPROVEMENT - A system for grading blocks may be used to improve memory usage. Blocks of memory, such as on a flash card, may be graded on a sliding scale that may identify a level of “goodness” or a level of “badness” for each block rather than a binary good or bad identification. This grading system may utilize at least three tiers of grades which may improve efficiency by better utilizing each block based on the individual grades for each block. The block leveling grading system may be used for optimizing the competing needs of minimizing yield loss while minimizing testing defect escapes. | 12-19-2013 |
20140029342 | EXPERIENCE COUNT DEPENDENT PROGRAM ALGORITHM FOR FLASH MEMORY - In a non-volatile memory device, the parameters used in write and erase operation are varied based upon device age. For example, in a programming operation using a staircase waveform, the amplitude of the initial pulse can be adjusted based upon the number of erase-program cycles (hot count) of the block containing the selected physical page for the write. This arrangement can preserve performance for relatively fresh devices, while extending life as a devices ages by using gentler waveforms as the device ages. | 01-30-2014 |
20140075252 | Erased Page Confirmation in Multilevel Memory - In a multi-level cell memory array, a flag that indicates that a logical page is unwritten is subject to a two-step verification. In a first verification step, the logical page is read, and ECC decoding is applied. If the first verification step indicates that the logical page is unwritten, then a second verification step counts the number of cells that are not in an unwritten condition. | 03-13-2014 |
20140095770 | Selective Protection of Lower Page Data During Upper Page Write - Lower page data that may be endangered by programming upper page data in the same memory cells is protected during upper programming using protective upper page programming schemes. High overall programming speeds are maintained by selectively using protective upper programming schemes only where endangered data is committed and may not be recoverable from another location. | 04-03-2014 |
20140098610 | Erased State Reading - Memory cells that are indicated as being erased but are suspected of being partially programmed may be subject to a verification scheme that first performs a conventional read and then, if the conventional read does not indicate partial programming, performs a second read using lower read-pass voltage on at least one neighboring word line. | 04-10-2014 |
20140173382 | INSPECTION OF NON-VOLATILE MEMORY FOR DISTURB EFFECTS - A method performed in a data storage device including a non-volatile memory includes reading a representation of data, the representation corresponding to one or more selected states of storage elements of a group of storage elements of the non-volatile memory. The method includes, in response to a count of errors in the representation of the data exceeding a threshold, scheduling a remedial action to be performed on the group of storage elements. | 06-19-2014 |
20140269052 | SYSTEM AND METHOD OF DETERMINING READING VOLTAGES OF A DATA STORAGE DEVICE - A data storage device includes a memory and a controller. In a particular embodiment, a method is performed in the data storage device. The method is performed during a read threshold voltage update operation and includes determining a first read threshold voltage of a set of storage elements of a memory according to a first technique and determining a second read threshold voltage of the set of storage elements of the memory according to a second technique. The first read threshold voltage is different from the second read threshold voltage, and the first technique is different from the second technique. | 09-18-2014 |
20140281682 | Systems and Methods for Performing Defect Detection and Data Recovery in a Memory System - Systems and methods for performing defect detection and data recovery within a memory system are disclosed. A controller of a memory system may receive a command to write data in a memory of the memory system; determine a physical location of the memory that is associated with the data write; write data associated with the data write to the physical location; and store the physical location of the memory that is associated with the data write in a Tag cache. The controller may further identify a data keep cache of a plurality of data keep caches that is associated with the data write based on the physical location of the memory that is associated with the data write; update an XOR sum based on the data of the data write; and store the updated XOR sum in the identified data keep cache. | 09-18-2014 |
20140281683 | FLASH MEMORY TECHNIQUES FOR RECOVERING FROM WRITE INTERRUPT RESULTING FROM VOLTAGE FAULT - Techniques, related to a flash memory device having a non-volatile memory array (NVM), for recovering from a write interrupt resulting from host-supplied memory voltage fault are disclosed. A memory controller is configured to control a response to an occurrence of the write-interrupt, the response including writing to the NVM, after the memory voltage is verified as being within an acceptable range, one or more of a safe copy of a portion of a first sector of upper-page data and a safe copy of a portion of a second sector of lower-page data, and terminating the write interrupt. Terminating the write-interrupt may include receiving new data from the host while avoiding sending an error message to the host. | 09-18-2014 |
20150046770 | SENSING PARAMETER MANAGEMENT IN NON-VOLATILE MEMORY STORAGE SYSTEM TO COMPENSATE FOR BROKEN WORD LINES - Disclosed is a technology to change the parameters by which a read operation is performed in a block with a broken word line. The first method is for reading a broken word line, which may involve changing the voltage on word lines neighboring the broken word line to let the voltage on the broken word line reach the appropriate magnitude through capacitive coupling between word lines. The first method may also involve increasing the time delay before memory cells connected to the broken word line are sensed to allow the voltage on the word line to settle due to increased RC delay. The second method is for reading an unbroken word line in a block with a broken word line, which involves increasing the time delay before memory cells connected to the unbroken word line are sensed while raising the voltages on the word lines neighboring the broken word line. | 02-12-2015 |
20150085571 | UPDATING READ VOLTAGES - A data storage device includes a controller that is configured to determine a first read voltage for a first page of a non-volatile memory (e.g., a lower page of a Multi-Level Cell flash memory device). The controller is also configured to determine a second read voltage for a second page (e.g., an upper page) of the non-volatile memory by applying an offset value to the first read voltage. The controller is also configured to store data identifying the first read voltage and the second read voltage. | 03-26-2015 |
20150089324 | METHOD AND DEVICE FOR WRITE ABORT PROTECTION - A data storage device includes a non-volatile memory and a controller. A method includes receiving first data and second data from a host device. A first error-correcting code (ECC) codeword associated with the first data is written to a first word line of the non-volatile memory, and a second ECC codeword associated with the second data is written to a second word line of the non-volatile memory. The first ECC codeword includes a first bit and a second bit, and the second ECC codeword includes a third bit and a fourth bit. The method further includes writing parity information to a parity storage portion of the non-volatile memory that is distinct from the first word line and from the second word line. The parity information includes a parity bit that is based on the first bit, the second bit, the third bit, and the fourth bit. | 03-26-2015 |
20150089325 | METHOD AND DEVICE FOR WRITE ABORT PROTECTION - A data storage device includes a non-volatile memory that includes a three-dimensional (3D) memory. A method includes receiving first data and second data from a host device. A first error-correcting code (ECC) codeword associated with the first data is written to a first word line of the non-volatile memory, and a second ECC codeword associated with the second data is written to a second word line of the non-volatile memory. The first ECC codeword includes a first bit and a second bit, and the second ECC codeword includes a third bit and a fourth bit. The method further includes writing parity information to a parity storage portion of the non-volatile memory that is distinct from the first word line and from the second word line. The parity information includes a parity bit that is based on the first bit, the second bit, the third bit, and the fourth bit. | 03-26-2015 |