# Jae Won Nam, Daejeon KR

## Jae Won Nam, Daejeon KR

Patent application number | Description | Published |
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20090096646 | METHOD OF ALGORITHMIC ANALOG-TO-DIGITAL CONVERSION AND ALGORITHMIC ANALOG-TO-DIGITAL CONVERTER - Provided are a method of algorithmic analog-to-digital conversion and an algorithmic Analog-to-Digital Converter (ADC). The algorithmic ADC includes a Multiplying Digital-to-Analog Converter (MDAC). The MDAC includes a Digital-to-Analog Converter (DAC) for converting a first digital signal into an analog signal, a subtractor for calculating a difference between the signal output from the DAC and an analog signal input from a first Sample and Hold Amplifier (SHA), an amplifier for amplifying the difference, a first capacitor unit connected with an output end of the first SHA and an input end of the amplifier through a first switching unit, a second capacitor unit connected with the input end and an output end of the amplifier through a second switching unit, and a third capacitor unit connected with the input end and the output end of the amplifier through a third switching unit. | 04-16-2009 |

20100052643 | BAND-GAP REFERENCE VOLTAGE GENERATOR - A band-gap reference voltage generator is provided. N-channel metal oxide semiconductor (NMOS) transistors are respectively connected to bipolar transistors in parallel. A Complementary To Absolute Temperature (CTAT) voltage that is inversely proportional to absolute temperature is reduced by a threshold voltage of the NMOS transistor. A weight for a temperature coefficient of a Proportional To Absolute Temperature (PTAT) voltage that is directly proportional to absolute temperature is reduced and a resistance ratio for a temperature coefficient of 0 is reduced by about | 03-04-2010 |

20100123611 | SUCCESSIVE APPROXIMATION REGISTER ANALOG-DIGITAL CONVERTER AND METHOD OF DRIVING THE SAME - A successive approximation register (SAR) analog-digital converter (ADC) and a method of driving the same are provided. The SAR ADC includes a first converting unit including a bit capacitor array corresponding to the number of bits and a correction capacitor array, a comparator outputting a high or low voltage corresponding to each capacitor according to an output voltage of the converting unit, and a correction unit correcting the output of the bit capacitor according to the output of the correction capacitor array among the high or low output of the comparator. Therefore, two bits having the same capacitance as a least significant bit (LSB) enable a digital output error to be corrected, so that a spurious free dynamic range (SFDR) of the signal converter is increased, and a signal to noise and distortion ratio (SNDR) of an output signal is improved. | 05-20-2010 |

20100156469 | HIGH-SPEED MULTI-STAGE VOLTAGE COMPARATOR - A high-speed multi-stage voltage comparator is provided. The multi-stage voltage comparator is configured to eliminate offset from outputs of preamplifiers through respective offset-cancellation switches, and to reset the outputs of the preamplifiers through respective reset switches to reduce an output recovery time. Thus, the multi-stage voltage comparator operates with high accuracy and at a high speed, so that it can be usefully applied to an analog-to-digital converter (ADC), and particularly, a high-speed successive approximation register ADC (SAR ADC). | 06-24-2010 |

20100156692 | MULTI-STAGE DUAL SUCCESSIVE APPROXIMATION REGISTER ANALOG-TO-DIGITAL CONVERTOR AND METHOD OF PERFORMING ANALOG-TO-DIGITAL CONVERSION USING THE SAME - A multi-stage dual successive approximation register analog-to-digital converter (SAR ADC) and a method of performing analog-to-digital conversion using the same are provided. The multi-stage dual SAR ADC includes: a plurality of SAR ADC stages for converting an analog input voltage into a predetermined bit digital signal, each SAR ADC stage being serially connected to one another and including two SAR ADCs; and at least one residue amplifier respectively connected between every two successive SAR ADC stages, amplifying residue voltage output from a previous SAR ADC stage to output the amplified residue voltage to a next SAR ADC stage. The two SAR ADCs of the previous SAR ADC stage share the residue amplifier. | 06-24-2010 |

20110018605 | OFFSET-VOLTAGE CALIBRATION CIRCUIT - Provided is an offset-voltage calibration circuit. The circuit includes a comparator configured to receive at least two comparison voltages and output a result of a comparison between the comparison voltages, an up/down counter (UDC) configured to output an up-counting or down-counting output signal in response to an output signal of the comparator, and a current digital-to-analog converter (DAC) configured to control the amount of current supplied from a node to which the comparison voltage is applied, in response to the output signal of the UDC and control the magnitude of the comparison voltage. | 01-27-2011 |

20110018629 | REFERENCE VOLTAGE SUPPLY CIRCUIT - A reference voltage supply circuit is provided. The reference voltage supply circuit includes a first amplifier for amplifying a first input voltage and a fed back first reference voltage, a second amplifier for amplifying a second input voltage and a fed back second reference voltage, a reference voltage generator for generating the first reference voltage and the second reference voltage according to output signals of the first and second amplifiers and feeding the first and second reference voltages back to the first and second amplifiers, and a glitch remover turned on/off according to an input pulse signal to conduct or cut off current flowing between a power supply terminal and the ground. | 01-27-2011 |

20110032134 | DIGITAL-TO-ANALOG CONVERTER - A digital-to-analog converter (DAC) is provided. The DAC includes a positive converter, a negative converter, and a comparator for receiving outputs of the positive converter and the negative converter, comparing the outputs with a reference voltage, and generating an output voltage. Each of the positive converter and the negative converter includes an upper-bit converter including a plurality of bit capacitors corresponding to respective upper bits, a lower-bit converter including a plurality of bit capacitors corresponding to respective lower bits, and a coupling capacitor for connecting the upper-bit converter with the lower-bit converter in series. Each of the positive converter and the negative converter receives a bias voltage to have a uniform offset when converting the respective bits. Accordingly, it is possible to obtain a high resolution using a small area. Also, the number of capacitors can be reduced, and the capacitance of a unit capacitor can be maximized. Consequently, it is possible to minimize heat noise and device mismatching. | 02-10-2011 |

20110102220 | PIPELINE ANALOG-TO-DIGITAL CONVERTER - Provided is a pipeline analog-to-digital converter (ADC) without a front-end sample-and-hold amplifier (SHA). To minimize a sampling error occurring between a flash ADC and a multiplying digital-to-analog converter (MDAC) of a first sub-ranging ADC due to removal of a front-end SHA, a delay time of a preamplifier included in the flash ADC is calculated, and the flash ADC samples an analog input signal later by the delay time than the MDAC. Accordingly, the pipeline ADC can minimize a sampling error without using a front-end SHA, and its chip area and power consumption can be reduced. | 05-05-2011 |

20110227774 | SUCCESSIVE APPROXIMATION REGISTER ANALOG-DIGITAL CONVERTER AND METHOD FOR OPERATING THE SAME - A successive approximation resistor analog digital converter (SAR ADC) includes a first conversion unit including a correction capacitor array and a bit capacitor array 2 | 09-22-2011 |