Patent application number | Description | Published |
20080203999 | TEST TRAY TRANSFERRING APPARATUS FOR A TEST HANDLER, TEST HANDLER, AND METHOD OF TRANSFERRING TEST TRAYS FOR A TEST HANDLER - A test handler is disclosed. First and second gripping blocks for respective front and rear test trays to be transferred along a circulation path move together in a circulation direction, but move independently in a direction perpendicular to the circulation path and grip and release independently. The test trays can be transferred by a single power source and interference between an assisting a test and a transferring can be minimized. | 08-28-2008 |
20080213078 | PICK AND PLACE APPARATUS - A pick and place apparatus includes a plurality of device holing elements in a predetermined arrangement; a power supply mechanism for supplying a power for controlling a horizontal pitch between the plurality of device holding elements; a power transmission mechanism for delivering the power from the power supply mechanism to the plurality of device holding elements as a translational force in a horizontal direction; a first linear motion guide mechanism for guiding horizontal movements of some of the plurality of device holding elements; and a second linear motion guide mechanism disposed below the first linear motion guide mechanism, for guiding horizontal movements of the other device holding elements. The plurality of device holding elements are slidably coupled to the first and the second linear motion guide mechanism alternately. | 09-04-2008 |
20080265874 | TEST HANDLER - A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing the test tray located in the test chamber to be tested, and a press unit for operating the pushing member; a position control unit for adjusting a position of the pushing member to compensate a deviation between the pushing member and the test tray due to a thermal expansion or contraction of any one of the pushing member and the test tray; and an unloading unit for unloading the semiconductor devices loaded on the test tray onto the customer trays after a test for the semiconductor devices is completed. | 10-30-2008 |
20080272764 | TEST TRAY FOR TEST HANDLER - The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated. | 11-06-2008 |
20090153178 | METHOD FOR TRANSFERRING TEST TRAYS IN A SIDE-DOCKING TYPE TEST HANDLER - The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated. | 06-18-2009 |
20090199395 | SIDE-DOCKING TYPE TEST HANDLER AND APPARATUS FOR TRANSFERRING TEST TRAY FOR SAME - In a side-docking type test handler, a descending mechanism lowers a horizontally postured test tray, which has been transferred into a soak chamber, down to a descent finish position and a vertical posture changing mechanism changes the posture of the test tray, which has been lowered to the descent finish position, from the horizontal state to a vertical state, to transfer the test tray into a test chamber. Further, a horizontal posture changing mechanism changes the posture of the test tray in the test chamber from the vertical state to the horizontal state while transferring the test tray to an ascent start position in a desoak chamber. | 08-13-2009 |
20090297301 | PICK-AND-PLACE-APPRATUS - A pick-and-place apparatus is disclosed, which transfers and loads semiconductor devices between first and second loading elements. The semiconductor devices are loadable and arrangeable at a first row interval in the first loading element, and alternatively arrangeable at second and third row intervals in the second loading element. The pick-and-place apparatus includes a multiplicity of picking unit modules, each of which has at least one or more picking units; and an interval regulation apparatus for regulating intervals between the picking unit modules at the first to third modes. The first to third row interval values are different from each other. The intervals between the picking unit modules are all regulated to be identical to the first row interval at the first mode. The intervals between the picking unit modules are alternately regulated to the second row interval and the third row interval in turn at the second mode. The intervals between the picking unit modules are alternately regulated to the third row interval and the second row interval in turn at the third mode. Therefore, the pick-and-place apparatus can stably transfer semiconductor devices from an element on which semiconductor devices are loaded at the same or different intervals therebetween to another element on which semiconductor devices are loadable or arrangeable at the different or same intervals therebetween. | 12-03-2009 |
20100001739 | TEST TRAY FOR TEST HANDLER - A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray. | 01-07-2010 |
20100019790 | TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE - A test handler ( | 01-28-2010 |
20110138934 | TEST HANDLER - A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in a horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices. | 06-16-2011 |
20120056636 | TEST HANDLER AND METHOD FOR OPERATING THE SAME FOR TESTING SEMICONDUCTOR DEVICES - A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time. | 03-08-2012 |
20130230377 | PICK AND PLACE APPARATUS FOR ELECTRONIC DEVICE INSPECTION EQUIPMENT, PICKING APPARATUS THEREOF, AND METHOD FOR LOADING ELECTRONIC DEVICES ONTO LOADING ELEMENT - A technology related to a pick-and-place apparatus for electronic device inspection equipment is provided. The pick-and-place apparatus includes the guiding unit that can interact with a loading element and can guide the picker to load the electronic devices at a correct position on the loading element. Therefore, the pick-and-place apparatus can allow the electronic devices, for example, semiconductor devices having a ball type of electrical contact lead (BGA, FBGA, etc.), to electrically contact the tester in a stable manner when the tester inspects the electronic devices. | 09-05-2013 |