Patent application number | Description | Published |
20080316469 | Device and method for beam adjustment in an optical beam path - A device for beam adjustment in an optical beam path, having at least two mutually independent light sources ( | 12-25-2008 |
20090022471 | DEVICE FOR ADJUSTING AN OPTICAL FIBER OR AN OPTICAL FIBER BUNDLE - Disclosed is a device for adjusting an optical fiber ( | 01-22-2009 |
20090086315 | ARRANGEMENT FOR EXAMINING MICROSCOPIC PREPARATIONS WITH A SCANNING MICROSCOPE, AND ILLUMINATION DEVICE FOR A SCANNING MICROSCOPE - The arrangement for examining microscope preparations with a scanning microscope comprises a laser ( | 04-02-2009 |
20100073757 | OPTICAL ARRANGEMENT AND METHOD FOR CONTROLLING AND INFLUENCING A LIGHT RAY - An optical arrangement and a related method for operating this optical arrangement are suggested, particularly in microscopes, for use as at least one of a main beam splitter and a beam combiner. One or more light beams can be coupled into the arrangement and at least one of the light beams that were coupled in can be coupled out again after having passed through the optical arrangement. In the path of the coupled in light beams at least one controllable microstructured element is provided, allowing to switch beam paths within the optical arrangement. This allows controlling or influencing the one or more light beams that are coupled out. | 03-25-2010 |
20100214654 | APPARATUS FOR THE DETECTION OF LIGHT IN A SCANNING MICROSCOPE - A light detector for use in a line scanning microscope and a microscope comprising such a light detector are described. The light detector comprises—a line array of avalanche semiconductor detectors; and an electronic trigger circuit that is adapted to operate the avalanche semiconductor detectors in at least one of a Geiger mode with internal charge amplification and in a linear mode. The trigger circuit further comprises a parallel counter that is designed to read out in parallel light pulses detected by the avalanche semiconductor detectors. The parallel counter is adapted to accumulate the light pulses detected by the avalanche semiconductor detectors over a preset counting time. | 08-26-2010 |
20110304900 | ACOUSTO-OPTICAL SYSTEM, MICROSCOPE AND METHOD OF USE OF THE ACOUSTO-OPTICAL SYSTEM - An acousto-optical system is described comprising at least one acousto-optical element having at least one transducer that is attached to a crystal, a driver unit for generating at least one acoustic signal for driving acousto-optical elements modifying light transmitted through the acousto-optical element and comprising at least one digital data processing unit, at least one digital-to-analog converter transforming the digital combination signal into an initial analog driver signal, and an amplifier for amplifying the initial analog driver signal to become said analog electronic driver signal. Further, a microscope and a method of operating the acousto-optical element is are described. Various objectives are achieved like more flexibility, real time compensation for non-linearity and reducing the number, size, costs and energy consumption of electronic components. | 12-15-2011 |
20120130670 | System and Method for Computer-Controlled Execution of at Least One Test in a Scanning Microscope - The invention relates to a method and a system for central computer controlled execution of at least one test run in a scanning microscope, particularly a confocal microscope, wherein at least one first software module of an application software is tested. The invention achieves the aim by a network made of individual scanning microscope clients and a central server. The clients can be contacted via a network interface and are administered in a central directory in the server. The application software for the individual components of a scanning microscope is made of individual software modules, each associated with a potential test. In order to be able to perform the various tests, the scanning microscope clients have been equipped on the hardware side with additional sensors and components that allow various operating parameters to be determined. | 05-24-2012 |
20120169864 | Method for Correcting Image Distortions in a Confocal Scanning Microscope - In order to identify scan coordinate values (φ | 07-05-2012 |
20120175505 | Method and Device for Scanning-Microscopy Imaging of a Specimen - A method and a device for scanning-microscopy imaging of a specimen ( | 07-12-2012 |
20120193513 | LASER SYSTEM FOR A MICROSCOPE AND METHOD FOR OPERATING A LASER SYSTEM FOR A MICROSCOPE - The invention relates to a laser system ( | 08-02-2012 |
20130003172 | SCANNING MICROSCOPE AND METHOD FOR OPTICALLY SCANNING ONE OR MORE SAMPLES - A device in the form of a scanning microscope, a device in the form of a structural unit for a microscope and a method and a device for optically scanning one or more samples. A device in the form of a scanning microscope has a light source ( | 01-03-2013 |
20130010340 | DEVICE FOR SCANNING AN OBJECT, METHOD FOR OPERATING THE DEVICE AND SCANNING MICROSCOPE - The invention relates to a device for scanning an object comprising a carrier body ( | 01-10-2013 |
20130015331 | DEVICE AND METHOD FOR DETECTING LIGHTAANM Birk; HolgerAACI MeckesheimAACO DEAAGP Birk; Holger Meckesheim DEAANM Seyfried; VolkerAACI NusslochAACO DEAAGP Seyfried; Volker Nussloch DE - A device for detecting light includes at least one silicon photomultiplier (SiPM) having an array of a plurality of single-photon avalanche diodes (SPADs), the array being larger in area than an incident light. The device is configured so as to at least one of activate and analyze only the SPADs upon which a specific minimum intensity of light impinges. | 01-17-2013 |
20130043377 | DETECTOR APPARATUS - A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a light sensor having a light incidence side and a cooling component. The cooling component is in direct contact with at least one of the light sensor, on the light incidence side, or a substrate carrying the light sensor. | 02-21-2013 |
20130043378 | DETECTOR APPARATUS - A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component electrically insulates the detector with respect to the housing or is part of an insulator electrically that insulates the detector with respect to the housing. | 02-21-2013 |
20130044370 | DEVICE AND METHOD FOR SCANNING AN OBJECT AND A MICROSCOPE - The invention relates to a device for scanning an object comprising a focusing lens system ( | 02-21-2013 |
20130306398 | Apparatus for Damping Sound in the Optical Beam Path of a Microscope, and Microscope Having a Corresponding Apparatus - An apparatus for damping sound in the optical beam path of a microscope, having an acoustic insulation housing for encapsulating a sound-emitting component, preferably a rapidly moving or oscillating beam deflection means, in particular a resonantly oscillating mirror, the housing comprising at least one optical entrance/exit opening, is characterized in that the housing, preferably the opening of the housing, is embodied and/or configured in such a way that the sound otherwise emerging from the housing is largely extinguished by destructive interference without thereby influencing the optical beam. A microscope having a corresponding apparatus is furthermore claimed. | 11-21-2013 |
20140306098 | DETECTOR APPARATUS - A detector apparatus that is embodied to receive light and to generate electrical signals has a housing and a detector arranged in the housing. The detector includes a light sensor that is embodied to receive light and to release electrons. The light sensor is at a lower electrical potential level than the housing; and that the detector is in thermally conductive contact with the housing via an electrically insulating intermediate arrangement, the thermal conduction direction inside the housing being opposite to the light propagation direction of the light to be detected. | 10-16-2014 |