Patent application number | Description | Published |
20080238739 | SYSTEM AND METHOD FOR CALIBRATING DIGITAL-TO-ANALOG CONVERTORS - A system and method for calibrating a digital-to-analog converter (DAC) is disclosed, the method comprises providing a plurality of spare bits to each of a group of DAC bits that are designated for calibration, calibrating a first DAC bit of the group of DAC bits using its corresponding plurality of spare bits, and keeping a second DAC bit of the group of DAC bits unchanged while calibrating the first DAC bit. | 10-02-2008 |
20080238744 | DIGITAL-TO-ANALOG CONVERTER CELL - A DAC cell comprising: two or more PMOS core devices coupled in series between a power supply and a steering node; a first core transistor coupled between the steering node and a complementary power supply line and controlled by a control signal; and a second core transistor coupled between the steering node and an output of the DAC cell and controlled by a logical inverse of the control signal, wherein the control signal and its logical inverse direct a current from the steering node to either the complementary power supply line or to the output of the DAC cell based on the control signal. | 10-02-2008 |
20080283963 | Electrical Fuse Circuit for Security Applications - A fuse circuit is disclosed, which comprises at least one electrical fuse element having a resistance that changes after being stressed in an electromigration mode, a switching device serially coupled with the electrical fuse element in a predetermined path between a fuse programming power supply (VDDQ) and a low voltage power supply (GND) for selectively allowing a programming current passing through the electrical fuse element during a programming operation, and at least one peripheral circuit coupled to the VDDQ, wherein the peripheral circuit is active and draws current from the VDDQ during a fuse programming operation. | 11-20-2008 |
20090086530 | System and method for reading multiple magnetic tunnel junctions with a single select transistor - A method for reading two or more magnetic tunnel junctions (MTJs) which are serially connected with a select transistor to form a memory string, the method comprises turning on the select transistor, measuring a first resistance of the memory string, storing the first resistance, toggling a predetermined one of the MTJs, measuring a second resistance of the memory string after the toggling, toggling back the predetermined one of the MTJs and comparing the first and second resistances with a plurality of predetermined resistance values, wherein the comparison result leads to a determination of the data stored in the MTJs. | 04-02-2009 |
20090294798 | Bipolar Device Compatible with CMOS Process Technology - A bipolar device includes: an emitter of a first polarity type constructed on a semiconductor substrate; a collector of the first polarity type constructed on the semiconductor substrate; a gate pattern in a mesh configuration defining the emitter and the collector; an intrinsic base of a second polarity type underlying the gate pattern; and an extrinsic base constructed atop the gate pattern and coupled with the intrinsic base, for functioning together with the intrinsic base as a base of the bipolar device. | 12-03-2009 |
20100020590 | SRAM WITH IMPROVED READ/WRITE STABILITY - A static random access memory (SRAM) cell is disclosed which comprises a cross-couple inverter latch coupled between a positive supply voltage and ground, and having at least a first storage node, and a first and second switching device serially connected between the first storage node and a predetermined voltage source, wherein the first switching device is controlled by a word select signal, and the second switching device is controlled by a first bit select signal, wherein either the word select signal or the first bit select signal is only activated during a write operation. | 01-28-2010 |
20100329061 | ELECTRICAL FUSE CIRCUIT FOR SECURITY APPLICATIONS - A fuse circuit is disclosed, which comprises at least one electrical fuse element having a resistance that changes after being stressed in an electromigration mode, a switching device serially coupled with the electrical fuse element in a predetermined path between a fuse programming power supply (VDDQ) and a low voltage power supply (GND) for selectively allowing a programming current passing through the electrical fuse element during a programming operation, and at least one peripheral circuit coupled to the VDDQ, wherein the peripheral circuit is active and draws current from the VDDQ during a fuse programming operation. | 12-30-2010 |
20120243290 | MULTI-LEVEL ELECTRICAL FUSE USING ONE PROGRAMMING DEVICE - A method for programming a multi-level electrical fuse system comprises providing a fuse box with an electrical fuse and providing one of at least two fuse writing voltages to the electrical fuse to program the electrical fuse to one of at least two resistance states. The fuse box comprises at least one electrical fuse, a programming device serially coupled to the electrical fuse, and a variable power supply coupled to the fuse box and configured to generate two or more voltage levels. | 09-27-2012 |