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Esler, NY

David Esler, Gloversville, NY US

Patent application numberDescriptionPublished
20100242293TIME-INDICATING RUB PIN FOR TRANSIENT CLEARANCE MEASUREMENT AND RELATED METHOD - A transient clearance measurement apparatus for determining a minimum clearance between stationary and rotating components includes: at least one rub pin secured to the stationary component and projecting toward a surface of the rotating component. The at least one rub pin has one or more embedded wires completing an electrical circuit, such that, in use, when the at least one rub pin is rubbed by the surface of the rotating component, the electrical circuit is broken.09-30-2010

David Richard Esler, Gloversville, NY US

Patent application numberDescriptionPublished
20080318055RECOVERABLE ELECTRONIC COMPONENT - An electronic component includes a base insulative layer having a first surface and a second surface; an electronic device having a first surface and a second surface, and the electronic device being secured to the base insulative layer; an adhesive layer disposed between the first surface of the electronic device and the second surface of the base insulative layer; and a removable layer disposed between the first surface of the electronic device and the second surface of the base insulative layer. The base insulative layer secures to the electronic device through the removable layer. The removable layer is capable of releasing the base insulative layer from the electronic device. The removal may be done without damage to a predetermined part of the electronic component.12-25-2008
20080318413METHOD FOR MAKING AN INTERCONNECT STRUCTURE AND INTERCONNECT COMPONENT RECOVERY PROCESS - A method is provided for making an interconnect structure. The method includes applying a removable layer to an electronic device or to a base insulative layer; applying an adhesive layer to the electronic device or to the base insulative layer; and securing the electronic device to the base insulative layer using the adhesive layer.12-25-2008
20100077830ELECTRONIC SELF-CALIBRATION FOR SENSOR CLEARANCE - Self-calibration of a multiple channel clearance sensor system, which in one embodiment includes at least one sensor for measuring at least one clearance parameter signal between a stationary object and a rotating object of a rotating machine. The sensor output is processed as a clearance parameter by an offset correction section configured to determine an offset error in the clearance parameter signal which is used by a level shifter. The level shifter is also switchably coupled to the clearance parameter signal wherein the output of the level shifter, which may be amplified and digitally converted, is processed by a signal level analyzer to determine a channel gain signal.04-01-2010
20100188100AUTOMATED SENSOR SPECIFIC CALIBRATION THROUGH SENSOR PARAMETER DOWNLOAD - A sensor system for measuring a clearance parameter between a stationary component and a rotating component of a rotating machine is provided. The system includes a clearance sensor to output a clearance measurement signal. A sensor memory is attached to the sensor for storing a first sensor information. A second sensor information is stored in a electronics interface memory. The first and the second sensor information are read and the clearance sensor is matched with a respective plurality of calibration data by an electronic interface based on the first and the second sensor information.07-29-2010
20100191502SYSTEM AND METHOD FOR CLEARANCE ESTIMATION BETWEEN TWO OBJECTS - A processing system for clearance estimation in a rotating machine includes one or more sensors and one or more digital signal processors for calculating the estimated clearance. The processing system may include techniques for obtaining real-time clearance estimates and techniques for obtaining averaged clearance estimates. Aspects of the processing system may also include a method of switching between real-time clearance estimates and averaged clearance estimates depending on the operating conditions of the rotating machine. Other aspects of the processing system include the use of two digital signal processors: a first digital signal processor configured to receive signals from a clearance sensor and perform a first set of high speed processing tasks, and a second digital signal processor configured to receive signals from the first digital signal processor and perform a second set of lower speed processing tasks.07-29-2010
20110295538AUTOMATED SENSOR SPECIFIC CALIBRATION THROUGH SENSOR PARAMETER DOWNLOAD - A sensor system for measuring a clearance parameter between a stationary component and a rotating component of a rotating machine is provided. The system includes a clearance sensor to output a clearance measurement signal. A sensor memory is attached to the sensor for storing a first sensor information. A second sensor information is stored in a electronics interface memory. The first and the second sensor information are read and the clearance sensor is matched with a respective plurality of calibration data by an electronic interface based on the first and the second sensor information.12-01-2011
20120274258AUTO-COMPENSATING SYSTEM AND METHOD FOR CONDITION MONITORING OF ELECTRICAL MACHINES - A condition monitoring method for an electrical machine is provided. The method includes providing at least one first sensor element embedded in or disposed on at least one substrate element located in a stator core for obtaining a first set of data. The method also includes providing at least one second sensor element for obtaining a second set of data from the electrical machine. Further, the method includes generating signals indicative of changes in characteristics of the first sensor element based on the second set of data. Finally, the method includes refining the first set of data by combining the first set of data with the generated signals.11-01-2012
20130321000ROTATIONAL CLEARANCE MEASUREMENT SYSTEM AND METHOD OF OPERATION - A radial clearance measurement system is provided. The radial clearance measurement system comprises a radial clearance sensor that is relatively insensitive to axial movement of an object rotating relative to the radial clearance sensor. In one embodiment, the radial clearance sensor includes an electrode having a relatively constant overlap area over the range of axial movement of the object.12-05-2013
20140119884Capacitive Sensor Device and Method of Manufacture - A capacitive sensor device and a method of manufacture are provided. The capacitive sensor device includes at least one sensor tip that includes an electrode positioned at a first end of the sensor tip, and a stem member coupled to the electrode and extending toward a second end of the sensor tip. The device also includes a coaxial cable including a center conductor, the center conductor coupled to the sensor tip at the second end, and an insulation layer supporting the sensor tip between the first and second ends. The insulation layer includes a metallization on a portion surrounding the second end of the sensor tip. The device further includes a casing surrounding a portion of the coaxial cable, the metallization, and the coupling of the center conductor and the sensor tip, wherein a braze joint is formed between the casing and the metallization to form a hollow, hermetic cavity.05-01-2014

Patent applications by David Richard Esler, Gloversville, NY US

David Richard Esler, Schenectady, NY US

Patent application numberDescriptionPublished
20080277456SYSTEM AND A METHOD FOR CONTROLLING FLOW OF SOLDER - An assembly including a solder wettable surface is provided. The assembly also includes a metal mask configured to restrict solder from flowing outside the solder wettable surface.11-13-2008
20110139495CIRCUIT BOARD INCLUDING MASK FOR CONTROLLING FLOW OF SOLDER - A circuit board includes a solder wettable surface and a metal mask configured to restrict solder from flowing outside the solder wettable surface of the circuit board.06-16-2011

David Richard Esler, Mayfield, NY US

Patent application numberDescriptionPublished
20080232745HIGH-TEMPERATURE PRESSURE SENSOR AND METHOD OF ASSEMBLY - A method for assembling a Fabry-Perot interferometer includes depositing a first metal layer on an end portion of a ferrule, depositing a second metal layer on a back portion of a die, placing the first metal layer and the second metal layer in contact with each other with respective first and second orifices aligned with respect to each other, and bonding the ferrule to the die by thermo compression. The resulting interferometer includes a glass die with a cavity, a silicon diaphragm disposed over the opening of the cavity and bonded to the glass die, a ferrule bonded to the glass die by thermo compression with the first and second orifices being aligned to each other, and an optical fiber inserted through the other end of the ferrule in direct contact to a back portion of the die and aligned with the first orifice.09-25-2008

Patent applications by David Richard Esler, Mayfield, NY US

David Richard Esler, Niskayuna, NY US

Patent application numberDescriptionPublished
20140270650OPTICAL SUBASSEMBLY AND METHOD OF MANUFACTURING THE SAME - An optical subassembly and method of manufacturing an optical subassembly are provided. One subassembly includes a base, an optical emitter attached to the base and one or more spacers attached to the base surrounding at least a portion of the optical emitter. The optical subassembly further includes a ferrule sleeve attached to the base with the optical emitter and one or more spacers within the ferrule sleeve, wherein the ferrule sleeve is configured to receive an optical fiber therein. The optical subassembly also includes one or more reinforcement members attached to the base adjacent the ferrule sleeve and configured to provide support to the ferrule sleeve.09-18-2014
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