Patent application number | Description | Published |
20090067458 | NONLINEAR IMAGING USING PASSIVE PULSE SPLITTERS AND RELATED TECHNOLOGIES - An apparatus includes a pulsed laser source that produces a pulsed laser beam at an input repetition rate and an input pulse power, a passive pulse splitter that receives the pulsed laser beam and outputs a signal including a plurality of sub-pulses for each input pulse of the pulsed laser beam, a sample, and a detector. The output signal has a repetition rate that is greater than the input repetition rate and the powers of each of the sub-pulses are less than the input pulse power. The sample is placed in the path of a sample beam that is formed from the beam that exits the pulse splitter. The detector receives a signal of interest emitted from the sample. | 03-12-2009 |
20110206075 | Nonlinear Imaging using Passive Pulse Splitters - An apparatus includes a pulsed laser source that produces a pulsed laser beam at an input repetition rate and an input pulse power; a passive pulse splitter that receives the pulsed laser beam and outputs a signal including a plurality of sub-pulses for each input pulse of the pulsed laser beam, where the sub-pulses have a repetition rate that is greater than the input repetition rate and at least two of the sub-pulses have power less than the input pulse power; a sample accommodating structure configured to accommodate a sample placed in the path of a sample beam that is formed from the beam that exits the pulse splitter; and a detector that receives a signal of interest emitted from a sample accommodated by the sample accommodating structure based on the incident sample beam. | 08-25-2011 |
20130181143 | MICROSCOPY WITH ADAPTIVE OPTICS - A method of manipulating a focused light beam includes focusing a beam of excitation light with a lens to a focal spot within a sample, where a cross-section of the beam includes individual beamlets. Directions and/or relative phases of the individual beamlets of the excitation beam at a rear pupil of the lens are individually varied with a wavefront modulating element, and emission light emitted from the focal spot is detected while the directions or relative phases of individual beamlets are varied. The directions of individual beamlets are controlled to either maximize or minimize the emission light from the focal spot, and the relative phases of individual beamlets are controlled to increase the emission light from the focal spot. | 07-18-2013 |
Patent application number | Description | Published |
20110304723 | BESSEL BEAM PLANE ILLUMINATION MICROSCOPE - A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned | 12-15-2011 |
20130286181 | STRUCTURED PLANE ILLUMINATION MICROSCOPY - An apparatus includes a light source configured for generating a coherent light beam having a wavelength, λ, a light detector, and beam-forming optics configured for receiving the generated light beam and for generating a plurality of substantially parallel Bessel-like beams directed into a sample in a first direction. Each of the Bessel-like beams has a fixed phase relative to the other Bessel-like beams. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beams and for imaging the received light onto the detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction, where the detector is configured for detecting light received by the imaging optics. A processor configured to generate an image of the sample based on the detected light. | 10-31-2013 |
20140198200 | BESSEL BEAM PLANE ILLUMINATION MICROSCOPE - A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned | 07-17-2014 |
20140198201 | BESSEL BEAM PLANE ILLUMINATION MICROSCOPE - A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned | 07-17-2014 |
20140284461 | BESSEL BEAM PLANE ILLUMINATION MICROSCOPE - A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned | 09-25-2014 |
20140285651 | BESSEL BEAM PLANE ILLUMINATION MICROSCOPE - A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned | 09-25-2014 |
20140285653 | BESSEL BEAM PLANE ILLUMINATION MICROSCOPE - A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned | 09-25-2014 |
Patent application number | Description | Published |
20090046298 | Optical lattice microscopy - An optical system includes a substrate adapted for supporting a sample, where the substrate has a refractive index, n | 02-19-2009 |
20090073563 | OPTICAL LATTICE MICROSCOPY - A method for creating a periodic interference pattern of coherent waves in two or three dimensions, D, includes generating at least D+2 waves, where each wave has substantially the same wavelength, λ, and travels substantially in a unique direction, k | 03-19-2009 |
20090135432 | Optical lattice microscopy - A microscope includes a source of electromagnetic radiation, having a wavelength, λ | 05-28-2009 |
20090206251 | OPTICAL MICROSCOPY WITH PHOTOTRANSFORMABLE OPTICAL LABELS - First activation radiation is provided to a sample that includes phototransformable optical labels (“PTOLs”) to activate a first subset of the PTOLs in the sample. First excitation radiation is provided to the first subset of PTOLs in the sample to excite at least some of the activated PTOLs, and radiation emitted from activated and excited PTOLs within the first subset of PTOLs is detecting with imaging optics. The first activation radiation is controlled such that the mean volume per activated PTOL in the first subset is greater than or approximately equal to a diffraction-limited resolution volume (“DLRV”) of the imaging optics. | 08-20-2009 |