Patent application number | Description | Published |
20100288359 | Photovoltaic Device - A method to improve CdTe-based photovoltaic device efficiency is disclosed. The CdTe-based photovoltaic device can include oxygen or silicon in semiconductor layers. | 11-18-2010 |
20110139240 | PHOTOVOLTAIC WINDOW LAYER - A discontinuous or reduced thickness window layer can improve the efficiency of CdTe-based or other kinds of solar cells. | 06-16-2011 |
20120018684 | POWDER BLEND - A method for producing uniform powder blends may include a multi-pass riffling process. | 01-26-2012 |
20120025100 | PHOTOLUMINESCENCE MEASUREMENT - A photoluminescence measurement system can include an optical source. | 02-02-2012 |
20120152351 | PHOTOVOLTAIC DEVICE - In general, a photovoltaic module may include a binary semiconductor layer formed from a vapor rich in one component of a binary semiconductor source. | 06-21-2012 |
20130076367 | SYSTEM AND METHOD FOR ESTIMATING THE SHORT CIRCUIT CURRENT OF A SOLAR DEVICE - Described herein is a method and system for determining a short-circuit current of a solar device before the solar device is tested in a solar simulator. A solar device includes a substrate layer, a front contact layer, a window/emitter layer, an absorber layer and a back contact. A thickness of the window/emitter layer and an absorption wavelength of the absorber layer are determined. The window/emitter layer thickness and absorber layer absorption wavelength are used with a fitting parameter that corresponds to transmission properties of the substrate and first contact layers in order to determine the solar device's short-circuit current. | 03-28-2013 |
20130115720 | SURFACE MEASUREMENT - A method and apparatus for determining grain size of a surface. A light source is directed at the surface. Reflected light from the surface is detected. A peak surface grain wavelength is determined from the reflected light. The peak surface grain wavelength is converted to a grain size. Grain size of a semiconductor surface is used as a feedback input to control a manufacturing process. | 05-09-2013 |
20130183794 | METHOD AND SYSTEM OF PROVIDING DOPANT CONCENTRATION CONTROL IN DIFFERENT LAYERS OF A SEMICONDUCTOR DEVICE - A method and system for controlling the amount of a second material incorporated into a first material by controlling the amount of a third material which can interact with the second material. | 07-18-2013 |
20130298992 | PHOTOVOLTAIC DEVICE - A method to improve CdTe-based photovoltaic device efficiency is disclosed. The CdTe-based photovoltaic device can include oxygen or silicon in semiconductor layers. | 11-14-2013 |
20140051206 | METHOD AND APPARATUS PROVIDING MULTI-STEP DEPOSITION OF THIN FILM LAYER - A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate. | 02-20-2014 |