Allyson
Allyson Beuhler, Woodridge, IL US
Patent application number | Description | Published |
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20150112029 | Polyester Polyols and Methods of Making and Using the Same - Polyester polyols are generally disclosed, including methods of making and using them. In some embodiments, the polyester polyols are incorporated into a block copolymer, such as a polyurethane block copolymer. In some embodiments, the polyurethane block copolymers can be used as compatibilizing agents, which can be used, for example, in polymer blends, polymer alloys, solutions, emulsions, as well as in extruded and injection molded articles. In some embodiments, at least a portion of the polyurethane block copolymer is derived from a renewable source. | 04-23-2015 |
Allyson Gajraj, Katy, TX US
Patent application number | Description | Published |
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20110098931 | System and method for obtaining and analyzing well data - A system and method including a sensors deployed in a wellbore, the sensors measuring various downhole parameters. The system retrieves the relevant data from the sensors, validates the data, conditions the data, and analyzes the data to diagnose the wellbore and the reservoir to indicate trends therein. The system has the capability of enabling the characterization of the wellbore and reservoir by being linked to well test analysis tools. The system also has a screening analysis that is much less time consuming than well test analysis tools and that indicates to a user which wellbore and/or reservoirs should be subjected to the more robust and time consuming well test analysis tool. | 04-28-2011 |
Allyson Giannikouris, Kitchener CA
Patent application number | Description | Published |
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20140329339 | DEFECT DETECTION AND CORRECTION OF PIXEL CIRCUITS FOR AMOLED DISPLAYS - A method of testing an array-based semiconductor device for defects during fabrication of the semiconductor device detects defects in said entities forming the semiconductor device at an intermediate stage in the fabrication of multiple types of entities forming the semiconductor device; determines whether the detected defects exceed preselected thresholds for the types of entities in which said detects are detected; if the detected defects do not exceed said preselected thresholds, continues the fabrication of the semiconductor device; and if the detected defects exceed said preselected thresholds, identifies the types of defects detected, repairs the identified defects, and continues the fabrication of the semiconductor device. | 11-06-2014 |
Allyson Skoien, Belleville, WI US
Patent application number | Description | Published |
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20140363883 | Device for cell culture and direct imaging - A cell culture device for the study of barrier function and differentiation are provided by this invention. | 12-11-2014 |