Patent application number | Description | Published |
20100271001 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PROGRAM, AND A RECORDING MEDIUM - According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device | 10-28-2010 |
20100271056 | CONTAINER, A METHOD FOR DISPOSING THE SAME, AND A MEASUREMENT METHOD - The present invention restrains adverse effects caused by refraction of a terahertz wave by a device under test when the terahertz wave is fed to the device under test for measurement. A container | 10-28-2010 |
20100294934 | LIGHT MEASUREMENT APPARATUS AND A TRIGGER SIGNAL GENERATOR - The present invention can restrain a jitter from being generated in a measurement result of light such as terahertz light which has transmitted through a device under test. A trigger signal generation device includes a first photoelectric conversion unit that applies photoelectric conversion to a probe light pulse, a second photoelectric conversion unit that applies photoelectric conversion to a pump light pulse, a first amplification unit that amplifies an output from the first photoelectric conversion unit, a second amplification unit that amplifies an output from the second photoelectric conversion unit, a trigger signal output unit that outputs a cross-correlation of outputs of the first amplification unit and the second amplification unit as a trigger signal, and a period difference adjustment unit that adjusts a difference in period between a period T | 11-25-2010 |
20100295534 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM - According to the electromagnetic wave measurement device of the present invention, an electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changing unit changes a relative position of an intersection across which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. A characteristic value deriving unit derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector while the characteristic value is associated with an assumed relative position which is the relative position if it is assumed that the electromagnetic wave is not refracted by the device under test. A first association correction unit changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the device under test is considered, thereby associating the result derived by the characteristic value deriving unit with the actual relative position. A corrected characteristic value deriving unit that derives the characteristic value associated with a predetermined relative position based on an output from the first association correction unit. | 11-25-2010 |
20110001048 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM - According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test and a container storing at least a part of the device under test. The electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. The relative position changing unit changes a relative position of an intersection at which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. The delay period recording unit records a delay period of the electromagnetic wave caused by a transmission of the electromagnetic wave through the container. The phase deriving unit that derives, based on a detected result by the electromagnetic wave detector, a phase in the frequency domain of the electromagnetic wave which has transmitted through the device under test. The delay-corrected phase deriving unit that derives a delay-corrected phase obtained by subtracting an integral of the delay period with respect to the frequency from the phase. The sinogram deriving unit that derives a sinogram based on a derived result by the delay-corrected phase deriving unit. The image deriving unit derives, based on the sinogram, an image of a cross section of the device under test including the intersection. | 01-06-2011 |
20110170875 | SIGNAL OUTPUT DEVICE, AND OUTPUT APPARATUS OF SIGNAL SOURCE OF SIGNALS AND OF LASER BEAM PULSES - A frequency converter includes a first direct digital synthesizer that receives a signal having a predetermined frequency f_master as a clock signal and further an internal frequency setting signal, and outputs an internal signal having a frequency based on the internal frequency setting signal, and a second direct digital synthesizer that receives the internal signal as a clock signal, and further an output frequency setting signal, and outputs an output signal having a frequency f_slave (=f_master−Δ) based on the output frequency setting signal. A difference between the predetermined frequency f_master and the frequency of the internal signal is larger than a difference between the predetermined frequency f_master and the frequency f_slave of the output signal. | 07-14-2011 |
20120155500 | REPETITION FREQUENCY CONTROL DEVICE - A repetition frequency control device includes a slave photoelectric conversion unit which converts a slave laser light pulse into a slave electrical signal, a master photoelectric conversion unit which converts a master laser light pulse into a master electrical signal, a frequency change unit which changes the repetition frequency of the master electric signal by a predetermined value, a phase comparator which detects a phase difference between the slave electric signal and the output from the frequency change unit, and a loop filter which removes a high frequency component of an output from the phase comparator, where the repetition frequency of the master laser does not undergo control based on one or both of the master electric signal and the slave electric signal. | 06-21-2012 |
20120163404 | REPETITION FREQUENCY CONTROL DEVICE - According to the repetition frequency control device, a master laser outputs a master laser light pulse the repetition frequency of which is controlled to a predetermined value. A slave laser outputs a slave laser light pulse. A reference comparator compares a voltage of a reference electric signal the repetition frequency of which is the predetermined value and a predetermined voltage with each other, thereby outputting a result thereof. A measurement comparator compares a voltage based on a light intensity of the slave laser light pulse and the predetermined voltage with each other, thereby outputting a result thereof. A phase difference detector detects a phase difference between the output from the reference comparator and the output from the measurement comparator. A loop filter removes a high-frequency component of an output from the phase difference detector. | 06-28-2012 |
20120286797 | ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RECORDING MEDIUM - According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector and a measurement unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test including at least two layers, and the electromagnetic wave detector detects reflected electromagnetic waves which are the electromagnetic waves reflected by the respective at least two layers. The measurement unit measures the device under test based on one or both of extreme values of electric fields of the respective reflected electromagnetic waves and a time difference between timings in which the electric fields of the respective reflected electromagnetic waves take the extreme values. | 11-15-2012 |
20130075597 | ELECTROMAGNETIC WAVE DETECTION DEVICE - According to the present invention, an electromagnetic wave detection device includes an optical waveguide, an electromagnetic wave input unit, and a phase difference measurement unit. According to the thus constructed electromagnetic wave detection device, an optical waveguide is a nonlinear crystal, and includes a branching portion for receiving a probe light pulse, and causing the probe light pulse to branch into two beams of branching light, and two branching light transmission portions for receiving the branching light from the branching portion, and transmitting the branching light. An electromagnetic wave input unit inputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] tilted by an angle generating Cherenkov phase matching with respect to a travel direction of the branching light into one of the two branching light transmission portions. | 03-28-2013 |
20130126736 | SPREAD ANALYSIS DEVICE FOR LUBRICANT, METHOD, AND RECORDING MEDIUM - An electromagnetic wave output device outputs an electromagnetic wave. An optical element has a total reflection surface for totally reflecting the electromagnetic wave, and causes the device under test to receive an evanescent wave generated from the total reflection surface. An electromagnetic wave detector detects the electromagnetic wave, and a spectrum deriver derives a reflectance of the electromagnetic wave on the total reflection surface or a value based on the reflectance based on a detection result by the electromagnetic wave detector while the reflectance or the value based on the reflectance is associated with the frequency of the electromagnetic wave and a manufacturing condition of the particle or the device under test. A characteristic extractor extracts a characteristic based on the manufacturing condition from a derived result by the spectrum deriver. | 05-23-2013 |
20130240736 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM - An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position. | 09-19-2013 |
20130284950 | ELECTROMAGNETIC WAVE EMISSION DEVICE - According to the present invention, an electromagnetic wave emission device includes a nonlinear crystal having an optical waveguide; and a prism including an electromagnetic wave input surface and an electromagnetic wave transmission surface. The electromagnetic wave transmission surface includes a rotation surface which is a trajectory of a tilted line segment rotated about a central axis of the electromagnetic wave input surface, the tilted line segment being tilted with respect to the central axis. The tilted line segment and the central axis are on the same plane. The central axis is in parallel to an extending direction of the optical waveguide. The central axis passes through a projection of the optical waveguide into the electromagnetic wave input surface. | 10-31-2013 |
20140166883 | ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RECORDING MEDIUM - According to the present invention, an electromagnetic wave measurement device includes: an electromagnetic wave detector, a frequency component acquisition unit, and a thickness indication quantity deriving unit. An object to be measured is disposed on a substrate and includes at least two layers, and the electromagnetic wave detector detects a substrate-surface-reflected electromagnetic wave which has been made incident to the object, has been reflected by the substrate, and has passed through the object. The frequency component acquisition unit acquires an amplitude of a frequency component of the substrate-surface-reflected electromagnetic wave. The thickness indication quantity deriving unit derives a thickness indication quantity based on the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave and a relationship between the thickness indication quantity and the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave. | 06-19-2014 |
20140168652 | REFLECTION MEASUREMENT APPARATUS - Provided is a light beam incident device including an off-axis parabolic mirror that receives parallel light beams and converges the parallel light beams at one point on an object to be measured, and an incident-side light reception surface of a mirror that feeds the parallel light beams to the off-axis parabolic mirror. An angle (incident angle) between the object to be measured and converged light beams obtained by converging the parallel light beams changes in accordance with a light reception portion at which the off-axis parabolic mirror receives the parallel light beams. The incident side light reception surface of the mirror can change the light reception portion by moving with respect to the off-axis parabolic mirror. | 06-19-2014 |