40th week of 2015 patent applcation highlights part 49 |
Patent application number | Title | Published |
20150276790 | PHYSICAL QUANTITY SENSOR, SENSOR UNIT, ELECTRONIC APPARATUS, MOVING OBJECT, AND PHYSICAL QUANTITY DETECTION METHOD - A physical quantity sensor includes a physical quantity sensor element and an IC connected to the physical quantity sensor element. The IC includes an analog power supply circuit that is switched to enable or disable, a signal processing unit to which a voltage is supplied from the analog power supply circuit and which processes a signal from the physical quantity sensor element, and a control circuit that sets the analog power supply circuit to enable within a processing period based on an external trigger and makes the signal processing unit process a physical quantity signal from the physical quantity sensor element intermittently for every processing period. | 2015-10-01 |
20150276791 | FUNCTIONAL DEVICE, METHOD OF MANUFACTURING THE FUNCTIONAL DEVICE, PHYSICAL QUANTITY SENSOR, AND ELECTRONIC APPARATUS - A functional device according to an embodiment of the invention includes: an insulating substrate; a movable section; movable electrode fingers provided in the movable section; and fixed electrode fingers provided on the insulating substrate and arranged to be opposed to the movable electrode fingers. The fixed electrode fingers include: first fixed electrode fingers arranged on one side of the movable electrode fingers; and second fixed electrode fingers arranged on the other side of the movable electrode fingers. The first fixed electrode fingers and the second fixed electrode fingers are arranged to be spaced apart from each other. | 2015-10-01 |
20150276792 | MOTION DETECTING DEVICE, PORTABLE TERMINAL DEVICE AND MOTION DETECTING METHOD - A motion detecting device has: an input section to which acceleration signals, that express accelerations of respective axes of three axes of a three-dimensional orthogonal coordinate system, are respectively inputted; and a motion detecting section that sets each of plural axes, that include two different axes that are selected from among the three axes, as a designated axis in a predetermined order, and outputs a motion detection signal if it is judged that directions of motion, that are detected on the basis of the acceleration signals of the respective axes that were inputted to the input section, are directions of respective designated axes that have been set. | 2015-10-01 |
20150276793 | UPPER BODY MOTION MEASUREMENT SYSTEM AND UPPER BODY MOTION MEASUREMENT METHOD - An upper body motion measurement system | 2015-10-01 |
20150276794 | METHOD FOR THE CORRECTION OF A MEASURED VALUE CURVE BY ELIMINATING PERIODICALLY OCCURRING MEASUREMENT ARTIFACTS, IN PARTICULAR IN A SOIL COMPACTOR - A method is provided for the correction of a measured value curve by eliminating periodically occurring measurement artifacts. The method includes steps of
| 2015-10-01 |
20150276795 | ATOMIC FORCE MICROSCOPY USING CORRELATED PROBE OSCILLATION AND PROBE-SAMPLE BIAS VOLTAGE - A method of Atomic Force Microscopy (AFM). A first drive signal is generated for causing a periodic motion of a probe tip in a direction normal to a sample surface. The first drive signal has a known amplitude and frequency. A bias signal is generated for applying an electric potential to the probe tip relative to a potential the sample surface. At least one component of the bias signal is oscillatory and correlated with the periodic motion of the probe tip. A response of the probe tip is detected, and analyzed by a processor to infer information about a composition of the sample surface. | 2015-10-01 |
20150276796 | METHOD FOR MEASURING VIBRATION CHARACTERISTIC OF CANTILEVER - A method for measuring vibration characteristic of a cantilever is proposed in this disclosure. The method includes: measuring vibration amplitude V of a cantilever installed in a scanning probe microscope when vibration with a resonant frequency f1 (Hz) is applied to the cantilever; obtaining a time Th (second) when the vibration amplitude V is equal to or more than 0.90 of a stationary amplitude V0; and calculating a Q value by using the following Expression: Q value=f1×Th. | 2015-10-01 |
20150276797 | SCANNING PROBE MICROSCOPE - A scanning probe microscope includes a cantilever that has a first attachment surface and a cantilever attachment portion that has a second attachment surface to which the first attachment surface of the cantilever is attached. Columnar elements including nanofibers or nanotubes are formed on the second attachment surface, and the second attachment surface adheres to the first attachment surface by using the columnar element. | 2015-10-01 |
20150276798 | THERMAL INTERFACE MATERIAL HANDLING FOR THERMAL CONTROL OF AN ELECTRONIC COMPONENT UNDER TEST - Thermal interface material handing is described for thermal control of an electronic component under test. In one example, a thermal control unit is adapted to control the temperature of at least a portion of an electronic component during testing. A pedestal between the thermal control unit and the electronic component conducts heat from the electronic component to the thermal head. A conduit extends through a portion of the pedestal, to permit the flow of a liquid thermal interface material from an external source to a space between the pedestal and the electronic component. The liquid thermal interface material improves heat conduction between the electronic component and the pedestal. An elastomeric seal between the electronic device and the pedestal constrains the thermal interface fluid within the space between the electronic component and the pedestal. | 2015-10-01 |
20150276799 | CURRENT REGULATION FOR ACCURATE AND LOW-COST VOLTAGE MEASUREMENTS AT THE WAFER LEVEL - A test system and test techniques for accurate high current parametric testing of semiconductor devices. In operation, the test system supplies a current to the semiconductor device and measures a voltage on the device. The testing system may use the measured voltage to compute an ON resistance for the high-current semiconductor device. In one technique, multiple force needles contact a pad in positions that provide equi-resistant paths to one or more sense needles contacting the same pad. In another technique, current flow through the force needles is regulated such that voltage at the pad of the device under test is representative of the ON resistance of the device and independent of contact resistance of the force needle. Another technique entails generating an alarm indication when the contact resistance of a force needle exceeds a threshold. | 2015-10-01 |
20150276800 | VERTICAL PROBE DEVICE AND SUPPORTER USED IN THE SAME - A vertical probe device includes a lower die having engaging holes and needle holes, a positioning film having limiting holes and needle holes, probe needles inserted through the needle holes, and supporters having at least an upper stopping surface and at least a lower stopping surface for moveably limiting the positioning film therebetween. Each supporter has a head, a neck passing through the limiting hole and having a length longer than the thickness of the positioning film, a body, and a tail inserted into the engaging hole, which are connected in order, and at least one of the upper and lower stopping surfaces. The supporters can prevent the positioning film from being lifted and flipped over and enables the positioning film to move so that the probe needles are reliable. | 2015-10-01 |
20150276801 | FIXTURE UNIT, FIXTURE APPARATUS, HANDLER APPARATUS, AND TEST APPARATUS - A fixture unit assuredly fits a fixed unit including a gap portion including a first wall surface and a second wall surface opposing each other. Provided are a fixture unit and a fixture apparatus including a fitting pin fitting a gap portion of a fixed unit, the gap portion including a first wall surface and a second wall surface opposing each other, where the fitting pin includes: a fixed pin inserted to the gap portion to contact the first wall surface; a moving pin inserted to the gap portion to be pressed on the second wall surface; and a base to which the fixed pin is fixed, and the moving pin includes a bottom portion in an arc form with a center being a central axis of movement, and the bottom portion fitting slidably with respect to a concave portion provided for the base. | 2015-10-01 |
20150276802 | CLAMP SENSOR AND MEASUREMENT APPARATUS - A clamp sensor detects a detected value for a clamped object and includes: a main body with two main surfaces and two side surfaces; first and second clamp units whose front ends can open and close and form a ring-shaped body surrounding the clamped object; and an opening/closing mechanism for the clamp units. The first clamp unit is fixed to the main body at one side surface. The second clamp unit has a base end rotatably supported by a support shaft disposed toward the other side surface. The opening/closing mechanism includes: a biasing member biasing the second clamp unit to open the clamp units; and a sliding portion disposed on the other side surface and capable of sliding along the length of the main body. When slid toward the clamp units, the sliding portion presses the second clamp unit to close the front ends. | 2015-10-01 |
20150276803 | EQUI-RESISTANT PROBE DISTRIBUTION FOR HIGH-ACCURACY VOLTAGE MEASUREMENTS AT THE WAFER LEVEL - A test system and test techniques for accurate high-current parametric testing of semiconductor devices. In operation, the test system supplies a current to the semiconductor device and measures a voltage on the device. The testing system may use the measured voltage to compute an ON resistance for the high-current semiconductor device. In one technique, multiple force needles contact a pad in positions that provide equi-resistant paths to one or more sense needles contacting the same pad. In another technique, current flow through the force needles is regulated such that voltage at the pad of the device under test is representative of the ON resistance of the device and independent of contact resistance of the force needle. Another technique entails generating an alarm indication when the contact resistance of a force needle exceeds a threshold. | 2015-10-01 |
20150276804 | DETECTION DEVICE - There is provided a detection device including: a detection electrode that is arranged at a position on an arrangement plane near a tubular body a drive electrode that is arranged on the arrangement plane; and a controller configured to generate lines of electric force between the detection electrode and the drive electrode and to detect a state of the tubular body by detecting lines of electric force entering the detection electrode. | 2015-10-01 |
20150276805 | TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIRCUIT - A method and apparatus are provided for transmission/reception of signals between automatic test equipment (ATE) and a device under test (DUT). A probe card has a plurality of associated proximate active probe integrated circuits (APIC) connected to a plurality of probes. Each APIC interfaces with one or more test interface points on the DUT through probes. Each APIC receives and processes signals communicated between the ATE and the DUT. Low information content signals transmitted from the ATE are processed into high information content signals for transmission to the probe immediately adjacent the APIC, and high information content or time critical signals received by the APIC from the DUT are transmitted as low information content signals to the ATE. Because the APIC is immediately adjacent the probe there is minimum loss or distortion of the information in the signal from the DUT. | 2015-10-01 |
20150276806 | PROBE DEVICE HAVING SPRING PROBE - A probe device includes a spring probe and a probe seat. The spring probe includes a needle and a spring sleeve sleeved onto the needle and provided with at least one spring section and at least one non-spring section. The probe seat includes a plurality of dies stacked together and at least one guiding hole through which the spring probe is inserted. An upper edge and a lower edge of the guiding hole of the probe seat are arranged corresponding in position to the non-spring section of the spring sleeve. As a result, the spring probe is prevented from getting jammed due to the contact of the spring section of the spring sleeve with the upper and lower edges of the guiding hole. | 2015-10-01 |
20150276807 | PROBE DEVICE HAVING SPRING PROBE - A probe device includes a spring probe having a spring sleeve with at least a spring section and a connection segment fixed to a needle and having a convex portion protruding over an outer cylinder surface of the spring section, and a probe seat having stacked dies and at least a guiding hole through which the probe is inserted. The dies includes a lower die, a supporting die above the lower die and a non-circular supporting hole at the supporting die. The distance between a supporting surface and a center of the supporting hole is greater than the radius of the outer cylinder surface and smaller than the distance between a guiding surface of the supporting hole and the center, which is greater than the maximum distance between the convex portion and a needle center, thereby preventing the probe receiving external force from exceeding deflection and bending. | 2015-10-01 |
20150276808 | CONTACT AND ELECTRICAL CONNECTION TESTING APPARATUS USING THE SAME - A contact terminal has a support section that holds an elastically deformable axle so as to rotate about the axle with an elastic deformation of the axle, and a contact section extending from the support section. The contact section has, at a distal end thereof, a contact portion configured to make a contact with a testing element. The contact section deforms elastically while rotating with the support section by the contact of the contact portion with the testing element. | 2015-10-01 |
20150276809 | RF Probe - Embodiments of the present invention provide an RF probe for coupling out a probe signal from a transmission line of a circuit. The RF probe includes at least two probe pins having first ends for contacting the circuit and second ends. Furthermore, the RF probe includes a provider for providing a variable impedance at the second ends of the probe pins. The RF probe is configured to provide the probe signal based on a signal propagating along at least one of the probe pins. | 2015-10-01 |
20150276810 | SUBSTRATE INSPECTION APPARATUS - There is provided a substrate inspection apparatus in which a contact between a probe and a semiconductor device is checked without using an IC tester. Further, when an abnormal state is detected in the contact check, a cause of the abnormal state can be determined. A prober includes a probe card having a plurality of probes to be contacted with respective electrode pads of the semiconductor device formed on a wafer W. The probe card includes a card-side inspection circuit configured to reproduce a circuit configuration of DRAM in which the semiconductor device cut from the wafer W is to be mounted, and a comparator configured to measure a potential of a line between the probe and the card-side inspection circuit. | 2015-10-01 |
20150276811 | PROBE CARD ATTACHING METHOD - A probe card attaching method makes it easy to attach/detach a probe card to/from a transfer stage. In a wafer inspection apparatus | 2015-10-01 |
20150276812 | CURRENT SENSING SYSTEM AND METHOD - A current sensing system constituted of: an impedance element; a switching network arranged to alternately couple a first end of the impedance element between a supply voltage and return, the impedance element arranged to develop a voltage there across reflecting a current flow to a load coupled to the second end of the impedance element; a first stage amplifier, a first and second input thereof respectively coupled to the first and second end of the impedance element, a power supply input thereof coupled to a voltage greater than the supply voltage and a return thereof coupled to the first end of the impedance element, the amplifier having a first and second output, the potential difference reflecting the impedance element voltage times a first stage gain; and a second stage amplifier, a first and second input thereof respectively coupled to a first and second output of the first stage amplifier. | 2015-10-01 |
20150276813 | DATA DECIMATION SYSTEM AND METHOD FOR FACILITATING TRANSMISSION AND VIEWING OF WAVEFORMS GENERATED BY AN ELECTRICAL DEVICE - A method of providing data relating to an electrical device to a client device having a certain, known pixel resolution includes receiving raw waveform data generated by a metering device in response to an event related to operation of the electrical device, the raw waveform data having a total number of data points and a waveform cycle time associated therewith, determining whether the raw waveform data should be decimated based on the total number of data points and the pixel resolution, responsive to determining that the raw waveform data should be decimated, generating decimated waveform data from the raw waveform data using the pixel resolution and the waveform cycle time. And sending the decimated waveform data to the client device. | 2015-10-01 |
20150276814 | CURRENT SENSOR - Provided is a current sensor capable of being assembled even if a bus bar inserted through a magnetic core has a complex shape that is difficult to insert through an opening portion of a case. A case includes a first case segment and a second case segment provided with opening portions having a cut-out shape that is open toward a direction orthogonal to a direction in which a detection target portion of a bus bar extends, and the case is assembled to the detection target portion by inserting the detection target portion into the opening portions from the direction orthogonal to the direction in which the detection target portion extends. | 2015-10-01 |
20150276815 | HIGH BANDWIDTH CURRENT SENSOR AND METHOD THEREFOR - A current sensor comprises a current carrying trace located within a substrate; and a sensing trace located within the substrate proximate to the current carrying trace; wherein the sensing trace detects an electromagnetic force (emf) generated by magnetic flux inductively coupled from the current carrying trace for transmitting to a current sensing device. | 2015-10-01 |
20150276816 | CURRENT DETECTING DEVICE - A first coil is wound around a first core, and have one end that is connected to ground and the other end that is connected to one end of a second coil. The second coil is wound around a second core, and has the one end that is connected to the first coil, and the other end that is connected to an excitation unit via a current-limiting resistor. A magnetic flux is generated in the first core by an excitation signal outputted from the excitation unit. Induced electromotive force is generated in the conductor due to the magnetic flux generated in the first core. The direction of the magnetic flux generated in the second core is opposite to the direction of the magnetic flux generated in the first core, and the induced electromotive forces of them generated in the conductor are cancelled each other out. | 2015-10-01 |
20150276817 | CURRENT SENSOR AND CURRENT MEASURING DEVICE - A current sensor includes an element substrate that has a first surface facing a wire to which electric current to be measured is supplied and a second surface positioned on the opposite side of the first surface; a pair of sloping surfaces that are formed mutually juxtaposed in the element substrate so as to have slope angles by which their mutual spacing gradually decreases in a first direction approximately orthogonal with the first surface heading from the first surface to the second surface; a pair of magnetism detecting elements that are respectively attached to the pair of sloping surfaces formed in the element substrate; and external connection terminals that are respectively connected to the pair of magnetism detecting elements and that extend in a second direction that is the opposite direction of the first direction, in which the sensitivity directions of the pair of magnetism detecting elements are respectively set so as to slope along the pair of sloping surfaces. | 2015-10-01 |
20150276818 | OPTICAL VOLTAGE SENSING FOR UNDERGROUND MEDIUM VOLTAGE WIRES - An optical voltage sensor for measuring voltage on an underground power line or for use in other scenarios in which access to a conductor is available through a blind hole. The optical voltage sensor includes a light modulating member, such as a Pockel's crystal. A reflective, conductive member is positioned at one end of the light modulating member and another conductive member is positioned at an opposed end. A voltage capacitively coupled to the reflective conductive member induces a voltage across the light modulating member, thereby impacting the amount of modulation. A beam of light is directed through the crystal and reflected back out of the crystal, where the amount of modulating can be measured. The amount of modulation indicates a measured voltage, and can be transmitted to a monitoring station where processing can determine the status of the power grid or generate other results based on the measured voltage. | 2015-10-01 |
20150276819 | Method and Apparatus for Determining Resistance Values of Dynamic Voltage-Adjusting Circuit - A method and an apparatus for determining resistance values of a dynamic voltage-adjusting circuit are provided. The method includes determining a reference voltage, a maximum output voltage value, and a minimum output voltage value of the dynamic voltage-adjusting circuit; determining, according to the reference voltage, the maximum output voltage value and the minimum output voltage value, a first relational expression between the reference voltage, the maximum output voltage value, and multiple resistors of the dynamic voltage-adjusting circuit, and a second relational expression between the reference voltage, the minimum output voltage value, and the multiple resistors; and determining a group of resistance values of the multiple resistors according to the two relational expressions. It is ensured that voltage values output by the dynamic voltage-adjusting circuit can fall within a same range when the reference voltage takes different values. | 2015-10-01 |
20150276820 | METHOD AND SYSTEM FOR MONITORING, METERING, AND REGULATING POWER CONSUMPTION - A method and a system for monitoring power consumption are provided. The system comprises a breaker including a server for dynamically distributing network configuration parameters and an active RFID device, and further comprises a device including a client for dynamically distributing network configuration parameters and a passive RFID device, wherein the device is a switch or a receptacle. In the method and the system, the device is registered by the breaker by passing information of the passive RFID device to the active RFID device; the breaker and the devices are connected through Ethernet over a power line. The server is configured to provide a service to the client. | 2015-10-01 |
20150276821 | POWER DETERMINING APPARATUS AND ELECTRONIC APPLIANCE INCLUDING THE SAME - A power determining apparatus is disclosed. The power determining apparatus includes a sensor for sensing a current or voltage supplied from a commercial power source or an uninterruptible power supply (UPS), and a controller for analyzing a current or voltage signal sent from the sensor, and determining which one of the commercial power source and the UPS supplies power, based on results of the analysis. | 2015-10-01 |
20150276822 | LIGHTNING DETECTION CIRCUIT ASSEMBLY - A lightning detection circuit assembly includes electrical connector including signal input terminal and signal processing system, and lightning detection circuit including resistor electrically connected with one end thereof to the electrical connector, grounding terminal electrically connected to the opposite end of the resistor and output terminal electrically connected to the end of the resistor that is electrically connected to the electrical connector. When the signal input terminal receives high current or high voltage of abnormal surge (lightning), the high voltage is transmitted to the lightning detection circuit and then discharged by the resistor through the grounding terminal, and at the same time, the resistor converts the surge into a data signal for output through the output terminal to external electronic device for recording, and thus the external electronic device can record the frequency, time or intensity of occurred surges (lightning) for reference in a further maintenance or inspection work. | 2015-10-01 |
20150276823 | Method For Detecting A Fault Condition In An Electrical Machine - A method for identifying a fault condition in an electrical machine in which at least a stator or a rotor has parallel winding branches is disclosed. A measurement is carried out for obtaining a set of circulating current values between two parallel winding branches of which each winding branch includes a single coil. A frequency analysis is applied on the set of circulating current values to obtain at least one frequency component. A fault condition of the electrical machine is determined on the basis of the at least one frequency component. | 2015-10-01 |
20150276824 | ON-CHIP IR DROP DETECTORS FOR FUNCTIONAL AND TEST MODE SCENARIOS, CIRCUITS, PROCESSES AND SYSTEMS - An integrated circuit includes a functional circuit ( | 2015-10-01 |
20150276825 | Method and Apparatus for a Cloud-Based Power Quality Monitor - A system includes a plurality of power quality devices for continuously measuring and buffering power quality data and transmitting the buffered power quality data on a periodic basis and one or more cloud-based servers communicatively coupled to the plurality of power quality devices. The one or more cloud-based servers are operable to: receive the buffered data transmitted by the power quality devices; decompress and store the buffered data in a database; and display on a web page one or more of a stripchart, daily profile, histogram, waveform, vector diagram, harmonic bar chart, and 3D harmonic graph generated using the stored data. The system also includes one or more computing devices communicatively coupled to the plurality of power quality devices and the one or more cloud-based servers. | 2015-10-01 |
20150276826 | SYSTEM FOR MEASURING ENERGY CONSERVATION EFFECTIVENESS - An observed space having energy consuming devices with conservation mechanisms, algorithms, techniques, or applications. The devices having their conservation applications engaged may be a normal mode. When the conservation applications are disengaged, the devices may be in a reference mode. An amount of energy consumption by the devices in the normal mode may be compared with an amount of energy consumption by the devices in the reference mode to determine an energy conservation effectiveness of the devices in the observed space. | 2015-10-01 |
20150276827 | SYSTEM AND METHOD FOR DETECTING, LOCALIZING AND QUANTIFYING EXCESS VOLTAGE DROP IN THREE-PHASE AC CIRCUITS - A system and method for detecting and localizing excess voltage drop in single or multiple phases of three-phase AC circuits is disclosed. An electrical distribution circuit is provided that includes an input connectable to an AC source, an output connectable to terminals of an electrical machine, the output configured to provide three-phase voltages and currents to the electrical machine, and a diagnostic system configured to detect an excess voltage drop (EVD) in the electrical distribution circuit. The diagnostic system includes a processor that is programmed to receive measurements of the three-phase voltages and currents provided to the electrical machine, compute a negative sequence voltage from the three-phase voltages and currents, determine a localization reference phase angle for each phase based in part on the three-phase voltages and currents, and calculate an EVD in the electrical distribution circuit based on the negative sequence voltage and the localization reference phase angles. | 2015-10-01 |
20150276828 | DEVICE AND METHOD FOR DETERMINING AN INDIVIDUAL POWER REPRESENTATION OF OPERATION STATES - The invention relates to a device ( | 2015-10-01 |
20150276829 | System and Methods Thereof for Monitoring of Energy Consumption Cycles - A system comprises of a plurality of current consumption monitors, such as self-powered power sensors (SPPSs) that collect information from energy consuming equipment. The monitors check periodically the current consumed by the equipment and the results are stored in memory. Periodically the data collected is processed respective of each monitor to determine the ratio between the total number of cycles, i.e., the number of times an equipment consumed energy, to the number of cycles in which the equipment consumed energy for a period of time that is shorter than a predetermined threshold of time. Upon detection of a change in the ratio over a period of time an alert is provided. In one embodiment the equipment may be caused to shut down responsive of an appropriate alert. | 2015-10-01 |
20150276830 | DEVICE, ARRANGEMENT AND METHOD FOR VERIFYING THE OPERATION OF ELECTRICITY METER - An electronic electricity meter ( | 2015-10-01 |
20150276831 | FREQUENCY ESTIMATION - Determining a property of an electrical signal at a node instant at the current instant (INSTC); determining a previous function indicative of a property of the signal at the node at a previous instant; determining an error function in a previous frequency estimation at the node at a previous instant; determining a first current function indicative of the property of the signal at the node at INSTC in accordance with the determined property, the previous function, and the error function; receiving, from another node, a second current function indicative of a property of an electrical signal at the at least one other node at INSTC; combining the first current function and the second current function to produce a current combined function (CCF) indicative of a property of the signal at the node at INSTC; and estimating a current frequency of the signal at the node in accordance with the CCF. | 2015-10-01 |
20150276832 | DETECTION OF ISLANDING CONDITION IN ELECTRICITY NETWORK - A method for single-phase islanding detection in a three-phase electricity network, can include supplying power into a three-phase electricity network (EN) by a power supply assembly (PSA), the electricity network (EN) having a network voltage, and providing a stimulus signal into a positive sequence electric quantity of the electricity network, the positive sequence electric quantity being current, power or a derived quantity thereof. A magnitude and/or a rate of change of an indicative element of a negative sequence component of the network voltage is monitored, a frequency domain of the indicative element including a frequency corresponding to the stimulus signal. A single phase islanding condition is detected in the electricity network (EN) if the magnitude and/or rate of change of the indicative element exceeds a predetermined limit value. | 2015-10-01 |
20150276833 | ANALYSING RF SIGNALS FROM A PLASMA SYSTEM - Samples representing signals and noise from a plasma system across a frequency range are collected. A first complex frequency-domain signal component is identified from a sample corresponding to a frequency value F at which a local maximum signal is found. This first component is phase-adjusted by a variable angle θ to a predetermined phase angle φ, and stored. A further complex component is identified corresponding to a frequency F(N) representing an Nth order harmonic of F. This further component is phase-adjusted by an angle N×θ, and stored. The procedure is repeated to build up sets of phase-adjusted first and further components, with θ chosen in each iteration for the first component to give a constant phase angle φ, and within any iteration the value of θ used for the first component is employed in the adjustment of the further component. The aggregated, phase-adjusted components exhibit increased signal-to-noise. | 2015-10-01 |
20150276834 | DISTORTION ESTIMATION APPARATUS AND METHOD - A distortion estimation apparatus for estimating distortion includes a feedback element, a nonlinearity determiner, and a distortion simulator. The feedback element provides a feedback signal derived from a distorted output signal of the distorting element. A signal processing quality of the feedback element is lower than an associated signal property of the distorted output signal. The nonlinearity determiner receives the feedback signal and an input signal to the distorting element or a signal derived from the input signal. The nonlinearity determiner determines an estimated transmission characteristic of the distorting element by relating signal properties of the feedback signal and the input signal or the signal derived from the input signal. The distortion simulator estimates the distortion caused by the distorting element based on the input signal or the signal derived from the input signal and the estimated transmission characteristic. | 2015-10-01 |
20150276835 | PLATING APPARATUS AND METHOD OF DETERMINING ELECTRIC RESISTANCE OF ELECTRIC CONTACT OF SUBSTRATE HOLDER - A plating apparatus that can obtain each one of electric resistances of plural inner contacts of a substrate holder is disclosed. The plating apparatus includes a resistance-measuring device configured to measure a combined resistance of two electric contacts selected from the plural electric contacts, repeat measuring of a combined resistance of two electric contacts while changing a combination of two electric contacts until a same number of plural combined resistances as the plural electric contacts are measured, create linear equations by coupling each of the plural combined resistances to two variables with use of an equal sign, the two variables representing electric resistances of the corresponding two electric contacts, and solve the linear equations to determine each one of electric resistances of the plural electric contacts. | 2015-10-01 |
20150276836 | METHODS AND DEVICES FOR MEASURING CONDUCTIVITY OF FLUIDS - A sensor for detecting the breakthrough of hardness in a water softener measures a change in the conductivity of elongated cation-exchange material in contact with the treated water. | 2015-10-01 |
20150276837 | ELECTRONIC DEVICE AND ANTENNA STATE DETERMINING METHOD OF THE ELECTRONIC DEVICE - An electronic device, an antenna state determining method, and a non-transitory computer readable recording medium. The electronic device includes an antenna configured to be extractable or detachable, an information collecting unit configured to collect information on a signal received via the antenna, and a determination unit configured to determine insertion, extraction, attachment, or detachment of the antenna by using the collected information. The method includes collecting information on a signal received via an extractable or detachable antenna; and determining insertion, extraction, attachment, or detachment of the antenna by using the collected information. The non-transitory computer readable recording medium having a program recorded thereon, which, when executed by a computer, performs a method including collecting information on a signal received via an extractable or detachable antenna; and determining insertion, extraction, attachment, or detachment of the antenna by using the collected information. | 2015-10-01 |
20150276838 | NOISE MODULATION FOR ON-CHIP NOISE MEASUREMENT - Functionality for estimating characteristics of an on-chip noise signal can be implemented on a processing module. An on-chip noise signal is determined at an on-chip determination point of a computer chip. The on-chip noise signal is converted to a frequency-varying signal using a voltage-controlled oscillator implemented on the computer chip. The frequency-varying signal is measured at an off-chip measurement point and frequency information is extracted from the frequency-varying signal. The frequency information is converted to a voltage level associated with the on-chip noise signal based on the relationship between an input voltage provided to the voltage-controlled oscillator and an output frequency generated by the voltage-controlled oscillator. | 2015-10-01 |
20150276839 | WORST CASE JITTER PREDICTION METHOD USING STEP RESPONSE - A method operational within a simulation environment is provided for estimating or predicting jitter. At least two step functions are defined to approximate a worst-case jitter condition for a simulated electrical interconnect or a simulated electrical path. Each of the at least two step functions is sequentially used as input signals to the simulated electrical interconnect or path to obtain at least two corresponding step function responses. Jitter for the simulated electrical interconnect or path is predicted based on the at least two step function responses. | 2015-10-01 |
20150276840 | NOISE MODULATION FOR ON-CHIP NOISE MEASUREMENT - Functionality for estimating characteristics of an on-chip noise signal can be implemented on a processing module. An on-chip noise signal is determined at an on-chip determination point of a computer chip. The on-chip noise signal is converted to a frequency-varying signal using a voltage-controlled oscillator implemented on the computer chip. The frequency-varying signal is measured at an off-chip measurement point and frequency information is extracted from the frequency-varying signal. The frequency information is converted to a voltage level associated with the on-chip noise signal based on the relationship between an input voltage provided to the voltage-controlled oscillator and an output frequency generated by the voltage-controlled oscillator. | 2015-10-01 |
20150276841 | NOISE DETECTION CIRCUIT AND SEMICONDUCTOR SYSTEM USING THE SAME - A noise detection circuit may include a divider configured to receive a clock signal and a clock bar signal, divide the clock signal and the clock bar signal, and generate a first divided signal and a second divided signal. The noise detection circuit may also include a noise detection reference block configured to reflect a power supply voltage level variation on the first divided signal and the second divided signal, and generate a first reference signal and a second reference signal, and a duty sensing unit configured to generate first duty information and second duty information of the clock signal in response to the first reference signal and the second reference signal. The noise detection circuit may also include a detection unit configured to generate a noise detection signal in response to the first duty information and the second duty information. | 2015-10-01 |
20150276842 | DIAGNOSTIC METHOD FOR CONTACTOR RESISTANCE FAILURE - A diagnostic method for contact resistance failure includes estimating electrical contact surface resistance of at least one contactor, determining a faulted status of the at least one contactor and indicating the faulted status of the at least one contactor if the at least one contactor is in the faulted status. | 2015-10-01 |
20150276843 | INDUCTION FURNACE AND SYSTEM FOR LOCATING A GROUND FAULT THEREIN - A method and an apparatus for detecting a ground fault in an induction furnace as well as an induction furnace are described. When a ground fault is detected by means of the ground-fault detector the ground fault is localized. By doing this it is determined if the ground fault is caused by a failure of the refractory lining or by other reasons. If the ground fault is caused by other reasons it is ascertained if it is caused by a defective magnetic yoke insulation. Furthermore, it can be ascertained which magnetic yoke of the induction furnace causes a ground fault. In this manner the induction furnace can be operated with improved security and smaller expense. | 2015-10-01 |
20150276844 | CONTROLLING GAMING MACHINE POWER-UP - A gaming system includes circuitry and associated methodology for detection of continuity along, one or more sensing paths for determination of the presence and proper seating of one or more component boards to each other and a backplane, having an arbitrary number of couplings. The invention controls voltage to one or more components of the gaming system, enabling selective activation of various components, on one or more of the connected boards, based on the proper seating of component boards to each other and a backplane. The invention implements dynamic configuration of sensing paths (defined by signal paths and signal traversal) and subsequent continuity detection through interfacing connector/port pairs, in combination with specifically placed electronic components and local ground connections along the sensing paths, to control powering selective system components based upon a detection of the presence and proper seating of multiple component boards to each other and a backplane. | 2015-10-01 |
20150276845 | CAUSALITY ENFORCEMENT FOR ELECTRICAL INTERCONNECTS THROUGH PERIODIC CONTINUATIONS - Causality evaluation for transfer functions representing the behavior of electrical interconnects of a system is provided herein. An initial transfer function can be received that represents the behavior of electrical interconnects of a system over an initial frequency range. A causal, periodic continuation can then be constructed based on the initial transfer function and one or more causality conditions. The continuation is periodic over an extended frequency range that is larger than the initial frequency range. At a plurality of frequencies, values for the initial transfer function and values for the continuation can be compared. The causality of the initial transfer function can be assessed based on the comparing. | 2015-10-01 |
20150276846 | HIGH VOLTAGE ISOLATION MEASUREMENT SYSTEM - The isolation resistance value is determined by measuring the voltage across a set of high resistance resistor networks placed between the high voltage battery pack (both the positive and negative terminals) and the chassis ground and then modifying the resistance networks by switching in an additional high resistance network and repeating the measurements. This results in a system that can be assembled using low cost components to determine with a high degree of accuracy the value of the isolation resistance. The implementation of this system does not require expensive solid state relays, as the small amount of resistance through the switching device is negligible when determining the isolation resistance of the high voltage system. The system is not dependent on high precision devices to give accurate isolation resistance detection in a range that is appropriate for high voltage applications. | 2015-10-01 |
20150276847 | METHOD AND SYSTEM FOR TESTING A SEMICONDUCTOR DEVICE AGAINST ELECTROSTATIC DISCHARGE - A method of testing a semiconductor device against electrostatic discharge includes operating the semiconductor device, and, while operating the semiconductor device, monitoring a functional performance of the semiconductor device. The monitoring includes monitoring one or more signal waveforms of respective one or more signals on respective one or more pins of the semiconductor device to obtain one or more monitor waveforms, and monitoring one or more register values of one or more registers of the semiconductor device to obtain one or more monitor register values as function of time. The method includes applying an electrostatic discharge event to the semiconductor device while monitoring the functional performance of the semiconductor device. The method can further comprise determining a functional change from the one or more monitor waveforms and the one or more monitor register values as function of time. | 2015-10-01 |
20150276848 | EXAMINATION DEVICE AND EXAMINATION METHOD - An examination device disclosed herein includes: a power source; an inductor provided between the power source and the semiconductor device; a diode connected in parallel with the inductor, and having an anode connected to a negative side of the inductor and a cathode connected to a positive side of the inductor; and a current cutoff mechanism provided between the power source and the semiconductor device, and configured to cut off an inflow of current to the semiconductor device, wherein the current cutoff mechanism starts to cut off the inflow of the current to the semiconductor device before a timing at which voltage that is applied to the semiconductor device is stabilized, after having experienced a rise to surge voltage, the rise having been triggered by the semiconductor device being turned off, and the current cutoff mechanism completes the cutoff after the timing. | 2015-10-01 |
20150276849 | SEMICONDUCTOR AUTOMATIC TEST EQUIPMENT - A backing apparatus for use in a semiconductor automatic test equipment including: a probe card holder configured to rigidly affix one or more first portions of a flexible probe card to the probe card holder, wherein a respective back side of each of the one or more first portions is adjacent to the probe card holder when the one or more portions are rigidly affixed to the probe card holder; linear actuators; and a rigid backing plate configured to rigidly affix a second portion of the flexible probe card to the rigid backing plate, wherein one side of the rigid backing plate is adjacent to a back side of the second portion when the second portion is rigidly affixed to the rigid backing plate, wherein each linear actuator is configured to provide backing of another side of the rigid backing plate against the probe card holder. | 2015-10-01 |
20150276850 | METHOD OF CHARACTERIZING AND MODELING LEAKAGE STATISTICS AND THRESHOLD VOLTAGE FOR ENSEMBLE DEVICES - An approach for determining leakage current and threshold voltage for ensemble semiconductor devices, implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having program instructions, are operable to: receive a number m of individual devices within an ensemble device; identify a sub-threshold slope; determine an uplift factor; separate random variation in logarithm of a leakage current into a correlated random component and an uncorrelated random component; determine a first standard deviation of correlated random component for the ensemble device; determine a second standard deviation of the uncorrelated random component for the ensemble device; generate a statistical model for electrical features of the ensemble device, based on the number m of individual devices, the sub-threshold slope, the uplift factor, the first and second standard deviation, and statistical random variables; and determine the electrical features of the ensemble device based on the statistical model. | 2015-10-01 |
20150276851 | SEMICONDUCTOR CHIP HAVING TRANSISTOR DEGRADATION REVERSAL MECHANISM - A method is described that includes monitoring degradation of a semiconductor chip's transistors during normal operation. The method further includes raising an internal voltage of the semiconductor chip in response to the degradation. The method further includes determining that the degradation has reached a threshold. The method further includes triggering application of an elevated temperature to the semiconductor chip so that the degradation is at least partially reversed. The method further includes applying a new lower internal voltage of the semiconductor chip in account of the degradation reversal. | 2015-10-01 |
20150276852 | ACTUATOR, HANDLER APPARATUS AND TEST APPARATUS - Provided is an actuator including: first to third rotation axes provided at a fixed section and having axes in a same direction, first to third rotation sections provided at positions offset from centers of the corresponding rotation axes, and rotating in response to the corresponding rotation axes; a movable section including first and third side walls facing the first and the third rotation sections in a first direction on a movable plane, and a second side wall facing the second rotation section in a second direction, the movable section moving on a predetermined movable plane in response to rotation of the first to third rotation sections; and a biasing section biasing the movable section with respect to the fixed section in at least one of the first direction and the second direction, and making at least one of the first to third rotation sections abut against the corresponding side wall. | 2015-10-01 |
20150276853 | PHYSICAL QUANTITY DETECTING SENSOR, ELECTRONIC APPARATUS, MOVING OBJECT, AND ELECTRONIC CIRCUIT - A physical quantity detecting sensor includes a physical quantity detecting sensor element and an IC connected to the physical quantity detecting sensor element. The IC includes: a logic circuit; an analog circuit; a first regulator that supplies a logic power supply voltage generated based on a power supply voltage to the logic circuit; a second regulator that is switched to enable or disable and supplies an analog power supply voltage, which is generated based on the power supply voltage when the second regulator is set to enable, to the analog circuit; and a switch for supplying the logic power supply voltage to the analog circuit when the second regulator is set to disable. | 2015-10-01 |
20150276854 | INTEGRATED CIRCUIT INTERCONNECT CRACK MONITOR CIRCUIT - A circuit device mounted on a substrate includes a detection circuit that monitors a characteristic of a return signal to determine an integrity of various interconnects of the device. | 2015-10-01 |
20150276855 | ATE DIGITAL CHANNEL FOR RF FREQUENCY/POWER MEASUREMENT - A method for testing using an automated test equipment (ATE) is disclosed. The method comprises capturing a radio frequency (RF) signal using a digital port on automated test equipment, wherein the RF signal is transmitted from a device under test (DUT) to be tested by the automated test equipment. It also comprises sampling the RF signal at a high sampling rate using a digital channel associated with the digital port. Further, it comprises generating a discrete signal using results from the sampling. Finally, it comprises determining a frequency and amplitude of the RF signal using the discrete signal. | 2015-10-01 |
20150276856 | PASSIVE PROBING OF VARIOUS LOCATIONS IN A WIRELESS ENABLED INTEGRATED CIRCUIT (IC) - Methods and apparatus are disclosed for wirelessly communicating among integrated circuits and/or functional modules within the integrated circuits. A semiconductor device fabrication operation uses a predetermined sequence of photographic and/or chemical processing steps to form one or more functional modules onto a semiconductor substrate. The functional modules are coupled to an integrated waveguide that is formed onto the semiconductor substrate and/or attached thereto to form an integrated circuit. The functional modules communicate with each other as well as to other integrated circuits using a multiple access transmission scheme via the integrated waveguide. One or more integrated circuits may be coupled to an integrated circuit carrier to form Multichip Module. The Multichip Module may be coupled to a semiconductor package to form a packaged integrated circuit. | 2015-10-01 |
20150276857 | APPARATUS AND METHOD FOR TESTING PAD CAPACITANCE - A pad capacitance test circuit may be coupled to one or more pads of an electronic circuit, such as a processor. The pad capacitance test circuit may be located on a die including the electronic circuit. The pad capacitance test circuit may reset a pad voltage of one or more of the pads to zero, and then couple the pad to a supply voltage through a pullup resistor for a time period. The final pad voltage at or near the end of the period of time may be measured. The pad capacitance may be determined from the measured value of the final pad voltage and known values of the supply voltage, the time period, and resistance of the pullup resistor. | 2015-10-01 |
20150276858 | TEST APPARATUS AND CIRCUIT SUBSTRATE UNIT - A test apparatus that tests a device under test, comprising first and second test substrates facing each other; test circuits provided respectively on a first substrate surface of the first test substrate facing the second test substrate and a second substrate surface of the second test substrate facing the first test substrate; a first cooling section provided on the first substrate surface of the first test substrate to house the test circuit and to have a cooling medium introduced therein; and a second cooling section provided on the second substrate surface of the second test substrate to house the test circuit and to have a cooling medium introduced therein. The first and second cooling sections include respective contact portions in contact with each other, and each contact portion has a connection opening that connects inside of the first cooling section and inside of the second cooling section to each other. | 2015-10-01 |
20150276859 | DEVICE HOLDER, INNER UNIT, OUTER UNIT, AND TRAY - To electrically connect a device under test mounted on a device holder and a socket of a test apparatus with accuracy. Provided is a device holder that retains a device, the device holder including: an inner unit that mounts the device; and an outer unit that retains the inner unit such that the inner unit is relatively movable, wherein the inner unit switches whether to lock the outer unit relative to the inner unit or to release the lock. Also, the inner unit and the outer unit of the device holder are provided. | 2015-10-01 |
20150276860 | HANDLER APPARATUS, DEVICE HOLDER, AND TEST APPARATUS - Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and a conveyer that conveys the device holder in which a position of the device under test has been adjusted, to fit the test socket, where the device holder includes: an inner unit to mount the device under test; an outer unit to retain the inner unit to be movable; and a release button to release a lock of movement of the inner unit, in response to being pressed from a side to which the device under test is mounted, and the actuator sets the inner unit to be movable by pressing the release button and adjusts a position of the inner unit. | 2015-10-01 |
20150276861 | HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST APPARATUS - A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit. | 2015-10-01 |
20150276862 | Handler Apparatus and Test Apparatus - Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket. | 2015-10-01 |
20150276863 | Handler Apparatus and Test Apparatus - Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket. | 2015-10-01 |
20150276864 | DUAL-PHASE INTERFEROMETRY FOR CHARGE MODULATION MAPPING IN ICS - A dual-phase interferometric method and device for charge modulation mapping in integrated circuits provides significant improvement in signal to noise ratio over conventional detection configurations. The method and device can be used for failure analysis and testing of advanced technology IC chips for which high sensitivity in modulation mapping is required. | 2015-10-01 |
20150276865 | SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INSPECTION METHOD - A semiconductor device inspection system ( | 2015-10-01 |
20150276866 | RESET GENERATION CIRCUIT FOR SCAN MODE EXIT - A reset generation circuit of an integrated circuit uses a scan data input pin as a scan mode exit control, which is enabled only when the IC reset pin of the device is active. The reset generation circuit allows a TAP controller to be scan testable yet at the same time the circuit provides a method to exit scan mode without requiring a power-up sequence or an extra pin. | 2015-10-01 |
20150276867 | INITIALIZING AND TESTING INTEGRATED CIRCUITS WITH SELECTABLE SCAN CHAINS WITH EXCLUSIVE-OR OUTPUTS - Embodiments of the invention provide a scan test system for an integrated circuit comprising multiple processing elements. The system comprises at least one scan input component and at least one scan clock component. Each scan input component is configured to provide a scan input to at least two processing elements. Each scan clock component is configured to provide a scan clock signal to at least two processing elements. The system further comprises at least one scan select component for selectively enabling a scan of at least one processing element. Each processing element is configured to scan in a scan input and scan out a scan output when said the processing element is scan-enabled. The system further comprises an exclusive-OR tree comprising multiple exclusive-OR logic gates. The said exclusive-OR tree generates a parity value representing a parity of all scan outputs scanned out from all scan-enabled processing elements. | 2015-10-01 |
20150276868 | CHIP DEBUG DURING POWER GATING EVENTS - A system, method, and tangible computer readable medium for chip debug is disclosed. For example, the system can include a plurality of functional blocks, a debug path, and a debug bus steering module. The debug path couples the plurality of functional blocks in a daisy chain configuration, where an end functional block from the plurality of functional blocks is at an end of the daisy chain configuration. The debug bus steering module is configured to pass one or more debug signals associated with a first functional block from the plurality of functional blocks along the debug path to the end functional block while a second functional block from the plurality of functional blocks performs one or more power gating cycles. | 2015-10-01 |
20150276869 | METHOD AND APPARATUS FOR AT-SPEED SCAN SHIFT FREQUENCY TEST OPTIMIZATION - There is provided an integrated circuit comprising at least one logic path, comprising a plurality of sequential logic elements operably coupled into a scan chain to form at least one scan chain under test, at least one IR drop sensor operably coupled to the integrated circuit power supply, operable to output a first logic state when a sensed supply voltage is below a first predefined value and to output a second logic state when the sensed supply voltage is above the first predefined value, at least one memory buffer operably coupled to a scan test data load-in input and a scan test data output of the at least one scan chain under test, and control logic operable to gate logic activity including the scan shift operation inside the integrated circuit for a single cycle when the at least one IR drop sensor outputs the first logic state and to allow normal scan test flow when the at least one IR drop sensor outputs the second logic state. There is also provided an associated method of performing at-speed scan testing of an integrated circuit. | 2015-10-01 |
20150276870 | METHOD AND APPARATUS FOR PERFORMING STATE RETENTION FOR AT LEAST ONE FUNCTIONAL BLOCK WITHIN AN IC DEVICE - A method of performing state retention, for example during power gating, for at least one functional block within an integrated circuit device. The method comprises enabling at least one scan chain within the at least one functional block, scanning out a set of scan chain values from the at least one scan chain, a subset of the set of scan chain values comprising validation values, and writing the set of scan chain values to at least one memory element. The method further comprises retrieving the set of scan chain values from the at least one memory element, and validating the validation values within the retrieved set of scan chain values. | 2015-10-01 |
20150276871 | INTEGRATED CIRCUIT AND METHOD FOR ESTABLISHING SCAN TEST ARCHITECTURE IN INTEGRATED CIRCUIT - An integrated circuit and method for establishing scan test architecture in the integrated circuit is provided. The integrated circuit includes a plurality of circuit modules. Each circuit module includes a clock control unit, a first pipeline unit, a serialized compressed scan circuit and a second pipeline unit. The clock control unit generates a scan clock according to a test clock. The first pipeline unit converts a test input signal into first data according to the scan clock. The serialized compressed scan circuit generates second data according to the first data and the test clock. The second pipeline unit converts the second data into a test output signal according to the scan clock. The scan clock of each of the circuit modules is independent from the scan clocks of the other circuit modules, thereby reducing the difficulty and cost of timing analysis and adjustment. | 2015-10-01 |
20150276872 | DIGITAL IC SIMULATION - The present invention discloses a digital integrated circuit simulation method and simulator. The method comprises: obtaining a circuit diagram of the digital integrated circuit and a checkpoint in the circuit diagram; determining a point relevant to a boundary between a two-value simulation and a multi-value simulation in the circuit diagram and a state of the relevant point according to the checkpoint; determining a boundary position, as well as a boundary type of the boundary position, of the boundary between the two-value simulation and the multi-value simulation in the circuit diagram according to the relevant point and the state of the relevant point; inserting a conversion circuit at the boundary position according to the boundary type of the boundary position; and modeling and simulating the circuit diagram into which the conversion circuit is inserted. The method and simulator can reduce simulation time and the needed storage resources. | 2015-10-01 |
20150276873 | Test Circuits - Described herein is a feed forward equalizer that is configured to operate in a normal operational mode and in a test operational mode. The feed forward equalizer has an input port and an output port which are used for the normal operational mode. A test input port and a test output port are provided in the feed forward equalizer, and are used for the test operational mode. Buffers may be provided for matching the impedance of respective ones of the input, output, test input, and test output ports. The feed forward equalizer allows testing during development, and once mounted in an integrated circuit, without interfering with the normal operational mode. | 2015-10-01 |
20150276874 | METHOD AND APPARATUS FOR IMPROVING EFFICIENCY OF TESTING INTEGRATED CIRCUITS - A circuit, such as an integrated circuit or a die, has a first input pad configured to receive a multiplexed signal including scan data and a clock signal, a scan chain having a scan data input and a clock input and circuitry coupled between said first input pad and said scan chain. The circuitry is configured to extract the scan data and the clock signal from the received multiplexed signal, provide the extracted scan data to the scan data input of the scan chain, and provide the extracted clock signal to the clock input of the scan chain. | 2015-10-01 |
20150276875 | Method and Circuit Unit for Determining Fault States in a Half-Bridge Circuit - A method is disclosed for determining fault states in a half-bridge circuit having at least a first semiconductor switch and a second semiconductor switch are connected in series with one another and each controllable by a control signal to switch between an open and a closed switching state. For each of the first and second semiconductor switches, an actual switching state and a setpoint switching state are determined. A bridge short circuit in the half-bridge circuit is identified if both (a) the actual switching state of the first semiconductor switch is different than the setpoint switching state of the first semiconductor switch and (b) the actual switching state of the second semiconductor switch is different than the setpoint switching state of the second semiconductor switch. | 2015-10-01 |
20150276876 | GRID DATA PROCESSING METHOD AND APPARATUS - The present invention discloses a grid data record processing method and apparatus. The method comprising: acquiring influence parameters of lag time of an insulator on which flashover is occurred, the lag time being a time interval from the insulator flashover to tripping of a corresponding breaker in a substation is caused; determining the lag time according to the acquired influence parameters of the lag time and a lag time evaluation model; and determining trip-up records caused by the insulator flashover from grid data records according to the lag time. With the method and apparatus according to embodiments of the present invention, trip-up records caused by insulator flashover can be efficiently determined from grid data records. | 2015-10-01 |
20150276877 | Electric power system circuit breaker trip diagnostic - Disclosed herein are various systems and methods for monitoring the health of a circuit breaker. In various embodiments, a system may receive a voltage measurement across a trip coil assembly associated with a circuit breaker. The system may further receive a current measurement through the trip coil assembly. A plurality of transition points may be identified based on at least one of the voltage measurement and the current measurement, the plurality of transition points corresponding to at least one of a mechanical characteristic and an electrical characteristic of the circuit breaker during a trip event. A predictive analysis may be performed based at least in part on the plurality of transition points. An indication of the predictive health may be displayed. | 2015-10-01 |
20150276878 | INTERCONNECTION EVALUATION SYSTEM AND METHOD FOR SWITCHBOARD - An interconnection evaluation system according to the present disclosure includes a switchboard including at least one endpoint, at least one endpoint contact tester configured to transmit a digital input signal obtained from each endpoint, an automation tester configured to output a preset digital output signal to the switchboard, and to generate interconnection information at each endpoint by reflecting the digital output signal and digital input signal, and an interface unit configured to generate a switchboard status information of switchboard by reflecting the interconnection information. | 2015-10-01 |
20150276879 | METHOD FOR DIAGNOSING A SELF-BLOWOUT CIRCUIT BREAKER, AND DIAGNOSIS APPARATUS - For diagnosing a self-blast circuit breaker ( | 2015-10-01 |
20150276880 | SYSTEM AND METHOD FOR DETECTING, LOCALIZING, AND QUANTIFYING STATOR WINDING FAULTS IN AC MOTORS - A system and method for detecting, localizing and quantifying stator winding faults in AC electrical machines is disclosed. A diagnostic system configured to detect a stator winding fault in an AC electrical machine includes a processor programmed to receive measurements of three-phase voltages and currents provided to the AC electrical machine from voltage and current sensors associated with the electrical distribution circuit, compute positive, negative and zero sequence components of voltage and current from the three-phase voltages and currents, and calculate a fault severity index (FSI) based on at least a portion of the positive, negative and zero sequence components of voltage and current, wherein calculating the FSI further comprises identifying a voltage gain in one or more phases of the AC electrical machine due to a stator winding fault and localizing the stator winding fault to one or more phases in the AC electrical machine. | 2015-10-01 |
20150276881 | MODEL-INDEPENDENT BATTERY LIFE AND PERFORMANCE FORECASTER - A method includes determining parameters of a rechargeable battery during an effective power cycle of the rechargeable battery. The parameters include a current provided by the rechargeable battery, a voltage across the rechargeable battery, and a temperature of the rechargeable battery. The effective power cycle includes multiple charge operations and multiple discharge operations. The method includes estimating a remaining capacity of the rechargeable battery based on the current, the voltage, and the temperature. The method also includes generating an output indicating the remaining capacity. | 2015-10-01 |
20150276882 | MONITORING APPARATUS, MONITORING CONTROL APPARATUS, POWER SUPPLY APPARATUS, MONITORING METHOD, MONITORING CONTROL METHOD, POWER STORAGE SYSTEM, ELECTRONIC APPARATUS, MOTOR-DRIVEN VEHICLE, AND ELECTRIC POWER SYSTEM - A monitoring apparatus includes a first converter that converts first analog data indicating a voltage value of each of batteries into first digital data; and a second converter that converts second analog data indicating an electric current value flowing through the plurality of batteries into second digital data. The first analog data and the second analog data are data having the same timing. | 2015-10-01 |
20150276883 | RESISTANCE BASED METHOD AND SYSTEM TO ASSESS VEHICLE COMPONENT INTEGRITY - Example embodiments provide systems and methods for a vehicle component structural integrity assessment system, comprising a first connection and a second connection coupled to a conduction path, which is associated with a vehicle component. The conduction path has an initial resistance. A controller is configured to transmit a signal upon the detection of a change in the resistance of the conduction path from the initial resistance. | 2015-10-01 |
20150276884 | LITHIUM-ION SECONDARY BATTERY SYSTEM AND STATUS DIAGNOSTIC METHOD OF LITHIUM-ION SECONDARY BATTERY - The present invention is a lithium-ion secondary battery system having a lithium-ion secondary battery, potential measuring sections, a voltage applying section, an electric current measuring section, and a switching section. The lithium-ion secondary battery has a positive electrode reference electrode, a negative electrode reference electrode, a positive electrode, and a negative electrode; when the positive electrode reference electrode and the negative electrode reference electrode are connected with the switching section, an electric current when a voltage is applied between the positive electrode reference electrode and the negative electrode reference electrode with the voltage applying section is measured with the electric current measuring section; and when the positive electrode reference electrode and the positive electrode are connected and the negative electrode reference electrode and the negative electrode are connected with the switching section, the potentials of the positive electrode and the negative electrode are measured with the potential measuring sections. | 2015-10-01 |
20150276885 | Method of Computing State of Charge and Battery State of Charge Monitor - Disclosed herein are a method of computing an estimated SOC and a battery state of charge (SOC) monitor. An embodiment method for computing an estimated SOC includes periodically measuring a present battery current and a present battery voltage. A hysteresis compensation value is then computed based on a previous SOC, the present battery current, and the present battery voltage when a change in battery current exceeds a threshold. The estimated SOC is then determined based on the hysteresis compensation value and a baseline SOC determined based on the present battery voltage and the present battery current. | 2015-10-01 |
20150276886 | ADJUSTING CHARGE VOLTAGE ON CELLS IN MULTI-CELL BATTERY - A battery pack includes a plurality of cells. Two or more fuel gauges are associated with a voltage adjustable set of the plurality of cells. Each of the two or more fuel gauges is associated with one cell in the voltage adjustable set. Each of the two or more fuel gauges is configured to communicate cell capacity of the associated cell to a master controller. Two or more charge voltage controllers are associated with the voltage adjustable set. Each of the two or more charge voltage controllers is associated with one or more cells in the voltage adjustable set. Each of the two or more charge voltage controllers is configured to receive a signal from the master controller. Each of the two or more charge voltage controllers is configured to increase charge voltage on the associated one or more cells in response to receiving the signal. | 2015-10-01 |
20150276887 | METHOD AND APPARATUS OF ESTIMATING STATE OF HEALTH OF BATTERY - A method of estimating state of health (SOH) of a battery includes measuring an internal resistance (R) of the battery and calculating a voltage drop (ΔV) value by a relationship of ΔV=R×I, wherein the I value is equal to a preset current lower limit value at the available capacity of the battery. Then measuring an open circuit voltage (OCV) lower limit value by the ΔV value and obtaining a state of charge lower limit (SOC | 2015-10-01 |
20150276888 | IMPEDANCE MEASURING DEVICE FOR LAMINATED BATTERY - An impedance measuring device for outputs an alternating current to an impedance measurement object, the impedance measurement object including at least a laminated battery and computes an impedance of the laminated battery on the basis of an alternating current applied to the impedance measurement object and at least one of a positive-electrode side AC potential difference and a negative-electrode side AC potential difference. This device includes a filter configured to remove a signal with a frequency of an AC signal to the AC signal, the AC signal indicating the AC potential difference on one electrode side opposite to that of the AC potential difference used by impedance computation, and an adding unit configured to add a filtered signal to the AC signal, the filtered signal being a signal after passing through the filter, the AC signal indicating the AC potential difference used by impedance computation. | 2015-10-01 |
20150276889 | ELECTROCHEMICAL ANALYSIS APPARATUS AND ELECTROCHEMICAL SYSTEM - An electrochemical analysis apparatus includes a power controller, a Fourier transform unit, and a calculating unit. The power controller generates a rectangular-wave signal, a first frequency F and a duty ratio D, and applies the signal to an electrochemical cell. The Fourier transform unit performs Fourier transform on first data obtained by sampling a response signal of the cell to calculate a first frequency characteristic including a component of a second frequency integer times as high as the first frequency. The Fourier transform unit performs Fourier transform on second data, a sampling start time of which is (1/F)·D (seconds) different from the first data from which the first frequency characteristic is calculated, to calculate a second frequency characteristic including a component of the second frequency. The calculating unit calculates an impedance characteristic of the cell based on the first frequency characteristic and the second frequency characteristic. | 2015-10-01 |