Entries |
Document | Title | Date |
20080228441 | Method and Device for Measuring an Object for Measurement - The invention relates to a method and device for measuring an object for measurement, comprising at least one reference structure for the definition of an object coordinate system, fixed with relation to the object, by means of a measuring system, which comprises at least one sensor system for recording a contour of the object for measuring in a measurement coordinate system. According to the invention, the object for measurement is placed in a measuring position in the recording region of the sensor system, the position of the object coordinate system is fixed by means of the reference structure, the object coordinate system is linked to the measurement coordinate system, the sensor system is turned about a rotation axis relative to the object for measurement, in order to determine contour data and a processing of the contour data carried out in an analytical unit, taking into account the position of the object coordinate system. The invention further relates to an application for contour determination. | 09-18-2008 |
20080270070 | Methods and systems for computing gear modifications - A method of computing gear modifications from a gear inspection chart is provided. The method includes extracting a gear profile from the gear inspection chart. The method also includes quantifying the gear profile. The method also includes determining a gear modification based on a quantified gear profile. The method also includes qualifying a gear based on the gear modification. | 10-30-2008 |
20080306709 | Adaptive 3D Scanning - The present invention relates to adaptive 3D scanning wherein a scan sequence for obtaining full geometrical coverage of a physical object are created automatically and specifically for the physical object, by using a method and a system for producing a 3D computer model of a physical object, wherein the method comprises the following steps providing a scanner system, said scanner system comprising a scanner, and a computer connectable to and/or integrated in said scanner, said computer comprising a virtual model of said scanner, entering shape information of the physical object into the computer, creating in said computer a visibility function based on said virtual model and the shape information, said visibility function being capable of evaluating the coverage of areas of interest of the physical object by at least one predetermined scan sequence, establishing at least one scan sequence based on the evaluation of the visibility function, performing a scan of the physical object using said at least one scan sequence, and obtaining a 3D computer model of the physical object. | 12-11-2008 |
20080312868 | Complete Round Working Method and Complete Round Working Device in Nc Machine Tool - A working route ( | 12-18-2008 |
20090012743 | Surface Measurement Instrument - A surface measurement instrument ( | 01-08-2009 |
20090063092 | Pin Array Locking Mechanism - A pin array includes a plurality of pins arranged in an array; and one or more flexible tubes in contact with each of the pins such that, when pressurized, each of the flexible tubes applies pressure to sides of the pins to prevent further movement of the pins. A method of locking a pin array that includes a plurality of pins arranged in an array; and one or more flexible vessels in contact with each of the pins, the method comprising controlling a pressure of a fluid in the flexible vessels to selectively allow or prevent movement of the pins with respect to the flexible vessels. | 03-05-2009 |
20090063093 | Method and apparatus for surveying actual measurement data of a component - An improved method for surveying actual measurement data of a component, which originate from an optical scan, is characterized in that the actual measurement data ( | 03-05-2009 |
20090070068 | Surface profile measuring apparatus - A surface profile measuring apparatus of the invention has a changing section for changing the cross section of a flux of light to be projected onto a sample by a light projecting section in measuring a surface profile of the sample. The surface profile measuring apparatus having the above arrangement enables to measure the surface profile of the sample easily and precisely, without using different kinds of measuring apparatuses. | 03-12-2009 |
20090076772 | Footbeds and a Method and Apparatus for Producing Such Footbeds - A method and apparatus for supplying a customer with a footbed. A kiosk provides measurements of a consumer's feet with a self-guided display by using both pressure measurements and scanning of the feet. The measurement information is converted to identify which of the preselected and stocked components proximate the kiosk can be combined to provide an appropriate footbed for the consumer. | 03-19-2009 |
20090112511 | METHOD FOR MEASURING A SELECTED PORTION OF A CURVED SURFACE OF AN OBJECT - A computer-implemented method for measuring a selected portion of a curved surface of an object is disclosed. The method includes the blocks of displaying a straight-line across an object, stretching the straight-line to form a plane, determining intersection points between the plane and the curved surface of the object, determining a vertical point of each point-cloud around the straight-line on the curved surface, a corresponding vertical distance, and a corresponding normal vector, projecting the vertical points onto the plane vertically, determining measured points, up tolerance points, and down tolerance points for the point-clouds around the straight-line on the plane, connecting the corresponding points to lines, and determining if one or more the dimensions of a selected portion around the straight-line of the object is acceptable according to the connected lines. | 04-30-2009 |
20090112512 | METHOD OF MEASURING WARPAGE OF REAR SURFACE OF SUBSTRATE - A method of measuring warpage of a rear surface of a substrate includes a substrate detection step, a best fit plane calculation step, and a warpage calculation step. Further, the method of measuring warpage of a rear surface of a substrate can further includes after the substrate detection step and before the best fit plane calculation step: a noise removal step and an outer peripheral portion removal step; the outer peripheral portion removal step and a smoothing step; or the noise removal step, the outer peripheral portion removal step, and the smoothing step. Thereby, a method of measuring warpage of a rear surface with a high surface roughness of a substrate can be provided. | 04-30-2009 |
20090138234 | Impression foam digital scanner - This disclosure provides for an impression scanner system having improved calibration having a housing and a calibration plate of known geometry. The calibration plate has a plurality of different shapes thereon. The system also has a radiation source for emitting radiation towards the shapes on the plate and a surface for reflecting images created by the radiation on the shapes. A sensor for receiving the images of the shapes as the plate moves relative to the housing is also provided. A processor compares known geometry of the plate to the images received by the sensor and calibrates the sensor based upon the known geometry and images to reduce system aberration and distortion | 05-28-2009 |
20090171622 | DISTORTION EVALUATING APPARATUS AND DISTORTION EVALUATING METHOD - A distortion evaluating apparatus which can quantitatively evaluate distortion in a measurement object surface is provided. A distortion evaluating apparatus evaluates distortion based on three-dimensional measurement data obtained from a measurement object surface. The apparatus includes a secondary differential component adapted for effecting a secondary differential operation on two-dimensional measurement data of a cross section of the measurement object surface indicative of unevenness therein, thus obtaining curvature data of the cross section, a permissible range setting component adapted for setting a permissible range for the curvature data, based on range of an upper limit value and a lower limit value from a reference value, and a distortion data extracting component adapted for extracting a portion of the curvature data exceeding the set permissible range as distortion data indicative of the distortion in the cross section. | 07-02-2009 |
20090182528 | ANALYZING SURFACE STRUCTURE USING SCANNING INTERFEROMETRY - A method includes comparing a scanning interferometry signal obtained for a location of a test object to each of multiple model signals corresponding to different model parameters for modeling the test object, wherein for each model signal the comparing comprises calculating a correlation function between the scanning interferometry signal and the model signal to identify a surface-height offset between the scanning interferometry signal and the model signal and, based on the identified surface-height offset, calculating a height-offset compensated merit value indicative of a similarity between the scanning interferometry signal and the model signal for a common surface height. The method further includes, based on the respective merit values for the different model signals, determining a test object parameter at the location of the test object. | 07-16-2009 |
20090216486 | Method for measuring three-dimension shape - A method of measuring a 3D shape, which can measure a 3D shape of target objects on a board by searching a database for bare board information when a measuring object is not set to a normal inspection mode or by performing bare board teaching when the board is supplied from a supplier having not the bare board information is provided. The method of measuring a 3D shape includes operation S | 08-27-2009 |
20090254305 | METHOD OF EVALUATING OPTICAL PERFORMANCE OF OPTICAL SYSTEM - A method of evaluating an optical performance of an optical system comprises a locating step of locating a plurality of circular regions in an evaluated region on an optical element included in the optical system, a fitting step of fitting a polynomial to surface shape data representing a surface shape of the optical element in each of the plurality of circular regions, and a calculation step of calculating the optical performance of the optical system based on the fitting result obtained in the fitting step in each of the plurality of circular regions. | 10-08-2009 |
20090259435 | Roundness Measuring Instrument and Method of Determining Quality of Tip Head - To realize a roundness measuring instrument of which the measurement precision when there is eccentricity has been improved. The instrument comprises a mount base | 10-15-2009 |
20090276181 | Method of Measuring an Anisotropic Surface Diffusion Tensor or Surface Energy Anisotropies - The invention relates to a method for the determination of the diffusion tensor anisotropy or the surface energy anisotropy that does not require the formation of particular structures, and enables this type of determination to be performed in the case of moderate-amplitude perturbations. | 11-05-2009 |
20090306930 | Method and system for measuring a component - A method for measuring the profile of a component in the region of an edge of the component comprises the following steps: determining the position of an edge point of the component; defining a centre line for the component in the region of the edge; and measuring at least one dimension of the component with reference to the centre line. | 12-10-2009 |
20090306931 | SHAPE MEASUREMENT METHOD OF SYNTHETICALLY COMBINING PARTIAL MEASUREMENTS - Coordinate transformation parameters are adopted at the time of synthetically combining partial measurement data so as to eliminate the setting error that can get in when a workpiece is set in position on a measuring machine. Then, a shape parameter is adopted to estimate the approximate error shape of the entire workpiece and the approximate error shape is removed from the measurement data. As a result, the residuals are reduced if the measurement data are those of three-dimensional sequences of points. Differences are small when small residuals are compared so that the mismatch is reduced. According to the present invention, the entire measurement data can be synthetically combined without using the conventional concept of overlap. | 12-10-2009 |
20090319224 | METHOD FOR CHARACTERISING THE PROFILE OF A SURFACE - A method for characterising the surface profile of a component comprises the steps of a) dividing the surface into at least two regions; b) for each region, measuring the surface and selecting a number of measured points to define a co-ordinate dataset for the region; c) for each region, applying a curve-fitting algorithm to the dataset for the region to define the surface profile of the region; d) combining the defined surface profiles for the regions to produce a defined surface profile for the aerofoil surface. The characterisation may be used in the design, analysis and manufacturing steps of product development, thereby decreasing the total time and work required. | 12-24-2009 |
20100023299 | ANALYSIS APPARATUS - An analysis apparatus includes an assignor assigning a physical property value corresponding to the kind of a material to each of regions formed by dividing a structural data representing a structure of a multilayer substrate, a determiner determining whether or not the each of the region belongs to a predetermined region in a layer of a predetermined kind, and a physical property value changer changing the physical property value of the region belonging to a predetermined region in a layer of a predetermined kind. | 01-28-2010 |
20100042363 | Imaging optics designed by the simultaneous multiple surface method - One embodiment of a method of calculating an optical surface comprises calculating a meridional optical line of the surface. A ray is selected that passes a known point defining an end of a part of the optical line already calculated. The optical line is extrapolated from the known point to meet the ray using a polynomial with at least one degree of freedom. The polynomial is adjusted as necessary so that the selected ray is deflected at the extrapolated optical line to a desired target point. The polynomial is added to the optical line up to the point where the selected ray is deflected. The point where the selected ray is deflected is used as the known point in a repetition of those steps. | 02-18-2010 |
20100070236 | BOLUS FOR RADIOTHERAPHY AND METHOD FOR DETERMINING THE SHAPE OF ONE SUCH BOLUS - A bolus that is intended to be irradiated during radiotherapy. Advantageously, the bolus is made from a polyurethane gel. | 03-18-2010 |
20100094589 | METHOD OF CORRECTING THE SHAPE OF A SENSED CURVE APPROXIMATING A LONGITUDINAL TRACE OF A BEZEL OF AN EYEGLASS FRAME, AND A METHOD OF ACQUIRING THE SHAPE OF AN OUTLINE OF SUCH A BEZEL - The correction method includes searching for one or more anomalous zones (S | 04-15-2010 |
20100106455 | STRAIGHTNESS MEASURING METHOD AND STRAIGHTNESS MEASURING APPARATUS - Distances from three displacement meters arranged in a first direction to three measuring points arranged along a measurement line that extends in the first direction on a surface of an object to be measured are measured while a movable body, which is either the three displacement meter or an objet to be measured, is moved in the first direction relative to a stationary body, which is the other one. Solution candidates are determined which are defined by two profiles among a surface profile along the measurement line, a profile of locus curve which is the locus a reference point fixed to the movable body, and a profile of a pitching component accompanied with the movement of the movable body. One candidate solution with the highest fitness is extracted by applying a genetic algorithm using a fitness function defined on the basis of the other profile. | 04-29-2010 |
20100121606 | Measuring of geometrical parameters for a wind turbine blade - This invention relates to methods for measuring geometrical parameters of a wind turbine blade, the method comprising placing a surveying instrument with a view to the root of the blade and measuring the blade. Methods are described for measuring parameters such as the blade length, the blade bending, the twist and the alpha-angle of the blade. This is accomplished by the use of a surveying instrument by which is measured a number of points or markings on the root of the blade, the blade tip and/or some reference markings on the blade. The invention further relates to the use of a surveying instrument for measuring and/or marking geometrical parameters on a wind turbine blade and for measuring deformations of a wind turbine blade. | 05-13-2010 |
20100161273 | APPARATUS FOR AND A METHOD OF DETERMINING SURFACE CHARACTERISTICS - A coherence scanning interferometer ( | 06-24-2010 |
20100169042 | SYSTEM FOR MEASURING A SHAPE, METHOD FOR MEASURING A SHAPE, AND COMPUTER PROGRAM PRODUCT - A system for measuring a shape, includes an external storage unit storing tolerances of first and second shape factors defining a design shape of a measuring object; a first measuring tool measuring the first shape factor of the measuring object to obtain measurement data; and a measurement processing unit determining a shape of the measuring object. The measurement processing unit includes; a comparison module comparing the measurement data of the first shape factor with the tolerance of the first shape factor; a verification module composing a predicted shape using the measurement data and verifying whether the predicted shape is formed as a figure; a calculation module calculating predicted data of the second shape factor from the predicted shape; and a determination module determining a measurement shape by comparing the predicted data with the tolerance of the second shape factor. | 07-01-2010 |
20100241396 | THREE DIMENSIONAL IMAGING - A method and apparatus are disclosed for providing image data for constructing an image of a region of a three dimensional target object. The method includes the steps of providing incident radiation, via at least one detector detecting an intensity of radiation scattered by the target object, repositioning incident radiation relative to the target object, subsequently detecting the intensity of radiation scattered by the target object, determining a probe function indicating an estimate of at least one characteristic of the incident radiation at one or more depths of the object and providing image data from which an image of one or more regions of the object may be constructed via an iterative process using the probe function. | 09-23-2010 |
20100274525 | Laser Scanning Measurement Systems And Methods For Surface Shape Measurement Of Hidden Surfaces - Laser scanning measurement systems and methods are disclosed that allow for surface shape measurements of otherwise hidden portions of an object's surface. The system includes a laser system that scans a laser beam over a scan path, a photodetector that detects light reflected from the object's surface, and a processor adapted to process detector signals from the photodetector to determine a two-dimensional (2D) surface shape representation and a three-dimensional (3D) surface shape profile representation. The system includes a mirror(s) configured to direct the scanned laser beam to one or more portions of the object surface that cannot be directly irradiated by the laser, and that allows the photodetector to detect light reflected from the one or more hidden portions via the mirror(s). The laser scanning measurement system is able to measure, in a single laser beam scan, some or all of the hidden portion(s) of an object rather having to rotate the object or having to use multiple scanned laser beams or multiple scanning systems. | 10-28-2010 |
20100299103 | THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS, THREE DIMENSIONAL SHAPE MEASUREMENT METHOD, AND COMPUTER PROGRAM - A 3D shape measurement apparatus for measuring a 3D shape of an object existing on a measurement area, comprising, a pattern projection unit for projecting a pattern having a periodicity onto the measurement area, and a capturing unit for capturing an image of the area where the pattern is projected, wherein the measurement area is specified by a reference plane, a projection area of the pattern projection unit, and a capturing area of the capturing unit, and the pattern projection unit projects the pattern to be focused on the reference plane. The apparatus further comprises a first calculation unit for calculating phase information of a pattern of the captured image, a second calculation unit for calculating defocus amounts of the pattern in the captured image, and a third calculation unit for calculating a 3D shape of the object based on the phase information and the defocus amounts. | 11-25-2010 |
20110060552 | Measuring Apparatus, Measuring Coordinate Setting Method and Measuring Coordinate Number Calculation Method - With little cost and time, this invention makes high-precision measurements over an entire surface of a substrate to check how well devices are fabricated. The devices include integrated circuits, magnetic heads, magnetic discs, solar cells, optical modules, light emitting diodes and liquid crystal display panels—the ones that are fabricated on a substrate by repetitively performing deposition, resist application, exposure, development and etching. The method of this invention involves inputting multipoint measured data and a number of points used for measurement and calculating measuring coordinates by the measuring coordinate calculation program | 03-10-2011 |
20110071790 | UNMOLDABILITY DETERMINATION APPARATUS, COMPUTER READABLE MEDIUM, AND UNMOLDABILITY DETERMINATION METHOD - An unmoldability determination apparatus includes: a normal line calculation unit that calculates a normal line extending from a point on each of surfaces constituting a three-dimensional shape of a molded product; an opposite direction component determination unit that determines whether or not the normal line calculated on each surface has an opposite direction component which is a directional component opposite to a mold release direction of a mold of the molded product prescribed for the each surface; a reach determination unit that, when a surface having a point at which the normal line having the opposite direction component is calculated is a projection surface, determines whether or not there is another surface on the molded product which one of a line extending from the projection surface in the mold release direction and a line extending in a direction opposite to the mold release direction reaches; and an unmoldability determination unit that, when there is another surface which both of the line extending from the projection surface in the mold release direction and the line extending in the direction opposite to the mold release direction reaches, determines the projection surface to be unreleasable from the mold only by movement of the mold in the mold release direction, thus determining the projection surface to be unmoldable. | 03-24-2011 |
20110087457 | SURFACE MEASUREMENT, SELECTION, AND MACHINING - Systems, processes, articles of manufacture, and techniques may be used to determine a machining shape for a surface to be machined. In particular implementations, determining a machining shape may include retrieving stored surface measurements for a surface to be machined, the measurements representing the surface at a plurality of points for each of a number of measurement locations on the surface, and analyzing the measurements to determine a shape to which the surface should be machined. Determining a machining shape may also include determining the surface that may be achieved by machining to the determined shape, analyzing the determined surface to determine whether it is acceptable, and storing the determined shape based on whether the determined surface is acceptable. | 04-14-2011 |
20110098971 | FORM MEASURING DEVICE AND METHOD OF ALIGNING FORM DATA - A form measuring device includes: a measuring unit configured to detect a height at each position in a reference axis direction of a measured object and measure a cross-sectional form of the measured object; and an arithmetic unit configured to synthesize a plurality of form measurement data, obtained by repeated measurements of the form of the same measured object by the measuring unit, and calculate synthesized form measurement data. In the synthesis of the form measurement data, the arithmetic unit is configured to calculate shift amounts in the reference axis direction and a height direction of the form measurement data with respect to the synthesized form measurement data and align the form measurement data in the reference axis direction and the height direction based on the calculated shift amount. | 04-28-2011 |
20110106492 | WAIST BELT FOR AUTOMATICALLY MEASURING WAIST CIRCUMFERENCE - Provided is a waist belt for automatically measuring a waist circumference. The waist belt includes a belt part ( | 05-05-2011 |
20110112796 | Curvature-Based Edge Bump Quantification - Evaluating irregularities in surfaces of objects such as semiconductor wafers using a thickness profile of a surface section and analyzing the profile to obtain information of an irregularity start position, magnitude, and span along with surface slope and height information. | 05-12-2011 |
20110144943 | Localized Substrate Geometry Characterization - A system for evaluating the metrological characteristics of a surface of a substrate, the system including an optical substrate measurement system, a data analyzing system for analyzing data in an evaluation area on the substrate, applying feature-specific filters to characterize the surface of the substrate, and produce surface-specific metrics for characterizing and quantifying a feature of interest, the surface-specific metrics including a range metric for quantifying maximum and minimum deviations in the evaluation area, a deviation metric for quantifying a point deviation having a largest magnitude in a set of point deviations, where the point deviations are an amount of deviation from a reference plane fit to the evaluation area, and a root mean square metric calculated from power spectral density. | 06-16-2011 |
20110184695 | MEASUREMENT METHOD - This invention relates to a method for measuring a feature of an object that comprises obtaining a representation of at least the feature on the object by acquiring multiple data points via surface measurement of at least the feature. A model substantially replicating at least the feature of the object is fitted to the representation. The model comprises parameters defining at least two independently alterable portions that are linked at a common point. The fitting comprises changing the form of the model by altering at least one of the at least two independently alterable portions. The method also comprises obtaining information regarding at least the feature from the fitted model. | 07-28-2011 |
20110208477 | MEASURING METHOD OF PATTERN DIMENSION AND SCANNING ELECTRON MICROSCOPE USING SAME - Provided is a technology of performing more highly accurate semiconductor inspection by detecting a pattern edge which does not contribute as a mask in an etching step and measuring a pattern without including such edge at the time of calculating dimensions. Since a pattern portion having a protruding shape is to be removed at the time of etching, a scanning electron microscope image is acquired such that the protruding edge not functioning as a mask is to be excluded at the time of calculating dimensions in pattern inspection. Then, the shape of the pattern edge is calculated, the portion of the protruding edge is corrected, and pattern dimensions mainly obtained from recessed edges are calculated. | 08-25-2011 |
20110218762 | SYSTEMS AND METHODS FOR WAFER EDGE FEATURE DETECTION AND QUANTIFICATION - Disclosed herein is a method to enhance detection and quantification of features in the wafer edge/wafer roll off regions. Modifications and improvements have been made to earlier methods which enable improved accuracy and increased scope of feature detection. | 09-08-2011 |
20110218763 | TOLERANCE DETECTION METHOD AND TOLERANCE DETECTION DEVICE FOR SHAPE MEASURING APPARATUS - When detecting a tolerance of a shape of a measured object having a complicated shape that makes it difficult to perform a continued measurement, a plurality of partial measurement data that are set are retrieved. Next, a reference position is set from first partial measurement data. Then, each of the partial measurement data is combined into one data using the reference position. Further, the tolerance is calculated using the combined data. | 09-08-2011 |
20110301915 | SURFACE PROFILE EVALUATION - A method and system for accepting or rejecting a curved surface of a body under evaluation involves conducting a comparison between the curvature of a surface profile for the surface under evaluation and higher and lower curvature tolerance boundaries. The higher and lower curvature tolerance boundaries are determined from a desired surface profile. The curvature at a plurality of locations on the curve profile under evaluation may be defined with reference to a geometric variable for said curved surface and may be plotted on a graph. The higher and lower curvature tolerance boundaries may also be plotted on the graph so as to determine whether the plot of curvature for the surface under evaluation falls within the bounds of the higher and lower tolerance boundaries. | 12-08-2011 |
20120010850 | MEASUREMENT APPARATUS AND METHOD - A measurement apparatus comprises a measurement head including a detector which detects an interference light between test light and reference light and a processing unit. The processing unit calculates an optical path length difference between the reference light and the test light from the detected interference light, calculates a test wavefront and a reference wavefront based on a nominal value of a shape of the surface to be measured and optical information of an optical component in the measurement head, calculates a wavefront difference, calculates a phase error, corrects the calculated optical path length difference based on the calculated phase error, calculates a distance between the reference point and the surface to be measured, and calculates the shape of the surface to be measured, based on the calculated distance between the reference point and the surface to be measured, and coordinates of the reference point. | 01-12-2012 |
20120022829 | METHOD FOR IDENTIFYING A PIECE OF WOOD AMONGST A PLURALITY OF STARTING PIECES OF WOOD AND/OR FOR DETERMINING ITS ROTATION WITH REFERENCE TO A KNOWN LAYOUT - A method for identifying a piece of wood amongst a plurality of starting pieces of wood comprises the operating steps of:
| 01-26-2012 |
20120041714 | SEMICONDUCTOR HEAT TREATMENT MEMBER HAVING SIC FILM - A semiconductor heat treatment member having a CVD-SiC film, which can reduce the frequency of cleaning steps and significantly improves the throughput of wafer process, is provided. | 02-16-2012 |
20120089364 | THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREMENT METHOD, AND COMPUTER-READABLE MEDIUM STORING CONTROL PROGRAM - A three-dimensional measurement apparatus includes a projection unit configured to project a plurality of types of stripe pattern light. The projection unit projects stripe pattern light, which can be obtained by shifting stripe pattern light whose reliability calculated by the calculation unit is equal to or greater than a threshold value by a predetermined cycle, on the object. | 04-12-2012 |
20120089365 | DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRUCTURES - A method includes fitting a function to a subset of reflectivity data comprising values for the reflectivity of a test object for different wavelengths, different scattering angles, and/or different polarization states; determining values for the function at certain wavelengths and scattering angles and/or polarization states; and determining information about the test object based on the determined values. | 04-12-2012 |
20120123736 | SYSTEM FOR RAPID ASSESSMENT OF GRADE VARIATIONS AND METHOD FOR USING A SYSTEM - A system for estimating or calculating grade variations of a ground surface is provided that is convenient to use and provides data of sufficient precision for the estimating or calculating process. The system can be deployed for estimating or calculating grade variations in connection with the placement and installation of fences, gates, pools, drainage, steps, decks, patios, contour features, ponds, driveways, and other site improvements. In addition to a deployment of the system to quickly establish and/or verify elevations of outdoor features, the system can be deployed to quickly establish and/or verify elevations in a building structure for installing cabinets, countertops, or alternating current outlets. | 05-17-2012 |
20120158357 | MEASUREMENT METHOD AND MEASUREMENT APPARATUS - The present invention provides a measurement method of measuring a surface shape of a measurement target surface including an aspherical surface by using a measurement apparatus including an optical system which guides a light from the measurement target surface to a detection unit having a detection surface, including a step of converting, into coordinates on the measurement target surface by using a coordinate conversion table, coordinates on the detection surface that indicate positions where light traveling from the measurement target surface enters the detection surface, and a step of converting, by using an angle conversion table, angle differences between angles of light reflected by a reference surface and angles of light reflected by the measurement target surface at the respective coordinates on the detection surface into angle differences at a plurality of respective coordinates on the measurement target surface that correspond to the respective coordinates on the detection surface. | 06-21-2012 |
20120158358 | THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD AND THREE-DIMENSIONAL SHAPE MEASUREMENT SYSTEM - An object to be measured is measured with marks formed on a platen surface with the object to be measured mounted thereon. At least three or more marks are formed on the platen surface. The marks are formed so as to uniquely determine a combination of sizes of at least three marks arbitrarily selected and intervals between the marks. Coordinate values representing three-dimensional shapes at first and second portions of the object are converted respectively to coordinate values based upon a reference coordinate system identified by the marks. The coordinate values determined after the conversion are synthesized, so that data on the entire three-dimensional shape of the object is obtained. | 06-21-2012 |
20120191411 | SHAPE MEASUREMENT METHOD FOR COMBINING PARTIAL MEASUREMENTS - The present invention provides a stitch measurement method for making a plurality of partial measurements, and obtaining an overall shape by combining partial measurement results, including a step of dividing, on lattices, each peripheral partial measurement region including an external portion of an overall measurement region into a first region inside the overall measurement region and a second region outside the overall measurement region, and dividing each central partial measurement region which does not include any external portion of the overall measurement region into a first region and a second region according to division patterns of the peripheral partial measurement region, a step of formulating first orthogonal function sequences on the first regions, and a step of defining linear combinations of respective functions of the first orthogonal function sequences on the first regions as first system errors for the respective partial measurement regions on the overall measurement region. | 07-26-2012 |
20120232840 | SHAPE MEASUREMENT DEVICE AND SHAPE MEASUREMENT METHOD - A MOCVD device (shape measurement device) of the present invention measure including the shape of measurement object with use of a mobile platform (rotating table) for moving a substrate, that is, the measurement object, velocity measuring means ( | 09-13-2012 |
20120232841 | INTELLIGENT AIRFOIL COMPONENT GRAIN DEFECT INSPECTION - A system including a positioning system with a component manipulator structured to position a component in response to a positioning algorithm; a scanning system capable of producing a set of light waves directed at a surface of the component, detecting a set of reflected light waves from the surface of the component, and producing a reflectivity data set in response to the set of reflected light waves; and a microprocessor structured to apply a fuzzy logic algorithm to the reflectivity signal to determine a solution set and produce a grain structure characterization in response to the solution set. | 09-13-2012 |
20120253741 | CHECKING POSITIONAL ACCURACY OF FEATURES - A component such as a casing of a gas turbine engine has an array of holes distributed around a flange. The casing may distort when unsupported, but nevertheless the position accuracy of the holes may be checked by manipulating measured hole positions to lie with known deviations from a best-fit circle. The maximum load and stress required to bring the hole array into conformity with the best-fit circle is calculated and compared with a predetermined maximum. The deviation of the hole positions associated with the best-fit circle from nominal positions can also be calculated. | 10-04-2012 |
20120271591 | Thin Films And Surface Topography Measurement Using Reduced Library - The properties of a surface of an object in presence of thin transparent films are determined by generating a library of model signals and processing a measurement signal via searching the library to evaluate films properties and topography. The library may be reduced with principal component analysis to enhance computation speed. Computation enhancement may also be achieved by removal of the height contributions from the signal leaving only the film contribution in the signal. The film measurement signal is compared to a library of film signals to determine the film parameters of the sample. The library of film signals is produced by processing each full signal in a library to similarly remove the height contributions leaving only the film contributions. Additionally, a post-analysis process may be applied to properly evaluate local topography. | 10-25-2012 |
20120278035 | SURFACE MEASUREMENT INSTRUMENT AND METHOD - A method of characterising the surface of an aspheric diffractive structure includes using a metrological apparatus to perform a measurement on the surface of the structure so as to provide a measurement profile representing the z-direction deviations of the surface of the structure; determining parameters relating to the aspheric and diffractive components of the aspheric diffractive structure; producing data having the determined parameters; and comparing the produced data with the measurement profile to determine residual error data. | 11-01-2012 |
20120278036 | THREE-DIMENSIONAL MEASUREMENT METHOD BASED ON WAVELET TRANSFORM - A new three-dimensional measurement method based on wavelet transform to solve the phase distribution of a fringe pattern accurately and obtain three-dimensional profile information of a measured object from phase distribution. The method includes: projecting a monochrome sinusoidal fringe pattern onto the object; performing wavelet transform for the deformed fringe pattern acquired with CCD line by line, solving the relative phase distribution by detecting the wavelet ridge line, recording the wavelet transform scale factors at the line, and creating a quality map; dividing the relative phase distribution into two parts according to the map, and performing direct-phase unwrapping for the part with better reliability using a scan line based algorithm, and unwrapping the part with lower reliability using a flood algorithm under the guide of the quality map, to obtain the absolute phase distribution of the fringe pattern; obtaining the three dimensional information using a phase-height conversion. | 11-01-2012 |
20120290260 | METHOD FOR GENERATING ERROR IMAGE AND PROGRAM FOR GENERATING ERROR IMAGE - A point group on a surface parametric space of free-form surface data corresponding to a measurement points is calculated as a first point group. Error data between each of measurement points and design points is calculated. The first point group is triangulated to generate first triangular facets and calculate a convex hull of the first point group. A second point group distributed in the calculated convex hull on the surface parametric space is set. Error data of the second point group is obtained from error data corresponding to the first point group. A point group including the first point group and the second point group is re-triangulated to generate a second triangular facets. | 11-15-2012 |
20120330609 | METHOD OF MEASURING A DEVIATION OF AN OPTICAL SURFACE FROM A TARGET SHAPE - A method of measuring a deviation of an optical surface from a target shape and a method of manufacturing an optical element. The method of measuring the deviation includes:—performing a first interferometric measurement using a first diffractive measurement structure, which is arranged to cover a first area of the optical surface, to provide a first interferometric measurement result,—performing a second interferometric measurement using a second diffractive measurement structure, which is arranged to cover a second area of the optical surface different from the first area, to provide a second interferometric measurement result, and—determining a deviation of the optical surface from the target shape. | 12-27-2012 |
20130013252 | LIGHT-EMITTING DEVICE, DISPLAY APPARATUS, AND METHOD FOR DESIGNING REFLECTIVE MEMBER - A backlight unit has a printed circuit board, a plurality of light-emitting portions each including a base, an LED chip, and a lens, and a reflective member surrounding the light-emitting portion. An area δ of a figure defining the contour of the reflective member as planarly viewed in an optical-axis direction parallel to an optical axis of the LED chip is determined on the basis of γ×β/α in which a quantity of light which exits through the transmitting region of the lens is represented by α, a quantity of light which exits through the entire surface of the lens is represented by β, and an area of the lens as planarly viewed in the optical-axis direction is represented by γ. | 01-10-2013 |
20130013253 | SYSTEM, METHOD, AND PROGRAM FOR PREDICTING PROCESSING SHAPE BY PLASMA PROCESS - A system, a method, and a program for predicting a processing shape by a plasma process by which a process state is measured on a realtime basis based on the result of which the processing shape is predicted. The system includes an apparatus condition DB | 01-10-2013 |
20130024158 | MEASUREMENT METHOD, MEASUREMENT APPARATUS, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM, AND OPTICAL ELEMENT FABRICATION METHOD - The present invention provides a method of measuring a shape of a target surface, including a step of obtaining shape data by causing a stage which holds the target surface to rotate the target surface about a rotation axis, positioning each of a plurality of partial regions of the target surface in a field of view of a measurement apparatus, and causing the measurement apparatus to measure each of the plurality of partial regions, a step of obtaining, for each of a plurality of partial contour regions, a central position of the target surface using data of a contour included in the shape data, and a step of obtaining, based on the obtained plurality of central positions, a position of the rotation axis of the target surface in positioning each of the plurality of partial regions. | 01-24-2013 |
20130030758 | SHAPE MEASUREMENT DEVICE FOR MACHINE TOOL WORKPIECE - Disclosed is a shape measurement device for a machine tool workpiece that is capable of measuring in a short period of time in comparison to cases using a high precision sensor exclusively and is capable of measuring a prescribed spot with high precision, which is equipped with a wide range sensor ( | 01-31-2013 |
20130054192 | METHOD AND DEVICE FOR MEASURING FREEFORM SURFACES - An optical measuring instrument for measuring aspheric surfaces includes an optical measuring arm and a multi-axis drive platform. The optical measuring arm provides for illuminating and imaging the aspheric surfaces. The multi-axis drive platform relatively moves the optical measuring arm with respect to the aspheric surfaces through a plurality of subaperture measurement positions. A focus of adjustable focusing optic is maintained at a nominal center of curvature of the aspheric surfaces. A variable optical aberrator adds aberration to an illumination wavefront to match the illumination wavefront to the intended local shape of the aspheric surface. Fitted low-frequency shape information is distinguished from a remainder of the local shape information yielding mid-frequency topographic measurements of the subapertures, which can be assembled to construct a profile measurement of the aspheric surface. | 02-28-2013 |
20130054193 | MEASUREMENT OF THE SURFACE SHAPE MAP OF FLAT AND CURVY OBJECTS, INDEPENDENT OF RELATIVE MOTIONS - A plurality of distance sensors are used to measure the surface shape map of objects in the presence of relative motions between the object and sensor in the measurement directions of the sensors. The method involves making multiple sequential measurements from a group of sensors while the object moves longitudinally relative to the sensors. The central idea of the invention is the observation that surface shape features appear in delayed sequence as the observed surface moves longitudinally relative to the sensor array, while any relative motions in the measurement directions appear simultaneously at all sensors. Mathematical procedures are used to identify the relative motions from within the measurements. These motions are then subtracted from the sensor reading to determine the surface shape map of the measured object. The invention can be applied to many different measurement types, including surface shape measurement of one- or multiple-sided generally flat objects, and surface shape measurement of more general three-dimensional objects. | 02-28-2013 |
20130096876 | METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STRUCTURES - A method and system are presented for use in characterizing properties of an article having a structure comprising a multiplicity of sites comprising different periodic patterns, where method includes providing a theoretical model of prediction indicative of optical properties of different stacks defined by geometrical and material parameters of corresponding sites, said sites being common in at least one of geometrical parameter and material parameter; performing optical measurements on at least two different stacks of the article and generating optical measured data indicative of the geometrical parameters and material composition parameters for each of the measured stacks; processing the optical measured data, said processing comprising simultaneously fitting said optical measured data for the multiple measured stacks with said theoretical model and extracting said at least one common parameter, thereby enabling to characterize the properties of the multi-layer structure within the single article. | 04-18-2013 |
20130103346 | MEASUREMENT METHOD - The present invention provides a measurement method of measuring a shape of a surface to be measured having an outer shape of a regular hexagon, including a first step of setting, on the surface to be measured, a plurality of partial regions having an identical outer shape of a parallelogram to cover the entire surface to be measured, a second step of measuring surface shapes of the respective partial regions by a measurement apparatus to obtain measurement data of the respective partial regions, and a third step of connecting the measurement data of the respective partial regions to calculate the shape of the surface to be measured, wherein the parallelogram has internal angles of 120° and 60°, and a maximum length of one side is not larger than a length of one side of the regular hexagon. | 04-25-2013 |
20130110461 | COMPUTING DEVICE AND METHOD FOR GENERATING MEASUREMENT PROGRAM OF PRODUCT | 05-02-2013 |
20130116972 | METHOD FOR ESTIMATING ROAD SURFACE CONDITION - A method capable of estimating a snowy road surface condition during vehicular travel in finer classification. In this method, tire vibrations in the circumferential direction, road surface temperature (T), and tire-generated sound are detected by an acceleration sensor, a road surface thermometer, and a microphone, respectively. Then band values P | 05-09-2013 |
20130179120 | SELECTING AN EARPIECE BASED ON DYNAMIC DATA - The attenuation and other optical properties of a medium are exploited to measure a thickness of the medium between a sensor and a target surface. Disclosed herein are various mediums, arrangements of hardware, and processing techniques that can be used to capture these thickness measurements and obtain dynamic three-dimensional images of the target surface in a variety of imaging contexts. This includes general techniques for imaging interior/concave surfaces as well as exterior/convex surfaces, as well as specific adaptations of these techniques to imaging ear canals, human dentition, and so forth. | 07-11-2013 |
20130191070 | SYSTEM AND METHOD FOR INSPECTING RAILROAD TIES - A system for inspecting railroad ties in a railroad track includes a light generator, an optical receiver and a processor. The light generator is oriented to project a beam of light across the railroad track while moving along the railroad track in a travel direction. The optical receiver is oriented to receive at least a portion of the beam of light reflected from the railroad track and configured to generate image data representative of a profile of at least a portion of the railroad track. The processor is configured to analyze the image data by applying one or more algorithms configured to find boundaries of a railroad tie and determine one or more condition metrics associated with the railroad tie. | 07-25-2013 |
20130204576 | MEASUREMENT METHOD USING INTERFEROMETER AND NON-TRANSITORY TANGIBLE MEDIUM STORING ITS PROGRAM - A measurement method includes calculating a central frequency f | 08-08-2013 |
20130245997 | UNDULATION DETECTION DEVICE AND METHOD - An undulation detection device includes a two-dimensional sensor configured to emit a sensing wave for distance measurement in a plurality of directions forming different lateral and vertical angles and to measure respective distances to objects from which the sensing wave is reflected, and a processor performs detecting an undulation of the measurement surface or an obstacle placed on the measurement surface from which the sensing wave is reflected, on the basis of a difference among the distances in the different directions, the difference being measured by the two-dimensional sensor, and outputting an undulation detection report, when an in-plane size of the undulation of the measurement surface or the obstacle placed on the measurement surface is equal to or more than a threshold. | 09-19-2013 |
20130253884 | METHOD AND APPARATUS FOR MORPHOLOGICAL ANALYSIS - An apparatus arranged to analyze a structure, the apparatus comprising: a control unit; a light source arranged to irradiate a target area of the structure; and a light detector in communication with said control unit, and arranged to detect said irradiated light from said light source after interaction with the target area, said control unit arranged to: transform amplitudes of the detected light to the optical thickness domain, said transform comprising a bilinear transform; determine morphological information of the target area responsive to said performed transform. The determined morphological information is optionally displayed within a three dimensional view of the target area. | 09-26-2013 |
20130325397 | DIMENSION MEASURING APPARATUS AND COMPUTER READABLE MEDIUM - A dimension measuring apparatus for measuring a dimension between a first contour data which is an evaluation reference of a pattern to be evaluated and a second contour data which is the pattern to be evaluated generates first correspondence information between a point on the first contour data and a point on the second contour data, determines consistency of a correspondence included in the first correspondence information, corrects an inconsistent correspondence, and generates second correspondence information, when associating a point on the first contour data and a point on the second contour data with each other. | 12-05-2013 |
20140005978 | SHAPE ANALYSIS METHOD AND SHAPE ANALYSIS PROGRAM | 01-02-2014 |
20140052407 | SYSTEMS, METHODS, AND COMPUTER-READABLE MEDIA FOR THREE-DIMENSIONAL FLUID SCANNING - Systems, methods, for three-dimensional (“3D”) and computer-readable media fluid scanning are provided. According to some embodiments, there is provided a method that may include adding a first predetermined amount of fluid into a container, measuring a first fluid height in the container after the adding the first predetermined amount of fluid, adding a second predetermined amount of fluid into the container when the first predetermined amount of fluid is in the container, measuring a second fluid height in the container after the adding the second predetermined amount of fluid, emptying the fluid from the container. | 02-20-2014 |
20140067319 | MEASURING METHOD, NON-TRANSITORY COMPUTER READABLE RECORDING MEDIUM AND MEASURING APPARATUS - In accordance with an embodiment, a measuring method includes creating a sectional shape model for each measurement process of periodically arranged patterns formed through manufacturing processes, generating theoretical waveforms for a signal waveform which would be obtained when light is applied to the patterns, setting a shape parameter of a common structure in the manufacturing processes, acquiring measurement waveforms of the measurement target patterns, calculating degrees of correspondence between the measurement waveforms and theoretical waveforms, and outputting the shape parameter in the sectional shape model with the desired degree of correspondence. The calculating the degree of correspondence includes performing model fitting between the measurement waveforms and theoretical waveforms by varying the shape parameter of the common structure in the manufacturing processes and other shape parameters with the shape parameter of the common structure being linked. | 03-06-2014 |
20140067320 | METHOD AND APPARATUS FOR GENERATING SHAPE INFORMATION OF OBJECT - A method and an apparatus for generating shape information of an object. The method of generating the shape information of the object includes identifying a bend location of a flexible display apparatus surrounding the object; identifying a bend angle of the flexible display apparatus; and generating the shape information of the object based on the bend location of the flexible display apparatus and the bend angle of the flexible display apparatus. | 03-06-2014 |
20140074432 | ELECTRONIC DEVICE AND METHOD FOR MEASURING OUTLINE OF OBJECT - In a method for measuring an outline of an object, the method creates vectors according to adjacent points of the outline, calculates an included angle between every two adjacent vectors, obtains sampled points in the outline and direction vectors of the sampled points, obtains reference points corresponding to the sampled points, inserts a point between each two adjacent reference points, and creates a measurement program according to the reference points and inserted points. The method further obtains measurement points of the outline of the object using the measurement program, obtains a tolerance of each measurement point and a tolerance of the outline of the object, and displays the tolerance of each measurement point using a graphic user interface. | 03-13-2014 |
20140107973 | THREAD PROFILE MEASURING METHOD - A method includes: performing a scanning measurement of a female thread along first and second axes extending along a center axis of the thread and opposed to each other across the center axis; determining characteristic values of the thread from contour data of the thread obtained through the measurement; obtaining the contour data including first contour data associated with the first axis and second contour data associated with the second axis by performing the measurement; detecting a thread displacement along the center axis between a crest associated with the first axis and a crest associated with the second axis at each of first position and second position on the center axis; calculating inclination and deviation of the first and second axes from the thread displacements detected at the first and second positions; and adjusting an attitude of the thread for the measurement to eliminate the inclination and deviation. | 04-17-2014 |
20140149072 | Scanner-Assisted Selection of Fitting Footwear with Individualized Footbed - A method is described for selecting, in a cost-effective and largely automated manner, best fit footwear with an optimally selected or individualized footbed. With the aid of a preferably multisensory foot scanner, the geometric three-dimensional shape of the foot and the plantar pressure image registered with it are determined at the same time. A database of digitized shoe interiors is used for determining, by means of a best fit selection, the series-produced shoe that best matches the 3D foot model. Using a conventional system for producing individualized insoles and/or footbeds, an insole that matches the sole of the foot is selected or prepared and, in a further, novel method step according to the invention, by means of numerical determination of the three-dimensional surfaces of the footbed, the foot sole and the peripheral zone of the sole in the inner shoe, the so-called insole space, the required insole constituting the footbed is selected, or further processed numerically, such that it fits in an optimum manner into the selected best fit item of footwear in the put-on condition. | 05-29-2014 |
20140149073 | SYSTEM AND METHOD FOR MEASURING CONICITY USING FOUR FORCE-SENSORS - The present invention relates to a system and method for measuring conicity using four force-sensors, in which a spindle attached to a tire and four sensors are used to measure lateral force generated in the tire; individual signals measured by the four sensors of the spindle are amplified; a DAQ board for calculating Fy(LFV) obtained by summing the individual signals amplified by an amplifier is calculated, obtaining five signals generated in the amplifier, and converting the analog signals into digital signals is provided; and the conicity is calculated using the digital signals, a predefined delta load and a factor. | 05-29-2014 |
20140207412 | Method and system for measuring content of a bin - A method, non-transitory computer readable medium and a system that includes a confidence level module arranged to calculate, in response to detection signals, estimated upper surface points and to associate a non-binary confidence level with each estimated upper surface point; wherein the detection signals are generated by a receiver in response to an irradiation of at least a portion of the upper surface of the content with radiation pulses transmitted by a transmitter; and an estimator that is arranged to calculate an estimate of the upper surface based upon the estimated upper surface points and the non-binary confidence level associated with each estimated upper surface point. | 07-24-2014 |
20140214360 | SYSTEM AND METHOD FOR SHAPE ATTRIBUTE BASED DETECTION OF OBSTACLES WITHIN A BIN - A method and a system for automatically mapping obstacles within a bin that stores content, the system may include: a location estimator that is arranged to calculate, in response to detection signals, an estimated shape of an upper surface of the content; wherein the detection signals are generated by a receiver in response to radiation signals reflected or scattered from multiple points within the bin; and an obstacle detector that is arranged to detect at least one obstacle point that belongs to an obstacle in response to (a) the estimated shape of the upper surface of the content, and (b) an expected shape attribute of the upper surface of the content. | 07-31-2014 |
20140214361 | SYSTEM AND METHOD FOR CONTENT ESTIMATE BASED DETECTION OF OBSTACLES WITHIN A BIN - A method and a system for automatically mapping obstacles within a bin that stores content, the system may include a location estimator that is arranged to calculate, in response to detection signals, multiple estimates of shapes of the upper surface of the content at different time periods; wherein the detection signals are generated by a receiver in response to radiation signals reflected or scattered within the bin; and an obstacle detector that is arranged to detect an obstacle in response to relationships between the multiple estimates of shapes of the upper surface of the content. | 07-31-2014 |
20140278231 | Film-Growth Model Using Level Sets - A technique for determining a set of surface profiles in a multilayer stack during a fabrication process may be determined using a model of this fabrication process, a geometry of the multilayer stack (such as a pre-defined geometry of the multilayer stack) and a surface profile in the multilayer stack (such as a measured surface profile of the top surface or a bottom surface of the multilayer stack). For example, the model of the fabrication process may be based on a generalized Eikonal equation. In conjunction with deposition rates and/or physical properties of the layers in the multilayer stack, deposition or growth of the multilayer stack may be simulated. Based on the determined set of surface profiles, an acceptance condition of the multilayer stack (such as a multilayer stack in a photo-mask for use in extreme ultra-violet photolithography) may be determined and/or a remedial action may be recommended. | 09-18-2014 |
20140297223 | METHOD FOR USING OPTICAL METROLOGY TO MONITOR CRITICAL DIMENSION UNIFORMITY - Various embodiments provide systems, computer program products and computer implemented methods. In some embodiments, the system includes a method of determining a characteristic of an optical mask. The method including: generating a first set of electromagnetic field (EMF) simulation data about the optical mask, using a first set of simulation criteria; determining a first correlation between optical metrology data about the optical mask and the first set of EMF simulation data; and determining the characteristic of the optical mask based upon the first correlation between the optical metrology data and the first set of EMF simulation data. | 10-02-2014 |
20140297224 | DATA PROCESSING METHOD OF TIRE SHAPE INSPECTING DEVICE - In a data processing method of a tire shape inspecting device of the present invention, a position immediately before the number of the undetected points becomes a predetermined, number or more is determined as a temporary range of upper and lower limit values. Meanwhile, an absolute value is obtained from a result obtained by performing a filtering process using a secondary differential filter on the surface height distribution information subjected to a zero point removing process, an average absolute value is calculated from the position of the first coordinate axis, and a threshold value for distinguishing the side wall surface is calculated. Then, the threshold value is compared with the average absolute value of the position of the first coordinate axis within the temporary range of the upper and lower limit values so as to determine the range of the upper and lower limit values. | 10-02-2014 |
20140316742 | OPTICAL COLLIMATOR FOR LED LIGHTS - There is provided a luminaire ( | 10-23-2014 |
20140343893 | METROLOGICAL APPARATUS AND A METHOD OF DETERMINING A SURFACE CHARACTERISTIC OR CHARACTERISTICS - A metrological apparatus has a surface data determiner to determine from measurement data a measured surface roughness data set ( | 11-20-2014 |
20140350887 | METHOD FOR CHARACTERIZATION OF A SURFACE TOPOGRAPHY - A method for characterization of a surface topography, comprising application of the following steps:
| 11-27-2014 |
20140358476 | AUTOMATIC DETERMINATION OF FOURIER HARMONIC ORDER FOR COMPUTATION OF SPECTRAL INFORMATION FOR DIFFRACTION STRUCTURES - Automatic determination of Fourier harmonic order for computation of spectral information for diffraction structures described. An embodiment of a method includes automatically determining a Fourier harmonic order for computation of spectral information for periodic structures, wherein the determination of the Fourier harmonic order is based at least in part on the pitches in each of multiple directions of the periodic structures, material properties of the periodic structures, and characteristics of the periodic structures in which the materials are contained; and computing the spectral information for the periodic structures based at least in part on the determined Fourier harmonic order. | 12-04-2014 |
20140372075 | IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND INSPECTION SYSTEM - A measurement target is captured using two types of illumination patterns set such that only color features of specular objects change, the two images that are obtained are compared, and objects are identified as being specular objects or diffuse objects depending on whether the color features change markedly. At this time, the emission intensity distribution of each illumination pattern is devised such that specular lobe components that are included in reflected light are canceled out. | 12-18-2014 |
20150025844 | SURFACE MEASUREMENT APPARATUS AND METHOD - A metrological apparatus has a workpiece support surface ( | 01-22-2015 |
20150032413 | GAGE FOR VERIFYING PROFILE OF PART AND METHOD OF VERIFYING PROFILE OF PART - A method of verifying the roundness of a clutch hub includes placing the clutch hub adjacent a non-contact measuring device. The method includes rotating one of the clutch hub and non-contact measuring device about a central axis that is stationary relative to the non-contact measuring device. Distance measurements are measured between the non-contact measuring device and a surface of the clutch hub at discrete points along splines and slopes between the splines of the clutch hub as the clutch hub is rotated about the central axis. The method includes identifying some of the distance measurements as spline measurements associated with splines of the clutch hub. The roundness of the clutch hub is calculated based on the spline measurements. | 01-29-2015 |
20150032414 | Method for the 3-Dimensional Measurement of a Sample With a Measuring System Comprising a Laser Scanning Microscope and Such Measuring System - The invention relates to a method for the 3-dimensional measurement of a sample with a measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by—providing the measuring system with a 3-dimensional virtual reality device,—creating the 3-dimensional virtual space of the measuring space using the 3-dimensional virtual reality device,—allowing for selecting an operation in the virtual space,—providing real-time unidirectional or bidirectional convection between the measuring space and the virtual space such that an operation selected in the virtual space is performed in the measuring space and data measured in the measuring space is displayed in the virtual space. The invention further relates to a measuring system for the 3-dimensional measurement of a sample, the measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by further comprising a 3-dimensional virtual reality device for displaying a 3-dimensional virtual space of the measuring space, and a real-time unidirectional or bidirectional connection is provided between the laser scanning microscope and the 3-dimensional virtual reality device. | 01-29-2015 |
20150046119 | VEHICLE CLASSIFICATION FROM LASER SCANNERS USING FISHER AND PROFILE SIGNATURES - Methods, systems and processor-readable media for vehicle classification. In general, one or more vehicles can be scanned utilizing a laser scanner to compile data indicative of an optical profile of the vehicle(s). The optical profile associated with the vehicle(s) is then pre-processed. Particular features are extracted from the optical profile following pre-processing of the optical profile. The vehicle(s) can be then classified based on the particular features extracted from the optical feature. A segmented laser profile is treated as an image and profile features that integrate the signal in one of the two directions of the image and Fisher vectors which aggregate statistics of local “patches” of the image are computed and utilized as part of the extraction and classification process. | 02-12-2015 |
20150057972 | MEASURING APPARATUS AND MEASURING METHOD - Provided is a measuring apparatus that a beam splitter configured to split the first beam into test light and reference light and a beam multiplexer configured to multiplex the test light reflected by an object to be tested and the reference light are separately provided, and a beam guiding unit configured to guide the second beam to the object to be tested is disposed on the optical path of the test light between the beam splitter and the beam multiplexer or between the beam multiplexer and the detector. | 02-26-2015 |
20150088458 | SHAPE MEASUREMENT METHOD AND SHAPE MEASUREMENT APPARATUS - A shape measurement method includes acquiring a plurality of partial measurement data sets of a measurement surface and inclination data corresponding to the partial measurement data sets; performing fitting of the partial measurement data sets so that differences between a reference equation and the partial measurement data sets are reduced, while the relative tilt between the partial measurement data sets is maintained less than or equal to a predetermined threshold; and obtaining the shape of the measurement surface by connecting the fitted partial measurement data sets. | 03-26-2015 |
20150106056 | SURFACE SHAPE MEASURING METHOD AND SURFACE SHAPE MEASURING DEVICE - A surface shape measuring method includes: acquiring displacement data on an object surface facing an optical displacement meter by scanning the object surface with the optical displacement meter that applies a light beam on the object surface and performs measurement; detecting an approximate range on the object surface including a groove formed on the object surface by searching the displacement data; calculating a groove start point and a groove terminating point of the groove included in the approximate range; calculating a smallest value of the displacement data in a restricted range from a center position between the groove start point and the groove terminating point to a width defined at a predetermined ratio with respect to the groove width; and calculating a difference between the smallest value of the calculated displacement data and the height of the object surface as the depth of the groove formed on the object surface. | 04-16-2015 |
20150106057 | PROFILE MEASUREMENT SYSTEM AND PROFILE MEASUREMENT METHOD - Provided are a profile measurement system and a profile measurement method capable of suppressing the influence of vibration with a simple configuration. The profile measurement system includes: a transmissive optical component having a reference plane opposed to a surface of a sample; a light source which irradiates the surface of the sample with light having a predetermined wavelength region through the transmissive optical component; an imaging spectrometer which measures a reflection spectrum for each position on a linear region defined on the surface of the sample; and a calculation unit which calculates a distance between each position on the linear region and the reference plane based on the measured reflection spectrum for each position on the linear region. | 04-16-2015 |
20150354950 | NORMAL-LINE DETECTION DEVICE, PROCESSING DEVICE, AND NORMAL-LINE DETECTION METHOD - A normal-line detection device is provided with: four or more non-contacting distance sensors for measuring the distance to a processing surface of a work piece, the non-contacting distance sensors being arranged on the periphery of a drill body, in an arrangement plane orthogonal to an axis line of the drill body, and a distance measurement axis of each non-contacting distance sensor and the axis line intersecting; and a PC for calculating an approximation surface of a processing surface on the basis of measurement values from the non-contacting distance sensors and the angle of the non-contacting distance sensors with respect to the axis line, and determining the normal-line of the approximation surface as the normal-line of the processing surface. | 12-10-2015 |
20160003611 | ASPHERICAL SURFACE MEASUREMENT METHOD, ASPHERICAL SURFACE MEASUREMENT APPARATUS, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM, PROCESSING APPARATUS OF OPTICAL ELEMENT, AND OPTICAL ELEMENT - An aspherical surface measurement method includes measuring a first wavefront of light from a standard surface having a known shape, measuring a second wavefront of light from an object surface having an aspherical shape, rotating the object surface around an optical axis and then measuring a third wavefront of light from the object surface, calculating error information of an optical system based on the first, second, and third wavefronts, calculating shapes of a plurality of partial regions of the object surface by using a design value of the optical system corrected based on the error information of the optical system and by using a plurality of measured wavefronts of lights from the partial regions of the object surface measured after the object surface is driven, and stitching the shapes of the partial regions of the object surface to calculate an entire shape of the object surface. | 01-07-2016 |
20160018217 | ENSURING INSPECTION COVERAGE FOR MANUAL INSPECTION - In order to support an inspecting person in a method for the manual non-destructive inspection of a test object, a detection device is provided for detecting three-dimensional surface coordinates of a region to be inspected on the test object and for continuously determining positions and speeds of an inspecting tool relative to the test object Discrete position values and speed values of the inspecting tool for the respective measurement time points are stored by a storage device. A computing device determines the share of an already inspected region in relation to the total region of the test object to be inspected. The method and device can be used for manual inspection of test objects having a plurality of different shapes. The inspecting person is effectively relieved and the process for the non-destructive inspection is documented in order to guarantee a complete inspection. | 01-21-2016 |
20160023661 | Road Geometry Generation from Sparse Data - Road geometries may be determined from sparse data by identifying a set of mobile device data points generated by a mobile device located in a geographic area. Further, the data points may be connected with a curve comprising a series of splines defined by curve functions. The shape of the splines may be optimized by applying a scaling factor to the curve functions. A resulting optimized curve may be representative of a road in a geographic area. | 01-28-2016 |
20160076880 | COMPUTING DEVICE AND METHOD FOR PROCESSING POINT CLOUDS - A computing device and a method process point clouds of an object. The computing device controls a rotating device connected to the computing device to rotate to one or more rotation angles of the rotating device. The computing device generates a first coordinate system and one or more second coordinate systems according to one or more rotation angles of the rotating device, and obtains a point cloud of an object based on each of the second coordinate systems from a scanner of the rotating device. The computing device converts the point cloud of the object based on each of the second coordinate systems to a point cloud of the object based on the first coordinate system, and joints all point clouds of the object based on the first coordinate system. | 03-17-2016 |
20160109332 | DATA GENERATION METHOD AND DATA GENERATION APPARATUS - A candidate extraction unit ( | 04-21-2016 |
20160138914 | SYSTEM AND METHOD FOR ANALYZING DATA - The present disclosure provides a system and a method for analyzing graphical data of an object. The system is implemented on a computing device linked to a database. The system receives a point cloud file corresponding to the object from the database, extracts point cloud data from the point cloud file, and meshes point cloud data to generate coordinate data corresponding to vertices for a plurality of meshed triangles. The system calculates distances between each of the meshed triangles and a fitting plane and a normal vector for each meshed triangle. The system calculates an included angle between the normal vector of each meshed triangle and a normal vector of the fitting plane to determine the accuracy of the point cloud data patches, and generates a report containing an accuracy analysis of the point cloud data for the object and a point cloud statistical analysis report. | 05-19-2016 |