Entries |
Document | Title | Date |
20080234968 | Program development system - When an acquisition and reporting control unit | 09-25-2008 |
20080281548 | Method and System for Automatic Defect Detection of Articles in Visual Inspection Machines - There is provided a method for establishing a parameters setup for inspecting a plurality of articles by an automatic inspection system. The method includes inspecting a first article by the inspection system, applying an automatic defects detection method according to a given set of inspection parameters, receiving an initial map of defects and sorting uncovered defects into defect types according to a predetermined set of defect types. While sorting defects, if new defects not recognized by the inspection system are detected, adding the new defects to the initial map to be sorted and automatically setting the inspection parameters by means of applying computational dedicated algorithms, using a heuristic approach, to form a modified parameters setup. The modified parameters setup is then used for obtaining a modified map of detected defects, and the modified parameters setup for inspecting other of the plurality of articles. A system for establishing a parameters setup for inspecting a plurality of articles is also provided. | 11-13-2008 |
20090018793 | METHOD AND SYSTEM FOR REDUCING DEVICE TEST TIME - A system and method for reducing device test time are disclosed herein. A method for reducing device test time includes applying a linear program solver to select a first set of tests for testing a device from a second set of tests for testing the device. The first set of tests is selected to reduce the time required to test the device while allowing no more than a predetermined number of devices tested to pass the first set of tests and fail the second set of tests. | 01-15-2009 |
20090043527 | COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR GENERATING A METROLOGY SAMPLING PLAN - Various computer-implemented methods, carrier media, and systems for generating a metrology sampling plan are provided. One computer-implemented method for generating a metrology sampling plan includes identifying one or more individual defects that have one or more attributes that are abnormal from one or more attributes of a population of defects in which the individual defects are included. The population of defects is located in a predetermined pattern on a wafer. The method also includes generating the metrology sampling plan based on results of the identifying step such that one or more areas on the wafer in which the one or more identified individual defects are located are sampled during metrology. | 02-12-2009 |
20090089004 | Time Learning Test System - A time-learning test system for running a test program on a device under test (DUT) is disclosed. A command is sent from a controller to an instrument. A preset wait period is observed in the test program. A response time of the instrument to the command is determined. The preset wait period is adjusted based on the response time. | 04-02-2009 |
20090089005 | GENERATION OF TEST SPECIFICATIONS BASED ON MEASURED DATA POINTS - Autonomous or machine generation of test specifications can be achieved by capturing the measured test data of a device and then using the captured test data to build a test specification, such as a limit line, for subsequent testing of similar devices. The generated test specification is typically adapted for use with respect to limited resources, such as through use of a piece-wise linear configuration. In an embodiment, the number of piece-wise linear portions of the generated test specification is minimized or otherwise optimized. In embodiments, the generated test specification is adjusted to accommodate expected measurement variation, such as thermal noise, device process variation, random jitter, etc., and, if desired, adjusted to allow for changes in test accuracy of subsequent tests. In one embodiment, one or more test measurement inaccuracies are eliminated in the construction of the limit line. | 04-02-2009 |
20090099805 | MEASUREMENT SYSTEM - A semiconductor wafer inspection device is provided which identifies an operator when an operation is performed and checks if the requested operation is permitted. In the device that has already performed an operator authentication, the operator identification is further carried out when a particular operation is requested. If the operation requested is a permitted one, it is executed even if requested by an operator different from the one previously authenticated. The history of operations and the change history of in-device data are recorded and displayed. Performing the operator authentication only when necessary can prevent illicit access to the in-device information without degrading the operability. | 04-16-2009 |
20090112505 | Method and system for providing test and measurement guidance - A method for providing a user with test and measurement guidance includes collecting an inventory of available test instruments, providing data for a device under test, providing a test specification, and generating a set of tests to be performed on the device under test utilizing the inventory, data, and test specification. | 04-30-2009 |
20090119055 | Automated Test System - The present invention provides a method of optimizing an automated test system during a problem determination phase of said test system in a distributed environment with a plurality of local and remote computers, said test system comprising at least a first test suite, said method comprising the steps of: receiving at least said first test suite by a centralized execution controller, said at least first test suite comprising at least a first and second test fragment; receiving at least one breakpoint description comprising a condition for pausing at least said first test suite by said centralized execution controller; sending at least said first test fragment and an execution command of at least said first test fragment from said centralized execution controller to said distributed environment; receiving a event definition and a hierarchy of event definitions describing said executed command by said execution controller; comparing said at least one breakpoint description with the received event definition by a matching mechanism coupled to said centralized execution controller; pausing said test suite execution if said executed event definition matches said breakpoint definition by said centralized execution controller. | 05-07-2009 |
20090281758 | Method and Apparatus for Triggering a Test and Measurement Instrument - A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to the test and measurement apparatus and determining for a first predetermined time whether an input signal generates a trigger. Thereafter, a second trigger configuration is loaded to the test and measurement apparatus upon the conclusion of the first predetermined time and for a second predetermined time it is determined whether the input signal generates a trigger. | 11-12-2009 |
20090281759 | Method and Apparatus for Multiple Trigger Path Triggering - A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously. It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations. | 11-12-2009 |
20090299681 | METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELECTING VALUES FOR ONE OR MORE PARAMETERS OF A DETECTION ALGORITHM - Methods and systems for generating information to be used for selecting values for parameter(s) of a detection algorithm are provided. One method includes without user intervention performing a scan of an area of a wafer using an inspection system and default values for parameter(s) of a detection algorithm to detect defects on the wafer. The method also includes selecting a portion of the defects from results of the scan based on a predetermined maximum number of total defects to be used for selecting values for the parameter(s) of the detection algorithm. The method further includes storing information, which includes values for the parameter(s) of the detection algorithm determined for the defects in the portion. The information can be used to select the values for the parameter(s) of the detection algorithm to be used for the inspection recipe without performing an additional scan of the wafer subsequent to the scan. | 12-03-2009 |
20100023294 | AUTOMATED TEST SYSTEM AND METHOD - An efficient automated testing system and method are presented. In one embodiment, an automated testing system includes a control component and an automated test instrument for testing a device or a plurality of devices (e.g., packages or wafers containing multiple independent different devices) under test. The automated test instrument component performs testing operation on the device or devices under test (DUT). The control component manages testing activities of a test instrument testing the device under test, including managing implementation of a plurality of test programs loaded as a group. In one exemplary implementation, the automated test system also includes a DUT interface and a user interface. The device under test interface interfaces with a device or devices under test. | 01-28-2010 |
20100030509 | Synchronizing a Loop Performed by a Measurement Device with a Measurement and Control Loop Performed by a Processor of a Host Computer - Various embodiments of a system and method for performing a measurement application are described herein. The system may include a host computer having a processor, and a measurement device having a programmable hardware element. The programmable hardware element may be configured to perform a loop to acquire measurement data from a physical system. The host computer may be configured to perform another loop to read the measurement data from the programmable hardware element and use the measurement data in a measurement and control algorithm. The host computer may be further configured to perform a synchronization algorithm to keep the measurement data acquisition loop performed by the programmable hardware element synchronized with the measurement and control loop performed by the host computer. | 02-04-2010 |
20100057395 | COMPACT FRAMEWORK FOR AUTOMATED TESTING - A system and method (“utility”) for automated testing using a compact framework is provided. The utility includes a plurality of functionalities that include development of a test module, development of a test flow, and execution of a test flow. Each of these functionalities may be separated by the compact framework, such that automated testing functions may be divided into individual roles. The individual roles may include test developer, test flow designer, and test flow executor. The utility may also include an authenticator that is operable to determine the individual role of a user (e.g., using a GUI), and to provide the functionality that corresponds to that role. The utility may provide one or more displays that provide real time data feedback. Further, the utility may be operable to generate customized test results reports that enable a user to analyze the performance of one or more devices under test. | 03-04-2010 |
20100070231 | SYSTEM AND METHOD FOR TEST CASE MANAGEMENT - The invention disclosed relates to a system and method for test case management, wherein the final ‘product’ to be developed is an amalgamation of a variety of ‘modules’ under the ‘product’ umbrella. The variety of ‘modules’ undergo metamorphosis in relation to various phases (that is, from conceptualization to designing to development to testing). At each of these stages, a different team is engaged to perform the relevant functions on the abovementioned modules. Hence, there is a need for a coherent, synchronized and hierarchical classification of the constituents (the modules in relation to their designing parameters, functionality parameters, testing parameters, performance parameters and the like), so that the different teams involved in different phases have a common platform for transferring information and for understanding the transferred information, and essentially for gaining a cohesive overview of the product to be developed. | 03-18-2010 |
20100076717 | Control and programming apparatus for processing tool data record of three-dimensional tool model - A control and programming apparatus, in particular a measuring device control and/or programming apparatus, is provided for controlling and/or programming a measurement sequence for a tool. The control apparatus has a data processing unit having a data input unit provided for receiving and/or reading in a desired tool data record for the measurement sequence. | 03-25-2010 |
20100131224 | TEST METHOD AND PROGRAM PRODUCT USED THEREFOR - The testing method of the present invention for testing a plurality of devices under test connected to a test module includes (a) determining combinations of devices under test that can theoretically be measured simultaneously from among the combinations of the plurality of devices under test based on at least the connection relationship between the test module and the plurality of devices under test. The resting method further includes (b) testing the plurality of devices under test by sequentially selecting the combinations of devices under test to be actually measured simultaneously from the combinations determined in (a). | 05-27-2010 |
20100153056 | METHOD OF GENERATING A RESTRICTED INLINE RESISTIVE FAULT PATTERN AND A TEST PATTERN GENERATOR - A method of generating an IRF pattern for testing an IC and a test pattern generator are disclosed. In one embodiment, the method includes: (1) identifying a path of the integrated circuit for inline resistive fault pattern generation, (2) determining if the path is a minimal slack path of the IC and (3) generating, when the path is the minimal slack path, a restricted inline resistive fault pattern for the path using only a capture polarity having a minimal inherent margin. | 06-17-2010 |
20100204950 | AUTOMATED TEST FOR CONSUMER ELECTRONICS - A method for testing a consumer electronics (CE) product that wirelessly receives user commands from an IR remote control includes obtaining command codes from the remote and correlating the command codes to respective functions. A tester can generate a test script designating the functions but the tester is not required to designate the command codes. In this way, the script can be executed by wirelessly transmitting to the CE product command codes corresponding to the functions designated in the script. During script execution, the CE product is queried for health indicia such as memory usage. The CE product sends the product health indicia to a test computer over a USB debug port. | 08-12-2010 |
20100274520 | CREATION OF TEST PLANS - Test plan to be utilized in a testing phase may be generated based on an initial test plan. A functional coverage model may be derived from the initial test plan. Modifications to the test plan may be automatically determined based on predetermined rules and parameters. Restrictions over possible combinations of values may be determined based on analysis of uncovered test activities in the initial test plan. Restrictions may be determined based on values of test activities in the initial test plan. Restrictions and modifications determined according to the disclosed subject matter may be indicated to a user for confirmation thereof. | 10-28-2010 |
20110098963 | CONTEXT BASED TESTING - In an embodiment, a method is provided. In this method, contexts used in a test are accessed, and these contexts are defined separate from the test. One of these contexts (a “first context”) defines a dependency to another context (a “second” context). A system of relationships between the contexts is constructed based on the dependency defined by the first context. The test is then executed using a number of contexts identified from the system of relationships. | 04-28-2011 |
20110098964 | TESTING SYSTEM - A test system ( | 04-28-2011 |
20110112790 | SYSTEM AND METHOD FOR AUTOMATIC HARDWARE AND SOFTWARE SEQUENCING OF COMPUTER-AIDED DESIGN (CAD) FUNCTIONALITY TESTING - The present invention relates to a system and a method for creating hardware and/or software test sequences and in particular, to such a system and method in which modular building blocks are used to create, sequence and schedule a large scale testing sequence using a matrix like platform. | 05-12-2011 |
20110131002 | METHOD FOR AUTOMATIC TESTING OF SOFTWARE - The invention relates to a method of automatic testing of a first software system using a test specification, the first software system comprising data and interacting with a third software system communicatively coupled to a database; the method comprising defining at least one operation; wherein an operation operates on at least one of at least one entity; defining at least one test condition; wherein a test condition defines at least one required value of a number of properties of at least one entity in order for the at least one entity to be passed on to the at least one operation and wherein said at least one test condition is defined by at least one condition generating expression in said test specification; operating, via said third software system, said at least one operation on said first software system, transmitting from the first software system to the third software system first data representing a result of said at least one operation operating on said first software system; if the first data satisfies at least one criterion used by at least one test condition then storing said first data in said database. | 06-02-2011 |
20110137606 | TEST APPARATUS AND TEST METHOD - Provided is a test apparatus that tests a device under test, comprising: a plurality of channels that output and receive signals to and from the device under test; a generating section that generates a packet data sequence transmitted to and from the device under test; and a channel selecting section that selects which of the channels is used to transmit the packet data sequence generated by the generating section. | 06-09-2011 |
20110153258 | TEST TABLE CREATION SYSTEM AND TEST TABLE CREATION METHOD - The objective of the present invention is to efficiently create a test table in a monitoring control system. | 06-23-2011 |
20110153259 | MEASURING SYSTEM FOR DETERMINING A VALUE OF A PHYSICAL OR CHEMICAL, MEASURED VARIABLE OF A MEDIUM AND METHOD FOR OPERATION OF THE MEASURING SYSTEM - A measuring system for determining a value of a physical or chemical, measured variable of a medium, comprises: a base unit; at least one relay unit connected with the base unit and a sensor unit connected with the relay unit. The relay unit is especially embodied to receive from the base unit, and to forward to the sensor unit, data, especially measurement data, operating data, commands or software modules, and/or to receive from the sensor unit, and to forward to the base unit, data, especially measurement data, operating data, commands or software modules wherein the sensor unit comprises a circuit having at least one microcontroller, at least a first memory region, in which a basic software of the sensor unit is stored, and a second memory region, in which an upload software of the sensor unit is stored. The upload software of the sensor unit is embodied, in interaction with the microcontroller, to perform an updating of the basic software of the sensor unit with at least one software module provided from the base unit. The relay unit comprises a circuit having at least one microcontroller, and at least a first memory region in which a basic software of the relay unit is stored. The circuit of the relay unit further comprises a second memory region, in which an upload software of the relay unit is stored, which is embodied, in interaction with the microcontroller of the relay unit, to perform an updating of the basic software of the relay unit with at least one software module provided from the base unit, and the upload software of the sensor unit, for execution by the microcontroller of the sensor unit, is activatable based on a comparison of a data sequence sent from the base unit with a first password assigned to the sensor unit, and the upload software of the relay unit, for execution by the microcontroller of the relay unit, is activatable based on a comparison of a data sequence sent from the base unit with a second password assigned to the relay unit. The second password is different from the first password. | 06-23-2011 |
20110184689 | METHOD OF AUTOMATICALLY FORMULATING TEST CASES FOR VERIFYING AT LEAST PART OF A PIECE OF SOFTWARE - A method of automatic formulation by a computer of test cases for verifying at least one function of a piece of software in relation to a specification including requirements relating input values and output values of the software, the method including the steps of:
| 07-28-2011 |
20110191057 | GRAPHIC ANIMATION OF GEOMETRIC DIMENSIONING AND TOLERANCING - A graphical representation of a feature and associated tolerance includes a graphical representation of a nominal definition of the feature; and a graphical representation of the tolerance zones, derived from the nominal definition of the feature. | 08-04-2011 |
20110208469 | AUTOMATIC TESTING OF A COMPUTER SOFTWARE SYSTEM - The invention relates to a method of automatic testing of a software system through test driver code that classifies test data into equivalence classes and updates the available test data after using it against the software system. One embodiment of the invention is a Test Runner that monitors the effect of calling the software system on the available test data and uses this information to automatically determine the execution order of test cases to meet a number of objectives including to: Reuse data between calls, ensure all test cases are executed, perform parallelized testing, perform time dependent testing, perform continuous testing according to a probability distribution on test cases, perform automated management of complex test data and finally to provide an easy and concise way for a user to define a large sets of test cases. | 08-25-2011 |
20110208470 | Operation verifying apparatus, operation verifying method and operation verifying system - An operation verifying apparatus of a first embodiment acquires a log indicating the content of a sequence of operations performed on a predetermined device, identifies corresponding functions from the log, and automatically generates a program based on the identified functions. Input data, which is to serve as an argument of each of these functions, is set. Execution sets as well as test scenarios are each structured by combining a program and input data. Then each execution set is continuously executed. As a result, an operation test using a test program is executed. | 08-25-2011 |
20110213580 | METHOD FOR FINDING PARAMETERS OF BIOLOGICAL TESTING DEVICE AND METHOD FOR MAKING BIOLOGICAL TESTING SHEETS CORRESPONDING TO THE PARAMETERS - A buffer solution is made based on electrode features of a biological testing device. An interference agent for stabilizing measurement signals from the biological testing sheet is prepared. An enzyme is prepared based on parameters of the biological testing device and the electrode properties. An optimum electrode potential is determined and then the properties of the electrodes are reevaluated using potassium ferricyanide and potassium ferrocyanide. Enzyme from an incomplete biological testing sheet is retained, which is dried, covered and cut. The number of sets is determined and the steps repeated to find optimal ingredients and corresponding testing sheets. Sampling and testing of the biological testing sheets using different parameter codes is performed until all parameter codes are tested to determine process completion. Thus, biological testing sheets matching different biological testing devices from different manufactures or biological testing devices are provided. | 09-01-2011 |
20110224939 | INTEGRATED TOOL FOR PERSISTING DEVELOPMENT ENVIRONMENT TEST SCENARIO INFORMATION - Architecture includes an integrated tool that allows a tester to automatically persist test plan information in association with related content while the tester is interacting with that content in an IDE. The tool further enables the tester to formally associate actions/expectations with specific items of content. In previous solutions, references to existing content are often lost due to inexact or missing descriptions. Formal associations allow for reuse of valuable content and avoid unnecessary recreation. The tool is integrated with the IDE, and thus, does not necessitate that the tester manually type or write descriptions of intent and expectations. This reduces the test plan cost significantly. The tool also persists information in a formal, self-describing format that enables easy consumption by either human testers or secondary software applications (e.g., for the purposes of identifying plans, performing associated actions and verifying expected behavior). | 09-15-2011 |
20110251821 | METHOD AND DEVICE FOR TESTING A COMPUTER CORE IN A PROCESSOR HAVING AT LEAST TWO COMPUTER CORES - A method and a device for testing a computer core in a processor having at least two computer cores is described. The computer cores are connected to each other via an internal connecting system, both computer cores contributing toward the operating sequence of a machine. In the method for testing a computer core, with which a high error detection rate may be achieved in a minimum outlay of time, a test is run in one computer core, while a program for executing the driving operation of the motor vehicle is being processed in the other computer core at the same time. | 10-13-2011 |
20110288810 | TEST APPARATUS AND TEST METHOD - Provided is a test apparatus that tests a device under test, comprising a testing section that stores a program in which commands to be executed branch according to detected branching conditions and that tests the device under test by executing the program; and a log memory that stores test results of the testing section in association with command paths of the program executed to obtain the test results. The testing section sequentially changes a characteristic of a test signal supplied to the device under test, and judges pass/fail of the device under test for each characteristic of the test signal, and the log memory stores a test result of the testing section in association with a command path of the program, for each characteristic of the test signal. | 11-24-2011 |
20120035878 | Combinatorial Process Optimization Methodology and System - A method for obtaining an optimized process solution from a set of design of experiments in a cost effective manner is provided. An actual experiment is performed and data from the experiments is obtained. Through statistical analysis of the data, coefficients are obtained. These coefficients are input into an experiment simulator where input parameters and conditions are combined with the coefficients to predict an output for the input parameters and conditions. From simulated results, conclusions can be drawn as to sets of input parameters and conditions providing desired results. Thereafter, physical experiments utilizing the input parameters and conditions may be performed to verify the simulated results. | 02-09-2012 |
20120065921 | METHOD AND DEVICE FOR TESTING INPUT/OUTPUT INTERFACES OF AVIONIC MODULES OF IMA TYPE - Input/output interfaces of avionic modules of IMA type in a device including several modules is tested. A system includes at least one application employed by a set of computer modules. This set includes the computer module (a first module), and at least one other computer modul (at least one second module). A system test is associated with the at least one system for functionally testing the set of computer modules according to the system. The system test includes at least one elementary system test for functionally testing at least one input/output interface of the first module. The execution of the at least one elementary system test is independent of the at least one second module. At least one result of execution of the at least one elementary system test is transmitted to a maintenance computer distinct from the computer modules of the plurality of computer modules. | 03-15-2012 |
20120065922 | SIMULATING AN UMBILICAL - A method of simulating an umbilical for use with a subsea fluid extraction well is provided. The method comprises using a programmed processing unit to condition an input electrical signal for producing an output signal characteristic of a signal which has passed through such an umbilical. | 03-15-2012 |
20120072159 | UNIVERSAL QUALITY ASSURANCE AUTOMATION FRAMEWORK - The present invention provides a method and a system for a universal software quality assurance automation framework. The three reusable components of this framework are composed of a test resource comprising of a test module-entity driver-entity communication. The test module provides an opportunity to create several case scenarios and test logics. The entity driver enables the test environment software entities to be accessible to the test module, without prior knowledge of where those entities are located. The entity communication enables the drivers to communicate with various entities inside the test environment. The combination of the three reusable components enable the framework to be product agnostic. Multiple tests may be performed in parallel. Test cases are presented in the integrated graphical user interface as a hierarchical managing structure. The framework is collaborative and multiple users may use it simultaneously. | 03-22-2012 |
20120084043 | BOX COUNTING ENHANCED MODELING - A method can include providing spatial data for a base case of a subsurface geologic formation; providing spatial data for a simulation case of the subsurface geologic formation; performing box counting for the spatial data for the base case; performing box counting for the spatial data for the simulation case; based on the box counting for the spatial data for the base case, determining a fractal dimension for the base case; based on the box counting for the spatial data for the simulation case, determining a fractal dimension for the simulation case; comparing the simulation case to the base case based at least in part on the fractal dimensions; and, based on the comparing, adjusting one or more simulation parameters to generate spatial data for an additional simulation case of the subsurface geologic formation. Various other apparatuses, systems, methods, etc., are also disclosed. | 04-05-2012 |
20120158347 | SEMICONDUCTOR DEVICE - A device includes a decoder, a selector, and a plurality of registers. The decoder is configured to generate a plurality of test signals. The selector is coupled to the decoder. The selector is configured to sequentially select a test signal from the plurality of test signals and to sequentially output the test signal selected. The plurality of registers is coupled in series to each other. The plurality of registers includes a first stage register. The first stage register is coupled to the selector to sequentially receive the test signal from the selector. | 06-21-2012 |
20120173187 | METHOD AND APPARATUS FOR EVALUATING PERFORMANCE OF MOBILE TERMINAL - A method and an apparatus for evaluating performance of a mobile terminal are provided. The method for evaluating performance of a mobile terminal includes: executing applications of a preset list, extracting storage approach patterns for the executed applications, generating test scenarios for the executed applications using the extracted storage approach patterns, performing benchmarking tests for the applications using the generated test scenarios, and evaluating the mobile terminal based on results of the performed benchmarking tests. | 07-05-2012 |
20120173188 | METHOD AND APPARATUS FOR MULTIPLE TRIGGER PATH TRIGGERING - A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously, It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations. | 07-05-2012 |
20120209557 | METHODS, APPARATUS AND ARTICLES OF MANUFACTURE TO TEST BATCH CONFIGURATIONS - Example methods, apparatus and articles to test batch configurations are disclosed. A disclosed example method includes identifying, using a processor, an execution path through a batch configuration of a process control system, generating a test plan for the execution path, stimulating the process control system to execute the test plan, and recording a result of the test plan. | 08-16-2012 |
20120215480 | COMPUTING DEVICE AND PROGRAMMING METHOD FOR A THREE-DIMENSIONAL MEASUREMENT MACHINE - In a programming method, a program template of a measurement program and a | 08-23-2012 |
20120215481 | METHODS AND APPARATUS RELATED TO MANAGEMENT OF EXPERIMENTS - In one embodiment, a method includes sending an indicator of an availability of a sample from a sample pool stored in a physical inventory. The sample being included in the sample pool based on an attribute of the sample satisfying a condition associated with the sample pool. An indicator that the sample has been selected from the sample pool for analysis at a first test site included in an array of test sites is received. A rule is retrieved from a rule database based on an experimental parameter value associated with the first test site. At least one of the experimental parameter value associated with the first test site or an experimental parameter value associated with a second test site is modified based on a condition within the rule being satisfied. | 08-23-2012 |
20120226465 | METHOD, PROGRAM, AND SYSTEM FOR GENERATING TEST CASES - To provide a technique for generating, at a high speed, a smaller-sized set that satisfies an intended property such as, for example, being pair-wise, and includes many test cases that match a set of existing test cases given as an input, candidates to be used from a set of existing input test cases are determined in the following manner: for some parameters, values to be held by test case candidates are determined; test cases having the determined values, among those included in the set of input test cases, are selected as the candidates. A test case having the highest score among one or more test case candidates generated with the method of the related art and one or more test case candidates selected from the set of input test cases is added to a set of output test cases. | 09-06-2012 |
20120239340 | LITHIUM CELL SIMULATING DEVICE - A lithium cell simulating device includes a programmable power supplying module for generating multiple powers; a lithium cell status controlling module for generating multiple lithium cell statuses; a load setting module for simulating a lithium cell status; a device under test (DUT) status detecting module for detecting whether a device under test (DUT) is actuated; and a control unit for controlling a test procedure in its entirety. Accordingly, the lithium cell simulating device is suitable for use with DUTs of different power requirements and effective in simulating a charging/discharging status, a battery level status, and a battery temperature status under different conditions in the absence of a lithium cell and other complicated test apparatuses, so as to enable a great reduction of costs incurred in performing a test on a production line. | 09-20-2012 |
20120259576 | SYSTEM AND METHOD FOR EFFICIENT TEST CASE GENERATION USING INPUT DEPENDENCY INFORMATION - A system and method for providing an efficient test case generator is disclosed. A test case project is established upon request from a user, via a user interface, to test an item. The test case project includes a plurality of fields and corresponding designated values to be tested. A first set of identified fields of the plurality are received, wherein the first set includes two or more fields identified by the user as having a dependent relationship with at least one another. A first relational field cluster for the first set of related fields and their values is created. A test case generation technique is performed on the first relational field cluster to compute all relevant test conditions for the first relation field cluster. Results of the computed test conditions for the first relational field cluster are displayed to the user via the user interface. | 10-11-2012 |
20120265476 | System Test Specification Generation Device and Testing Device - Disclosed is a system test specification generation device for generating a system test specification to be applied to software comprising a plurality of software components in a state in which the software components have been combined. | 10-18-2012 |
20120296597 | METHODS AND SYSTEMS FOR DISTRIBUTING EQUIPMENT AND ADAPTERS FOR ELECTRICAL HARNESS TESTING - Methods and systems for distributing equipment and adapters for electrical harness testing. Embodiments of the present invention provide a computer aided design (CAD) automated method of arranging test equipment elements and determining test adapter cable lengths based on the physical locations of the test nodes in the unit under test. Using these methods/systems, test setups may be quickly evaluated. | 11-22-2012 |
20120303310 | Systems and Methods for Providing Test Keys to Mobile Devices - Embodiments of the invention provide systems and methods for providing test keys to mobile devices. According to one example embodiment of the invention, a method for providing test keys to mobile devices is provided. Identifying information for a mobile device or a secure element associated with the mobile device can be received. A test key to be provided to the mobile device is determined. The test key can be configured to facilitate the use of the mobile device within a test environment. The test key can be provided to the mobile device, wherein a production key stored on the secure element can be replaced by the test key. In certain embodiments, the operations of the method may be performed by one or more computers associated with the service provider. | 11-29-2012 |
20120330598 | METHOD, PROGRAM, AND SYSTEM FOR GENERATING TEST CASES - To provide a technique for generating, at a high speed, a smaller-sized set that satisfies an intended property such as, for example, being pair-wise, and includes many test cases that match a set of existing test cases given as an input, candidates to be used from a set of existing input test cases are determined in the following manner: for some parameters, values to be held by test case candidates are determined; test cases having the determined values, among those included in the set of input test cases, are selected as the candidates. A test case having the highest score among one or more test case candidates generated with the method of the related art and one or more test case candidates selected from the set of input test cases is added to a set of output test cases. | 12-27-2012 |
20130006569 | CONTROL POLICY ADJUSTING APPARATUS, METHOD OF ADJUSTING CONTROL POLICY, AND PROGRAM - A load information acquiring unit ( | 01-03-2013 |
20130035892 | APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR TESTING PROCESSING ELECTRONICS - An apparatus and method are disclosed for testing processing electronics, especially a detector module of a computer tomograph. In at least one embodiment, the apparatus includes at least one processing center, which defines test sequences during operation and/or further processes result data from the test sequences; a scheduler unit connected to the processing center which during operation, after accepting definitions of the test sequences from the processing center, executes these test sequences independently and which is coupled to a contact apparatus for contacting the processing electronics; a signal generator, which initiates test signals at the processing logic; and at least one trigger unit which during operation, synchronizes a start of a test sequence executed by the scheduler unit and an initiation of the test signals by the signal generator in real time with one another. | 02-07-2013 |
20130041613 | GENERATING A TEST SUITE FOR BROAD COVERAGE - For generating a test suite, a selection module receives a maximum time for executing a plurality of test cases, each test case comprising metadata and a plurality of components, each component comprising test instructions and an intensity. The selection module further selects a first test case of the plurality of test cases with a specified priority selected iteratively from a highest priority to a lowest priority as a selected test case if combined expected time durations for all selected test cases and a minimum expected time duration of the first test case is less than the maximum time. A generation module selects a specified intensity for the first test case and generates the test suite from the selected test cases and the specified intensity for each selected test case. | 02-14-2013 |
20130060507 | APPLICATION TESTING - A process application layer receives a command that define a generic test for an application under test. A test code generator transforms the command into test engine instructions that exercise the generic tests on the application under test. | 03-07-2013 |
20130066582 | METHOD AND DEVICE FOR DETERMINING TEST SETS OF OPERATING PARAMETER VALUES FOR AN ELECTRONIC COMPONENT - A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set. | 03-14-2013 |
20130080108 | AUTOMATIC GENERATION OF VALID AT-SPEED STRUCTURAL TEST (ASST) TEST GROUPS - A method and system is provided for automatically generating valid at speed structural test (ASST) test groups. The method includes loading a netlist for an integrated circuit into a processor. The method further includes determining a plurality of clock domain crossings between a plurality of clock domains within the integrated circuit. The method further includes generating a first test group. The method further includes adding a first clock domain of the plurality of clock domains to the first test group. The method further includes adding a second clock domain of the plurality of clock domains to the first test group when the second clock domain does not have a clock domain crossing into the first clock domain. | 03-28-2013 |
20130110447 | SYSTEMS AND METHODS FOR TESTING A PERIPHERAL INTERFACING WITH A PROCESSOR | 05-02-2013 |
20130138381 | HANDHELD ELECTRONIC DEVICE TESTING METHOD - A testing method tests a handheld electronic device installed with an open operating platform and having a touchscreen. The testing method includes the steps of executing a screen test program installed on the open operating platform to start a testing procedure; generating test coordinates by the screen test program; performing a touch selection operation based on the test coordinates by the touchscreen; and performing a functional operation by the open operating platform in response to the touch selection operation. The testing loop is repeatedly executed to simulate the ways a user may exercise touch control over the handheld electronic device to cause the handheld electronic device to hang or cause damage to software programs thereof. Accordingly, the testing method enhances the reliability of testing the handheld electronic device. | 05-30-2013 |
20130138382 | X-RAY ANALYSIS APPARATUS - An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system capable of implementing a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; a material evaluation table for storing information relating to a material that may be measured, and a name of an evaluation performed on the material; an input device for inputting the information relating to the material; a wizard program for performing computation for selecting the name of an evaluation on the basis of the information relating to the material inputted using the input device; and a wizard program for selecting a corresponding measurement method on the basis of the selected name of the evaluation. | 05-30-2013 |
20130138383 | SOLUTION FOR FULL SPEED, PARALLEL DUT TESTING - A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmed to provide test patterns and an interface to at least one device under test (DUT). The system also includes a connection to the at least one DUT, wherein the connection is coupled directly between the configurable IC and the at least one DUT. | 05-30-2013 |
20130151190 | TECHNIQUES FOR AUTOMATED INSTALLATION TESTING AND REPORTING FOR ANALYTICAL INSTRUMENTS - Automated installation processing of a mass spectrometer is described. Software is executed providing a user interface for controlling the installation process. Manual setup operations in connection with physical installation of the mass spectrometer are performed. Instrument level testing of the mass spectrometer is performed. The instrument level testing includes automating execution of a first test sequence in response to a first user interface selection. The first test sequence includes one or more performance tests whereby mass spectral data characterizing observed performance of the mass spectrometer is compared to predetermined performance criteria. System level testing of functionality of the mass spectrometer in combination with one or more other components is performed upon successful completion of said instrument level testing. The system level testing includes automating execution of a second test sequence in response to a second user interface selection. System level testing is performed after successful completion of instrument level testing. | 06-13-2013 |
20130197852 | MEASUREMENT MACHINE UTILIZING A BARCODE TO IDENTIFY AN INSPECTION PLAN FOR AN OBJECT - Embodiments of the present invention relate to a measurement machine for measuring an object, and more particularly to a measurement machine such as a portable articulated arm coordinate measuring machine or a laser tracker that measures an object according to a measurement or inspection plan that is identified by a machine readable information symbol located on the object to be measured or on a drawing (e.g., a CAD drawing) of the object. | 08-01-2013 |
20130211770 | METHOD AND AUTOMATIC TEST EQUIPMENT FOR PERFORMING A PLURALITY OF TESTS OF A DEVICE UNDER TEST - A method for performing a plurality of tests on a device under test comprises performing a plurality of tests on a device under test. Each test of the plurality of tests comprises a foreground process and a background process. The foreground process comprises a setup process during which a desired test mode is set. The background process comprises an upload process during which data captured from the device under test is provided. The foreground process is executed with a higher priority than the background process, thereby minimizing a delay between a start of consecutive tests of the device under test. | 08-15-2013 |
20130218509 | Customizing Operation of a Test Instrument Based on Information from a System Under Test - Customizing a test instrument. A plurality of pairs of code modules may be provided. Each pair of code modules may include a first code module having program instructions for execution by a processor of the test instrument and a second code module for implementation on a programmable hardware element of the test instrument. For each pair of code modules, the first code module and the second code module may collectively implement a function in the test instrument. User input may be received specifying modification of a second code module of at least one of the plurality of pairs of code modules. Accordingly, a hardware description may be generated for the programmable hardware element of the test instrument based on the modified second code module. | 08-22-2013 |
20130218510 | Method and Device for Magnetoresistive Sensor - A method and structure for operating a magnetoresistive sensor system includes applying a set-reset process wherein the set-reset signal is phased through the magnetoresistive element in such a way that the set-reset field of each region is not released until the adjacent field is aligned. Starting at one end of the magnetoresistive element, the set-reset signal is activated. This aligns the domains directly underneath the first of the set-reset elements. Before this field is released, the adjacent set-reset is activated, which aligned the domains in the adjacent field. Once the adjacent field has been realigned, the set-reset field in the first region can be released, and the set-reset field in the next region can be activated. In this way, no more than two set-reset elements must be active at any one time. | 08-22-2013 |
20130231888 | TEST APPARATUS AND TEST MODULE - Provided is a test apparatus that tests a device under test, comprising a test module that communicates with the device under test to test the device under test; and a control apparatus that executes a plurality of test programs, causes the test module to perform tests corresponding respectively to the test programs, receives test results from the test module, and performs predetermined result processes on the test results. The control apparatus stores an execution order of the test programs, and executes at least a portion of the result processes in an order indicated by the stored execution order. | 09-05-2013 |
20130238274 | Method for controlling an integrated circuit, integrated circuit and computer including an integrated circuit - The present invention relates to a method ( | 09-12-2013 |
20130253876 | Determination of a Magnetic Resonance System Activation Sequence - A method and a control sequence determination device for the determination of a magnetic resonance system activation sequence including at least one high-frequency pulse sequence to be transmitted by a magnetic resonance system are provided. A current B | 09-26-2013 |
20130262019 | CLOSED-LOOP ALIGNMENT IDENTIFICATION WITH ADAPTIVE PROBING SIGNAL DESIGN TECHNIQUE FOR WEB MANUFACTURING OR PROCESSING SYSTEMS - A method includes designing probing signals for testing an alignment of actuators in a web manufacturing or processing system with measurements of a web of material being manufactured or processed by the system. The method also includes providing the probing signals during alignment testing to identify the alignment of the actuators with the measurements of the web. Designing the probing signals includes designing the probing signals based on both spatial and dynamic characteristics of the web manufacturing or processing system. | 10-03-2013 |
20130311128 | TEST SUPPORT SYSTEM, TEST SUPPORT METHOD, AND COMPUTER READABLE NON-TRANSITORY STORAGE MEDIUM - An example of the invention is a test support system for supporting testing of a function of a program that works depending on a position of a mobile object in map information. A storage device holds event generation requirements information defining requirements for generation of an event in the program. The requirements specify a position designated in the map information and requirements on movement of the mobile object with respect to the designated position. A processor creates a plurality of test cases to be referred to in creating test data to be input to the program for checking whether the event is generated in accordance with the requirements with reference to the map information and the requirements. Each of the plurality of test cases specifies the designated position in the map information and movement of the mobile object with respect to the designated position. | 11-21-2013 |
20130346011 | MICROGRID POWER DISTRIBUTION SYSTEM AND POWER FLOW ASYMMETRICAL FAULT ANALYSIS METHOD THEREFOR - A fault analysis method includes: using a matrix of two sets of microgrid power distribution networks to analyze and solve a fault current, and for various types of faults of the distributed power distribution system, obtaining appropriate boundary conditions to calculate a variety of different types of single or simultaneous fault currents of load points. The present invention may be further applied to a situation where a bus or impedance or parallel loop is added. The present invention has good robustness and execution speed, and requires small memory space for calculation of analysis and identification of a power flow fault of the distributed power distribution system, and may be actually applied to an instrument control system for identification and analysis of a fault of a large-scalemicrogrid distribution system. | 12-26-2013 |
20140005974 | AUTOMATICALLY MODIFYING A TEST FOR A PROGRAM ON MULTIPLE ELECTRONIC DEVICES | 01-02-2014 |
20140039826 | Measurement System Results Queue For Improved Performance - System and method for testing units under test (UUTs). A test sequence is provided that includes an acquisition sequence and a processing sequence. The acquisition sequence may include a sequence of acquisition functions for performing acquisitions on one or more UUTs. The processing sequence may include a sequence of processing functions for processing measurement data resulting from the acquisitions. Each acquisition function may be performed, including performing a plurality of acquisitions, thereby generating respective measurement data sets, and storing the respective measurement data sets in order of the acquisitions. Each processing function may be performed, including retrieving and processing each respective measurement data set in order of acquisition. At least one processing function of the processing sequence may be performed concurrently with at least one acquisition function of the acquisition sequence. | 02-06-2014 |
20140107963 | METHOD AND APPARATUS FOR ENHANCED SLEEP MODE TIERING TO OPTIMIZE STANDBY TIME AND TEST YIELD - A method and apparatus for optimizing the yield of tested electronics devices is provided. A sample device is characterized to derive a specification for each device in the group. The sample size is chosen to provide reliable data and to minimize the effect of outlier devices on the characterization. After characterization, boundaries are set for the group of tested devices. Boundaries may be set based on voltages optimized for power consumption. The group of devices may be further subdivided into sub-groups based on the results of testing. The sub-groups are each assigned a unique code that reflects the results of the testing. This code is programmed into automated test equipment and is also stored in system software in order to ensure consistent values across the group of tested devices. The automated test equipment and system software are correlated using the same code to ensure higher test yield. | 04-17-2014 |
20140129173 | Application Component Testing - Systems and methods described here include embodiments for generating component test code for use in an application test generation program used to test an application under test. Certain embodiments include a computer server running the application test generation program with an integrated custom engine and function libraries, the custom engine configured to allow a user to define a component, allow the user to select at least one application area, allow the user to define a component step for the defined component, wherein defining a component step includes, an object repository associated with the selected application area, at least one object option associated with the selected object repository, wherein the selection of the object option determines subsequent sets of object options for selection by the user, repeating, and to generate the component test code, via associations in the function libraries between component test code portions and the defined component steps. | 05-08-2014 |
20140163919 | PUMP COMPATIBILITY TEST - A testing device ( | 06-12-2014 |
20140172347 | GENERATION OF A RANDOM SUB-SPACE OF THE SPACE OF ASSIGNMENTS FOR A SET OF GENERATIVE ATTRIBUTES FOR VERIFICATION COVERAGE CLOSURE - System, method and computer readable medium are described. The method may include obtaining user defined distribution traits characterizing a random sub-space of a space of assignments for a set of generative variables. The method may further include applying the user defined distribution traits on the space of assignments for a set of generative variables to generate the random sub-space of the space of assignments for a set of generative variables. The method may also include testing a device under test using the generated random sub-space of the space of assignments for a set of generative variables. | 06-19-2014 |
20140207403 | INSPECTION INSTRUMENT AUTO-CONFIGURATION - A method includes obtaining, via an inspection instrument, identifying information relating to an object that is to be inspected; querying, via the inspection instrument, a data source for relevant inspection information using at least the identifying information; receiving, via the inspection instrument, the relevant inspection information; and configuring the inspection instrument, via changes automatically implemented by the inspection instrument, based upon the received relevant inspection information. | 07-24-2014 |
20140207404 | SCALABLE TEST PLATFORM - A method, computer program product, and computing system for, upon the occurrence of a computer-related event, comparing code utilized by one or more subsystems included within a scalable test platform to code available from a remote location. If the code available from the remote location is newer than the code utilized by one or more subsystems, the code available from the remote location is obtained, thus defining newer code. The code utilized by one or more subsystems is updated with the newer code. | 07-24-2014 |
20140257739 | IMPLEMENTING RANDOM CONTENT OF PROGRAM LOOPS IN RANDOM TEST GENERATION FOR PROCESSOR VERIFICATION - A method and apparatus are provided for implementing random content of program loops in random test generation for processor verification. A converged branch instruction stream is used by a test generator to ensure that all random conditional branches converge to a main program loop. A built in exception handling mechanism of the test generator enables program interrupts to converge to the main program loop. Mandatory read only registers applied to the test generator allow all register based storage addresses to use registers that maintain a value and thus stabilize the storage address translations through subsequent iterations of the loop. A global class restriction mechanism defines specific restricted instruction classes applied to the test generator avoids inherently problematic operations for the program loops. Machine state detection and restoration mechanisms in the test generator are provided to preserve storage addressability. | 09-11-2014 |
20140288872 | TESTING DEVICE AND TESTING METHOD FOR TESTING PERFORMANCE PARAMETER OF ELECTRONIC DEVICE - A testing device includes a display and a storage that stores a testing table. The testing table records at least one testing project and a test value of each of a plurality of parameters corresponding to the at least one testing project. Each parameter corresponding to a reference value range. The test value of each parameter is compared with the corresponding reference value range to determine whether the test value of each parameter is within the corresponding reference value range. The display displays test information of each test project according to a comparison result between the test value of each parameter and the corresponding value range. | 09-25-2014 |
20140324378 | AUTOMATED GENERATION OF A TEST CLASS PRE-HEADER FROM AN INTERACTIVE GRAPHICAL USER INTERFACE - A method for performing tests using automated test equipment (ATE) is presented. The method comprises obtaining information concerning a test class using a graphical user interface. Further, it comprises generating a first header file automatically, wherein the first header file comprises the information concerning the test class. Next, it comprises importing the first header file into a test plan operable to execute using a tester operating system wherein the test plan comprises instances of the test class. It further comprises, generating a second header file from the first header file automatically, wherein the second header file is a header file for the test class. The method also comprises validating the test plan using the tester operating system. Finally, the method comprises loading the test plan and a compiled module onto the tester operating system for execution, wherein the compiled module is a compiled translation of the test class. | 10-30-2014 |
20140343886 | AUTOMATED TESTING AND DIAGNOSTIC MANAGEMENT OF BUILDING AUTOMATION AND CONTROLLED SYSTEMS - Various embodiments provide systems, methods, and computer program products for diagnosing an operational functionality and/or performance of one or more building controlled systems. Such are generally configured to: correlate one or more control system points with one or more test variables associated with one or more test sequences; execute at least one of said one or more test sequences based at least in part upon said correlation and at least in part upon one or more user-defined parameters, the execution generating test data indicative of one or more results; at least in part analyze the test data to identify whether one or more discrepancies exist therein, the identification being based at least in part upon a comparison of the test data with the one or more control system point properties; and generate at least one of one or more reports, one or more alerts, or one or more instructions. | 11-20-2014 |
20140372069 | Web-Based Multi-Sensor/Instrument Control System - A system for monitoring and controlling electrical devices has a local central processor with memory for storing an operating and control systems for controlling analog or digital sensors, instruments, and devices. A web browser interfaces with a communications system to exchange data with the local central processor. External hardware couples to the local central processor via an inter integrated circuit interconnection system. Plural sensors and instruments couple to the local central processor, and are controlled over the internet. Electrical devices include any combination of temperature sensors, potentiometric sensors, oceanographic sensors and instruments, industrial sensors and instruments, voltammetric sensors, light sensors, atmospheric sensors and instruments, water sensors, pH sensors, and amperometric sensors and instruments. Sensor data is stored in a removable data storage arrangement. | 12-18-2014 |
20150012238 | METHOD AND DEVICE FOR DETERMINING TEST SETS OF OPERATING PARAMETER VALUES FOR AN ELECTRONIC COMPONENT - A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set. | 01-08-2015 |
20150032406 | METHOD AND DEVICE FOR OPTIMIZATION OF A PULSE SEQUENCE FOR A MAGNETIC RESONANCE IMAGING SYSTEM - In a method for optimization of a pulse sequence for a magnetic resonance imaging apparatus, a plan gradient pulse train that is to be executed to chronologically match a radio-frequency pulse train to control an RF transmission system of the magnetic resonance imaging apparatus is adopted to control a gradient system of the magnetic resonance imaging apparatus. The determined plan gradient pulse train forms an optimization segment and for the optimization segment a plan gradient moment is determined. A real gradient pulse train that can actually be executed is determined for the optimization segment of the determined plan gradient pulse train and a real gradient moment is determined for the real gradient pulse train. An error gradient moment difference between the real gradient moment and the plan gradient moment is determined. The real gradient pulse train is modified so that the magnitude of the gradient moment difference between the plan gradient moment and the gradient moment of the modified real gradient pulse train is optimized. A pulse sequence optimization unit is designed to implement such a method and a magnetic resonance imaging system is operated using such a pulse sequence optimization unit. | 01-29-2015 |
20150051863 | TEST SYSTEM - A server stores multiple configuration data. A tester hardware is configured to be capable of changing at least a part of its functions according to configuration data stored in rewritable memory, to supply a power supply voltage to a DUT, to transmit a signal to the DUT, and to receive a signal from the DUT. An information technology equipment is configured such that, (i) when the test system is set up, the information technology equipment acquires the configuration data from the server according to the user's input, and writes the configuration data to the memory. Furthermore, the information technology equipment is configured such that, (ii) when the DUT is tested, the information technology equipment executes a test program so as to control the tester hardware, and to process data acquired by the tester hardware. | 02-19-2015 |
20150057962 | REAGENT KIT AND MEASUREMENT SOFTWARE SERVER - Provided is a reagent kit that includes: a reagent to be used together with a measuring device in measurement of an optical characteristic of a sample; one or more reagent containers containing therein the reagent; and an access information indicator. The access information indicator is indicative of access information that allows a client to gain access to a measurement software server. The client is operated upon the measurement of the optical characteristic. The measurement software server is a server on which measurement software is uploaded. The reagent kit is provided for analysis of the sample through the measurement of the optical characteristic. The access information contains provider identification information that allows for identification of a reagent provider. The reagent provider is a provider of the reagent kit. | 02-26-2015 |
20150066417 | TEST SYSTEM - A server stores multiple configuration data. A tester hardware is configured to be capable of changing at least a part of its functions according to configuration data stored in rewritable nonvolatile memory, to supply a power supply voltage to a DUT, to transmit a signal to the DUT, and to receive a signal from the DUT. An information technology equipment is configured such that, (i) when the test system is set up, the information technology equipment acquires the configuration data from the server according to the user's input, and writes the configuration data to the nonvolatile memory. Furthermore, the information technology equipment is configured such that, (ii) when the DUT is tested, the information technology equipment executes a test program so as to control the tester hardware, and to process data acquired by the tester hardware. | 03-05-2015 |
20150081243 | Setsudo: Pertubation-based Testing Framework for Scalable Distributed Systems - Disclosed are a testing framework—SETSUD Ō—that uses perturbation-based exploration for robustness testing of modern scalable distributed systems. In sharp contrast to existing testing techniques and tools that are limited in that they are typically based on black-box approaches or they focus mostly on failure recovery testing, SETSUD Ō is a flexible framework to exercise various perturbations to create stressful scenarios. SETSUD Ō is built on an underlying instrumentation infrastructure that provides abstractions of internal states of the system as labeled entities. Both novice and advanced testers can use these labeled entities to specify scenarios of interest at the high level, in the form of a declarative style test policy. SETSUD Ō automatically generates perturbation sequences and applies them to system-level implementations, without burdening the tester with low-level details. | 03-19-2015 |
20150142367 | TECHNIQUES FOR USE WITH TEST QUALIFICATION PROTOCOLS - Described are techniques for performing qualification protocol testing. A qualification entity category is selected indicating a category of an entity for which a qualification test protocol is generated. One or more qualification tests are selected and included in the qualification test protocol. Test information is specified for the one or more qualification tests. The test information includes first information identifying one or more code modules executed to perform said one or more qualification tests, second information identifying test inputs to said one or more code modules, and third information specifying how to evaluate tests results from executing each of said one or more qualification tests. A qualification protocol structure including said test information is generated. | 05-21-2015 |
20150317242 | TEST DESIGN ASSISTANCE DEVICE, TEST DESIGN ASSISTANCE METHOD, PROGRAM AND COMPUTER-READABLE MEDIUM - A test design assistance device | 11-05-2015 |
20150323512 | Computer-Implemented Systems and Methods for Generating Generalized Fractional Designs - A method and system for creating a design plan to test a product characteristic are described. One or more factors, level corresponding to the factors, and partitions for testing the product characteristic are determined. For each partition, an active matrix is generated. The product characteristic can be tested at each partition using the levels for the factors specified by the corresponding active matrix. | 11-12-2015 |
20150363304 | SELF-LEARNING AND SELF-VALIDATING DECLARATIVE TESTING - A system and method for self-learning and self-validating declarative testing are provided. In example embodiments, a user experience module identifies a declarative test representing a user experience being tested. A test execution module simulates a client machine including a client machine environment and executes the declarative test using the simulated client machine and the user behavior data of the specific user to generate test results. A validation module validates the test results by invoking at least one of plurality of validators, including at least one client-side validator and at least one server-side validator. | 12-17-2015 |
20160025613 | Reducing Condensation Risk Within Liquid Cooled Computers - An approach is provided in which a manufacturing test scheduling system predicts a dew point forecast indoor a facility based upon outdoor weather data and indoor environment data. The manufacturing test scheduling system selects time slots in the dew point forecast based upon a pre-defined dew point threshold and, in turn, schedules tests of a liquid cooled computer system during the selected time slots. | 01-28-2016 |
20160077158 | TESTING DEVICE AND ITS CALIBRATION METHOD - According to one embodiment, a testing device includes a signal generator that generates a first signal output to a device under test, a channel selector provided after the signal generator and configured to select one of a plurality of channels, a signal receiver that receives the second signal supplied from the device under test, a correction value calculator that calculates a correction value for calibrating loss of a respective one of the channels, wherein the correction value calculator calculates a correction value for calibrating loss of a respective one of the channels included in the channel selector, based on a signal level received by the signal receiver via a loopback channel, when a calibration-level output state indicating a state where a signal level of the first signal generated by the signal generator reaches a predetermined transmission reference level of calibration is assumed. | 03-17-2016 |
20160091876 | Embedded Shared Logical Instrument - System and method for controlling a custom modular measurement system. An editor may receive user input specifying one or more system definitions, each mapping message based commands, parameters, variables and/or metadata (“information”) accordant with a control protocol for standalone instruments to functions and data in a programming language, and generates the definitions accordingly, each being useable by a client application to interface with a custom modular measurement system that includes multiple logical instruments via the message based information. At least one of the definitions may be deployed onto the measurement system. A run-time engine of the measurement system may accept a message based command from the application, and call a corresponding function, which may invoke operation of at least one of the logical instruments. The logical instruments may be operated concurrently, including sharing use of a single physical measurement device by at least two of the logical instruments. | 03-31-2016 |
20160161544 | TESTING OF SEMICONDUCTOR DEVICES - A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module. | 06-09-2016 |
20170234669 | MEASUREMENT MACHINE UTILIZING A BARCODE TO IDENTIFY AN INSPECTION PLAN FOR AN OBJECT | 08-17-2017 |