Class / Patent application number | Description | Number of patent applications / Date published |
378082000 | Spatial energy dispersion | 67 |
20080240354 | Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus - A Method for X-ray wavelength measurement and an X-ray wavelength measurement apparatus capable of determining absolute wavelength easily and carrying out wavelength measurement having high precision with a simple structure are provided. The present invention is a Method for X-ray wavelength measurement carried out by using a channel-cut crystal for wavelength measurement ( | 10-02-2008 |
20090080612 | RADIATION SPECTRUM MEASURING SYSTEM - According to an aspect of the invention, a radiation spectrum measuring system for measuring a radiation spectrum by using a radiation detection element includes, a radiation spectrum measuring unit for measuring a radiation spectrum by obtaining a pulse signal output from the radiation detection element as data, and a rise time detection unit which detects a rise time of the pulse signal, compares the detected rise time with a preset value, and causes the radiation spectrum measuring unit to exclude from data a pulse signal with a rise time longer than the preset value. | 03-26-2009 |
20090122957 | Method for Evaluating Press-Formability of Galvanized Steel Sheet - The press formability of a galvanized steel sheet including an oxide film, which has a thickness of 10 nm to 100 nm, as a surface layer is nondestructively speedily evaluated. A specific method for solving problems is characterized by including the steps of irradiating X-rays to a galvanized steel sheet, dispersing a fluorescent X-ray, which is excited and emitted in the applying, with an analyzing crystal exhibiting the difference in diffraction angle between a primary oxygen Kα x-ray and a secondary zinc Lβ x-ray of | 05-14-2009 |
20090310748 | Method and Apparatus for Analysis Using X-Ray Spectra - A method for precisely measuring and displaying the whole profile of an X-ray spectral waveform, which rises from a background level and finally returns to the background level after passing across a peak. X-rays are counted for a time interval of to at a spectral position, resulting in X-ray N counts not containing statistical fluctuations. A standard deviation Eo representing a variation accompanying the N counts is given by Sqrt(N). Where the variation is greater than a given magnitude (tolerance error Er for display) at a spectral position where the X-ray intensity is high, X-rays are counted for a time interval of tm longer than the time interval to, producing increased counts Nm. | 12-17-2009 |
20100027747 | PILEUP REJECTION IN AN ENERGY-DISPERSIVE RADIATION SPECTROMETRY SYSTEM - A method of detecting a pileup in an energy-dispersive radiation spectrometry system, wherein a filter of the system generates a first pulse in response to a preamplifier signal, and wherein the system has one or more fast channels having an energy of full efficiency wherein substantially all photons received having at least the full efficiency energy are detected. The method includes measuring an above threshold time duration of the filter, determining that the fast channels have not made any detections while the first pulse is above the minimum detectable threshold energy of the filter, in response thereto, declaring a pileup if the above threshold time duration exceeds a longest expected pulse duration that is a duration of a second pulse that would be output by the filter in response to a single photon having an energy equal to the energy of full efficiency being received by the system. | 02-04-2010 |
20100027748 | Synergistic Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry - An X-ray spectroscope collects an energy-dispersive spectrum from a sample under analysis, and generates a list of candidate elements that may be present in the sample. A wavelength dispersive spectral collector is then tuned to obtain X-ray intensity measurements at the energies/wavelengths of some or all of the candidate elements, thereby verifying whether or not these candidate elements are in fact present in the sample. Additionally, the alignment of the wavelength dispersive spectral collector versus the sample can be optimized by tuning the wavelength dispersive spectral collector to the energy/wavelength of a selected one of the candidate elements—preferably one whose presence in the sample has been verified, or one which has a high likelihood of being present in the sample—and then varying the alignment of the wavelength dispersive spectral collector versus the sample until the wavelength dispersive spectral collector returns the maximum intensity reading for the selected candidate element. Intensity readings for the other candidate elements can then be collected at this optimized alignment. | 02-04-2010 |
20100061513 | ELECTROMAGNETIC WAVE/PARTICLE BEAM SPECTROSCOPIC METHOD AND ELECTROMAGNETIC WAVE/PARTICLE BEAM SPECTROSCOPIC INSTRUMENT - The present invention provides an electromagnetic wave/particle beam spectroscopic instrument that is not easily deteriorated in spectroscopic capability, and is resistant to electromagnetic noise, vibrations, heavy sound, heat and specific particle beams of interest, particle beams other than electromagnetic waves, electric noise due to electromagnetic waves, mechanical destruction, and recoiling of solid constituent atoms and is also more resistant to radiation exposure on the detection means than the conventional energy resolving technologies. A spectroscopic instrument | 03-11-2010 |
20100316190 | PHASE-SENSITIVE X-RAY IMAGER - X-ray phase sensitive wave-front sensor techniques are detailed that are capable of measuring the entire two-dimensional x-ray electric field, both the amplitude and phase, with a single measurement. These Hartmann sensing and 2-D Shear interferometry wave-front sensors do not require a temporally coherent source and are therefore compatible with x-ray tubes and also with laser-produced or x-pinch x-ray sources. | 12-16-2010 |
20110058652 | SHORT WORKING DISTANCE SPECTROMETER AND ASSOCIATED DEVICES, SYSTEMS, AND METHODS - A spectrometer includes a rigid body having a first planar face with an orientation and a second planar face with a different orientation than the first planar face. The first and second planar faces are configured to position Bragg diffraction elements, and the orientation of the first planar face and the different orientation of the second planar face are arranged to convey a predetermined spectral range of the electromagnetic radiation to non-overlapping regions of the sensor location via the diffraction elements. | 03-10-2011 |
20110096906 | Method and System for Extracting Spectroscopic Information from Images and Waveforms - The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances. | 04-28-2011 |
20110188631 | X-ray spectrometer - The invention relates to X-ray spectral analysis and can be used for control of radiation spectra of X-ray generators as well as for analysis of elemental chemical composition and atomic structure of the specimens by measuring their absorption spectra. The X-ray spectrometer comprises at least one dispersing prism element, means of translation of the dispersing element relative to an X-ray beam, a refracted radiation detector and measuring tools for angle positioning of the dispersing element and the refracted radiation detector. The main distinction of the claimed spectrometer is that it contains an additional radiation detector, means to install it downstream the radiation reflected from the refracting surface of the dispersing element and measuring tools for its angle position in relation to the primary X-ray beam. The dispersing element is made of diamond, or beryllium, lithium hydride or boron carbide. The claimed spectrometer scheme provides a multiple increase of spectral measurements accuracy within the energy range up to 100 keV and possibility of pulse spectra calibration. | 08-04-2011 |
20110211675 | STABILIZATION IN GAMMA-RAY SPECTOMETRY - A calibration source ( | 09-01-2011 |
20110268252 | X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD - An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided. | 11-03-2011 |
20120027175 | Object Scanning Protocol - A two step method of scanning objects to gain information about material content comprises the steps of providing a radiation source and a radiation detector system spaced therefrom to define a scanning zone therebetween. In a first scanning step, an object is moved relative to the source and detector system, intensity information about radiation incident at the detector system after interaction with the object as it passes through the scanning zone is collected, variation of intensity as the object moves through the scanning zone is used to identify anomalous structures and/or absence of homogeneity in the object. In a second, subsequent scanning step an object is located in fixed position in the scanning zone and collecting intensity information collected, analysed against a suitable functional relationship relating transmitted to incident intensity, and the results compared with a library of suitable data to provide an indication of material content. | 02-02-2012 |
20120114100 | DIRECTIONAL GAMMA RADIATION DETECTOR SYSTEM - A directional gamma radiation detector system for determining an angle under which a measured gamma radiation hits a gamma radiation detector system, includes gamma radiation detectors arranged in close distance; detector electronics for operating the at least two gamma radiation detectors as spectrometers in a way that the detector electronics are collecting energy spectra of the detected gamma rays for each gamma radiation detector; and system electronics allowing the directional gamma radiation detector system to identify coincident events in the at least two gamma radiation detectors. | 05-10-2012 |
20130070900 | COMBINE APPARATUS OF SCANNING ELECTRON MICROSCOPE AND ENERGY DISPERSIVE X-RAY SPECTROSCOPY - Disclosed is a combine apparatus of a scanning electron microscope and an energy dispersive x-ray spectroscopy in that the scanning electron microscope and the energy dispersive x-ray are combined, whereby unifying as one apparatus. The combine apparatus of the scanning electron microscope and the energy dispersive x-ray spectroscopy includes: an image generation means for detecting electrons emitted from a sample for measuring a shape of the sample and simultaneously generating a scanning electron microscope image for analyzing an x-ray; a controller for generating a display control signal and a specific position storing control signal of the image generated from the image generation means; and an x-ray measuring circuit for accumulating an energy level on a specific position of the image generated from the image generation means according to the specific position storing control signal generated by the controller to provide an element information thereof. | 03-21-2013 |
20140003579 | PHOTONIC SPECTROMETRY DEVICE AND METHOD, METHOD FOR CALIBRATING THE DEVICE, AND USE OF THE DEVICE | 01-02-2014 |
20140003580 | PHOTONIC SPECTROMETRY DEVICE, CORRESPONDING METHOD, AND USE OF THE DEVICE | 01-02-2014 |
20140314207 | Device and method for determining the energetic composition of electromagnetic waves - The present invention relates to a method and device for determining the energetic composition of electromagnetic waves. It is the object of the present invention to provide a method and device for X-ray spectroscopy that allows simultaneous detection of the individual energies at a comparatively higher resolution and/or across a comparatively wider energy range. According to the invention, at least one reflective zone plate ( | 10-23-2014 |
20140369473 | Method And Apparatus For Characterising A Material By Scattering Of Electromagnetic Radiation - The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (θ); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (μmaterial (E0, E1, ε)), a configuration for estimating the density (p) of the material. | 12-18-2014 |
20150010133 | METHODS FOR MEASURING A THICKNESS OF AN OBJECT - A method for analyzing an object includes measuring a first reflectivity of light from a surface and measuring a second reflectivity of light from the object, after the object is formed on the surface. A variation between the first and second reflectivities is calculated, and the variation is transformed by a predetermined transform. A thickness of the object is determined based on the transformed variation. | 01-08-2015 |
20150131783 | RADIATION DETECTION SYSTEM AND RADIATION IMAGING APPARATUS - A radiation detection system comprises at least one detector in which a plurality of detection elements are arranged, wherein each detection element includes a converting portion that converts energy of incident radiations directly into electrical signals and a signal reading portion that reads the electrical signal from the converting portion and outputs the electrical signal, the converting portion including a plurality of protruded portions arranged at intervals, and the plurality of protruded portions are electrically connected to one signal reading portion. | 05-14-2015 |
378083000 | Composition analysis | 11 |
20080247511 | Method for detecting a mass density image of an object - A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitted from the crystal analyzer onto a detector and digitized. A first image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a first angular position. A second image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a second angular position. A refraction image is obtained and a regularized mathematical inversion algorithm is applied to the refraction image to obtain a mass density image. | 10-09-2008 |
20090060133 | SYSTEMS AND METHODS FOR USING A CRYSTALLINITY OF A SUBSTANCE TO IDENTIFY THE SUBSTANCE - A method for naming a substance is described. The method includes using a crystallinity of the substance to name the substance. | 03-05-2009 |
20100246768 | X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS - In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror consists of a combination of plural flat reflective surfaces. The respective centers of the flat reflective surfaces are located on an equiangular spiral having a center that is located on a surface of the sample. The X-ray detector is one-dimensional position-sensitive in a plane parallel to the diffraction plane. X-rays that have been reflected at different flat reflective surfaces reach different points on the X-ray detector respectively. A corrective operation is performed for separately recognizing the different reflected X-rays on the assumption that the different reflected X-rays that have been reflected at the different flat reflective surfaces might be unfortunately mixed each other on the same detecting region of the X-ray detector. This X-ray diffraction method is superior in angular resolution, and is small in X-ray intensity reduction, and is simple in structure. | 09-30-2010 |
20100303206 | Online energy dispersive X-ray diffraction analyser - An on-line EDXRD analyser including (i) a housing defining an analysis zone and having a passageway through it to allow transport of material in a process stream to pass through the analysis zone, (ii) a collimated source of polychromatic X-rays, (iii) an energy-resolving (ER)X-ray detector, (iv) a primary beam collimator disposed between the source of X-rays and the (ER)X-ray detector comprising an annular slit which defines an incident beam of polychromatic X-rays to irradiate a portion of the analysis zone, (v) a scatter collimator disposed between the primary beam collimator and the ERX-ray detector, the scatter collimator comprising an annular slit which defines a diffracted beam of X-rays scattered by the material to converge towards the ERX-ray detector, and (vi) a detector collimator comprising a conical opening which further defines the diffracted beam of X-rays scattered by the material. The ERX-ray detector measures an energy spectrum of the diffracted X-rays at a predetermined diffraction angle defined by the relative positioning of (ii) to (vi), and where one of (iv) and (v) comprises an aperture arranged to enable a detector to measure the transmission of a direct beam of X-rays through the material. | 12-02-2010 |
20110110493 | Determination of Composition of Liquids - A method of and apparatus for obtaining radiation transmission data from a liquid in such manner that allows some data about relative proportions of constituent ingredients to be derived is described. A radiation source and a radiation detector system able to resolve transmitted intensity across a plurality of frequencies within the spectrum of the source are used to produce transmitted intensity data for each such frequency. Measured data is compared numerically to a mass attenuation data library storing mass attenuation data, individually or collectively, for a small number of expected constituent ingredients of the liquid to fit each intensity data item to the relationship given by the exponential attenuation law: I/I | 05-12-2011 |
20120321045 | COMPOSITIONS, METHODS OF USE AND SYSTEMS FOR ANALYSIS OF SILICON LEVELS IN PETROLEUM MATERIALS - This invention relates in general to the determination of silicon levels in fuel mixtures, such as petroleum products. More particularly, the present invention relates to compositions for use as standards in an x-ray analyzer for the measurement of silicon in various fuel mixtures, and to methods of using these compositions. | 12-20-2012 |
20130188776 | SYSTEM AND METHOD FOR MEASURING ASH CONTENT AND CALORIFIED VALUE OF COAL - A system and a method for measuring an ash content and a calorific value of a coal are provided. The system comprises: an X ray device, disposed over the coal and configured to emit an X ray to the coal; at least one X ray measuring device, disposed over the coal and configured to measure an energy spectrum of an X ray reflected by the coal; a distance sensor, disposed over the coal and configured to measure a distance between the coal and the at least one X ray measuring device; and a computing device, configured to receive the energy spectrum and the distance from the at least one X ray measuring device and the distance sensor and to compute the ash content and the calorific value of the coal according to the energy spectrum and the distance. | 07-25-2013 |
20130287173 | DEVICE FOR ANALYZING FILM ON SURFACE OF ELECTRODE FOR RECHARGEABLE LITHIUM BATTERY AND METHOD OF ANALYZING FILM ON SURFACE OF ELECTRODE FOR RECHARGEABLE LITHIUM BATTERY USING SAME - A device for analyzing a film on a surface of an electrode for a rechargeable lithium battery includes: an inert chamber capable of maintaining an inert atmosphere including controlled amounts of moisture and oxygen and including an inner space for pretreating a sample including the film on the surface of the electrode; a first analyzer coupled to the inert chamber through a connection tube, the first analyzer being configured to receive the sample and being configured to provide composition and thickness information of the film; an inert holder configured to be assembled around the sample in the inert chamber and configured to maintain the inert atmosphere around the sample; and a second analyzer mounted with the inert holder therein and configured to provide shape information of the film. A method of analyzing a film on a surface of an electrode using the device is also disclosed. | 10-31-2013 |
20150139400 | System And Method For Determining The Radiological Composition of Material Layers Within a Conduit - There is provided a System and Method For Determining The Radiological Composition of Material Layers Within a Conduit. The system and method disclosed is equally applicable to pipes, vessels, and conduits as well as medical applications such as determining vessel thickness, occlusion, scarring, or the like in humans and animals. A phantom setup is disclosed that has a phantom containing a test standard such as a reactor water test standard, removable plates, a collimator and probe with a spectrometer display. The phantom setup provides a baseline data set that can be used in conjunction with field measurements to determine the composition of materials within the conduit, such as corrosion or the like. The baseline data set may be semi-logarithmic and contains spectrometer readings of various plate thicknesses or quantities of plates. | 05-21-2015 |
20150369762 | QUANTITATIVE DETERMINATION OF NITROGEN SPECIES DISTRIBUTION IN DISPERSANTS - The nitrogen species in a long chain alkenyl succinimide are quantitated and speciated by means of X-Ray Photoelectron Spectroscopy with speciation being made by chemometrically curve resolving the XPS spectrum. | 12-24-2015 |
20160033427 | Diffractometry-Based Analysis Method And Associated Diffractometer, Particularly Suitable For Samples Comprising Multiple Layers Of Materials - A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined. | 02-04-2016 |
378084000 | Monochromator or focusing device | 34 |
20080279332 | X-Ray or Neutron Monochromator - The invention relates to a monochromator device for selecting at least one wavelength band from incident radiation in a given wavelength range. The monochromator device may include at least one optical layer of a monocrystalline material having a crystallographic line that is adapted to the at least one wavelength band to be selected; and a mechanical substrate. The at least one optical layer and the mechanical substrate are assembled by molecular bonding. | 11-13-2008 |
20090161829 | MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING - An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics. | 06-25-2009 |
20090290681 | METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS - Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising: (a) disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction; (b) projecting a beam of monochromatic x-rays on the sample; and (c) obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively. | 11-26-2009 |
20100002838 | HIGH PRECISION POSTURE CONTROL METHOD OF X-RAY MIRROR - A high precision posture control method for sustaining the posture of an X-ray optical element constantly at 1 μrad or less. A longitudinal condensation mirror ( | 01-07-2010 |
20100111254 | METHOD FOR X-RAY WAVELENGTH MEASUREMENT AND X-RAY WAVELENGTH MEASUREMENT APPARATUS - A Method for X-ray wavelength measurement and an X-ray wavelength measurement apparatus capable of determining absolute wavelength easily and carrying out wavelength measurement having high precision with a simple structure are provided. The present invention is a Method for X-ray wavelength measurement carried out by using a channel-cut crystal for wavelength measurement ( | 05-06-2010 |
20100183122 | X-RAY CONDENSING METHOD AND ITS DEVICE USING PHASE RESTORATION METHOD - An X-ray condensing method and its device are provided with an X-ray mirror that has a wavefront adjustable function to finely adjust a wavefront of a reflecting X-ray, measure an X-ray intensity distribution in the vicinity of a focus, measure an X-ray intensity distribution in the vicinity of the X-ray mirror or use a known X-ray intensity distribution of an incident X-ray, calculate a complex amplitude distribution at the reflective surface by using a phase restoration method from the X-ray intensity distribution in the vicinity of the focus and the X-ray intensity distribution in the vicinity of the reflective surface, calculate a wavefront aberration of an X-ray condensing optical system from the complex amplitude distribution, and control the reflective surface of the X-ray mirror with the wavefront adjustable function so that the wavefront aberration is minimized. | 07-22-2010 |
20100195795 | X-Ray multichannel spectrometer - An X-ray multichannel spectrometer comprising a polychromatic source ( | 08-05-2010 |
20100246769 | X-RAY OPTICAL GRATING AND METHOD FOR THE PRODUCTION THEREOF, AND X-RAY DETECTOR EMBODYING SAME - In a method for the production of x-ray-optical gratings composed of a first material forming of periodically arranged grating webs and grating openings, a second material is applied by electroplating to fill the grid openings. The electroplating is continued until a cohesive layer of the second material with uniform height is created over the grating webs with this layer having a large absorption coefficient, the absorption properties of the grating structure of the grating are homogenized, so an improvement of the measurement signals that are generated with this grating is improved. Moreover, the mechanical stability of gratings produced in such a manner is improved. | 09-30-2010 |
20110129065 | X-RAY MONOCHROMATOR, METHOD OF MANUFACTURING THE SAME AND X-RAY SPECTROMETER - An X-ray monochromator including: a substrate having a concave surface; and an inorganic oxide film formed on the concave surface and having a plurality of pores, in which the plurality of pores of the inorganic oxide film being laid periodically in a stacked manner in the normal directions of the concave surface, and in which the plurality of pores being cylindrical is provided. The X-ray monochromator shows an excellent X-ray spectroscopic performance. | 06-02-2011 |
20110135059 | X-ray optical configuration with two focusing elements - An X-ray optical configuration ( | 06-09-2011 |
20110170666 | XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNED PACKAGE - An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics. | 07-14-2011 |
20110299658 | X-RAY RADIATOR TO GENERATE QUASI-MONOCHROMATIC X-RAY RADIATION, AND RADIOGRAPHY X-RAY ACQUISITION SYSTEM EMPLOYING SAME - For a quasi-monochromatic x-ray radiation with high radiation intensity, an x-ray radiator generates quasi-monochromatic x-ray radiation to expose a subject from a point-shaped radiation source that emits a polychromatic x-ray radiation, and having a diffraction device to diffract the polychromatic x-ray radiation. The diffraction device has a super-mirror made of crystalline material with a flat surface. In the super-mirror, the crystalline material has at least one (in particular continuous) variation of the lattice plane spacing of the crystal lattice. The radiation source and the diffraction device are arranged such that quasi-monochromatic x-ray radiation is generated from the polychromatic x-ray radiation by partial reflection at the super-mirror. | 12-08-2011 |
20120063569 | Two-Axis Sagittal Focusing Monochromator - An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source. | 03-15-2012 |
20120114101 | METHODS AND SYSTEMS FOR THE DIRECTING AND ENERGY FILTERING OF X-RAYS FOR NON-INTRUSIVE INSPECTION - Systems and methods are disclosed herein for lenses based on crystal X-ray diffraction and reflection to be used to direct and energy filter X-ray beams | 05-10-2012 |
20120140891 | Method for extracting a primary diffusion spectrum - A method and device for spectrometry analysis and for extracting a primary diffuse spectrum from a diffusion spectrum of diffuse radiation, according to a diffusion angle, coming from a material exposed to incident radiation through a surface, that includes the application of a spectral response function organized in the form of a matrix (M), known as a correlation matrix, of which each value a | 06-07-2012 |
20120294426 | COMPACT X-RAY ANALYSIS SYSTEM - The invention relates to a device for the delivery of a beam of X-rays for analysis of a sample ( | 11-22-2012 |
20130108022 | METHOD FOR CHARACTERIZATION OF A SPHERICALLY BENT CRYSTAL FOR K-alpha X-RAY IMAGING OF LASER PLASMAS USING A FOCUSING MONOCHROMATOR GEOMETRY | 05-02-2013 |
20130272501 | X-RAY IMAGING APPARATUS - The present invention relates to an X-ray imaging apparatus including an X-ray source, a grating that divides diverging X-rays irradiated from the X-ray source, and a detector that detects X-rays which are divided by the grating and pass through a sample. The grating includes a plurality of transparent objects which pass the diverging X-rays and a plurality of opaque objects that shield the diverging X-rays. A focused position at which a plurality of extended lines intersect each other and the X-ray source are arranged in different position. The extended lines are formed by extending center lines which connect a center of the X-ray source side of each of the plurality of opaque objects facing the X-ray source with a center of the detector side of each of the plurality of opaque objects facing the detector. | 10-17-2013 |
20160086681 | Zone Plate and Method for Fabricating Same Using Conformal Coating - A system and method for improving efficiency of zone plates fabricated by conformal layer coatings is disclosed. In embodiments, the inventive conformal layer coating zone plates provide increased zone widths from one times a deposited conformal layer coating thickness up to and including two times the conformal layer coating thickness. By designing a template that increases a mark-to-space ratio of the annular rings of the template, coating sidewalls of the annular rings with an conformal layer coating to form the zones, and then substantially filling annular channels defined by the annular rings with the conformal layer coating to form wider zones, significant efficiency increases can be achieved over conventional conformal layer coating zone plates, especially for innermost zones. | 03-24-2016 |
20160178541 | APPARATUS FOR ANALYZING THIN FILM | 06-23-2016 |
378085000 | With plural dispersing elements | 14 |
20080247512 | Sagittal Focusing Laue Monochromator - An x-ray focusing device generally includes a slide pivotable about a pivot point defined at a forward end thereof, a rail unit fixed with respect to the pivotable slide, a forward crystal for focusing x-rays disposed at the forward end of the pivotable slide and a rearward crystal for focusing x-rays movably coupled to the pivotable slide and the fixed rail unit at a distance rearward from the forward crystal. The forward and rearward crystals define reciprocal angles of incidence with respect to the pivot point, wherein pivoting of the slide about the pivot point changes the incidence angles of the forward and rearward crystals while simultaneously changing the distance between the forward and rearward crystals. | 10-09-2008 |
20090060134 | SCHLIEREN-TYPE RADIOGRAPHY USING A LINE SOURCE AND FOCUSING OPTICS - A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis. Such shadowgraph is naturally well defined in the opposite axis of narrow beam origin and can reveal an object's refraction, reflection and/or scattering properties along that axis. An embodiment may also include discriminators (stops, phase shifters, analyzer crystals, etc.) in the beam exiting the object. An embodiment may also include mechanisms for scanning whereby a two-dimensional or three-dimensional image of a large object is made possible. An embodiment may also include an image of an object's internal features being derived from an analysis of the radiation and/or radiation waveform exiting the object. | 03-05-2009 |
20100054415 | PHASE CONTRAST IMAGING - Phase contrast imaging is achieved using a sample mask | 03-04-2010 |
20100296629 | GRADED LENSES - A waveguide apparatus comprising a bundle of polycapillaries and a longitudinal axis is described. Each polycapillary comprises a plurality of capillary channels, wherein the diameter of the polycapillaries and/or of the capillary channels is changing (e.g., increasing or decreasing) across a cross section of the waveguide apparatus perpendicular to the longitudinal axis. | 11-25-2010 |
20100310046 | SYSTEMS AND METHODS FOR DETECTING AN IMAGE OF AN OBJECT BY USE OF X-RAY BEAMS GENERATED BY MULTIPLE SMALL AREA SOURCES AND BY USE OF FACING SIDES OF ADJACENT MONOCHROMATOR CRYSTALS - Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources are disclosed. A plurality of monochromator crystals may be positioned to intercept the plurality of first X-ray beams such that a plurality of second X-ray beams each having predetermined energy levels is produced. Further, an object to be imaged may be positioned in paths of the second x-ray beams for transmission of the second X-ray beams through the object and emitting from the object a plurality of transmission X-ray beams. The X-ray beams may be directed at angles of incidence upon a plurality of analyzer crystals for detecting an image of the object. | 12-09-2010 |
20100310047 | STRAIN MATCHING OF CRYSTALS AND HORIZONTALLY-SPACED MONOCHROMATOR AND ANALYZER CRYSTAL ARRAYS IN DIFFRACTION ENHANCED IMAGING SYSTEMS AND RELATED METHODS - Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods are disclosed. A DEI system, including strain matched crystals can comprise an X-ray source configured to generate a first X-ray beam. A first monochromator crystal can be positioned to intercept the first X-ray beam for producing a second X-ray beam. A second monochromator crystal can be positioned to intercept the second X-ray beam to produce a third X-ray beam for transmission through an object. The second monochromator crystal has a thickness selected such that a mechanical strain on a side of the first monochromator crystal is the same as a mechanical strain on the second monochromator crystal. An analyzer crystal has a thickness selected such that a mechanical strain on a side of the first monochromator crystal is the same as a mechanical strain on the analyzer crystal. | 12-09-2010 |
20110317814 | X-RAY OPTICAL SYSTEMS WITH ADJUSTABLE CONVERGENCE AND FOCAL SPOT SIZE - An x-ray optical system includes a multiple corner optic assembly including an adjustable aperture assembly located in close proximity to the optic assembly. The adjustable aperture assembly enables a user to easily and effectively adjust the convergence of an incident beam of x-rays or the optic focal spot size. The adjustable aperture assembly may further enable a user to condition x-rays of one wavelength and block x-rays of another wavelength and thereby reduce the amount of background radiation exhibited from x-rays of more than one wavelength. | 12-29-2011 |
20120057676 | GRATING FOR PHASE-CONTRAST IMAGING - The invention relates to gratings for X-ray differential phase-contrast imaging, a focus detector arrangement and X-ray system for generating phase-contrast images of an object and a method of phase-contrast imaging for examining an object of interest. In order to provide gratings with a high aspect ratio but low costs, a grating for X-ray differential phase-contrast imaging is proposed, comprising a first sub-grating ( | 03-08-2012 |
20120057677 | TILTED GRATINGS AND METHOD FOR PRODUCTION OF TILTED GRATINGS - The present invention relates to phase-contrast imaging which visualizes the phase information of coherent radiation passing a scanned object. Focused gratings are used which reduce the creation of trapezoid profile in a projection with a particular angle to the optical axis. A laser supported method is used in combination with a dedicating etching process for creating such focused grating structures. | 03-08-2012 |
20120099705 | RADIOGRAPHIC APPARATUS AND RADIOGRAPHIC SYSTEM - A radiographic apparatus includes a guide housing, a first grating unit, a radiological image detector and a grating pattern unit. The guide housing houses a first grating unit, the grating pattern unit, and a radiological image detector and supports a subject to which radiation is irradiated. The grating pattern unit includes a periodic form having a period and masks a radiological image formed by the radiation having passed through the first grating. The radiological image detector detects a masked radiological image which is formed by masking the radiological image by the grating pattern unit. The first grating unit and the grating pattern unit are supported by the guide housing with a buffer material being interposed between the first grating unit and the grating pattern unit and an inner wall of the guide housing. | 04-26-2012 |
20130108023 | Development of a double crystal monochromator | 05-02-2013 |
20130266120 | SPECTROSCOPIC APPARATUS - To cover a wide wavelength bandwidth, a spectroscopic apparatus uses three varied line spacing concave diffraction gratings G | 10-10-2013 |
20140023180 | PRECISION MECHANICAL STRUCTURE OF AN ULTRA-HIGH-RESOLUTION SPECTROMETER FOR INELASTIC X-RAY SCATTERING INSTRUMENT - A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure. | 01-23-2014 |
20140105363 | XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNED PACKAGE - An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics. | 04-17-2014 |