Class / Patent application number | Description | Number of patent applications / Date published |
374124000 | With scanning or temperature distribution display | 8 |
20080317094 | Temperature vector analyzer - The present invention discloses a temperature vector analyzer, which comprises the following elements: a temperature detection device further comprising a plurality of infrared sensors; a temperature-vector display panel; a microprocessor receiving infrared-radiating heat source temperatures detected by the plurality of infrared sensors, calculating the vector components of the infrared-radiating heat source temperatures to attain a center-originating temperature vector, and presenting the temperature vector on the temperature-vector display panel; and a power source providing power for the temperature detection device, the temperature-vector display panel, and the microprocessor. The present invention can apply to detect a local heat origin or a local heat-dissipating point. | 12-25-2008 |
20090290615 | METHOD AND APPARATUS FOR DYNAMIC MEASUREMENT OF ACROSS-CHIP TEMPERATURES - In one embodiment, the invention is a method and apparatus for dynamic measurement of across-chip temperatures. One embodiment of a method for measuring temperatures across an integrated circuit chip includes generating a plurality of surface images of the integrated circuit chip, deriving power values across the integrated circuit chip from the surface images, computing the temperatures across the integrated circuit chip in accordance with the power values, and outputting the temperatures. | 11-26-2009 |
20100040109 | MULTI-ZONE NON-CONTACT SPOT THERMOMETER - A non-contact measurement device includes two or more detectors for sensing scene data from corresponding measurement zones within a target scene. Devices further include an optical system for imaging scene data from the target scene onto the detectors. The optical system is configured to provide a different optical profile for each detector, such that the device can be used to provide a best-fit optical profile for a variety of non-contact applications. | 02-18-2010 |
20100124249 | TEMPERATURE UNIFORMITY MEASUREMENT DURING THERMAL PROCESSING - Methods and systems for determining a radial differential metrology profile of a substrate heated in a process chamber is provided. Methods and systems for determining an angular or azimuthal differential metrology profile of a rotating substrate in a processing chamber are also provided. The radial and azimuthal differential metrology profiles are applied to adjust a reference metrology profile to provide a Virtual metrology of the process chamber. The virtual metrology is applied to control the performance of the process chamber. | 05-20-2010 |
20110268149 | SYSTEM AND METHOD FOR COMPRESSOR INLET TEMPERATURE MEASUREMENT - A system includes a radiation detector array directed toward a fluid flow into a compressor. The radiation detector array is configured to output a signal indicative of a two-dimensional temperature profile of the fluid flow. The system also includes a controller communicatively coupled to the radiation detector array. The controller is configured to detect a temperature variation across the fluid flow based on the signal. | 11-03-2011 |
20140294043 | MEMS INFRARED SENSOR INCLUDING A PLASMONIC LENS - A portable thermal imaging system includes a portable housing configured to be carried by a user, a bolometer sensor assembly supported by the housing and including an array of thermal sensor elements and at least one plasmonic lens, a memory including program instructions, and a processor operably connected to the memory and to the sensor, and configured to execute the program instructions to obtain signals from each of a selected set of thermal sensor elements of the array of thermal sensor elements, assign each of the obtained signals with a respective color data associated with a temperature of a sensed object, and render the color data. | 10-02-2014 |
20140328370 | METHOD FOR EXAMINATION OF A SAMPLE BY MEANS OF THE HEAT FLOW THERMOGRAPHY - The invention provides a method for a non-destructive, non-contacting and image forming examination of a sample by means of the heat flow thermography method where the examination consists of evaluating an existence and/or depth distance values of any heat flow velocity transitions below a surface of the sample, wherein the sample is excited by heat pulses of at least one excitation source, and a thermal flow originating therefrom is captured by at least one infrared sensor in an image sequence of thermal images, and wherein the thermal images obtained from the image sequence are evaluated by means of a signal and image processing and depicting a thermal flow with a resolution in time and in space. The method comprises: exciting the sample at least twice independently from each other by means of the heat pulses from the excitation source where a second excitation and any succeeding excitation is delayed with respect to a preceding excitation by a time delay whereby the start of the captured sequence happens at another defined point of time within the time between two images within an image sequence; detecting the respective total thermal flow processes generated by the at least two excitation processes of the sample by the infrared sensor in the independent image sequences containing the excitation as well as the thermal answer signal from the sample, combining all captured image sequences to a total image sequence in which all images are arranged in a sequence which is correct in time with respect to the point of time of the pulse like excitation, and extracting from the total image sequence, in a manner known per se, an indication of the depth distance of a heat flow velocity transition from a surface of the sample. Therein, the heat flow velocity transitions can be a boarder layer of a layered material or defects in a substrate or below a surface of a work piece. | 11-06-2014 |
20140334519 | SYSTEM AND METHOD FOR TEMPERATURE MONITORING IN A ROOM - A method for monitoring a temperature of a survey surface in a room. The method includes: providing a number of temperature sensors coupled to the survey surface; receiving from the number of temperature sensors respective temperature values; applying an extrapolation model to the received temperature values and extrapolating an extrapolated thermographic scan of the survey surface; and monitoring the temperature of the survey surface on the basis of the extrapolated thermographic scan. | 11-13-2014 |