Class / Patent application number | Description | Number of patent applications / Date published |
356366000 | With polariscopes | 41 |
20090033937 | SENSOR FOR MEASURING LIVING BODY INFORMATION AND KEYPAD ASSEMBLY USING THE SAME - A sensor for measuring living body information and a keypad assembly including the sensor includes a light guide panel for guiding a first light. A light extracting pattern is provided on the light guide panel for outputting the first light guided by the light guide panel to an exterior of the light guide panel. A light coupling pattern is provided on the light guide panel for changing a proceeding direction of a second light incident from the exterior of the light guide panel, so that the second light is guided by the light guide panel. | 02-05-2009 |
20090316154 | Tachyonized Material Test Method - Many suppliers claimed their products have been Tachyonized™ since the discovery and commercialization of Tachyonized™ products by Advanced Tachyon Technologies International. Genuine materials that have been Tachyonized have demonstrated a range of beneficial properties to biological organisms and processes. However, the market has been saturated with competitors making such claims without any foundation. Accordingly, the inventive process provides a simple and rapid test method to confirm the authenticity of Tachyonized materials. | 12-24-2009 |
20100007882 | RAPID ACQUISITION ELLIPSOMETRY - Disclosed embodiments pertain to optical assemblies which impart a spatially dependent rotation to linearly polarized light. A pair of optical assemblies may be used to apply a spatially dependent rotation to linearly polarized light in the region between the optical assemblies, and produce a spatially independent rotation after traversing the second optical assembly. A pair of optical assemblies may be used in combination with a wave plate to allow a determination of the Stokes parameters of an elliptically polarized beam of light. | 01-14-2010 |
20100177313 | INSPECTING METHOD USING AN ELECTRO OPTICAL DETECTOR - An inspecting method using an electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the upper substrate and the lower substrate; a transparent electrode interposed between the nematic liquid crystal layer and the upper substrate, the transparent electrode connected to a device under test (DUT) via a power supply; a polarizing plate located over the nematic liquid crystal layer; and a reflecting plate located under the nematic liquid crystal layer. A method using the electro-optical detecting device includes applying a voltage between the transparent electrode and the DUT to generate an electric field across the liquid crystal layer; illuminating the detector and capturing an image of the detector using the light reflected from the detector; and determining the DUT has some defects from the image of the detector by an abnormal electric field generated between the transparent electrode and the DUT. | 07-15-2010 |
20100245823 | Methods and Systems for Imaging Skin Using Polarized Lighting - An imaging system for imaging skin includes a light source to illuminate a subject and a first polarizer to polarize light provided by the light source to illuminate the subject. The imaging system also includes a photodetector to acquire an image of the subject as illuminated by the light source and an adjustable second polarizer, coupled to the photodetector, to provide an adjustable degree of polarization of light received by the photodetector. | 09-30-2010 |
20120033215 | MULTI-LAYER OVERLAY METROLOGY TARGET AND COMPLIMENTARY OVERLAY METROLOGY MEASUREMENT SYSTEMS - A multi-layer overlay target for use in imaging based metrology is disclosed. The overlay target includes a plurality of target structures including three or more target structures, each target structure including a set of two or more pattern elements, wherein the target structures are configured to share a common center of symmetry upon alignment of the target structures, each target structure being invariant to N degree rotation about the common center of symmetry, wherein N is equal to or greater than 180 degrees, wherein each of the two or more pattern elements has an individual center of symmetry, wherein each of the two or more pattern elements of each target structure is invariant to M degree rotation about the individual center of symmetry, wherein M is equal to or greater than 180 degrees. | 02-09-2012 |
20120320377 | Optical System Polarizer Calibration - A method to calibrate a polarizer in polarized optical system at any angle of incidence, by decoupling the calibration from a polarization effect of the system, by providing a calibration apparatus that includes a substrate having a polarizer disposed on a surface thereof, with an indicator on the substrate for indicating a polarization orientation of the polarizer, loading the calibration apparatus in the polarized optical system with the indicator in a desired position, determining an initial angle between the polarization orientation and a reference of the polarized optical system, acquiring spectra using the polarized optical system at a plurality of known angles between the polarization orientation and the reference of the polarized optical system, using the spectra to plot a curve indicating an angle of the polarizer in the polarized optical system, and when the angle of the polarizer is outside of a desired range, adjusting the angle of the polarizer, and repeating the steps of acquiring the spectra, and plotting a curve indicating the angle of the polarizer. | 12-20-2012 |
20140043609 | METHOD FOR USING POLARIZATION GATING TO MEASURE A SCATTERING SAMPLE - Described herein are systems, devices, and methods facilitating optical characterization of scattering samples. A polarized optical beam can be directed to pass through a sample to be tested. The optical beam exiting the sample can then be analyzed to determine its degree of polarization, from which other properties of the sample can be determined. In some cases, an apparatus can include a source of an optical beam, an input polarizer, a sample, an output polarizer, and a photodetector. In some cases, a signal from a photodetector can be processed through attenuation, variable offset, and variable gain. | 02-13-2014 |
20150062581 | DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD - A defect inspection apparatus includes: a seed light generator including a pulse signal generator that generates a pulse signal and a polarization modulator that outputs pulse light of any one of two polarization states orthogonal to each other in synchronization with the pulse signal output from the pulse signal generator; a wavelength converting unit including a branching mechanism that branches the pulse light output by the polarization modulator of the seed light generator using polarization and a converting unit that wavelength-converts the pulse light branched by the branching mechanism into beams of two different wavelengths, respectively; an illumination optical system that illuminates a surface of an inspected target material with the beams of the two different wavelengths converted by the wavelength converting unit; a detection optical system including a detecting unit that detects light generated by the beams of the two different wavelengths illuminated by the illumination optical system; and a signal processing system including a distributor that distributes a signal based on the light detected by the detecting unit of the detection optical system for each wavelength, on the basis of the pulse signal output from the pulse signal generator, and a defect determining unit that processes a signal based on the light distributed by the distributor and determines a defect. | 03-05-2015 |
20150316468 | METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES - A method and system are presented for use in measuring on patterned samples, aimed at determining asymmetry in the pattern. A set of at least first and second measurements on a patterned region of a sample is performed, where each of the measurements comprises: directing illuminating light onto the patterned region along an illumination channel and collecting light reflected from the illuminated region propagating along a collection channel to be detected, such that detected light from the same patterned region has different polarization states which are different from polarization of the illuminating light, and generating a measured data piece indicative of the light detected in the measurement. Thus, at least first and second measured data pieces are generated for the at least first and second measurements on the same patterned region. The at least first and second measured data pieces are analyzed and output data is generated being indicative of a condition of asymmetry in the patterned region. | 11-05-2015 |
20150355022 | AN APPARATUS FOR ENABLING WIDE-FIELD POLARIMETRY - A polarimetry apparatus comprising a plurality of flexible light conduits each having first and second ends, and a respective polarization modulator associated with each light conduit, wherein each light conduit is configured to receive incident light from a different predetermined region in space via the first end, and deliver said light to a detector unit via the second end, and wherein the polarization modulator is configured to modulate the polarization of the light to enable a partial or complete polarization state of the incident light to be determined by the detector unit for each light conduit. | 12-10-2015 |
20160146596 | APPARATUS AND METHOD FOR MEASURING PRETILT ANGLE OF LIQUID CRYSTAL - An apparatus and method for measuring a pretilt angle of a liquid crystal (LC) are disclosed. The method includes irradiating polarized light on an LC cell including a first substrate, a second substrate facing the first substrate, and an LC layer between the first substrate and the second substrate. At least one of the first substrate and the second substrate includes a minute branch electrode. Irradiated light is scanned within a predetermined angle range in a direction not parallel to the minute branch electrode, an intensity of light that is transmitted through the LC cell is detected, and a pretilt angle of the LC is obtained by using a light intensity detection signal corresponding to the transmitted light. | 05-26-2016 |
356367000 | Including polarimeters | 29 |
20080204751 | Optical Rotating Power Measurement Method And Optical Rotating Power Measurement Apparatus - An optical rotating power measurement method comprising: an optical rotating power data acquisition step of starting measurement of the optical rotating power of the sample in a measurement apparatus during a temperature changing process where a controller controls the temperature of the sample such that the temperature reaches the predetermined temperature and of obtaining temperature data and optical rotating power data of the sample as time passes during the temperature changing process; and a data processing step of obtaining a straight line relationship data between the temperature data and the optical rotating power data, by using the fact that the optical rotating power of the sample is proportional to a measurement temperature; wherein the optical rotating power data of the sample at the predetermined temperature or the temperature dependence data of the optical rotating power of the sample is determined based on the straight line relationship data. | 08-28-2008 |
20090040522 | Measuring Apparatus and Measuring Method - A measuring apparatus that measures the polarization state of analysis target light includes a modulation section | 02-12-2009 |
20090073442 | Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums - Embodiments of the present invention are directed to pulsed polarimeters for conducting remote, non-perturbative diagnostic measurements of inducing fields of a medium demonstrating induced optical activity. In one aspect, a pulse polarimeter includes a light source emitting a polarized light pulse having sufficiently narrow spatial extent at a prescribed wavelength and a light gathering optical system including a light gathering optic having an optic axis directed toward the medium and positioned to collect and collimate a predetermined solid angle of an emission from the medium into a collimated emission beam, while preserving the polarization state of the emission. The pulse polarimeter includes a directional coupler that makes coincident the propagation direction of the polarized light pulse with the optic axis and a polarization detection system for measuring the intensity and determining the polarization state of the collimated emission beam continuously in time as the polarized light pulse transits the medium. | 03-19-2009 |
20090231583 | Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums - Embodiments of the present invention are directed to pulsed polarimeters for conducting remote, non-perturbative diagnostic measurements of inducing fields of a medium demonstrating induced optical activity. In one aspect, a pulse polarimeter includes a light source emitting a polarized light pulse having sufficiently narrow spatial extent at a prescribed wavelength and a light gathering optical system including a light gathering optic having an optic axis directed toward the medium and positioned to collect and collimate a predetermined solid angle of an emission from the medium into a collimated emission beam, while preserving the polarization state of the emission. The pulse polarimeter includes a directional coupler that makes coincident the propagation direction of the polarized light pulse with the optic axis and a polarization detection system for measuring the intensity and determining the polarization state of the collimated emission beam continuously in time as the polarized light pulse transits the medium. | 09-17-2009 |
20090296088 | Method and apparatus for determining liquid crystal cell parameters from full mueller martix mesaurements - Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test ( | 12-03-2009 |
20090296089 | Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements - Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test ( | 12-03-2009 |
20100039646 | POLARIMETRIC IMAGING SYSTEM HAVING A MATRIX OF PROGRAMMABLE WAVEPLATES BASED ON A MATERIAL WITH AN ISOTROPIC ELECTROOPTIC TENSOR - The subject of the invention is a polarimetric imaging system exhibiting an optical axis, and comprising means ( | 02-18-2010 |
20100073676 | MICROSTRUCTURING OPTICAL WAVE GUIDE DEVICES WITH FEMTOSECOND OPTICAL PULSES - The present invention is directed to the creation of optical waveguiding devices from standard optical fibers by the creation of zones of permanently altered refractive index characteristics therein. A high intensity femtosecond laser beam is focused at a predetermined target region in the fiber so as to soften the glass material at the target region. After aligning the focal region with the target region in the fiber there will be relative movement between the focal region and the fiber, which has the effect of sweeping the focal region across the fiber in a predetermined path, so as to create a secondary waveguide path. A portion of the light traveling along the core is removed from the core along the secondary waveguide path such that the device can be utilized as an attenuator, an optical tap, or a polarimeter. | 03-25-2010 |
20100097606 | ROTATION DETECTION KIT - A rotation detection kit, comprising a source for generating at least a first polarized beam emitted along a propagation axis, a receiver comprising at least a first beam intensity sensor and an analyzer. The analyser comprises a first polarizer device for location in the at least first polarized beam between the source and at least first beam intensity sensor. The first polarizer device is configured such that the receiver can measure rotation between the source and the analyzer about a first axis that is non-parallel to the propagation axis based on the at least first beam intensity sensor's output. | 04-22-2010 |
20100103421 | SENSOR UNIT FOR A SURFACE PLASMON RESONANCE (SPR) UNIT - The invention relates to a sensor unit for a Surface Plasmon Resonance (SPR) unit, comprising a transparent sensor structure forming at least one wall of a cavity, the wall being defined by a concave inner surface and a convex outer surface The inner surface is provided with a layer of a conductive material capable of supporting a surface plasmon. In the cavity there is provided a flow structure in said cavity so as to form at least one compartment for sample between the flow structure and the inner wall of the cavity. Also, a method for the detection of events at a surface by utilizing surface plasmon resonance is provided. It comprises placing a sample with an analyte of interest in a sensor unit as claimed in claim | 04-29-2010 |
20100110433 | Polarimetric imaging device optimized for polarization contrast - The invention relates to a polarimetric imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets of four individual pixels, a first pixel comprising a first diffraction grating (R | 05-06-2010 |
20100128268 | A VECTORIAL POLARIMETRY METHOD AND APPARATUS FOR ANALYZING THE THREE-DIMENSIONAL ELECTROMAGNETIC FIELD RESULTING FROM AN INTERACTION BETWEEN A FOCUSED ILLUMINATING FIELD AND A SAMPLE TO BE OBSERVED - A method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating beam and a sample to be observed, by characterising the distribution of the state of polarisation of light across a measurement plane, the method comprising the steps of generating a beam of illuminating light; controlling the state of polarisation at different positions across the beam width of the light beam; focussing said illuminating light beam to a focus, wherein said focus is a tight focus and said focused light has a suitable three-dimensional vectorial structure at the focus; detecting and measuring the state of polarisation of the reflected light at different positions across the width of the measurement plane to retrieve information on the three-dimensional vectorial electromagnetic interaction of the illuminated focused field and the sample. | 05-27-2010 |
20100134798 | SUBSTANCE CONCENTRATION SENSOR AND PRODUCTION METHOD THEREFOR - The invention relates to a sensor for determining a concentration of a substance contained in a fluid-containing matrix, with a measurement chamber ( | 06-03-2010 |
20100149533 | SWITCHABLE IMAGING POLARIMETER AND METHOD - A polarimeter and method of polarizing incoming light includes an optical assembly, a first adjustable circular retarder that rotates the polarization content of incoming light, a polarization beam splitter that receives light from the adjustable circular retarder and polarizing the light into a first portion of light having a first polarization and a second portion of light having a second polarization. The first portion of light is directed to a focal plane and the second portion of light is directed to the optical assembly. The optical assembly is switchable between a polarizing mode of operation in which the first portion of light is viewable at the focal plane in absence of the second portion of light and an imaging mode of operation in which the first portion of light and the second portion of light are viewable at the focal plane. | 06-17-2010 |
20100157298 | POLARIMETRIC IMAGING APPARATUS - A polarimetric imaging apparatus ( | 06-24-2010 |
20100208264 | POLARIZATION MONITORING RETICLE DESIGN FOR HIGH NUMERICAL APERTURE LITHOGRAPHY SYSTEMS - This invention relates to the manufacture of semiconductor substrates such as wafers and to a method for monitoring the state of polarization incident on a photomask in projection printing using a specially designed polarization monitoring reticle for high numerical aperture lithographic scanners. The reticle measures 25 locations across the slit and is designed for numerical apertures above 0.85. The monitors provide a large polarization dependent signal which is more sensitive to polarization. A double exposure method is also provided using two reticles where the first reticle contains the polarization monitors, clear field reference regions and low dose alignment marks. The second reticle contains the standard alignment marks and labels. For a single exposure method, a tri-PSF low dose alignment mark is used. The reticles also provide for electromagnetic bias wherein each edge is biased depending on that edge's etch depth. | 08-19-2010 |
20100315641 | Polarimeter - A kit having a supporting device for maintaining a transparent article having a longitudinal axis A, a proximal end and a distal end. The supporting device including a proximal holder including a port intended to receive the proximal end of the article, and a distal holder including a receiving part intended to receive the distal end of the article, the port and the receiving part being aligned on the same longitudinal axis B. The supporting device further having a compressor for putting the article under longitudinal compression directed towards a center of the article, when the article is mounted on the supporting device with its longitudinal axis A aligned on the longitudinal axis B, and a polarimeter. The invention also pertains to a method for measuring the stress inside an article made of transparent material. | 12-16-2010 |
20110176132 | HETERODYNE POLARIMETER WITH A BACKGROUND SUBTRACTION SYSTEM - A polarimeter based on coherent detection and a method for measuring the optical rotation of a polarized light beam by an optically active substance, while enabling the subtraction of background signals, are provided. | 07-21-2011 |
20110273711 | Device and Method for Determining a Piece of Polarisation Information and Polarimetric Imaging Device - The invention relates to a method and to a device for determining a piece of polarisation information on a measurement point of a target sample, the device comprising: -a light source capable of emitting a rectilinearly polarised light beam in a predefined direction, the light beam being intended to be reflected by the measurement point of the target sample; -a unit for computing the piece of polarisation information on the measurement point using the beam reflected by the target sample; -a waveguide for guiding the incident beam towards the target sample and the reflected beam towards the computing means; and -a unit for rotating the polarisation, capable of rotating two orthogonal polarimetric components of the incident beam exiting the waveguide and two orthogonal polarimetric components of the reflected beam before passing through the waveguide. | 11-10-2011 |
20120033216 | SPATIALLY PRECISE OPTICAL TREATMENT FOR MEASUREMENT OF TARGETS THROUGH INTERVENING BIREFRINGENT LAYERS - A treatment pattern (such as a focused spot, an image, or an interferogram) projected on a treatment target may lose precision if the treatment beam must pass through a birefringent layer before reaching the target. In the general case, the birefringent layer splits the treatment beam into ordinary and extraordinary components, which propagate in different directions and form two patterns, displaced from each other, at the target layer. The degree of birefringence and the orientation of the optic axis, which influence the amount of displacement, often vary between workpieces or between loci on the same workpiece. This invention measures the orientation of the optic axis and uses the data to adjust the treatment beam incidence direction, the treatment beam polarization, or both to superpose the ordinary and extraordinary components into a single treatment pattern at the target, preventing the birefringent layer from causing the pattern to be blurred or doubled. | 02-09-2012 |
20120113423 | METHOD AND APPARATUS FOR HIGH PRECISION SPECTROSCOPY - The invention provides spectroscopy apparatuses and methods allowing precise overlapping between circularly polarized pump beam and a counter propagating linearly polarized probe beams in a sample which presents unique advantages for precision spectroscopy. In general, the apparatus comprises a phase retarding element with which by double pass by retro reflection of an incident beam turn linearly polarized light to circular and vice versa. This unique configuration enable to design a compact and miniature apparatus which may be applied for measuring polarization spectroscopy, nonlinear optical rotation and coherent population trapping phenomena with certain advantages resulting from the unique optical arrangement. The design of the apparatus further facilitates integration and scaling to produce arrays of units which may be particularly useful for magnetometry applications. Other important applications of the invention include laser frequency stabilization and atomic clocks. | 05-10-2012 |
20120206724 | Terahertz-infrared ellipsometer system, and method of use - The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz, including:
| 08-16-2012 |
20130114080 | MODIFICATION OF A FLOW CELL TO MEASURE ADSORPTION KINETICS UNDER STAGNATION POINT FLOW AND DEVELOPMENT OF A SETUP CORRECTION PROCEDURE FOR OBTAINING ADSORPTION KINETICS AT THE STAGNATION POINT - This application describes a flow cell to perform experiments under well-controlled hydrodynamic conditions. The resulting cell enables combining the advantages of in-situ spectroscopic ellipsometry with stagnation point flow conditions. An additional advantage is that the proposed cell features a fixed position of the “inlet tube” with respect to the substrate, thus facilitating the alignment of multiple substrates. Theoretical calculations were performed by computational fluid dynamics and compared with experimental data (adsorption kinetics) obtained for the adsorption of polyethylene glycol to silica under a variety of experimental conditions. Additionally, a simple methodology to correct experimental data for errors associated with the size of the measured spot and for variations of mass transfer in the vicinity of the stagnation point is herein introduced. The proposed correction method would allow researchers to reasonably estimate the adsorption kinetics at the stagnation point and quantitatively compare their results, even when using different experimental setups. The applicability of the proposed correction function was verified by evaluating the kinetics of protein adsorption under different experimental conditions. | 05-09-2013 |
20140218733 | IN-LINE ARRANGEMENT FOR MEASURING POLARIZATION EXTINCTION RATIO - An in-line polarization extinction ratio (PER) monitor that generates a value of an optical signal's PER from a single measurement, without requiring the optical transmission signal path of the system to be directly coupled into a separate measurement device. The polarization extinction ratio may be defined as: 10 log(P | 08-07-2014 |
20140354991 | NORMAL-INCIDENCE BROADBAND SPECTROSCOPIC POLARIMETER CONTAINING REFERENCE BEAM AND OPTICAL MEASUREMENT SYSTEM - Disclosed is a normal-incidence broadband spectroscopic polarimeter containing reference beam, comprising a light source, a first reflecting unit, a first concentrating unit, a second concentrating unit, a polarizer, a first curved mirror, a first planar mirror, a second reflecting unit and a probing unit. Also disclosed is an optical measurement system, comprising the normal-incidence broadband spectroscopic polarimeter containing reference beam. The normal-incidence broadband spectroscopic polarimeter containing reference beam achieves an integral combination of the light beams after splitting, can maintain the polarization state of the light beams while increasing the light transmission efficiency, and has a low complexity. | 12-04-2014 |
20150323445 | CAVITY ENHANCED POLARIMETER AND RELATED METHODS - A polarimeter for measuring chirality of a material comprising an optical ring cavity comprising a plurality of reflective elements configured to promote bi-directional propagation of a laser beam within the cavity, a laser-emitting device configured to introduce a first input laser beam and a second input laser beam into the ring cavity, and a Faraday rotator and a phase compensator configured to suppress a birefringent background as the first and second laser beams pass through the ring cavity, wherein the plurality of mirrors, Faraday rotator, and phase compensator are configured such that light from the first and second laser beams passes through a chiral material located within the cavity a sufficient number of times for a measurement of optical rotary dispersion (ORD) and circular dichroism (CD) of light transmitted through the chiral material to be obtained. Particular implementations include monolithic ring cavities or microresonators or use of intra-cavity gain media. | 11-12-2015 |
356368000 | With electro-optical light rotation | 3 |
20100118305 | Process and device for measuring the rotation angle of a rotating object - To measure the rotation angle of two objects rotating in relation to each other, a transmitter ( | 05-13-2010 |
20110026026 | APPARATUS FOR CHARACTERIZING FIBROUS MATERIALS USING STOKES PARAMETERS - An apparatus for determining fiber orientation parameters of a sheet of material during a production process includes a polarized radiation generating system operable for providing polarized radiation having a frequency of at least 1×10 | 02-03-2011 |
20110080585 | Scatterometry Measurement of Asymmetric Structures - Asymmetry metrology is performed using at least a portion of Mueller matrix elements, including, e.g., the off-diagonal elements of the Mueller matrix. The Mueller matrix may be generated using, e.g., a spectroscopic or angle resolved ellipsometer that may include a rotating compensator. The Mueller matrix is analyzed by fitting at least a portion of the elements to Mueller matrix elements calculated using a rigorous electromagnetic model of the sample or by fitting the off-diagonal elements to a calibrated linear response. The use of the Mueller matrix elements in the asymmetry measurement permits, e.g., overlay analysis using in-chip devices thereby avoiding the need for special off-chip targets. | 04-07-2011 |