Class / Patent application number | Description | Number of patent applications / Date published |
348295000 | Time delay and integration mode (TDI) | 30 |
20080284883 | ADDRESS GENERATOR AND IMAGE CAPTURING DEVICE - An address generator that generates, in an image capturing device including a photoelectric conversion unit having arrayed therein in a matrix plural photoelectric conversion elements that convert received light into charges and accumulate the charges and a rolling shutter function, an address indicating a line position of each of the photoelectric conversion elements that are processing objects of readout processing and reset processing for accumulated charges includes address counters provided at least in a number same as a number of time divisions of the readout processing and the reset processing, a control unit that independently controls an operation of each of the address counters, a selecting circuit that sequentially selects each of the address counters in a time division manner and outputs a count value of the selected address counter to an address decode circuit as the address, and the address decode circuit that outputs a signal for changing the photoelectric conversion element in a line position corresponding to the address inputted from the selection circuit in a time division manner to an active state. | 11-20-2008 |
20100177224 | Image Device Having a Plurality of Detectors in a Time Delay and Integration (TDI) Configuration and Associated Method - In certain embodiments, an imaging device includes an image sensor that includes a detector array. The detector array includes a plurality of detectors operable to receive a charge generated by light. The detector array also includes a plurality of detector sub-arrays each including one or more of the plurality of detectors. The one or more detectors of each detector sub-array are in a time delay and integration (TDI) configuration. The image sensor of the imaging device is operable to, for each of the plurality of detector sub-arrays of the detector array, generate an image signal corresponding to a scan of an object. | 07-15-2010 |
20110019044 | Time Delay Integration Based MOS Photoelectric Pixel Sensing Circuit - A time delay integration (TDI) based MOS photoelectric pixel sensing circuit (TDIPSC) is proposed. The TDIPSC includes multi-element photoelectric pixel sensor (MEPS) having sub-pixel sensor elements SPSE | 01-27-2011 |
20110141330 | Compensating For Misalignment In An Image Scanner - In certain embodiments, compensating for misalignment comprises receiving, at a detector array, electromagnetic (E-M) radiation from a target object. The detector array comprises time delay and integration (TDI) detectors organized into segments. Each segment comprises one or more rows of detectors perpendicular to a designed scan axis, and comprises columns of detectors parallel to the designed scan axis. The detector array moves in a relative scan direction relative to the target object. The following is performed for each segment and for each column of each segment. If there is misalignment at a segment, a signal is passed to a correcting next column of a next segment in the direction of the misalignment, where the signal accumulates scan data of a portion of the target object. Otherwise, the signal is passed to a designed next column of the next segment in the direction of the designed scan axis. | 06-16-2011 |
20110221944 | CMOS IMAGE SENSOR HAVING A WIDE LINEAR DYNAMIC RANGE - The disclosure relates to a process of controlling a pixel cell of an image sensor of the CMOS type, comprising the steps of: initializing a sense node and a read node of the pixel cell; partially transferring electrical charges accumulated at the sense node to the read node; completely evacuating electrical charges accumulated at the read node; partially transferring electrical charges accumulated at the sense node to the read node; measuring the electrical charges accumulated at the read node to obtain a pixel signal corresponding to a quantity of electrical charges accumulated during a short integration period; completely transferring electrical charges accumulated at the sense node to the read node, without a prior initialization of the read node, and measuring the electrical charges at the read node to obtain a pixel voltage corresponding thus to the sum of the electrical charges accumulated during the short and long integration periods. | 09-15-2011 |
20110317052 | TIME DOMAIN MULTIPLEXING FOR IMAGING USING TIME DELAY AND INTEGRATION SENSORS - A time delay integration (TDI) sensor ( | 12-29-2011 |
20120206634 | IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR - An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report. | 08-16-2012 |
20130057739 | CONTINUOUS CLOCKING MODE FOR TDI BINNING OPERATION OF CCD IMAGE SENSOR - A device and method for continuous vertical clocking a charge-coupled device image sensor operating in a time delay and integration and binning mode of operation is disclosed. The method includes providing a charge-coupled device image sensor with a continuous charge transfer signal to a vertical charge-coupled device register for shifting charge continuously to more closely approximate the speed of movement of the target object of capture by the image sensor in order to eliminate artifacts in the TDI imaging direction. The control module of the CCD image sensor provides the continuous charge transfer signal to the vertical charge-coupled device register. | 03-07-2013 |
20130076949 | TIME-DELAY-AND-INTEGRATE IMAGE SENSORS HAVING VARIABLE INTERGRATION TIMES - In various embodiments, a time-delay-and-integrate (TDI) image sensor includes (i) a plurality of integrating CCDs (ICCDs), arranged in parallel, that accumulate photocharge in response to exposure to light, (ii) electrically coupled to the plurality of ICCDs, a readout CCD (RCCD) for receiving photocharge from the plurality of ICCDs, and (iii) electrically coupled to the RCCD, readout circuitry for converting charge received from the RCCD into voltage. | 03-28-2013 |
20130286266 | CMOS LINEAR IMAGE SENSOR WITH MOTION-BLUR COMPENSATION - Time delay and integration sensor comprising a matrix of photosensitive pixels organized in rows and columns. Each pixel of a column comprises a photosensitive element, a storage node, and a first transfer transistor connecting the photosensitive element to the storage node. Each pixel of a column, except for the last one, further comprises a second transfer transistor which connects the storage node of the pixel to the photosensitive element of the next pixel of the column. The two transfer transistors are connected to be active at the same time. With such a configuration, it is possible to define a sliding group of several consecutive pixels in a column, to expose the group of pixels, to aggregate the information of the pixels of the group, and to start again after shifting the group of pixels by one pixel. | 10-31-2013 |
20130293752 | EXPOSURE TIME SELECTION USING STACKED-CHIP IMAGE SENSORS - Imaging systems may be provided with stacked-chip image sensors. A stacked-chip image sensor may include a vertical chip stack that includes an array of image pixels and processing circuitry. The image pixel array may be coupled to the processing circuitry through an array of vertical metal interconnects. The image pixel array may be partitioned into image pixel sub-arrays configured to capture image data using one or more integration times. The processing circuitry may determine motion information for the image data captured by each pixel sub-array and may determine integration times for each pixel sub-array. The pixel sub-arrays may capture additional image data using the determined integration times. The additional image data may be combined to generate final image frames having short integration pixel values and long integration pixel values. The processing circuitry may output the final image frames to off-chip image processing circuitry. | 11-07-2013 |
20130314572 | TWO-LINE, SHARED PIXEL LINEAR IMAGE SENSOR - The invention relates to image sensors of scanner type observing one image line at a time. According to the invention, only two lines of pixels are used, operating in TDI mode (summation of the charge of two pixels seeing the same image point successively) but using active pixels with a charge-voltage conversion within the pixel. The pixels of like rank of the two lines each use a photodiode and a charge storage node with a transfer gate adjacent to the photodiode and to the storage node for transferring the charge accumulated in the photodiode to the charge storage node. The storage node is shared between the two pixels of like rank, and the charge of the two photodiodes is transferred successively into this node before the reading of the potential taken by the node. The time interval which separates the two charge transfers corresponds substantially to the time which separates the transit of an image line past the first line of pixels and then past the second. | 11-28-2013 |
20130329103 | IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR - An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report. | 12-12-2013 |
20140104468 | TIME DELAY AND INTEGRATION SCANNING USING A CCD IMAGER - A method for operating a focal plane array in a Time Delay Integration (TDI) mode, the method including: shifting a number of rows during TDI integration, wherein the number of rows shifted is less than a total number of rows of the focal plane array; and reading out a number of rows equal to the total number of rows of the focal plane array minus the number of rows shifted, leaving behind the partially-integrated rows. | 04-17-2014 |
20140160330 | Using an Image Sensor for Recording Frames in Fast Succession - An image sensor comprising a row of light sensors registering incident light as electric signals, and a shift register including first and second register places per each light sensor is used for recording frames in fast succession. The image sensor allows for transferring the electric signals from the light sensors to the respective first register places and for shifting the electric signals on selected ones of the first and second register places forward in the shift register. After a first exposure time, the electric signals from each of a plurality of pairs of neighboring light sensors are added on one register place. After a second exposure time, the electric signals from each of the same pairs of neighboring light sensors are added on one register place located between two of the register places on which added electric signals from the first exposure time are present. | 06-12-2014 |
20140240562 | Integrated Multi-Channel Analog Front End And Digitizer For High Speed Imaging Applications - A module for high speed image processing includes an image sensor for generating a plurality of analog outputs representing an image and a plurality of HDDs for concurrently processing the plurality of analog outputs. Each HDD is an integrated circuit configured to process in parallel a predetermined set of the analog outputs. Each channel of the HDD can include an AFE for conditioning a signal representing one sensor analog output, an ADC for converting a conditioned signal into a digital signal, and a data formatting block for calibrations and formatting the digital signal for transport to an off-chip device. The HDDs and drive electronics are combined with the image sensor into one package to optimize signal integrity and high dynamic range, and to achieve high data rates through use of synchronized HDD channels. Combining multiple modules results in a highly scalable imaging subsystem optimized for inspection and metrology applications. | 08-28-2014 |
20140247379 | Whole Slide Fluorescence Scanner - A system for creating a contiguous digital image of a fluorescence microscope sample. In an embodiment, the system comprises a both a macro camera and a time delay integration (TDI) line scan camera. The system may also comprise a motorized stage, an illumination module, a light source, an excitation filter, an objective lens, an emission filter, and at least one processor configured to assemble a plurality of digital images of portions of the fluorescence microscope sample, generated by the TDI line scan camera, into a contiguous digital image of at least a portion of the fluorescence microscope sample. | 09-04-2014 |
20140253769 | DARK CURRENT REDUCTION IN IMAGE SENSORS VIA DYNAMIC ELECTRICAL BIASING - In various embodiments, an image sensor and method of using an image sensor are described. In an example embodiment, the image sensor comprises a semiconductor substrate and a plurality of pixel regions with each pixel region comprising an optically sensitive material over the substrate and positioned to receive light. There is a bias electrode for each pixel region, with the bias electrode configured to provide a bias voltage to the optically sensitive material of the respective pixel region. Also included is a pixel circuit for each pixel region with each pixel circuit comprising a charge store formed on the semiconductor substrate and a read out circuit, the charge store being in electrical communication with the optically sensitive material of the respective pixel region. The pixel circuit is configured to reset the voltage on the charge store to a reset voltage during a reset period, to integrate charge from the optically sensitive material to the charge store during an integration period, and to read out a signal from the charge store during a read out period. The pixel circuit includes a reference voltage node to be coupled to the charge store during the reset period and the read out circuit during the read out period where a reference voltage is applied to the reference voltage node and is configured to be varied during the operation of the pixel circuit. | 09-11-2014 |
20140267852 | STARING FOCAL PLANE SENSOR SYSTEMS AND METHODS FOR IMAGING LARGE DYNAMIC RANGE SCENES - A focal plane staring sensor is provided that includes an M×N sensor, where M is a number of rows of sensor pixels in the sensor and N is a number of columns of sensor pixels in the sensor, where M and N are integers greater than one. A control circuit samples in each sensor pixel value for each sensor pixel of the M×N sensor at a plurality of different integration times corresponding to an amount of time that a photonic charge can be acquired in each sensor pixel of the M×N sensor, wherein the control circuit selects in each sensor pixel one sample from a set of samples to generate a scaled value to facilitate an equalization of a signal to noise ratio between the sensor pixels. | 09-18-2014 |
20140368703 | DIGITAL DOMAIN ACCUMULATIVE CMOS-TDI IMAGE SENSOR WITH LOW POWER CONSUMPTION - The present invention relates to the field of design of analog digital hybrid integrated circuit. The object of the invention is to reduce ADC conversion rate thus further reducing power consumption of the sensor while not reducing line frequency of the CMOS-TDI. To this end, a digital domain accumulative CMOS-TDI image sensor with low power consumption is provided. It includes a pixel array of n+k lines multiplied m columns, a column parallel signal pre-processing circuit, a column parallel successive approximation (SAR) ADC, a column parallel digital domain accumulator, a column parallel divider, a timing control circuit and an output shift register, wherein n+k+1 coarse quantification memory units are provided to the column parallel digital domain accumulator for storage of coarse quantification results; and memory units for storage of n times of fine quantification results are also provided, thus realizing n stages of TDI signal accumulation after accumulation of n times of fine quantification results. The invention is generally used in hybrid integrated circuit design. | 12-18-2014 |
20150009375 | IMAGING SYSTEMS WITH DYNAMIC SHUTTER OPERATION - An imaging system may include an image sensor having an array of image pixels. Each image pixel may include an electronic shutter for controlling when a photosensor in the image pixel accumulates charge. The electronic shutter may be operable in an open state during which charge is allowed to accumulate on the photosensor and a closed state during which charge is drained from the photosensor. The electronic shutter may be cycled through multiple open and closed states during an image frame capture. At the end of each open state, the charge that has been acquired on the photosensor may be transferred from the photosensor to a pixel memory element. By breaking up the total exposure time for a pixel during an image frame into shorter, non-continuous periods of exposure time, dynamic scenery image artifacts may be minimized while maintaining the desired total exposure time. | 01-08-2015 |
20150077601 | METHODS FOR TRIGGERING FOR MULTI-CAMERA SYSTEM - A system may include one or more camera modules each containing one or more image sensors. The system may be configured to capture images from light spectra outside the visible band. Therefore, the pixel integration times, and frame rates of the one or more image sensors may be unique and distinct. An image sensor may respond to a trigger control signal by beginning integration of a subset of pixels some duration after an appropriate trigger control signal transitions from low to high. The image sensor may output the frame captured by the pixels a predetermined duration after the trigger control signal transitions, to ensure a deterministic response. Pixels used to generate the image of a subsequent frame may begin integrating during the readout of the current frame. The pixels may be integrated for exactly their programmed integration time, even when the frame rate is varied. | 03-19-2015 |
20150365613 | SOLID-STATE IMAGE PICKUP DEVICE AND METHOD FOR MANUFACTURING SOLID-STATE IMAGE PICKUP DEVICE - A solid-state imaging device includes a light receiving section formed by such exposure as to stitch a plurality of patterns in a first direction on a semiconductor substrate. The light receiving section includes a plurality of pixels disposed in a two-dimensional array in the first direction and a second direction perpendicular to the first direction. Electric charges are transferred in the second direction in each of pixel columns consisting of a plurality of pixels disposed in the second direction, among the plurality of pixels. | 12-17-2015 |
20150365619 | TIME DELAY INTEGRATION IMAGE SENSOR WITH DETECTION OF TRAVELLING ERRORS - The invention relates to time delay integration (TDI) image sensors. The sensor includes means for detecting a shift of the sensor with respect to the image. The pixel matrix is divided in the column direction into at least a first and a second sub-matrix (Ma, Mb). On each side of each sub-matrix are arranged groups of additional columns (GRa | 12-17-2015 |
20160044261 | A/D CONVERSION CIRCUIT AND IMAGE-CAPTURING DEVICE - An A/D conversion circuit includes: a reference signal generation section that includes an integrator circuit having a first constant current source and generates a reference signal that changes in accordance with a constant current output by the first constant current source; a comparison section that executes a comparison process between an analog signal and the reference signal and terminates the comparison process; a clock generation section that includes a delay section having delay units for delaying an input signal for a predetermined time and outputting delayed input signals in accordance with a constant current output by a second constant current source, and outputs a lower phase signal based on the signals output from the delay units; a latch section that latches the lower phase signal at a timing related to the termination of the comparison process; and a count section that counts a clock based on the lower phase signal. | 02-11-2016 |
20160088248 | IMAGE SENSOR AND IMAGE PROCESSING SYSTEM INCLUDING THE SAME - An image sensor including a comparator configured to generate a comparison signal by comparing a ramp signal and a pixel signal with each other, a counter configured to generate a digital pixel value by counting an input clock signal according to the comparison signal, and a divider configured to control a frequency of the input clock signal according to an analog gain of the image sensor. | 03-24-2016 |
20160094760 | IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR - An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report. | 03-31-2016 |
20160094796 | SENSOR ARCHITECTURE USING FRAME-BASED AND EVENT-BASED HYBRID SCHEME - A hybrid camera sensor offers efficient image sensing by periodically evaluating pixels at a certain frame rate and disregarding values of pixels that have changed less than a threshold amount. Because only a fraction of pixels in the camera sensor may change values from frame to frame, this can result in faster readout times, which can optionally enable increased frame rates. | 03-31-2016 |
20160094799 | IMAGE SENSOR AND IMAGING APPARATUS - A resolving power is enhanced two-dimensionally without reducing a pixel size. For this purpose, when the direction of travel of a flying object is taken as a row direction and the direction orthogonal to the row direction is taken as a column direction, a plurality of sensor units each including a plurality of linear array sensors extending in the column direction are provided in the row direction, and the sensor units are arranged deviated by a preset block interval in the row direction relative to the sensor units adjacent to each other, as well as arranged deviated by a preset shift interval in the column direction. | 03-31-2016 |
20160150128 | METHOD AND APPARATUS FOR IMPROVING RESOLUTION IN A TDI IMAGE - According to one aspect, embodiments herein provide a TDI image sensor comprising an array of light sensing elements, at least one clock, and an image processor, wherein the at least one clock is configured to operate a first plurality of the light sensing elements to transfer accumulated charge to an adjacent element at a first phase and to operate a second plurality of the light sensing elements to transfer accumulated charge to an adjacent element at a second phase, and wherein the image processor is configured to read out a first signal from the first plurality of light sensing elements corresponding to a total charge accumulated at the first phase, to read out a second signal from the second plurality of light sensing elements corresponding to a total charge accumulated at the second phase, and to combine the first signal and the second signal to generate an image. | 05-26-2016 |