Entries |
Document | Title | Date |
20080297596 | Magnification Observation Apparatus and Method For Creating High Tone Image File - A high tone image is saved in a versatile image file format to enhance usability. There are provided an imaging unit that images an original image having a predetermined dynamic range, which is a ratio between minimum luminance and maximum luminance; a synthesized image generating part that generates a synthesized image data that is higher in tone than a tone width of the original image by synthesizing a plurality of original images imaged under different imaging conditions at the same observation position; a display unit that displays the images imaged by the imaging unit; a tone conversion part that converts the synthesized image data generated by the synthesized image generating part to low tone image data having a tone width capable of being displayed on the display unit; and a tone data saving part that generates a high tone data-attached display file including a high tone image region for saving the synthesized image data serving as a basis as an image file for saving the low tone image data. | 12-04-2008 |
20080297597 | Magnification Observation Apparatus and Method For Photographing Magnified Image - A high tone image is saved in a versatile image file format to enhance usability. There are provided an imaging unit that images an original image having a predetermined dynamic range, which is a ratio between minimum luminance and maximum luminance; a synthesized image generating part that generates a synthesized image data that is higher in tone than a tone width of the original image by synthesizing a plurality of original images imaged under different imaging conditions at the same observation position; a display unit that displays the images imaged by the imaging unit; a tone conversion part that converts the synthesized image data generated by the synthesized image generating part to low tone image data having a tone width capable of being displayed on the display unit; and a tone data saving part that generates a high tone data-attached display file including a high tone image region for saving the synthesized image data serving as a basis as an image file for saving the low tone image data. | 12-04-2008 |
20090002485 | Image Acquisition Apparatus - This invention provides an inexpensive image acquisition apparatus capable of capturing not only an image of a still object, but also an image of a moving object with the use of an appropriate quantity of illumination light. The image acquisition apparatus includes a head section incorporating an image acquisition device therein and including a lens module and an illuminating part, a main body section including an illumination light source, an image acquisition control part and an image processing part, and a cable section connecting between the main body section and the head section. The lens module is one of a first lens module incorporating therein a lens for high-speed observation and a second lens module incorporating therein a lens for enlargement observation, which is selectively attached to the head section. In a case where the first lens module is attached to the head section, the illuminating part is a first lens illumination unit for illuminating a region of which an image is captured by the first lens module. Herein, the first lens illumination unit is attached to the head section. | 01-01-2009 |
20090213214 | Microscope System, Image Generating Method, and Program for Practising the Same - A microscope system has a VS image generation means for generating a virtual slide image of a specimen which is constructed by mutually connecting a plurality of microscope images with a first photomagnification photographed and acquired whenever an objective lens and the specimen are relatively moved in a direction perpendicular to the optical axis and which represents the entire image of the specimen, an object-of-interest set means setting an object of interest with respect to the entire image of the specimen represented by the VS image, and a three-dimensional VS image generation means for generating a three-dimensional VS image which is constructed by connecting the microscope images at different focal positions in accordance with the same focal position and which is constructed from the microscope images with a second photomagnification higher than the first photomagnification and represents the image of the object of interest. | 08-27-2009 |
20090295914 | Image Processing System and Scanning Electron Microscope - The present invention achieves the process of easily registering a template which is prepared for a size change in pattern matching for specifying a measurement point, and high-speed pattern matching by which adequate position accuracy can be obtained in measurement. The present invention includes means for automatically calculating the size and position of a positioning template different from a measurement point itself when the measurement point is designated, to display a template having the calculated size and position. The present invention further includes means for performing pattern matching by using all or some of a plurality of divided templates and extracting templates having a similar positional relationship to the original positional relationship. | 12-03-2009 |
20100033561 | SOLID-STATE MICROSCOPE - Exemplary embodiments provide solid-state microscope (SSM) devices and methods for processing and using the SSM devices. The solid-state microscope devices can include a light emitter array having a plurality of light emitters with each light emitter individually addressable. During operation, each light emitter can be biased in one of three operating states including an emit state, a detect state, and an off state. The light emitter can include an LED (light emitting diode) including, but not limited to, a nanowire based LED or a planar LED to provide various desired image resolutions for the SSM devices. In an exemplary embodiment, for near-field microscopy, the resolution of the SSM microscope can be essentially defined by the pitch p, i.e., center-to-center spacing between two adjacent light emitters, of the light emitter array. | 02-11-2010 |
20100188498 | MICROSCOPE SYSTEM AND ITS CONTROL METHOD - A microscope system includes a light amount ratio changing unit for changing a ratio of the amount of light directed to a first optical path for directing an optical image of the sample to an eyepiece lens and a second optical path for directing an optical image of the sample to an image capturing unit, an image capturing controlling unit for controlling an exposure time of the image capturing unit, and a controlling unit for obtaining a first exposure time from the image capturing controlling unit, for calculating a second exposure time on the basis of the first exposure time and a second ratio of the amount of light, and for controlling the image capturing controlling unit to set the second exposure time as the exposure time if the light amount ratio changing unit changes to the second ratio of the amount of light. | 07-29-2010 |
20100194874 | User Interface for an Electron Microscope - A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively. | 08-05-2010 |
20100194875 | MICRO PARTICLE IMAGE VELOCIMETRY, AND PARTICLE IMAGE-CAPTURING METHOD THEREOF - A particle image-capturing method includes controlling a light-emitting diode unit to emit light so as to illuminate a fluid through an annular condenser, particles in which scattering the light, and controlling an image-capturing unit to capture images of the scattered light through a microscope. A micro particle image velocimetry that performs the method is also disclosed. | 08-05-2010 |
20100208054 | DISPOSABLE MICROSCOPE AND PORTABLE DISPLAY - Various embodiments for providing removable, pluggable and disposable opto-electronic modules for illumination and microscopic imaging are provided, for use with portable display devices. Generally, various medical or industrial miniature microscopes can include one or more solid state or other compact electro-optic illuminating elements, electronic vision systems and means of scanning located thereon. Additionally, such opto-electronic modules may include illuminating optics, imaging optics, and/or image manipulation and processing elements. The illuminating elements may have different wavelengths and can be time-synchronized with an image sensor to illuminate an object for imaging or detecting purpose or other conditioning purpose. All control and power functions of such disposable microscope units can be made in the control unit that the disposable microscopes are plugged into. | 08-19-2010 |
20100315503 | Digital microscope device - The present invention relates to a digital microscope device that is mainly an innovative electronic equipment for observing, inspecting, and recording minute structures. It is including a digital microscope body set with a LCD on its top, and set with an optical lens and a main electrical circuit board in the main body. By utilizing the main electrical circuit board to link with the optical lens and LCD to display the images inspected by the optical lens directly on a LCD, a portable digital microscope that can be carried to any locations is formed, is convenient for the observation of users, and can store the observed images directly to obtain the better effectiveness. | 12-16-2010 |
20110001816 | MICROSTRUCTURE INSPECTION METHOD, MICROSTRUCTURE INSPECTION APPARATUS, AND MICROSTRUCTURE INSPECTION PROGRAM - A microstructure inspection method which inspects an angle of a sidewall of a sample microstructure pattern, the method including: taking SEM photographs of the sample microstructure pattern under plural SEM conditions; measuring a width of a white band at an edge portion of the sample microstructure pattern in the SEM photographs; and calculating the angle of the sidewall of the sample microstructure pattern on the basis of an amount of change in the width of the white band due to the change between the plural SEM conditions. | 01-06-2011 |
20110063431 | METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATION - A cross-section processing and observation method includes: forming a first cross section in a sample by etching processing using a focused ion beam; obtaining image information of the first cross section by irradiating the focused ion beam to the first cross section; forming a second cross section by performing etching processing on the first cross section; obtaining image information of the second cross section by irradiating the focused ion beam to an irradiation region including the second cross section; displaying image information of a part of a display region of the irradiation region from the image information of the second cross section; displaying the image information of the first cross section by superimposing it on the image information being displayed; and moving the display region within the irradiation region. Observation images in which display regions are aligned can be obtained while reducing damage to the sample. | 03-17-2011 |
20110102573 | Method and Apparatus For Reviewing Defects of Semiconductor Device - A method and apparatus for reviewing defects of a semiconductor device is provided which involves detecting a defect on a SEM image taken at low magnification, and reviewing the defect on a SEM image taken at high magnification, and which can review a lot of defects in a short period of time thereby to improve the efficiency of defect review. In the present invention, the method for reviewing defects of a semiconductor device includes the steps of obtaining an image including a defect on the semiconductor device detected by a detection device by use of a scanning electron microscope at a first magnification, making a reference image from the image including the defect obtained at the first magnification, detecting the defect by comparing the image including the defect obtained at the first magnification to the reference image made from the image including the defect at the first magnification, and taking an image of the detected defect at a second magnification that is larger than the first magnification. | 05-05-2011 |
20110134234 | ELECTRONIC MICROSCOPE - An electronic microscope includes a handle having an outer body enclosing a main body and an image sensor, a lens controller fixed to the front end of the outer body of the handle, and a light guide coupled to the front end of the lens controller. The lens controller includes an inner case having a guide slot in the circumference and a flange on one end to which the handle is coupled, an outer case rotatably coupled with the inner case from outside and having a spiral passage in the circumference communicating with the guide slot, and a lens unit inserted into the inner case. The lens unit moves back and forth in response to rotation of the outer case. The light guide includes a LED board, LEDs radially mounted on the LED board, and an observation filter detachably provided on the front end of the lens controller. | 06-09-2011 |
20110187847 | SCANNING TYPE CHARGED PARTICLE MICROSCOPE DEVICE AND METHOD FOR PROCESSING IMAGE ACQUIRED WITH SCANNING TYPE CHARGED PARTICLE MICROSCOPE DEVICE - The present method comprises the steps of imaging the sample under different imaging conditions to acquire multiple images, generating degradation functions for the multiple acquired images, and then generating an image with an improved resolution using the multiple acquired images and the degradation functions corresponding to the acquired images to process the image with the improved resolution. | 08-04-2011 |
20110205352 | HIGH RESOLUTION IMAGING DEVICES WITH WIDE FIELD AND EXTENDED FOCUS - Embodiments of the present invention relate to a high-resolution imaging device with wide field and extended focus comprising a beam generator for generating a plurality of nondiffracting beams and a scanning mechanism for moving the plurality of nondiffracting beams relative to the object to illuminate a volume of the object. The high-resolution imaging device also comprises surface element and a body having a light detector layer outside the surface element. The light detector layer has a light detector configured to measure light data associated with the plurality of nondiffracting beams illuminating the volume of the object. In some cases, the high-resolution imaging device also includes a lens inside of the light detector layer. The lens is configured to focus the light on the light detector surface. | 08-25-2011 |
20110205353 | METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE - A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample ( | 08-25-2011 |
20110211060 | WAFER INSPECTION DATA HANDLING AND DEFECT REVIEW TOOL - A defect detected by a wafer inspection tool is reliably captured by a defect review tool. A defect review condition in the defect review tool is varied depending on defect attributes provided by the wafer inspection tool so as to optimize the review process. For example, review magnification is varied depending on the size of the defect, or the frame addition number is varied depending on the maximum gray level difference. | 09-01-2011 |
20110228073 | ILLUMINATION APPARATUS OPTIMIZED FOR SYNTHETIC APERTURE OPTICS IMAGING USING MINIMUM SELECTIVE EXCITATION PATTERNS - A synthetic aperture optics (SAO) imaging method minimizes the number of selective excitation patterns used to illuminate the imaging target, based on the objects' physical characteristics corresponding to spatial frequency content from the illuminated target and/or one or more parameters of the optical imaging system used for SAO. With the minimized number of selective excitation patterns, the time required to perform SAO is reduced dramatically, thereby allowing SAO to be used with DNA sequencing applications that require massive parallelization for cost reduction and high throughput. In addition, an SAO apparatus optimized to perform the SAO method is provided. The SAO apparatus includes a plurality of interference pattern generation modules that can be arranged in a half-ring shape. | 09-22-2011 |
20110249110 | SCANNING ELECTRON MICROSCOPE - Provided is a scanning electron microscope including: an image recording unit ( | 10-13-2011 |
20110254944 | SCANNING CHARGED PARTICLE MICROSCOPE - When a scanning image of a scanning charged particle microscope is impaired by an external disturbance, a disturbance frequency can be simply and precisely analyzed from the image in order to specify the external disturbance. The maximum frequency analyzable by the scanning charged particle microscope can also be increased up to several kHz, which is the rotation frequency of, for example, a turbo-molecular pump commonly used as an exhaust pump of the scanning charged particle microscope. In an FFT analysis of a stripe pattern which is an impairment of the scanning image, the scanning charged particle microscope performs a one-dimensional FFT (1D-FFT) in the Y-direction (sub-deflection direction of the charged particle beam) or a one-dimensional DFT (1D-DFT) in the X-direction (main deflection direction of the charged particle beam). To extend the analyzable maximum frequency up to several kHz, the scanning charged particle microscope also performs the 1D-FFT (or 1D-DFT) analysis in the X-direction (main deflection direction of the charged particle beam) along which the charged particle beam has a fast scanning speed. | 10-20-2011 |
20110279667 | METHOD AND MEASURING SYSTEM FOR SCANNING MULTIPLE REGIONS OF INTEREST - The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed. The invention further relates to a measuring system for implementing the method according to the invention | 11-17-2011 |
20110285839 | DEFECT OBSERVATION METHOD AND DEVICE USING SEM - An imaging region of a high-magnification reference image capable of being acquired in a low-magnification field without moving a stage from a position at which a defective region has been imaged at a low magnification is searched for and if the search is successful, an image of the imaging region itself is acquired and the high-magnification reference image is acquired. If the search is unsuccessful, the imaging scheme is switched to that in which the high-magnification reference image is acquired from a chip adjacent to the defective region. | 11-24-2011 |
20110298915 | PATTERN INSPECTING APPARATUS AND PATTERN INSPECTING METHOD - In conventional methods, efficient analyses with respect to detected defects were not given consideration. A detected image is matched against pre-obtained partial images of a normal part and a defect part to determine a defect in the detected image. Then, the partial images and the detected image are synthesized to generate a review image in which the identifiability of the detected image is improved. Thus, the operator is able to readily make a determination with respect to the detected defect. | 12-08-2011 |
20110304724 | PHYSICAL PROPERTIES MEASURING METHOD AND APPARATUS - A physical properties measuring method includes: acquiring an experimental convergent beam electron diffraction image of a sample by using a transmission electron microscope; calculating Zernike moment intensities of the experimental convergent beam electron diffraction image; and comparing the Zernike moment intensities of the experimental convergent beam electron diffraction image with Zernike moment intensities of calculated convergent beam electron diffraction images calculated on changed physical properties of the sample. | 12-15-2011 |
20120019648 | ELECTRON MICROSCOPE - An electron microscope according to the present invention includes: a backscattered electron detector provided with a backscattered electron detecting element ( | 01-26-2012 |
20120057015 | SCAN METHOD - In general, in one aspect, the disclosure features a method and system for imaging of samples, for example, imaging samples with charged particles. | 03-08-2012 |
20120092482 | METHOD AND DEVICE FOR CREATING COMPOSITE IMAGE - A composite image creating method and device are provided which, when images separately captured a plurality of times are panoramically synthesized, can prevent deformation of a pattern due to multiple irradiation of the electron beam. One image is generated by overlapping joining areas of rims of two adjacent images when a plurality of images are joined to generate one image. Of two adjacent images, the joining area of an image of an earlier image capturing order is left, and the joining area of an image of a later image capturing order is removed. The joining area of the image of an earlier image capturing order is obtained with irradiation of electron beam a less number of times than the joining area of the image of a later image capturing order, and therefore deformation of a pattern due to irradiation of the electron beam is little. | 04-19-2012 |
20120092483 | SYSTEM AND METHOD OF IMAGE PROCESSING, AND SCANNING ELECTRON MICROSCOPE - A scanning electron microscope comprises an image processing system for carrying out a pattern matching between a first image and a second image. The image processing system comprises: a paint-divided image generator for generating a paint divided image based on the first image; a gravity point distribution image generator for carrying out a smoothing process of the paint divided image and generating a gravity point distribution image; an edge line segment group generation unit for generating a group of edge line segments based on the second image; a matching score calculation unit for calculating a matching score based on the gravity point distribution image and the group of edge line segments; and a maximum score position detection unit for detecting a position where the matching score becomes the maximum. | 04-19-2012 |
20120098953 | SCANNING ELECTRON MICROSCOPE DEVICE AND PATTERN DIMENSION MEASURING METHOD USING SAME - In a panoramic image construction technology of dividing a wide-range imaging area (EP) of semiconductor patterns into a plurality of imaging areas (SEP), and joining a group of images, which are obtained by imaging the SEPs using an SEM, through image processing, a fact that although a pattern serving as a key to joining is not contained in an overlap area between some of the SEPs, all the images can be joined in some cases is noted so that: although the number of patterns serving as keys to joining is small, SEPs whose images are all joined can be determined; or even if such SEPs cannot be determined, SEPs satisfying user's request items as many as possible can be determined. The cases are extracted by optimizing an SEP arrangement, whereby the number of cases in which SEPs whose images are all joined can be determined is increased. | 04-26-2012 |
20120098954 | SEMICONDUCTOR INSPECTION DEVICE AND SEMICONDUCTOR INSPECTION METHOD USING THE SAME - Provided are a semiconductor inspection device and a semiconductor inspection method such that in a specimen image in a single field of view obtained by an electron microscope, it is possible to suppress variations in the edge position measurement error attributable to the materials and structures of the lower layers of measured patterns by a first method, wherein the area in the field of view obtained by electron beam scanning is divided into a plurality of regions on the basis of information regarding the structures and materials of the object to be observed and the electron beam scanning conditions are changed for individual regions ( | 04-26-2012 |
20120105617 | METHOD OF MEASURING CRITICAL DIMENSION OF PATTERN AND APPARATUS FOR PERFORMING THE SAME - In a method of measuring a critical dimension of a pattern, a pattern image is obtained from an object pattern. A design pattern of the object pattern and the pattern image are matched to determine a detection region on the pattern image. An optimum turning point of the pattern contour is determined in the detection region and a ROI (region of interest) is set within a predetermined range from the optimum turning point. A critical dimension of the pattern is measured in the ROI. | 05-03-2012 |
20120105618 | STRUCTURAL ILLUMINATION AND EVANESCENT COUPLING FOR THE EXTENSION OF IMAGING INTERFERMETRIC MICROSCOPY - In accordance with the invention, there are imaging interferometric microscopes and methods for imaging interferometric microscopy using structural illumination and evanescent coupling for the extension of imaging interferometric microscopy. Furthermore, there are coherent anti-Stokes Raman (CARS) microscopes and methods for coherent anti-Stokes Raman (CARS) microscopy, wherein imaging interferometric microscopy techniques are applied to get material dependent spectroscopic information. | 05-03-2012 |
20120120226 | TRANSMISSION ELECTRON MICROSCOPY FOR IMAGING LIVE CELLS - In one aspect, the present invention relates to a microfluidic chamber. In one embodiment, the microfluidic chamber has a first sub-chamber and at least one second sub-chamber. The first sub-chamber has a first window and a second window. Both the first window and the second window are transparent to electrons of certain energies. The second window is positioned substantially parallel and opposite to the first window defining a first volume therebetween. The first window and the second window are separated by a distance that is sufficiently small such that an electron beam that enters from the first window can propagate through the first sub-chamber and exit from the second window. The at least one second sub-chamber is in fluid communication with the first sub-chamber and has a second volume that is greater than the first volume of the first sub-chamber. | 05-17-2012 |
20120127299 | SCANNING ELECTRON MICROSCOPE - A scanning electron microscope includes a main scanning electron microscope unit having an electron optical column and a sample chamber, a controller over the main scanning electron microscope unit, a single housing that houses both the main scanning electron microscope unit and the controller, and a bottom plate disposed under the single housing, the main scanning electron microscope unit and the controller. A first leg member is attached to a bottom face of the bottom plate on a side of the controller with a first opening hole provided through the bottom plate on a side of the main scanning electron microscope unit, and a damper is fixed to a bottom face of the main scanning electron microscope unit and disposed through the first opening hole. | 05-24-2012 |
20120133757 | MICROSCOPIC EXAMINATION OF AN OBJECT USING A SEQUENCE OF OPTICAL MICROSCOPY AND PARTICLE BEAM MICROSCOPY - For the microscopy of an object using a combination of optical microscopy and particle beam microscopy, a microscope slide system comprises an electrically conductive holder, wherein at least one window is configured in the holder, and wherein the holder has the dimensions of a standard glass microscope slide for the optical microscopy; a microscope slide element, which is designed to carry the object for the microscopy and which is designed such that the element can be placed over the window; and a fastening device, which is designed to fix the microscope slide element over the window. By means of said microscope slide system, the object can be analyzed using separate microscopes, without having to relocate the object. | 05-31-2012 |
20120176488 | DUAL EMISSION MICROSCOPE - A microscope device having dual emission capability, wherein detrimental effects of image-aberrations and -distortions are reduced. By providing the means for reflecting the one beam in a manner so as to invert its handedness and the means for reflecting the second beam in a manner so as to preserve its handedness, a fully symmetrical configuration is obtained, where corresponding image points in both color/polarisation channels all experience the same field-dependent aberrations. | 07-12-2012 |
20120176489 | IMAGE-ACQUISITION DEVICE - An image acquisition apparatus | 07-12-2012 |
20120182415 | Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing Apparatus - Disclosed is a pattern matching method whereby a testing point can be searched accurately while simplifying the work of presetting. An image region of a part of a captured image is extracted, and a divided image of the image region is set as a template image. A pattern matching is performed by rotating the template image. Moreover, the pattern matching determines whether a point-symmetric pattern exists inside the image region. | 07-19-2012 |
20120188361 | SYSTEM FOR IMAGE ANALYSIS AND METHOD THEREOF - A system for image analysis and a method thereof are disclosed. In one embodiment, the system includes a detector configured to receive an image of a sample, isolate particles from a background image of the sample image and detect positions of the isolated particles and a first operator configured to calculate a static degree of randomness values of the particles using Lennard-Jones potentials based on the detected positions. The system may further include a second operator configured to obtain a dynamic degree of randomness values of particles based at least in part on the sum of tensile forces between particles by implicit integration added until the particles reach a dynamic equilibrium, and calculate a positional degree of randomness of particles based at least in part on subtraction of the dynamic degree of randomness values from the static degree of randomness values. | 07-26-2012 |
20120212601 | METHOD AND SYSTEM FOR MEASURING CRITICAL DIMENSION AND MONITORING FABRICATION UNIFORMITY - A method for measuring critical dimension (CD) includes steps of: scanning at least one area of interest of a die to obtain at least one scanned image; aligning the scanned image to at least one designed layout pattern to identify a plurality of borders within the scanned image; and averaging distances each measured from the border or the plurality of borders of a pattern associated with a specific type of CD corresponding to the designed layout pattern to obtain a value of CD of the die. The value of critical dimensions of dies can be obtained from the scanned image with lower resolution which is obtained by relatively higher scanning speed, so the above-mentioned method can obtain value of CD for every die within entire wafer to monitor the uniformity of the semiconductor manufacturing process within an acceptable inspection time. | 08-23-2012 |
20120212602 | PATTERN DIMENSION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM MICROSCOPE USED IN SAME - In order to provide a pattern dimension measurement method with a small measured error and excellent reproducibility even though defocus occurs and a charged particle beam microscope used in the same, in a method for applying a charged particle beam to a specimen formed with a pattern to measure a pattern dimension from a signal intensity distribution of signal charged particles from the specimen, edge index positions (X | 08-23-2012 |
20120257040 | ADAPTIVE PHASE CONTRAST MICROSCOPE - An optical microscope is provided with an adjustable optical phase ring. The adjustable ring provides a way to compensate for distortion in the visible phase ring before the light reaches the sample. In an inverted microscope, when observing transparent cells under a liquid, the visible light phase ring is distorted. By the use of a Liquid Crystal Display (LCD) in place of a fixed ring, the projected ring is adjusted to realign the light and produce phase. In a typical micro plate, the meniscus formed produces a lens effect that is realigned by providing changes in the position and pattern, to allow phase imaging over a wider portion of the well. The realignment of the ring can be manual or automated and can be dynamically adjusted based upon an observed image of the sample. | 10-11-2012 |
20120257041 | METHOD FOR DEFECT INSPECTION AND APPARATUS FOR DEFECT INSPECTION - Provided is a technique for a wafer inspection conducted by simple operation, which is useful even when the inspection covers a variety of items and the inspection items are changed frequently with time like in a start-up period of a semi-conductor process. According to the technique, inspection images are collected, and then a template is prepared from the inspection images. A plurality of regions are defined on the template, and inspection methods and output indexes are registered in correspondence with the respective regions. In the inspection, by reference to the template images corresponding to the derived inspection images, the inspection is conducted based on the inspection information registered therein and the quantitative output levels are calculated. | 10-11-2012 |
20120287257 | CHARGED-PARTICLE MICROSCOPE AND METHOD FOR CONTROLLING SAME - The present invention provides an intuitive and easy-to-operate graphical user interface environment for charged-particle microscopes. | 11-15-2012 |
20120287258 | CHARGED PARTICLE BEAM MICROSCOPE AND METHOD OF MEASUREMENT EMPLOYING SAME - The electric charged particle beam microscope includes an electric charged particle source; a condenser lens converging electric charged particles emitted from the electric charged particle source on a specimen; a deflector scanning the converged electric charged particles over the specimen; a control unit of the deflector; a specimen stage on which the specimen is mounted; a detector detecting the electric charged particles; a computer forming an image from a control signal from the deflector and an output signal from the detector; and a display part connected with the computer. The control unit of the deflector can change the scan rate of the electric charged particles. A first rate scan image is obtained at a first rate and a second rate scan image is obtained at a second rate slower than the first rate. | 11-15-2012 |
20120300056 | OBSERVATION METHOD AND OBSERVATION DEVICE - With respect to a charged particle beam device, the step size of focal point measure for executing autofocusing is optimized to a value that is optimal with respect to the spread of an approximation curve for a focal point measure distribution. The step size of focal point measure for executing autofocusing is corrected using an image feature obtained based on a layout image derived from an image obtained at a first magnification or from design data. Autofocusing is executed based on the obtained step size to carry out observation, measurement, or to image the sample under inspection. | 11-29-2012 |
20120307038 | CHARGED PARTICLE BEAM APPARATUS - A signal processing unit ( | 12-06-2012 |
20120327212 | SEM TYPE DEFECT OBSERVATION DEVICE AND DEFECT IMAGE ACQUIRING METHOD - The present invention enables provision of a defect observation device that reduces wait time from an end of pickup of a reference image and accompanying processing to a start of pickup of a defect image compared to conventional ones by making a pixel count resolution of the reference image be low compared to a pixel count of the defect image in an image pickup unit using an electronic microscope for automatic fine defect classification, whereby a throughput enhanced compared to those of conventional ones can be achieved. | 12-27-2012 |
20120327213 | Charged Particle Beam Microscope - Disclosed is a charged particle beam microscope which can obtain information about pattern materials and stereostructure without lowering throughput of pattern dimension measurement. To achieve this, the charged particle beam microscope acquires a plurality of frame images by scanning the field of view of the sample (S | 12-27-2012 |
20130002848 | STAGE ADAPTOR FOR IMAGING BIOLOGICAL SPECIMENS - A stage adaptor for imaging a biological specimen is described. The adaptor having a housing; a vented chamber contained within the housing; and a removable lid for covering the vented chamber. A depression is provided on the removable lid for receiving an objective from a microscope. An aperture is also provided at the apex of the depression for viewing inside the vented chamber. Also described is an integrated stage adaptor and imaging system as well as a method for imaging the biological specimen using the stage adaptor. | 01-03-2013 |
20130010100 | IMAGE GENERATING METHOD AND DEVICE USING SCANNING CHARGED PARTICLE MICROSCOPE, SAMPLE OBSERVATION METHOD, AND OBSERVING DEVICE - In a process of acquiring an image of semiconductor patterns by using a scanning electron microscope (SEM), this invention provides an image generating method and device that allows a high-resolution SEM image to be produced while suppressing damages caused by SEM imaging to a sample as a result of irradiation of an electron beam. A plurality of areas having similarly shaped patterns (similar areas) are extracted from a low-resolution SEM image which has been imaged while suppressing the irradiation energy of electron beam. From the image data of the extracted areas a single high resolution image of the patterns is generated by image restoration processing. Further, the method of this invention also uses design data in determining the similar areas and the SEM imaging position and imaging range for performing the image restoration processing. | 01-10-2013 |
20130044203 | OPTICALLY ENHANCED DIGITAL IMAGING SYSTEM - Improved methods and systems for imaging are provided. Specifically, systems and methods for extending the range of a digital zoom are provided in which an imaging system provides continuous magnification over a plurality of interleaved optical pathways and digital zooming imagers. Systems and methods of centering an image as the field of view changes, and for masking out undesirable obstacles from a magnified image are also provided. | 02-21-2013 |
20130070078 | METHOD AND DEVICE FOR TESTING DEFECT USING SEM - In performing a programmed-point inspection of a circuit pattern using a review SEM, stable inspection can be performed while suppressing the generation of a false report even when a variation in a circuit pattern to be inspected is large. SEM images that are obtained by sequentially imaging a predetermined circuit pattern using the review SEM are stored into a storage unit. Images that meet a set condition are selected from the stored SEM images, and averaged to create an average image (GP image). By performing pattern check by GP comparison using this GP image, an inspection can be performed while suppressing the generation of a false report even when a variation in the circuit patterns is large. | 03-21-2013 |
20130076889 | DISPLAY DEVICE AND DISPLAY METHOD - A display device includes an image acquisition module which has an image sensor and a first focal plane, which captures a picture of an object, and an observation module which images the object such that a user can perceive it with his eye. A second focal plane is set by the observation module and the accommodation state of the eye, and with a measuring module for measuring the accommodation state of the eye. A control unit adjusts the position of the first focal plane on the basis of the measured accommodation state such that it coincides with the second focal plane. | 03-28-2013 |
20130120551 | Pattern Dimension Measurement Method, Pattern Dimension Measurement Device, Program for Causing Computer to Execute Pattern Dimension Measurement Method, and Recording Medium Having Same Recorded Thereon - A technique for calculating the angle from an auxiliary dot sequence indicating the track of a pattern and for performing pattern measurement is provided, thereby enabling achievement of high-accuracy pattern measurement with reduced influence of the roughness of pattern edges. | 05-16-2013 |
20130120552 | IMAGE SENSING DEVICE - The image sensing device ( | 05-16-2013 |
20130147941 | LASER-SCANNING MICROSCOPE SYSTEM - Repeatability of control items is ensured by improving the precision of time control, and control details for the control items can be changed even when observation is underway. Provided is a laser-scanning microscope system including a microscope apparatus that scans a specimen surface with laser light from a laser light source by using a scanner; a hardware sequencer that controls the microscope apparatus so as to execute a control item that is set in an application program in correspondence with a time axis; and a software sequencer that manages control details for the control item that is set in the application program. | 06-13-2013 |
20130162805 | IMAGE PROCESSING APPARATUS, IMAGE PROCESSING SYSTEM, IMAGE PROCESSING METHOD, AND PROGRAM FOR PROCESSING A VIRTUAL SLIDE IMAGE - An image processing apparatus includes a data acquisition unit configured to acquire data of a virtual slide image, and a display control unit configured to display the virtual slide image and a plurality of annotations added to the virtual slide image on a display apparatus, wherein data pieces of the plurality of annotations include diagnostic criterion information of the plurality of annotations, respectively, and the display control unit groups at least two of the plurality of annotations based on the diagnostic criterion information, causes display forms of the plurality of annotations to differ from each other based on the diagnostic criterion information, and displays the plurality of annotations on the virtual slide image. | 06-27-2013 |
20130201322 | FLUORESCENT MICROSCOPE FOR OBSERVING MULTIPLE FLUORESCENT IMAGES, FLUORESCENT IMAGE SURVEYING METHOD USING THE SAME, AND MULTIPLE FLUORESCENT IMAGE OBSERVING SYSTEM - A fluorescent microscope for observing multiple fluorescent images includes: a first optical module comprising a first light source for supplying first excitation light having a first wavelength, a first excitation filter for selectively transmitting the first excitation light supplied from the first light source, a first dichroic filter for reflecting the first excitation light having passed through the first excitation filter toward the survey object, an objective lens for condensing the first excitation light reflected by the first dichroic filter and transferring the condensed first excitation light to the survey object, a second dichroic filter for reflecting first radiation light radiated from the survey object, a first radiation filter for selectively transmitting the first radiation light reflected by the second dichroic filter, and a first image acquisition unit for acquiring an image by using the first radiation light having passed through the first radiation filter to be supplied; and a second optical module comprising a second light source for supplying second excitation light having a second wavelength, a second excitation filter for selectively transmitting the second excitation light supplied from the second light source, a second radiation filter passing through the second excitation filter and irradiated to the survey object to be radiated, to selectively transmitting the second radiation light EM | 08-08-2013 |
20130222570 | METHOD AND SYSTEM FOR IMAGING HIGH DENSITY BIOCHEMICAL ARRAYS WITH SUB-PIXEL ALIGNMENT - A method and associated system for imaging high density biochemical arrays comprises one or more imaging channels that share a common objective lens and a corresponding one or more time delay integration-type imaging cameras with optical alignment mechanisms that permit independent inter-channel and intra-channel adjustment of each of four degrees: X, Y, rotation and scale. The imaging channels are configured to independently examine different spectra of the image of the biochemical arrays. | 08-29-2013 |
20130235182 | DEFECT INSPECTION METHOD AND DEVICE THEREFOR - In imaging a sample using an electron microscope, in order to reduce a time for focusing, a scanning range of a Z coordinate is reduced to complete focusing by obtaining SEM images such that: for a first predetermined number of portions, focal positions of an electron beam in obtaining each SEM image are moved in a predetermined range; then, a curved surface shape of the surface of the sample is estimated by using information relating to the focal positions of the electron beam in the first predetermined number of portions; after the images are taken, the range in which the focal positions of the electron beam are moved for scanning the electron beam on the surface of the sample is made to be narrower than the predetermined range by using the curved surface information estimated, thereby performing scanning to take the images of the sample. | 09-12-2013 |
20130242079 | CORRECTION OF A FIELD-OF-VIEW OVERLAY IN A MULTI-AXIS PROJECTION IMAGING SYSTEM - Two-dimensional scanning array microscope system, which has fields of view of individual objectives overlapping at the object, produces a composite image of the object that is devoid of optical distortions caused by such overlapping. Method for processing imaging data with the system includes precise identification of detector pixels corresponding to different portions of multiple image swaths projected on the detector by the system during the scan of the object, and, based on such identification, allocating or assigning of detector pixels that receive light from the object through more than one objective to only one of objectives, thereby correcting imaging data received in real time to remove a portion of data corresponding to image overlaps. | 09-19-2013 |
20130250091 | IMAGE PROCESSING APPARATUS, IMAGE PROCESSING SYSTEM, IMAGE PROCESSING METHOD, AND PROGRAM - An image processing apparatus that generates data of a display image from data on layer images having different resolutions includes a detection unit that detects a scroll or magnification change request, and a display image generation unit that generates the display image data based on the request, in which the display image generation unit determines whether the request is a high or low speed request when the display image data having a resolution different from those of the layer images is generated, generates the display image data through enlargement processing on data of any of the layer images having a resolution lower than that of the display image when the request is the high speed request, and generates the display image data through reduction processing on data of any of the layer images having a resolution higher than that of the display image in case of the low speed request. | 09-26-2013 |
20130265407 | Method and device for determining a critical angle of an excitation light beam - A method for determining a critical angle of total reflection based upon images captured at different angles of incidence of a light beam includes illuminating a sample with an excitation light beam, capturing images of at least part of the sample at a plurality of different angles of incidence of the excitation light beam, and determining a critical angle of total reflection at an interface of the sample based upon analysis of the images. An apparatus for determining a critical angle of total reflection at an interface of a sample includes a light source arrangement to illuminate a sample with an angle of incidence, an image capturing arrangement to capture an image of the sample, and a processing arrangement to determine the critical angle of total reflection at an interface of the sample on the basis of an analysis of images captured at a plurality of different angles of incidence. | 10-10-2013 |
20130265408 | CHARGED PARTICLE BEAM APPARATUS - For inspection of a pattern such as a semiconductor device, it is useful to selectively detect a defect on the specific pattern in order to estimate the cause of the occurrence of the defect. An object of the invention is to provide a charged particle beam apparatus capable of setting, on the basis of the shape of the pattern on a sample, a region to be inspected. The invention is characterized in that the contour of the pattern on the sample is extracted using a template image obtained on the basis of an image of the sample, the region to be inspected is set on the basis of the contour of the pattern, a defect candidate is detected by comparing the image to be inspected with a comparative image, and the sample is inspected using a positional relationship between the region to be inspected and the defect candidate included in the region to be inspected. | 10-10-2013 |
20130271595 | CIRCUIT PATTERN INSPECTING DEVICE AND INSPECTING METHOD THEREOF - Provided are a high speed circuit pattern inspecting method and inspecting device which have a short preparation time for inspection and are capable of determining a defect by detecting only an image of one die. A coordinate which is expected to obtain the same pattern as a corresponding coordinate and an alignment coordinate are selected by referring to design information. The detected image and the design information are aligned using the alignment coordinate to correct the deviated amount and a pattern of the corresponding coordinate is compared with a pattern of the coordinate which is expected to obtain the same pattern to compare the patterns by detecting only an image of one die. | 10-17-2013 |
20130278745 | CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIGNAL THEREOF - A charged particle beam device of the present invention has a signal processing function of acquiring a secondary signal obtained when a charged particle beam is caused to scan at a low speed not subjected to a band limitation of an electrical signal path, and a secondary signal obtained when a charged particle beam is caused to scan at a high speed subjected to the band limitation of the electrical signal path, calculating a degradation function (H | 10-24-2013 |
20130286183 | BACTERIAL IDENTIFICATION - The present invention provides for separation of bacterial species and serotypes using electrophoretic methods. | 10-31-2013 |
20130300854 | CHARGED PARTICLE MICROSCOPE AND MEASUREMENT IMAGE CORRECTION METHOD THEREOF - A charged particle microscope corrects distortion in an image caused by effects of drift in the sampling stage by measuring the correction reference image in a shorter time than the observation image, making corrections by comparing the shape of the observation image with the shape of the correction reference image, and reducing distortion in the observation images. The reference image for distortion correction is measured at the same position and magnification as when acquiring images for observation. In order to reduce effects from drift, the reference image is at this time measured within a shorter time than the essential observation image. The shape of the observation image is corrected by comparing the shapes of the reference image and observation image, and correcting the shape of the observation image to match the reference image. | 11-14-2013 |
20130307960 | Image-Enhancing Spotlight Mode for Digital Microscopy - An apparatus to permit a viewer of a digital microscopy original image to manipulate the display and/or the microscope to obtain an enhanced view of a region of interest within the original image. In one preferred embodiment a spotlight mode matches the gray shade scale for a spotlight region-of-interest to the pixel intensity variation present in the spotlight region. The gray shade scale used for the spotlight mode may then be generalized to the original image. In a preferred embodiment, spotlight mode provides an easy mechanism for permitting a user to command a re-imaging of a selected spotlight region from a displayed image. Such re-imaging may permit the use of imaging parameter selections that better fit the spotlight region. | 11-21-2013 |
20130321610 | PATTERN MEASURING APPARATUS, PATTERN MEASURING METHOD, AND COMPUTER-READABLE RECORDING MEDIUM ON WHICH A PATTERN MEASURING PROGRAM IS RECORDED - There is provided a technique to correctly select and measure a pattern to be measured even when contours of the pattern are close to each other in a sample including a plurality of patterns on a substantially same plane. | 12-05-2013 |
20140036058 | INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, PROGRAM, AND IMAGE DISPLAY APPARATUS - There is provided an information processing apparatus, including an image combination section which connects a plurality of partial images, each of which is an image obtained by imaging a part of a region to be observed, and a connection information generation section which generates connection information of a combined image combined by the image combination section. The connection information is provided, along with the combined image or separately from the combined image, to an image display apparatus capable of displaying the combined image. | 02-06-2014 |
20140043462 | SYSTEMS AND METHODS FOR DISTRIBUTED VIDEO MICROSCOPY - System and methods are provided for distributed microscopy. A plurality of microscopes may capture images and send them to a media server. The microscopes and the media server may be part of a local area network. The microscopes may each have a distinct network address. The media server may communicate with an operations console, which may be used to view images captured by the microscopes. The operations console may also accept user input which may be used to selectively control the microscopes. | 02-13-2014 |
20140055595 | IMAGE RESTORATION METHOD, IMAGE RESTORATION APPARATUS, AND IMAGE-PICKUP APPARATUS - A method includes performing an approximate partially coherent imaging operation for elements of a first basis generated from a model image having no noise and no blur, and generating based upon the first basis a second basis that is blurred, the approximate partially coherent imaging operation being expressed by a convolution integral on an eigenfunction corresponding to a maximum eigenvalue of a Kernel matrix and each element of the first basis, generating an intermediate image in which each pixel value of the observed image that has been denoised is replaced with its square root, and obtaining a restored image by approximating each of a plurality of patches that are set to entirely cover the intermediate image, using a linear combination of elements of the first basis and linear combination coefficients obtained when each patch is approximated by a linear combination of elements of the second basis. | 02-27-2014 |
20140063226 | MICROSCOPE - A touch screen ( | 03-06-2014 |
20140085454 | IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS USING TIME AXIS LOW BAND PASS FILTER - An image processing apparatus and image processing method according to the present disclosure are characterized to obtain N number of image data regarding a same object, each N number of image data consisting of a plurality of pixels; remove noise data of among N number of pixel data regarding pixels in a same location, from the N number of image data; and generate an image of the object using data excluding the noise data. | 03-27-2014 |
20140092230 | METHOD FOR AVOIDING ARTEFACTS DURING SERIAL BLOCK FACE IMAGING - A method includes capturing a first image of the sample via a detector, wherein the particles of the primary particle beam have a first average energy so that the interaction products detected by the detector predominantly contain sample information from a sample layer lying below the sample surface. The method also includes removing the outermost sample layer with the aid of the cutting device, and capturing a second image of the sample via the detector, wherein the particles of the primary particle beam have a second average energy so that the interaction products detected by the detector predominantly contain sample information from the surface layer of the sample. The method further includes calculating the lateral shift/lateral offset of the sample from a comparison of the first and second images, and compensating for the lateral offset. | 04-03-2014 |
20140092231 | CHARGED PARTICLE MICROSCOPE DEVICE AND IMAGE CAPTURING METHOD - A specimen image capture method using a charged particle microscope device includes: a first image acquisition step in which the gain of a detector in a charged particle microscope is set to a first gain value, charged particle beam scanning is carried out on a specimen, and a first image is obtained; a second image acquisition step in which the gain of the detector is set to a second gain value, which is different to the first gain value, charged particle beam scanning is carried out on the specimen, and a second image is obtained; and an image combination step in which the first gain value and the second gain value are used and the first image and the second image are combined. | 04-03-2014 |
20140118529 | Fourier Ptychographic Imaging Systems, Devices, and Methods - Systems, devices, and methods of Fourier ptychographic imaging by computationally reconstructing a high-resolution image by iteratively updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space. | 05-01-2014 |
20140146160 | Method of Sampling a Sample and Displaying Obtained Information - The invention relates to a method of sampling and displaying information comprising | 05-29-2014 |
20140168405 | SAMPLING ASSEMBLY, MICROSCOPE MODULE, AND MICROSCOPE APPARATUS - A microscope apparatus is disclosed. The microscope apparatus comprises a microscope module and an image capture device. The microscope module comprises a housing, a lens element, a sampling assembly, and a light guide element. The lens element is mounted on the housing. The sampling assembly is accommodated in the housing. The light guide element is mounted in the sampling assembly. The sampling assembly is configured to sample a specimen and comprises a cover body and a base body received in the cover body. The cover body has a first top plate and a first anchoring structure connected to the top plate. The base body has a second opt plate and a second anchoring structure connected to the second top plate. The second top plate faces the first top plate to define a holding space for the specimen. | 06-19-2014 |
20140184779 | MICROSCOPY OPTOELECTRIC DEVICE WITH FOCUS SCANNING - A microscopy optoelectronic device for reconstructing a three-dimensional model of a sample, which can be connected to any PC in order to obtain three-dimensional surface micro-reliefs, includes a portable device body, having a casing and a frame supporting: a digital optical sensor; an optical group, coupled to the sensor including an objective lens directed towards a distal end of the device body, faceable towards the sample; a motor that translates the optical group and sensor with respect to said frame; a connector to connect the device body to an energy source and to a device that controls the position of the optical group and to transmit the digitalized images; and a light source that provides diffused lighting at the objective lens arranged to surround a front region with respect to the objective lens and also includes a luminescent and diffusing surface having a tubular portion coaxial to the optical group. | 07-03-2014 |
20140184780 | APPARATUS AND CONTROL METHOD THEREFOR - An imaging apparatus controls a size of an imaging region according to a spread of Z positions of substances in an object. For example, the imaging region becomes wide when the spread is small and becomes narrow when the spread is large. Or, the number of image sensors to be used is increased when the spread is small and is decreased when the spread is large. Or, an image sensor having a wide image pickup area is used when the spread is small, and an image sensor having a narrow image pickup area is used when the spread is large. | 07-03-2014 |
20140204196 | FOCUS AND IMAGING SYSTEM AND TECHNIQUES USING ERROR SIGNAL - Systems and techniques for an optical scanning microscope and/or other appropriate imaging system includes components for scanning and collecting focused images of a tissue sample and/or other object disposed on a slide. The focusing system described herein provides for determining best focus for each snapshot as a snapshot is captured, which may be referred to as “on-the-fly focusing.” Best focus may be determined using an error function generated according to movement of a dither focusing lens. The devices and techniques provided herein lead to significant reductions in the time required for forming a digital image of an area in a pathology slide and provide for the creation of high quality digital images of a specimen at high throughput. | 07-24-2014 |
20140210982 | SYSTEM AND METHOD FOR AUTOMATIC QUALITY CONTROL FOR ASSEMBLY LINE PROCESSES - A system and method is disclosed for a quality control and/or inspection procedure for assembly line processes. The disclosed system and method enable automatic optical inspection of a device during different stages of manufacture as well as in its finished form. The disclosed system and method enable the automatic quality control process to be self-learning, dynamic, and to identify and classify defects in real time. | 07-31-2014 |
20140210983 | OPTICAL MICROSCOPE DEVICE AND TESTING APPARATUS COMPRISING SAME - The present invention allows observation or capturing of a high-contrast image of a sample for which sufficient contrast cannot be obtained in bright-field observation, such as a wafer having a pattern with a small pattern height. According to the present invention, a sample is illuminated through an objective lens used for capturing an image, and an imaging optics are provided with an aperture filter so that an image is captured while light of bright-field observation components is significantly attenuated. | 07-31-2014 |
20140232847 | MIRROR UNIT AND IMAGE ACQUISITION UNIT - A deformable mirror unit | 08-21-2014 |
20140232848 | Method for Varying the Scanning Field of A Laser Scanning Microscope - Disclosed is a method for varying the size of the scanning field of a multifocal laser scanning microscope, said scanning field being scanned in X columns and Y lines, and n laser spots being arranged at a distance d from one another in the scanning field along the slow scanning axis in the sample plane, the distance between the scanned lines in the sample plane being a=d/K, where K ε N, the size of the scanning field being varied by varying K. After scanning K lines, a vertical skip is made, e.g. a skip of (n− | 08-21-2014 |
20140253713 | Time-Resolved Single-Photon or Ultra-Weak Light Multi-Dimensional Imaging Spectrum System and Method - A single-photon or ultra-weak light multi-D imaging spectral system and method. In order to realize rough time resolution, a time-resolved single-photon counting 2D imaging system for forming color or grey imaging is provided. Moreover, in order to realize high-precision time resolution, the system comprises a light source, an imaging spectral measurement unit, an electric detection unit, a system control unit and an algorithm unit. The light carrying information of an object is imaged on a spatial light modulator and randomly modulated according to compressed sensing theory, emergent light of a grating is collected using a point or array single-photon detector, the number of photons and photon arrival time are recorded, and reconstruction is carried out using the compressed sensing algorithm and related algorithm of the spectral imaging. The system provides single-photon detection sensitivity, high time resolution and wide spectral range, and can be applied in numerous new high-tech industries. | 09-11-2014 |
20140253714 | INFRARED IMAGING MICROSCOPE USING TUNABLE LASER RADIATION - An imaging microscope ( | 09-11-2014 |
20140267675 | DIGITAL MICROSCOPE APPARATUS, IMAGING METHOD THEREFOR, AND PROGRAM - A digital microscope apparatus includes: an observation image capturing unit configured to capture an observation image of each of a plurality of small areas, an area containing a sample on a glass slide being partitioned by the plurality of small areas; and a controller configured to set at least one evaluation area for the observation image of each of the plurality of small areas, the observation image being captured by the observation image capturing unit, to perform an edge detection on the at least one evaluation area, and to calculate, using results of the edge detection on two evaluation areas that are closest between two of the observation images adjacently located in a connected image, a difference in blur evaluation amount between the two observation images, the connected image being obtained by connecting the observation images according to the partition. | 09-18-2014 |
20140267676 | DIGITAL MICROSCOPE APPARATUS, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING PROGRAM - A digital microscope apparatus includes an illumination optical system configured to emit illumination light; a stage having an opening capable of transmitting the light therethrough, on which a preparation can be placed in accordance with a position of the opening; an enlarging imaging unit including an objective lens configured to enlarge an image and disposed to face the system with the stage disposed therebetween, and an imaging device configured to capture an image enlarged by the lens; a white image acquiring unit configured to open the opening, to cause the system to emit the light in a state where an image point of the system is aligned with a focal point of the lens, and to acquire, as a white image, an image formed on an imaging surface of the device; and a calculation unit configured to use the captured white image to calculate a shading correction coefficient. | 09-18-2014 |
20140285652 | METHOD FOR MEASURING PATTERN MISALIGNMENT - According to one embodiment, a method for measuring pattern misalignment, includes: a first step obtaining image data; a second step specifying a measurement region; a third step calculating a first shift amount (x | 09-25-2014 |
20140285653 | BESSEL BEAM PLANE ILLUMINATION MICROSCOPE - A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned | 09-25-2014 |
20140285654 | SCANNING LASER MICROSCOPE - Brightness information with a wide dynamic range is acquired and observed while preventing degradation of a detector. The invention provides a microscope system including a scanner that two-dimensionally scans laser light emitted from a light source unit on a specimen; a detector ( | 09-25-2014 |
20140293036 | BIO-IMAGING METHOD AND SYSTEM - An imaging system for generating images of biological samples having a surface, the system comprising: a sample support for supporting a biological sample in use; a plurality of illumination sources, the plurality of illumination sources being arranged around the sample support and each adapted to illuminate the biological sample, in use, from a different direction; an image capture device for capturing illumination which has impinged on the biological sample to thereby form an image of the sample; wherein at least one of the illumination sources direction is not perpendicular to the surface of the sample. | 10-02-2014 |
20140293037 | OPTICAL MICROSCOPE AND METHOD FOR EXAMINING A MICROSCOPIC SAMPLE - An optical microscope includes a first mask that has transmission regions that are separated from one another for the simultaneous generation of a plurality of illumination light beams from illumination light, for example, a first scanning device for generating a scanning motion of the illumination light beams and a sample holder. The optical microscope also includes a second mask with transmission regions separated from one another, which transmission regions are smaller than the transmission regions of the first mask in order to clip the illumination light beams, such that, through the scanning motion of the first scanning device, each of the illumination light beams can be successively passed onto different transmission regions of the second mask, and a second scanning device is provided for generating a scanning motion between the clipped illumination light beams and the sample holder. A method for examining a microscopic sample is also provided. | 10-02-2014 |
20140300725 | SYSTEM AND METHOD FOR COLOR CORRECTION OF A MICROSCOPE IMAGE WITH A BUILT-IN CALIBRATION SLIDE - A system and method are disclosed for correcting the color of microscope images for different illuminants. The system includes a microscope having at least one image setting value selector with a plurality of pre-set positions, and an optical train having a distal end and a proximal end and being configured to convey illumination. The optical train is further configured to allow introduction of a calibration slide into the optical train of the microscope at a plurality of possible positions, each position being a conjugate plane of the sample plane, when the sample is in focus. The calibration slide incorporates an integral transmission filter array of known transmission values. | 10-09-2014 |
20140313315 | METHOD AND SYSTEM FOR TRANSMITTING LIGHT - A temporal focusing system is disclosed. The temporal focusing system is configured for receiving a light beam pulse and for controlling a temporal profile of the pulse to form an intensity peak at a focal plane. The temporal focusing system has a prismatic optical element configured for receiving the light beam pulse from an input direction parallel to or collinear with the optical axis of the temporal focusing system and diffracting the light beam pulse along the input direction. | 10-23-2014 |
20140320627 | PATTERN EVALUATION METHOD AND PATTERN EVALUATION DEVICE - An pattern evaluation method includes a step of estimating imaging deviation allowed to evaluate an overlay position on one or more evaluation point candidates based on pattern layout information, a step of deciding one or more evaluation points from among the evaluation point candidates based on the allowed imaging deviation, a step of deciding an imaging sequence for imaging the selected evaluation point, and a step of evaluating an overlay position between first and second patterns based on an image obtained by imaging the evaluation point according to the imaging sequence. | 10-30-2014 |
20140340504 | MICROSCOPE SYSTEM - A microscope system including: an observation optical system acquiring an image of an observation position of a sample; a stimulation optical system irradiating the sample with stimulation light; an observation position setting section setting the observation positions; a stimulation position setting section setting a common stimulation position; a stage switching the observation positions; a synchronization condition setting section setting a common synchronization condition in which the timing of the image acquisition is associated with the timing of the irradiation with stimulation light; an observation condition registration section registering the common stimulation position and the common synchronization condition as observation conditions associated with each of the observation positions; and a control section, according to the registered conditions, switching the observation positions, making the observation optical system acquire an image of each of the observation positions, and making the stimulation optical system irradiate each of the stimulation positions with stimulation light. | 11-20-2014 |
20140368633 | DEVICE FOR VIEWING A DIGITAL IMAGE - The invention relates to a device for viewing a digital image comprising means ( | 12-18-2014 |
20140375793 | METHOD FOR MEASURING OVERLAY AND MEASURING APPARATUS, SCANNING ELECTRON MICROSCOPE, AND GUI - A method for measuring overlay at a semiconductor device on which circuit patterns are formed by a plurality of exposure processes is characterized in including an image capturing step for capturing images of a plurality of areas of the semiconductor device, a reference image setting step for setting a reference image based on a plurality of the images captured in the image capturing step, a difference quantifying step for quantifying a difference between the reference image set in the reference image setting step and the plurality of images captured in the image capturing step, and an overlay calculating step for calculating the overlay based on the difference quantified in the difference quantifying step. | 12-25-2014 |
20150022654 | CLOSED-LOOP AUTOMATIC DEFECT INSPECTION AND CLASSIFICATION - Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as to automatically assign respective classifications to the defects, and to autonomously control the imaging module to continue capturing the images responsively to the assigned classifications. | 01-22-2015 |
20150029326 | HIGH THROUGHPUT PARTIAL WAVE SPECTROSCOPIC MICROSCOPY AND ASSOCIATED SYSTEMS AND METHODS - The present technology provides methods, systems, and apparatuses to achieve high throughput and high speed acquisition of partial wave spectroscopic (PWS) microscopic images. In particular, provided herein are high-throughput, automated partial wave spectroscopy (HT/A-PWS) instruments and systems capable of rapid acquisition of PWS Microscopic images and clinical, diagnostic, and research applications thereof. | 01-29-2015 |
20150029327 | IMAGING APPARATUS, DISPLAY DATA GENERATING APPARATUS, IMAGING SYSTEM, AND METHOD FOR CONTROLLING THE SAME - Image data of a specimen is acquired by applying an image processing to imaging data obtained by imaging for the specimen by means of an imaging device while controlling an exposure amount. First image data is generated by using the exposure amount and a parameter of the image processing to be determined while permitting provision of different values for each of distinct pieces of the first image data on condition that pixel values of pixels corresponding to portions of the specimen having an identical transmittance have an identical value in relation to all pieces of the first image data to be generated. Second image data is generated by using the exposure amount and a parameter of the image processing to be adaptively determined on the basis of a feature of the specimen. Display screen data, which includes at least the first image data, is generated. | 01-29-2015 |
20150035966 | HANDHELD DIAGNOSTIC SYSTEM WITH DISPOSABLE SAMPLE HOLDER AND CHIP-SCALE MICROSCOPE - A handheld diagnostic system may include a disposable sample holder and an analysis module having a chip-scale microscope. The sample holder may have a transparent portion having test chambers for containing respective portions of a biological sample. The analysis module may having a housing with an opening configured to receive the transparent portion of the sample holder. The chip-scale microscope may include an image sensor for capturing images of the biological sample as the transparent portion of the sample holder is inserted into the opening of the analysis module. The analysis module may include a light source for illuminating the sample during image capture operations and optics for gathering light from the sample and focusing the light onto the image sensor. The analysis module may transmit sample imaging information to a portable electronic device, which may in turn display corresponding sample analysis information for a user. | 02-05-2015 |
20150042783 | SYSTEMS AND METHODS FOR IDENTIFYING PARAMETERS FROM CAPTURED DATA - In one embodiment, identifying a parameter of interest from captured image data includes capturing image data with a signal-amplifying image detector having at least one detection element in a manner in which on average fewer than approximately 10 photons are detected by each detection element and estimating the parameter of interest from the image data with a standard deviation that is no greater than approximately 1.5 times the square root of the Cramer-Rao lower bound. | 02-12-2015 |
20150049180 | MICROSCOPE - Provided is a microscope comprising a recording unit, having a magnifying imaging optical unit and an image module, for recording images of a sample with a first image frequency and a digital evaluation unit, to which the recorded images are supplied and which carries out predetermined image processing based on the recorded images and produces, as a result, output images with a second image frequency that is smaller than the first image frequency or equal to the first image frequency and can transfer them to an output unit for representation. | 02-19-2015 |
20150054937 | Light microscope and method for image recording using a light microscope - The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope. | 02-26-2015 |
20150054938 | IMAGE ANALYSIS METHOD AND IMAGE ANALYSIS APPARATUS - An image analysis method includes acquiring images of spatially different analysis regions. Each of the images of the analysis regions is constituted by pixels including a plurality of data acquired simultaneously or time-serially. The method further includes obtaining a cross-correlation between two analysis regions by using data of pixels of images of the analysis regions. | 02-26-2015 |
20150062325 | IMAGE ESTIMATING METHOD, PROGRAM, RECORDING MEDIUM, IMAGE ESTIMATING APPARATUS, NETWORK DEVICE, AND METHOD OF OBTAINING IMAGE DATA - An image estimating method is configured to utilize image data of an object captured at N different positions z | 03-05-2015 |
20150077536 | SYSTEM AND METHOD FOR DATING TEXTURED GELATIN SILVER PAPER - A system and method for dating gelatin silver photographic paper is provided. The system and method includes providing a database management system having physical texture characteristic profiles. The system implements a program of instructions to determine a probable date range or source for each textural characteristic profile. The system includes LED sources disposed around an inner surface of a dome; an LED controller, and a CCD imager microscope. | 03-19-2015 |
20150085099 | High-Resolution Scanning Microscopy - Microscope and method for high resolution scanning microscopy of a sample, wherein
| 03-26-2015 |
20150097942 | CONFOCAL MICROSCOPY METHODS AND DEVICES - A video-confocal microscopy method for creating an image of an optical section (π) of a sample ( | 04-09-2015 |
20150116479 | INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, PROGRAM, AND MICROSCOPE SYSTEM - Provided is an information processing device including an image analysis unit which divides an entire image in which an entire observation target region is imaged into a plurality of regions, and then judges whether an observation target is present in each region, and an imaging control unit which controls imaging of partial images with a magnification higher than a magnification of the entire image corresponding to the regions based on judgment results of the image analysis unit. | 04-30-2015 |
20150124077 | CHARGED PARTICLE BEAM ADJUSTMENT ASSISTANCE DEVICE AND METHOD - A charged particle beam adjustment assistance device that can assist work to adjust a charged particle beam apparatus having a three-dimensional observing function and reduce human labor and man-hours required for adjustment value inputting is provided. | 05-07-2015 |
20150124078 | INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, PROGRAM, AND MICROSCOPE SYSTEM - There are provided an information processing apparatus, an information processing method, a program, and a microscope system which can compose a microscopically observed image having a wide field of view and a high resolution by highly accurately stitching a plurality of digital images together. | 05-07-2015 |
20150124079 | IMAGE DATA FORMING APPARATUS AND CONTROL METHOD THEREOF - An image data-forming apparatus comprises an image data buffer unit that can temporarily store a part of pathological image data. When an image data output unit generates display image data from the pathological image data, the image data output unit uses data stored in the image data buffer unit when data required for generating display image data is stored in the image data buffer unit. The pathological image data includes data on a plurality of annotations attached to certain positions in the pathological image. A buffering control unit controls buffering based on information on the pathological diagnosis linked to each of the plurality of annotations. | 05-07-2015 |
20150130923 | MICROSCOPE SYSTEM - Microscope images are easily browsed even with a terminal, such as a tablet terminal, whose transmission speed is low. Provided is a microscope system that includes: a microscope that acquires a plurality of microscope images of a specimen; a system main unit provided with a storage section that sequentially stores the microscope images acquired by the microscope; and a terminal that is connected to the system main unit via a network, in which the system main unit delivers the microscope images stored in the storage section, via the network, in response to a request from the terminal; and the terminal sequentially displays the microscope images delivered from the system main unit. | 05-14-2015 |
20150138335 | OBSERVATION APPARATUS - An observation apparatus includes a stage on which a sample is placed, image capturing device for capturing an image of the sample placed on the stage, velocity calculation unit for calculating a velocity of the stage, display unit for displaying the image of the sample, and a control unit for switching an operating mode, on the basis of the velocity of the stage, between a first operating mode for causing the display unit to display an image, which has a dynamic range wider than original images and is generated by merging the plurality of original images that the image capturing device obtains by capturing images of the sample under a plurality of different image capturing conditions, and a second operating mode for causing the display unit to display an original image or an image obtained by processing the original image. | 05-21-2015 |
20150145981 | Light Scanning Microscope with Spectral Detection - A light scanning microscope with an illumination module switchable between an illumination with m number of spots and an illumination with n number of spots, a deflecting unit which moves the m or n spots in a predetermined sample region, and a detector module for confocal and spectrally resolved detection of the sample radiation. The detector module has a confocal diaphragm unit, a splitting unit which is arranged downstream of the confocal diaphragm unit, a detector, and an imaging unit which images the partial beams on the detector in a spatially separated manner. The confocal diaphragm unit is switchable between a confocal diaphragm with exactly m apertures for m-spot illumination and a confocal diaphragm with n apertures for n-spot illumination. The splitting unit has a first beam path for m-spot illumination and a second beam path for n-spot illumination. The splitting unit is switchable between the two beam paths. | 05-28-2015 |
20150145982 | MICROSCOPE SYSTEM - Provided is a microscope system including a microscope provided with a multi-channel image-acquisition unit that acquires images of a specimen at respective wavelengths; an adjustment-method storage portion that stores, for respective channels, contrast adjusting methods for the images acquired by the image-acquisition unit; and a contrast adjusting portion that adjusts, for the respective channels, contrasts of the images acquired by the image-acquisition unit based on the contrast adjusting methods stored in the adjustment-method storage portion. | 05-28-2015 |
20150145983 | IMAGE ACQUISITION DEVICE, IMAGE ACQUISITION METHOD, AND COMPUTER-READABLE STORAGE MEDIUM - An image acquisition device acquires an image of a subject by capturing images of plural regions of the subject. The image acquisition device includes an image capturing device including an image formation optical unit and an image capturing unit, a temperature measurement unit that measures a temperature of the image capturing device, a selection unit that selects the temperature or an evaluation function by referring to an image of a first region from among the plural regions, the temperature or the evaluation function being selected as reference information for a second region adjacent to the first region, an information acquisition unit that acquires the temperature or the evaluation function, and a control unit that adjusts relative positions of a surface conjugated with a light reception surface of the image capturing unit and the subject, and causes the image capturing unit to capture an image of the second region. | 05-28-2015 |
20150293338 | SYSTEM FOR MICROSCOPIC APPLICATIONS - A system for microscopic applications, including a rotating structural element that acts as a beam splitter and has reflecting and transmitting structures, and which is disposed in an intermediate image plane of the beam path conjugated with the object field, and by which the structure is imaged onto an object in the object plane. The fluorescent light reflected by the object, or caused by the illumination, strikes the structural element as well as an image processing module. The beam reflected and transmitted by the structural element is guided through the image processing module. The structural element is set at an angle to the vertical of the beam path. An optical adapter, which tilts the microscopic intermediate image onto the plane of the structural element acting as beam splitter, is disposed at the interface between the microscope and the image processing module. | 10-15-2015 |
20150293342 | IMAGE CAPTURING APPARATUS AND IMAGE CAPTURING METHOD - An image capturing apparatus performs image capturing of an object from its surface side. The image capturing apparatus includes an image capturing optical system | 10-15-2015 |
20150300941 | METHOD FOR CHARACTERISING PARTICLES BY IMAGE ANALYSIS - A method for characterizing particles including: producing at least one image of the particles of a sample with a scanning electron microscope, capturing and processing the image. The processing includes: for each usable particle, measuring maximum Feret length and minimum Feret width of same; defining a geometric model of the particle from the maximum Feret length and minimum Feret width of same; calculating a projected area of the particle from the geometric model and the minimum Feret width of same; calculating a volume of the particle from the geometric model, the projected area and the maximum Feret length of same; calculating a characteristic particle size on the basis of the geometric model, the minimum Feret width and maximum Feret length; calculating a volume shape factor from the volume and characteristic size. | 10-22-2015 |
20150301329 | IMAGE ACQUIRING METHOD AND IMAGE ACQUIRING APPARATUS USING THE SAME - An image acquiring method for acquiring an image using a measurement apparatus including an image acquiring means which acquires an image of a surface of a target to be measured in the unit of predetermined size pixels and a moving means capable of moving the target to be measured, the image acquiring method includes: acquiring an image of a first region from the surface of the target to be measured through the image acquiring means; acquiring an image of a second region, which is different from the first region, by moving the target to be measured, through the moving means; acquiring a differential image by subtracting, from either the image of the first region or the image of the second region, the other image; and overlapping the differential image multiple times. | 10-22-2015 |
20150304552 | CONFOCAL MICROSCOPE - TI The present application discloses a confocal microscope including a light generator configured to simultaneously generate reflection light, which is reflected from a sample, and transmission light, which passes through the sample; a scanner configured to optically scan the sample and define a direction of a first optical path, along which the reflection light propagates; an adjuster configured to angularly adjust a direction of a second optical path, along which the transmission light propagates; a first signal generator configured to generate a first signal based on the reflection light; a second signal generator configured to generate a second signal based on the transmission light; and an image generator configured to generate a synthetic image in which a reflection image represented by the reflection light and a transmission image represented by the transmission light are synthesized in response to the first and second signals. | 10-22-2015 |
20150317508 | Methods and Systems for Fourier Ptychographic Imaging - In one aspect, the present disclosure provides a system for Fourier ptychographic microscopy, the system comprising (i) an image capture apparatus including an objective lens, (ii) at least one processor, and (iii) data storage including program instructions stored thereon that when executed by the at least one processor, cause the system to: (a) capture, via the image capture apparatus, a plurality of initial images of an object, wherein each of the plurality of initial images of the object have a first resolution, and (b) process each of the plurality of initial images in Fourier space to generate a final image of the object having a second resolution, wherein the second resolution is greater than the first resolution. | 11-05-2015 |
20150346471 | METHOD FOR THE IMAGE-BASED CALIBRATION OF MULTI-CAMERA SYSTEMS WITH ADJUSTABLE FOCUS AND/OR ZOOM - The invention relates to a method for the image-based calibration of multi-camera systems with adjustable focus and/or zoom, including the following method steps: calculating a number of beams from an optics simulation for different focus and/or zoom settings or combinations of focus and zoom settings; reading out the focus and/or zoom settings and storing these values with the beams such that a unique assignment is ensured; parameterizing a continuous pinhole camera model for extrinsic and intrinsic calibration of different zoom and/or focus settings of the multi-camera system on the basis of the data from the optics simulation. | 12-03-2015 |
20150355443 | IMAGE ACQUISITION APPARATUS - To acquire a pasted image having an enlarged dynamic range and having a high quality and a high angle of view, an image acquisition apparatus includes an imaging unit that captures an object, to acquire an image, an imaging control unit that controls the imaging unit, an HDR processing unit that combines a plurality of partial images acquired by capturing the same region of the object under different exposures, to generate an HDR image having an enlarged dynamic range, a pasting processing unit that pastes the plurality of HDR images generated for different regions of the object, to acquire a pasted image having a higher angle of view, and an exposure setting unit that sets an exposure condition in capturing all the partial images based on image information acquired by capturing a wider range than the single partial image included in the pasted image. | 12-10-2015 |
20150358533 | CONTROL METHOD FOR IMAGING APPARATUS AND IMAGING SYSTEM - In a first disposing step, a plurality of imaging elements are disposed in positions which are different in an optical axis direction. Then an object is imaged using the plurality of imaging elements while moving the object in a direction perpendicular to the optical axis using a movable stage, so as to acquire a plurality of image data of which focal positions with respect to the object in the optical axis direction are different (pre-imaging). An in-focus position with respect to the object is determined based on the plurality of image data acquired in the pre-imaging. | 12-10-2015 |
20160004060 | HIGH FRAME-RATE MULTICHANNEL BEAM-SCANNING MICROSCOPY - A beam-scanning optical design is described for achieving up to kHz frame-rate optical imaging on multiple simultaneous data acquisition channels. In one embodiment, two fast-scan resonant mirrors direct the optical beam on a circuitous trajectory through the field of view, with the trajectory repeat-time given by the least common multiplier of the mirror periods. Dicing the raw time-domain data into sub-trajectories combined with model-based image reconstruction (MBIR) 3D in-painting algorithms allows for effective frame-rates much higher than the repeat time of the Lissajous trajectory. Because sub-trajectory and full-trajectory imaging are different methods of analyzing the same data, both high-frame rate images with relatively low resolution and low frame rate images with high resolution are simultaneously acquired. | 01-07-2016 |
20160004062 | MICROSCOPY SLIDE SCANNER WITH VARIABLE MAGNIFICATION - An instrument and a method of scanning a large microscope specimen moves the specimen relative to a detector array during scanning by a scanner. Magnification of the instrument is adjustable using a zoom tube lens over a continuous range of magnification to enable scans of the specimen to be taken over a range of resolutions without varying the infinity corrective objective. Scans of the specimen can be taken over a range of resolutions with the same infinity connected objective. | 01-07-2016 |
20160004063 | MICROSCOPY IMAGING DEVICE WITH ADVANCED IMAGING PROPERTIES - Systems, methods and devices are implemented for microscope imaging solutions. One embodiment of the present disclosure is directed toward an epifluorescence microscope. The microscope includes an image capture circuit including an array of optical sensor. An optical arrangement is configured to direct excitation light of less than about 1 mW to a target object in a field of view of that is at least 0.5 mm | 01-07-2016 |
20160011409 | INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING PROGRAM | 01-14-2016 |
20160018632 | RAPID CONFOCAL MICROSCOPY TO SUPPORT SURGICAL PROCEDURES - One embodiment of techniques for confocal microscopy includes illuminating a spot on a surface of a biological sample. A first emission intensity from the spot is detected in a first range of optical properties; and a second emission intensity in a second range. A pixel that corresponds to the spot is colored using a linear combination of the first and second emission intensities. Sometimes, the pixel is colored to approximate a color produced by histology. In some embodiments, a surface of a sample is contacted with a solution of a nucleus dye. Then, a spot is illuminated with a laser beam of wavelength about 488 nanometers (nm). Fluorescence emission intensity is detected above about 500 nm. Sometimes, a certain illumination correction is applied. In some embodiments, a sample holder that compresses a sample is removable from a stage that is fixed with respect to a focal plane of the microscope. | 01-21-2016 |
20160019696 | Device and Method for Computing Amount of Drift and Charged Particle Beam System - A drift amount computing device ( | 01-21-2016 |
20160025959 | SAMPLE OBSERVATION METHOD AND SAMPLE OBSERVATION DEVICE - A sample observation method includes an acquisition of for acquiring an electronic image of a sample, and a subtraction step of subtracting a DC component from a signal of the electronic image, and the acquisition step is performed in a state of bright-field observation, the electronic image at the subtraction step is an image acquired in a first predetermined state, and in the first predetermined state, at least a position of the sample and a in-focus position of an image forming optical system are different. A sample observation device includes a light source, an illumination optical system, an image forming optical system, an image-pickup device, and an image processing device, and the illumination optical system is disposed so as to irradiate a sample with illumination light from the light source, the image forming optical system is disposed so that light from the sample is incident thereon and an optical image of the sample is formed, the image-pickup device is disposed at a position of the optical image, and the image processing device is configured to implement the aforementioned sample observation method. | 01-28-2016 |
20160041376 | SYSTEM AND METHOD FOR MEASURING OIL CONTENT IN WATER USING LASER-INDUCED FLUORESCENT IMAGING - The invention is a system and method to measure oil content in water utilizing the fluorescence of oil emitted under excitation by laser. Oil and water mixture is transferred through the system to a measurement section in a microscope, which produces high resolution 3-dimensional images of the oil and water mixture with the fluorescence. The images are analyzed to calculate the amount of oil in water and oil droplets distribution. The image is also analyzed to distinguish oil coated solids from oil droplets, and to calculate the sizes and volumes of the solids. | 02-11-2016 |
20160041379 | MICROSCOPE OBJECTIVE - Provided here are microscope objectives that include a first plurality of lenses positioned within the passageway on a sample end of the microscope objective and a second plurality of lenses positioned within the passageway and spaced apart from the first plurality of lenses and opposite the sample end such that the first plurality of lenses and the second plurality of lenses are aligned along an imaging axis and such that each individual lens is rotationally symmetrical about the imaging axis. Also included is a motor configured to move a carrier along the imaging axis to change a distance between each lens of first plurality of lenses relative to at least one lens of the second plurality of lenses. | 02-11-2016 |
20160048014 | SPIM Arrangement - A selective/single plane illumination microscopy (SPIM) arrangement having an illumination device ( | 02-18-2016 |
20160054551 | METHOD FOR IMAGING A SAMPLE BY MEANS OF A MICROSCOPE AND MICROSCOPE - A method for imaging a sample using a microscope having an illumination unit, an imaging lens system and an image sensor, including: illuminating an area of the sample; imaging and magnifying the sample onto the image sensor and capturing the image using a predetermined number of pixels; providing a plurality of different comparison sample areas; for each comparison sample area, performing a reference measurement, wherein the comparison sample areas are illuminated, imaged and magnified onto the image sensor and captured with the predetermined number of image pixels as a reference image; determining a brightness-correction image with the predetermined number of image pixels by determining the value for each image pixel of the brightness-correction image from the values of allocated image pixels of the reference images, and correcting the image of the area of the sample captured based on the brightness-correction image and outputting it as a corrected image. | 02-25-2016 |
20160062098 | MICROSCOPY OF A TISSUE SAMPLING USING STRUCTURED ILLUMINATION - Systems and methods are provided for evaluating a fresh tissue sample, prepared as to fluoresce under illumination, during a medical procedure. A structured light source is configured to project a spatially patterned light beam onto the fresh tissue sample. An imaging system is configured to produce an image from fluorescence emitted from the illuminated fresh tissue sample. A system control is configured to provide a human-comprehensible clinically useful output associated with the medical procedure. | 03-03-2016 |
20160062101 | METHOD AND APPARATUS FOR SMALL AND LARGE FORMAT HISTOLOGY SAMPLE EXAMINATION - The disclosure is directed at a method and apparatus for small and large format histology examination. By providing a pair of networked processors and by linking one processor with a microscope, control of the microscope may be performed at a remote location. Further, by transmitting low magnification images, a reviewer may determining a region of interest before having a higher magnification image captured thereby reducing the data storage required for this histology examination. | 03-03-2016 |
20160070093 | Deconvolution By Digital Filtering From Linear Discriminate Analysis - A quantitative optical microscopy arrangement is described. Specifically, a digital filter derived from linear discriminant analysis is described for recovering impulse responses in applications that may include photon counting from a high speed photodetector and applied to remove ringing distortions from impedance mismatch in multiphoton fluorescence microscopy. Training of the digital filter is achieved by defining temporally coincident and non-coincident transients and identifying the projection within filter-space that best separates the two classes. The training allows rapid data analysis by digital filtering. The LDA filter is also capable of recovering deconvolved impulses for single photon counting from highly distorted ringing waveforms from an impedance mismatched photomultiplier tube. The LDA filter is also successful in removing these ringing distortions from two-photon excited fluorescence micrographs and may extend the dynamic range of photon counting by about three orders of magnitude through minimization of detector paralysis. | 03-10-2016 |
20160077322 | IMAGE ACQUISITION DEVICE AND METHOD AND SYSTEM FOR ACQUIRING FOCUSING INFORMATION FOR SPECIMEN - In an image acquisition device, an optical path difference generating member can form an optical path length difference of a second optical image without splitting light in a second optical path. This can suppress the quantity of light required for the second optical path to obtain information of the focal position, whereby a quantity of light can be secured for a first imaging device to capture an image. The image acquisition device synchronizes the movement of a predetermined part of a sample within a field of an objective lens with rolling readout such that each pixel column of a second imaging device is exposed to an optical image of the predetermined part in the sample. | 03-17-2016 |
20160079031 | Method of Constructing 3D Image, Image Processor, and Electron Microscope - A method capable of constructing an accurate three-dimensional image is offered. The method comprises the step (S | 03-17-2016 |
20160088205 | MULTIPLEXED FOURIER PTYCHOGRAPHY IMAGING SYSTEMS AND METHODS - Certain embodiments pertain to Multiplexed Fourier Ptychographic imaging systems and methods. In one example, the Multiplexed Fourier Ptychographic imaging system includes an LED array configured to illuminate a sequence of LED patterns for illuminating a sample being imaged. The system includes LED circuitry configured to independently control power to turn on multiple LEDs simultaneously in each LED pattern of the array. The system has a light detector that acquires a first set of lower resolution images of the sample each image acquired during exposure time during illumination by a unique LED pattern. The system uses the first set of lower resolution images to generate a second set of lower resolution images associated with each LED in the LED array and iteratively updates overlapping regions in the Fourier domain with the second set of lower resolution images to generate a higher resolution image. | 03-24-2016 |
20160091701 | GENERATING PERSPECTIVE VIEWS IN MICROSCOPY - A microscope includes a spatial light modulator configured for adjusting the perspective angle of a view imaged at the light detector. The spatial light modulator is positioned at a pupil plane, or at an equivalent conjugate plane thereof, in the illumination light path or in the detection light path. The microscope enables perspective views of a sample at different angles, which may be utilized to generate a three-dimensional image of the sample. | 03-31-2016 |
20160094775 | AUTOFOCUS APPARATUS, AUTOFOCUS METHOD, AND PROGRAM - An autofocus apparatus according to an embodiment of the present invention is provided with an image acquirer, a pattern controller, and a focus controller. The image acquirer includes an optical system which forms an image of an object at a predetermined magnification and an image capturer which photographs the image of the object formed by the optical system. The pattern controller includes a generator which generates a pattern in a size according to the predetermined magnification of the optical system and a projector which projects the pattern generated by the generator onto the object. In the focus controller, an image of the projected pattern formed by the optical system at the predetermined magnification controls a focus position of the optical system based on the image of the object photographed by the image capturer. | 03-31-2016 |
20160116729 | MICRODISSECTION VIEWING SYSTEM - The present disclosure provides devices, systems and methods for the acquisition and display of captured and/or saved slide images of a sample. In particular embodiments, the images are displayed on a portable computer attached to a removable device configured to hold a slide of the sample. The device is aligned with the portable computer so that the displayed sample image is overlaid with the sample being held by the device. In exemplary embodiments, the displayed image is used as a template for dissection of the sample being held by the device. | 04-28-2016 |
20160124209 | IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, MICROSCOPE SYSTEM, AND COMPUTER-READABLE RECORDING MEDIUM - An image processing device includes: an image acquiring unit configured to acquire a plurality of images of different imaging fields of view on the same subject; an image selector configured to select, from the plurality of images acquired, in which a common region of a predetermined size is set at a common position in the individual images, a plurality of image pairs that are combinations of images in which a subject image in the common region in one image corresponds to a subject image in a region other than the common region in another image; a correction gain calculating unit configured to calculate a correction gain for performing shading correction; and an image correcting unit configured to correct shading produced in a correction-target image, using the correction gain calculated by the correction gain calculating unit. | 05-05-2016 |
20160131890 | APPARATUS AND METHOD FOR GENERATING IN-FOCUS IMAGES USING PARALLEL IMAGING IN A MICROSCOPY SYSTEM - A method of generating in-focus images of measurement locations of a sample holder in a microscopy imaging system is provided. A camera array is positioned at a first distance from the sample holder. A first image of a measurement location is acquired using an imaging device disposed on the camera array. A candidate output image associated with the imaging device is developed in accordance with the first image. The camera array is positioned at a second distance from the sample holder and a second image of the measurement location is acquired using the imaging device. A portion of the candidate output image is updated in accordance with a portion of the second image in accordance with a selection criterion. The updated candidate image is transmitted. | 05-12-2016 |
20160147054 | COMPUTATIONAL MICROSCOPY THROUGH A CANNULA - An imaging system can include an optical fiber and a light source for providing optical stimulation to a region of interest along the optical fiber. A camera can capture emission such as fluorescence resulting from the optical stimulation. A cannula configured for implantation into a subject can be configured to direct the emission from the subject. A mating sleeve coupling the cannula to the optical fiber, and configured to support the camera, can include a dichroic mirror to allow the optical stimulation to pass from the optical fiber to the cannula and to redirect the emission from the cannula to the camera. | 05-26-2016 |
20160147058 | MICROSCOPE SYSTEM - A microscope system including an objective lens, a camera for capturing an image of light that comes from a specimen and that is collected by the objective lens, a stage for moving the specimen and the objective lens relative to each other in a direction perpendicular to an optical axis, a controller implementing a VS-image generation for generating a VS image by joining a plurality of microscope-image groups that are acquired while moving the objective lens and the specimen relative to each other, a correction-region search for searching for a correction region for acquiring a correction image, a correction-data generation for generating shading-correction data based on the correction image acquired for the searched-for correction region, and a shading correction for performing correction by using the generated shading-correction data. | 05-26-2016 |
20160178883 | EPI-ILLUMINATION FOURIER PTYCHOGRAPHIC IMAGING FOR THICK SAMPLES | 06-23-2016 |
20160178921 | Illumination Apparatus Optimized for Synthetic Aperture Optics Imaging Using Minimum Selective Excitation Patterns | 06-23-2016 |
20160252713 | DETERMINATION OF DEFLECTION OF A MICROSCOPE SLIDE | 09-01-2016 |
20180025482 | METHOD FOR MEASURING OVERLAY AND MEASURING APPARATUS, SCANNING ELECTRON MICROSCOPE, AND GUI | 01-25-2018 |
20180026778 | ELECTRONIC DEVICE AND SYSTEM FOR SYNCHRONIZING PLAYBACK TIME OF SOUND SOURCE | 01-25-2018 |