Class / Patent application number | Description | Number of patent applications / Date published |
324229000 | Thickness measuring | 27 |
20080290864 | Magnetic Field Position Sensor and Method of Use - A magnetic field position sensing device for sensing the position, on a front surface of a wall, of a magnet of known magnetic field intensity secured to a rear surface of the wall. The sensing device has a magnetic field transducer which produces signals proportional to the strength of the magnetic field detected. These signals are treated in a microcontroller and compared to a reference signal value representative of the magnetic field intensity of the magnet, when not obstructed, whereby to generate signals to a display device which displays a numerical value indicative of the thickness of the wall. Audible/visual signaling devices are also provided whereby to direct the movement of the sensing device by a user person to locate same on the front surface of the wall substantially adjacent the magnet and this is accomplished by displacing the sensing device in a diminishing spiral path. | 11-27-2008 |
20090001977 | BILL DISCRIMINATION DEVICE AND SENSOR FOR SAME - The sensor portion of the bill discrimination device has a variable inductance portion whose inductance changes depending on thickness of the bill and the magnetic ink amount, and an output signal generator for generating an output signal depending on the inductance of the variable inductance portion. The variable inductance portion includes a contact member which may have magnetostrictive behavior, and a coil portion disposed about the perimeter thereof. The contact member is positioned so as to be subjected to pressing force of a spring via an auxiliary roller. When the pressing force received from the spring changes depending on the thickness of a currency bill, the magnetic permeability of the contact member will change and the inductance of the variable inductance portion will change. At the same time, the inductance of the variable inductance portion will also change depending on the magnetic charge of the currency bill. | 01-01-2009 |
20090058408 | METHOD AND A DEVICE FOR ELECTROMAGNETIC MEASUREMENT OF THICKNESS AND ELECTRICAL CONDUCTIVITY - A method for non-contact determination of sought properties of an object to be measured by using electromagnetic induction. An electromagnetic field is generated in a transmitter coil placed on one side of the object to be measured. The magnetic field penetrates through the object to be measured and is detected by a receiver coil placed on the other side of the object to be measured. A control coil is placed near the transmitter coil generating a change in the magnetic field of the transmitter coil. A field change in the detecting is detected in the control coil. The field is detected in the receiver coil. The difference in time is determined for the detection of the field change in the control coil and in the receiver coil, respectively. The time of penetration through the object to be measured is determined, and the thickness or electrical conductivity of the object to be measured is determined therefrom. | 03-05-2009 |
20090134867 | CORROSION EVALUATION DEVICE AND CORROSION EVALUATION METHOD - A corrosion evaluation device for performing a quantitative evaluation of corrosion by measuring a quantity of decrease in the thickness of a magnetic material which is covered by a non magnetic material or a magnetic material which is not covered by a non magnetic material which includes: a magnetic field generating device for generating such a magnetic field that includes the magnetic material in a magnetic path, a Giant Magnet-Resistive effect (GMR) sensor provided with a GMR sensor for detecting a magnetic flux leakage with regard to the magnetic material and converts a change in the magnetic flux into an electrical signal, a thickness reduction calculation portion for calculating a quantity of decrease in the thickness of the magnetic material based on the electrical signal. The corrosion evaluation device precisely performs a quantitative evaluation of corrosion even when the magnetic material, which is to be evaluated, is covered by a non magnetic material. | 05-28-2009 |
20090243604 | Measurement of pipe wall thickness using magnetic flux leakage signals - An apparatus comprising a processor configured to implement a method comprising obtaining a pipe profile comprising a diameter, a nominal thickness, and a material, receiving a magnetic flux leakage (MFL) indication for a pipe associated with the pipe profile, and determining a wall thickness for the pipe using the pipe profile and the MFL indication. Also disclosed is a method comprising modeling an apparatus comprising a magnet configured to induce a magnetic field in a pipe, and determining a wall thickness measurement (WTM) for the pipe using a model of the apparatus and the pipe, a detected MFL signal, and a simulated MFL signal. | 10-01-2009 |
20090315545 | Apparatus for Measurement of Volume-or-Mass-Flow of a Medium - The invention relates to an apparatus for measuring volume- or mass-flow of a medium flowing through a measuring tube ( | 12-24-2009 |
20110254544 | METHOD AND DEVICE FOR MEASURING THE LAYER THICKNESS OF PARTIALLY SOLIDIFIED MELTS - The present invention relates to a method and a device for measuring the layer thickness of partially solidified melts, particularly on a conveyor belt, during continuous casting. In order to determine the layer thickness, magnetic fields are used, which are created by means of electromagnetic stirring coils that are present on one side of the layer. The reduced magnetic field is then detected on the other side of the layer and is used for calculating the layer thickness. | 10-20-2011 |
20110260720 | Measuring probe for non-destructive measuring of the thickness of thin layers - The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers on an object with a measuring head, which comprises at least one sensor element for contact on a measurement surface of an object, and with a support device for receiving the measuring head, which is at least partly surrounded by a housing, wherein at least one further measuring head, which is adjacent to and separated from the first measuring head, is arranged on the support device, which can be controlled independently of the first measuring head. | 10-27-2011 |
20110260721 | Measuring probe for non-destructive measuring of the thickness of thin layers - The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which comprises at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar. | 10-27-2011 |
20120001624 | Method And Apparatus For Measuring The Thickness Of A Metal Layer Provided On A Metal Object - A method and an apparatus for measuring the thickness of a metal layer. The metal layer has a resistivity (ρ | 01-05-2012 |
20120126798 | Method and apparatus for magnetic response imaging - An apparatus and method for identifying, measuring, and monitoring metal loss through corrosion or other deleterious factors in ferromagnetic piping and ferromagnetic objects. Drive coils secured to the object are driven to emit a magnetic field which is transmitted through the object by magnetic domains in the object. Response coils detect the magnetic domains and generate a response signal. The drive and response signals can penetrate insulating materials and non-ferromagnetic metallic coverings of the piping and vessels. The system operates reiteratively over an extended period of time, e.g., months or years, to detect loss of magnetic domains which is an important indicator of corrosion and deterioration of the object. | 05-24-2012 |
20130009634 | APPARATUS AND METHOD FOR MEASURING DEPOSITS INSIDE A TUBE - The present invention provides a probe apparatus and an associated method for measuring a magnetite deposit thickness, which apparatus and method is independent of the porosity and magnetic permeability of the magnetite deposit. The probe apparatus of this invention is an axial scanning and inside surface-following probe that can accurately and reliably measure the inside diameter of a tube. The probe apparatus of the present invention optionally comprises two modules: the first module is the surface-following module and the second module is a conventional eddy current probe. | 01-10-2013 |
20140062468 | DEVICE FOR GLOBALLY MEASURING THICKNESS OF METAL FILM - A device for globally measuring a thickness of a metal film ( | 03-06-2014 |
20140117982 | FILM MEASUREMENT - In one embodiment, a sample is tested by an eddy current sensor at two distances separated by a known incremental distance. In one aspect, at least one of an unknown distance of the sensor from the test sample and the film thickness of the test sample may be determined as a function of a comparison of sensor output levels of a single parameter and the known incremental distance to calibration data. In yet another aspect, the distance between the sensor and the test sample may oscillated to produce an oscillating sensor output signal having an amplitude and mean which may be measured and compared to calibration data to identify at least one of the unknown film thickness of a conductive film on a test sample, and the unknown distance of the test sample from the sensor. Other aspects and features are also described. | 05-01-2014 |
20140125330 | HALL EFFECT PROBE WITH EXCHANGEABLE WEAR TIPS - Disclosed is a Hall sensor probe that configured to be coupled with one of a plurality of magnetic targets for measuring the thickness of a non-ferromagnetic wall. The probe comprises a magnetic field source, a Hall sensor, a concentrator and a main housing. The novel aspects of the probe include a wear tip that is exchangeably affixed onto the main-housing, leaving a permanent gap from and disjoined from the concentrator in a manner that transfers stress from the tip directly onto the main-housing. To serve every aspects of the primary objective, being it mechanical, thermal and operational, the material of the tip preferably has a fracture toughness higher than 20 MPa·m | 05-08-2014 |
20140125331 | EQUIPMENT OF INSPECTING THICKNESS OF FIBRE CLOTH AND METHOD THEREFOR - The invention provides an equipment of inspecting thickness of fibre cloth and method therefor. The method includes following steps: disposing a fibre cloth on a metal backboard; sensing an eddy current responding from the fibre cloth and the metal backboard by an eddy current sensing device to obtain a multilayer thickness information; and comparing the multilayer thickness information with a single-layer thickness information to obtain a cloth thickness information corresponding to the thickness of the fibre cloth, wherein the single-layer thickness information is obtained by sensing an eddy current responding from the metal backboard, thereby the thickness of fibre cloth can be obtained. | 05-08-2014 |
20150316508 | APPARATUS AND METHOD FOR DETECTING INNER DEFECTS OF STEEL PLATE - An apparatus for detecting inner defects of a steel plate comprises an all-defect detection unit for detecting all defects including surface defects present on the surface of the steel plate and inner defects present inside the steel plate by intensity of leakage flux, measured by generating magnetic flux in a strike direction of the steel plate; a surface defect detection unit for detecting surface defects by intensity of leakage flux, measured by generating magnetic flux in the thickness direction of the steel plate, for a predetermined detection region including all the defects detected by the all-defect detection unit; and a data processing unit for detecting only inner defects present in a detection region by excluding the detected surface defects from all the defects detected by the all-defect detection unit, for the detection region, thereby detecting only the inner defects of the steel plate. | 11-05-2015 |
20160025681 | Pipeline Condition Detecting Method and Apparatus - The current invention relates to an apparatus for detecting at least one characteristic of a pipeline. The apparatus includes means for generating a magnetic flux along a portion of a pipeline wall, means for detecting the magnetic field, and at least one proximity sensor. The apparatus further includes means for generating an indication of whether defects are located in the internal or external wall of the pipeline. | 01-28-2016 |
324230000 | Layer or layered material | 9 |
20080290865 | Method of forecasting and detecting polishing endpoint and the device thereof and real time film thickness monitoring method and the device thereof - An object of the present invention is to provide a method of forecasting and detecting a polishing endpoint and the device thereof and a real time film thickness monitoring method and the device thereof capable of suppressing a Joule heat loss to the minimum due to an eddy current, and precisely forecasting and detecting the polishing endpoint, and moreover, precisely calculating a remaining film amount to be removed and a polishing rate and the like on the spot so as to be able to accurately evaluate whether the predetermined conductive film is appropriately removed. | 11-27-2008 |
20090058409 | Method and device for forecasting polishing end point | 03-05-2009 |
20090096446 | Polishing monitoring method, polishing apparatus and monitoring apparatus - The present invention provides a method for monitoring a change in thickness of a conductive film brought into sliding contact with a polishing surface of a polishing pad using an eddy current sensor. The output signal of the eddy current sensor comprises two signals corresponding to a resistance component and an inductive reactance component of an impedance of an electric circuit including a coil of the eddy current sensor. The method includes acquiring the output signal of the eddy current sensor when the eddy current sensor is facing the conductive film, defining the two signals as coordinates on a coordinate system, repeating the acquiring of the output signal and the defining of the coordinates, determining a center of curvature of an arc specified by at least three sets of coordinates on the coordinate system, determining an angle of inclination of a line connecting the center of curvature and a latest one of the at least three sets of coordinates, and monitoring a change in thickness of the conductive film by monitoring a change in the angle of inclination. | 04-16-2009 |
20090251137 | Method for determining the layer thickness of an electrically conductive coating on an electrically conductive substrate - An embodiment of the present invention discloses a method for determining the layer thickness of an electrically conductive coating which is applied on an electrically conductive substrate of a test object. First, the induced voltage of an eddy current sensor is collected in the air as a function of the frequency of an exciter field. The majority of coated reference objects which have been provided each contains a substrate and coating from the same materials, such as the substrate and coating of the test object. The reference objects display various known layer thicknesses. A reference voltage can be detected for each reference object as a function of the frequency of the exciter field with the eddy current sensor. Subsequently, a material induced voltage can be determined from the reference voltage and the induced voltage of the eddy current sensor in the air for each reference object. Afterwards, standard amplitude of the material induced voltage can be generated for each reference object. Thus, a calibration curve results, which represents the standard amplitude of the material induced voltage as a function of layer thickness of the coating. The standard amplitude is also determined in the same way for test objects. Thus, the layer thickness of the coating of the test object is determined by the calibration curve. | 10-08-2009 |
20090256558 | Film thickness measuring apparatus and film thickness measuring method - Coil is made to be disposed with gap opposed to the surface of wafer, and wafer stage is made to move in X and Y direction and R and θ direction. When supplying an alternating current to coil with the frequency swept by impedance analyzer, the magnetic field made to be induced in coil will operate on the conductive film of wafer. By changing a parameter (a frequency or an angle) influencing the skin effect of the conductive film and giving the parameter to coil, the state where a magnetic field is not made to penetrate relatively the film of wafer and the state where the magnetic field is made to penetrate relatively the film can be formed. From the variation of various values corresponding to the eddy current induced based on the change of state influenced by the skin effect of the conductive film, the film thickness of wafer can be measured with sufficient accuracy. | 10-15-2009 |
20090261820 | WAFER FOR ELECTRICALLY CHARACTERIZING TUNNEL JUNCTION FILM STACKS WITH LITTLE OR NO PROCESSING - Probes are electrically connected to a surface of a tunnel junction film stack comprising a free layer, a tunnel barrier, and a pinned layer. Resistances are determined for a variety of probe spacings and for a number of magnetizations of one of the layers of the stack. The probe spacings are a distance from a length scale, which is related to the Resistance-Area (RA) product of the tunnel junction film stack. Spacings from as small as possible to about 40 times the length scale are used. Beneficially, the smallest spacing between probes used during a resistance measurement is under 100 microns. A measured in-plane MagnetoResistance (MR) curve is determined from the “high” and “low” resistances that occur at the two magnetizations of this layer. The RA product, resistances per square of the free and pinned layers, and perpendicular MR are determined through curve fitting. | 10-22-2009 |
20090267597 | Techniques for Electrically Characterizing Tunnel Junction Film Stacks with Little or no Processing - Probes are electrically connected to a surface of a tunnel junction film stack comprising a free layer, a tunnel barrier, and a pinned layer. Resistances are determined for a variety of probe spacings and for a number of magnetizations of one of the layers of the stack. The probe spacings are a distance from a length scale, which is related to the Resistance-Area (RA) product of the tunnel junction film stack. Spacings from as small as possible to about 40 times the length scale are used. Beneficially, the smallest spacing between probes used during a resistance measurement is under 100 microns. A measured in-plane MagnetoResistance (MR) curve is determined from the “high” and “low” resistances that occur at the two magnetizations of this layer. The RA product, resistances per square of the free and pinned layers, and perpendicular MR are determined through curve fitting. | 10-29-2009 |
20100171493 | METHOD AND DEVICE FOR MEASURING THICKNESS OF A SUBSTRATE - A gauge for measuring the thickness of a piece of steel or other ferromagnetic substrate. The gauge may be used to measure the wall thickness of tubing, a pipe, a shim, a plate, etc, given that it's made from a material that a magnet might be attracted to. The gauge uses a force sensor to measure the force between a magnet and the tubing, pipe, shim, plate, etc. Because different thicknesses correspond to a different magnitude of force, the gauge may be used to find flaws and variations in the material. The gauge may use a force sensor that is approved for use in or near flammable environments. | 07-08-2010 |
20140203802 | MEASURING PROBE FOR MEASURING THE THICKNESS OF THIN LAYERS, AND METHOD FOR THE PRODUCTION OF A SENSOR ELEMENT FOR THE MEASURING PROBE - The invention relates to a measuring probe for measuring the thickness of thin layers with a housing ( | 07-24-2014 |