|WEATHERFORD/LAMB, INC. Patent applications|
|Patent application number||Title||Published|
|20150243471||Alignment Marking for Rock Sample Analysis - A method for using a Focused Ion Beam and/or Scanning Electron Microscope (FIB/SEM) for etching one or more alignment markers on a rock sample, the one or more alignment markers being etched on the rock sample using the FIB/SEM. The one or more alignment markers may further be deposited with a platinum alloy or other suitable compositions for increasing alignment marker visibility.||08-27-2015|
Patent applications by WEATHERFORD/LAMB, INC.