VISHAY GENERAL SEMICONDUCTOR, INC. Patent applications |
Patent application number | Title | Published |
20100109692 | APPARATUS, SYSTEM AND METHOD FOR TESTING ELECTRONIC ELEMENTS - An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles. | 05-06-2010 |
20090236705 | APPARATUS AND METHOD FOR SERIES CONNECTION OF TWO DIE OR CHIPS IN SINGLE ELECTRONICS PACKAGE - An apparatus and method for a two semiconductor device package where the semiconductor devices are connected in electrical series. The first device is mounted P-side down on an electrically conductive substrate. Non-active area on the P side is isolated from the electrically conductive substrate. The second device is mounted P-side up at a spaced apart location on the substrate. Opposite sides of each are electrically connected to leads to complete the series connection of the two devices. A method of manufacturing such a package includes providing an electrically conductive lead frame, mounting one device P-side up and flipping the other device and mounting it P-side down on the lead frame with non-active area of the P side isolated from the lead frame, and connecting the other side of each device to separate leads. Isolation of the non-active area of the P side of the device can be through modification of the substrate or lead frame surface by grooves or raised portions. Alternatively, it can be by adding an electrically isolating coating on the non-active area of the P-side of a semiconductor device to allow it to be mounted P side down on an electrically conductive substrate or mounting location without modification to the substrate or lead frame. | 09-24-2009 |