| PANERATECH, INC. Patent applications |
| Patent application number | Title | Published |
|---|
| 20150276577 | MATERIAL EROSION MONITORING SYSTEM AND METHOD - Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter. | 10-01-2015 |
| 20140340279 | ADAPTIVE ANTENNA FEEDING AND METHOD FOR OPTIMIZING THE DESIGN THEREOF - Disclosed is an antenna feeding system and method to optimize the design of the feeding system to feed an antenna made of a resistive sheet. The system and method are operative to design a topology of the antenna feeding system to adapt to a topology of the resistive sheet antenna to mitigate the adverse effects caused by the inherent losses of resistive sheets while operating as antennas. The system is designed to reduce a convergence of radiofrequency currents that may create a localized high density current concentration, such as “hot spots” and “pinch points,” on the resistive sheet, by a sufficient extent so as to prevent power losses that substantially decrease the radiation efficiency of the antenna as compared with feeding systems designed using traditional design techniques. | 11-20-2014 |
| 20130144554 | MICROWAVE PROBE FOR FURNACE REFRACTORY MATERIAL - Disclosed is a system and method to aid in these inspections that avoid the disadvantages of the prior art. The system and method are operative to take thickness measurements of, and thus evaluate the condition of, materials including but not limited to refractory materials, operating in frequency bands that result in less loss than previously known technologies, and utilizing a system configuration and signal processing techniques that isolate the reflected signal of interest from other spurious antenna reflections, particularly by creating (through the configuration of the antenna assembly) a time delay between such spurious reflections and the actual reflected signal of interest, thus enabling better isolation of the signal of interest. Still further, the antenna assembly is intrinsically matched to the material to be probed, such as by impedance matching the antenna to the particular material (through knowledge of the dielectric and magnetic properties of the material to be evaluated) to even further suppress spurious reflections. | 06-06-2013 |
