OLYMPUS NDT, INC. Patent applications |
Patent application number | Title | Published |
20150276371 | APARATUS AND METHOD FOR CONDUCTING AND REAL-TIME APPLICATION OF EC PROBE CALIBRATION - A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe. | 10-01-2015 |
20150212184 | PACKET BASED DDS MINIMIZING MATHEMATICAL AND DAC NOISE - Disclosed are a method of and an apparatus devising a packet based DDS circuitry for performing packet based a direct digital synthesizing (DDS) function within an electronic testing instrument. The circuitry comprising a DDS logic circuit configured to execute direct digital syntheses on a plurality of consecutive packets of sine-like waves, each packet having a length of a period precisely chosen such that the sine wave at the end of one packet matches up with the sine wave at the start of the immediate subsequent packet. Also disclosed is an eddy current testing circuitry using multiple outputs of the single packet based DDS, one of the output is used in a circuit producing reference signals approximating the response signals. With the usage of the packet based DDS, the reference signal can be highly effective in nulling the unchanging portion of the response signals. | 07-30-2015 |
20150085143 | METHOD AND CIRCUITRY FOR REMOVING CIRCLING DRIFTS IN NDT/NDI MEASUREMENT DISPLAY - Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display. | 03-26-2015 |
20150049108 | METHOD AND SYSTEM OF SIGNAL REPRESENTATION FOR NDT/NDI DEVICES - Disclosed is a method and system to provide an improved signal representation of non-destructive test/inspection instruments by proper color display, in order to emulate as closely as possible, the visual rendering effect of those seen in the traditional non-electronic testing, including penetrant testing and magnetic particle testing. The foregoing object of the invention is preferably realized by providing an eddy current or phased array instrument with a color palette module that allows the deployment of an array of color representation system typically used in traditional non-electronic testing methods. | 02-19-2015 |
20150039245 | SYSTEM AND METHOD OF NON-DESTRUCTIVE INSPECTION WITH A VISUAL SCANNING GUIDE - Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear. | 02-05-2015 |
20140236499 | SIZING OF A DEFECT USING PHASED ARRAY SYSTEM - Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the ADDT standard which is adapted to phased array systems with fixed probe orientations. Based on pre-configured parameters obtained from C-scans, the method as presently disclosed provides novel analysis on C-scans and more complete information on defects, including the orientation and sizes in length and depth or thickness of the defects. Phased array systems devised with the presently disclosed method can perform such inspection and complete sizing automatically for longitudinal, transverse and oblique defects in one pass of scan. | 08-21-2014 |
20140132254 | HALL EFFECT MEASUREMENT INSTRUMENT WITH TEMPERATURE COMPENSATION - Disclosed is a Hall Effect instrument with the capability of compensating for temperature drift consistently, accurately and in real time of operation. The instrument embodies a four-point ohm meter circuit measuring Hall Effect sensor resistance and tracking the effect of temperature on the Hall Effect sensor. The instrument takes into account a relationship between the temperature and a temperature compensation index on a per probe basis, which has exhibited a deterministic difference observed by the present inventor. | 05-15-2014 |
20140109675 | ULTRASONIC TESTING INSTRUMENT WITH DITHERY PULSING - Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes. | 04-24-2014 |
20140088921 | NON-DESTRUCTIVE TESTING INSTRUMENT WITH DISPLAY FEATURES INDICATING SIGNAL SATURATION - Disclosed is a non-destructive testing instrument configured, when the digital signal is saturated during one data acquisition session, to display an indicator flag to warn the operator in order to help the operator to clearly see that a measurement is invalid. It's also configured to abandon and not to display the measurement results to stop any further analysis on them. | 03-27-2014 |
20140035568 | ASSEMBLY WITH A UNIVERSAL MANIPULATOR FOR INSPECTING DOVETAIL OF DIFFERENT SIZES - Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off. | 02-06-2014 |
20140002072 | EDDY CURRENT ARRAY CONFIGURATION WITH REDUCED LENGTH AND THICKNESS | 01-02-2014 |
20130283918 | METHOD AND SYSTEM OF USING 1.5D PHASED ARRAY PROBE FOR CYLINDRICAL PARTS INSPECTION - A method of using a 1.5D array ultrasonic probe as a component of an inspection system intended for different diameter cylindrical parts without mechanical adjustments of the probe is presented. In particular, the method is presented as a way to improve the near surface resolution over an extended range of cylindrical parts diameter and inspection depths/tubes wall thickness with respect to usual 1D arrays of fixed curvature along the elevation axis. The method relies on a customizable concentric firing pattern of the acoustic pulses with respect to the cylindrical part surface, and on adjustment of the aperture size of the said array. The intended effect is to sharpen and minimize the extent of the front wall echo and to optimize the response from an eventual flaw in the inspected range. | 10-31-2013 |
20130249540 | EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURING OPERATION WITHOUT KNOWN LIFT REFERENCES - The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition. | 09-26-2013 |
20130197841 | METHOD AND A DEVICE OF PHASED ARRAY INSPECTION WITH PULSE RATE OPTIMIZATION - Disclosed is a method and a phased array inspection device enabling calibration of the device with an optimized pulse rate, the pulse rate is derived based on the true adaptive value of the impedance of the specific phased array probe circuit or the pulser circuit and the circuit energy consumption limitations. The energy consumption limitations include the total energy made available by the power supply to the pulser and probe circuit and the pulser energy consumption with limitation due to pulser circuit's physical limit such as thermal limitation. | 08-01-2013 |
20130060488 | IMAGE PROCESSING SYSTEM AND METHOD FOR NDT/NDI TESTING DEVICES - A system and method suitable for producing user designated views of non-destructive inspection target with adjustable color, opacity and/or fill-patterns in coordination of the display of inspection scan images. The geometric definition of the inspection target and the inspection scan area are both prepared by independent processes under which vertices and respective primitives are established. The inspection target primitives are given an alpha texture that includes color, opacity and/or fill-pattern designated by the user. The scan area primitives are mapped by a color and/or opacity texture representing inspection signal information such as amplitude. An efficient commercially available graphics accelerator is used to render both of the images of inspection target's chosen view and that of scanned area. The method allows implementation in real-time and on hand-held devices. | 03-07-2013 |
20130030726 | CIRCUITRY FOR MEASURING AND COMPENSATING PHASE AND AMPLITUDE DIFFERENCES IN NDT/NDI OPERATION - Disclosed are a method and an NDT/NDI inspection device deploying digital circuitry to conduct detection and compensation of phase and amplitude shift in responding signals. A digital waveform generator, such as a direct digital synthesizer (DDS) is used to generate a digital sine-wave of a specific frequency and amplitude, mimicking the pulser frequency and amplitude. The sine-wave is converted to analog signal through a DAC and transmitted to the transducer. The received analog sine-wave from the transducer is converted back to a digital signal through an ADC. The transmitted and received digital signals are then compared for phase and amplitude differences. A null circuit involving another waveform generating component is employed to compensate the detected phase and amplitude differences. As a result the phase and amplitude differences are effectively eliminated before being further processed and analyzed for defects information. | 01-31-2013 |
20120265491 | NON-DESTRUCTIVE INSPECTION INSTRUMENT EMPLOYING MULTIPLE SENSOR TECHNOLOGIES IN AN INTEGRAL ENCLOSURE - A non-destructive inspection (NDI) instrument includes a sensor connection system configured to receive test signals from at least two different types of NDI sensors which are configured to obtain test signals from an object being tested. The sensor connection system has sensor-specific connection circuits and at least one common sensor connection circuit. A data acquisition circuitry is coupled to the sensor connection and has sensor-specific data acquisition circuits and at least one common data acquisition circuit. It is further coupled to a common digital data processor which executes sensor-specific processing modules and at least one common processing module. A common display screen and user interface is coupled to the data processor and enables programs including sensor-specific user interface modules and at least one common user interface module. The sensor types preferably include all of or any combination of an ultrasound sensor, an eddy current sensor and acoustic sensor. | 10-18-2012 |
20120206132 | SHIELDED EDDY CURRENT COILS AND METHODS FOR FORMING SAME ON PRINTED CIRCUIT BOARDS - A shielded eddy current coil probe is formed on a printed circuit board and comprises a first coil component forming a test coil and a second coil component forming an active shielding coil. The test coil and the active shielding coil are concentrically arranged and the number of coil windings in the active shielding coil and the field direction thereof are configured to limit the induced field or the sensed field in the test object to the footprint area of the test coil on the test object. Multiple sets of test coils with active shielding coils can be provided on the same or different layers of the printed circuit board to realize different driver, receiver and combined driver/receiver coil configurations. | 08-16-2012 |
20120025816 | ORTHOGONAL EDDY CURRENT PROBE FOR MULTI-DIRECTIONAL INSPECTION - Disclosed is an improved orthogonal eddy current probe with at least three coils, each of the coils is wound across the two facing sides of an at least six-sided right polygonal prism, such as a hexagonal core. At each time interval, two of the three coils are used as driver coils, being charged simultaneously with electric current driven in coherent directions to induce a combined eddy current and one of the coils is used as a receiver coil to sense the eddy current, with the combined eddy current to be orthogonal to the receiver coil. Each coil alternates to be one of the driver coils or the receiver coil at a predetermined switching sequence and a predetermined switching frequency during consecutive time intervals. The eddy current probe as disclosed provides the advantages of inspecting a test surface for flaws of any flaw orientation with one pass of scan, providing sufficient sensitivity and desirable noise cancellation in all directions. | 02-02-2012 |
20120007595 | 2D COIL AND A METHOD OF OBTAINING EC RESPONSE OF 3D COILS USING THE 2D COIL CONFIGURATION - The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The 3D orthogonal sensor is conventionally wound onto a 3D core, with at least some of the surfaces being un-parallel to the surface be inspected. Using the herein disclosed 2D configuration allows the use of printed circuit board technologies for the manufacturing of these EC sensors. The herein disclosed method and the associated 2D EC sensors are particularly useful for reproducing the EC effect of conventional orthogonal probe arrays. | 01-12-2012 |
20110257903 | ROTATING ARRAY PROBE SYSTEM FOR NON-DESTRUCTIVE TESTING - A device is disclosed for performing non-destructive inspection and testing (NDT/NDI) of an elongated test object, wherein the inspection system includes: a test object conveyor for conveying the test object along a longitudinal conveyance path; a probe assembly including phased-array probes, the probe assembly being configured to induce signals in the test object and sense echoes reflected from the test object; a probe assembly conveyor configured to movably support the probe assembly, to move the probe assembly on a circumferential path about the test object; and a control system coupled to the test object conveyor and to the probe assembly conveyor and configured to allow data acquisition by and from the phased-array probes while, simultaneously, the test object moves along the longitudinal path and the phased-array probes move on the circumferential path. The test system may include phased-array probes of different types to optimize detecting faults or cracks in the test object which extend in different directions. | 10-20-2011 |
20110132092 | HIGH DYNAMIC RANGE NDT/NDI INSPECTION DEVICE WITH SELECTIVE NOISE AVERAGING - An apparatus for performing ultrasonic inspection of an object, during one measurement on the object, triggers a sequence of excitations of the probe system and receives a sequence of substantially identical echo signals reflected from the object, and further scales each echo signal to different degrees to increase and extend the dynamic range of the echo signals. An A/D converter is then used to digitize the scaled signal sequentially in a manner which dispenses the need for using numerous A/D converters and the associated filters. The digitized signal samples are then combined to produce a single digital output in a manner that is not over-flowed and with desirable resolution. A sequence of successive acquisitions of the scaled signal with the highest sensitivity are averaged to reduce system noise. | 06-09-2011 |
20110113883 | ULTRASONIC INTERNAL ROTATING INSPECTION PROBE THAT SELF-ELIMINATES AIR BUBBLES - Disclosed is an improved ultrasonic probe for Internal Rotating Inspection System (called IRIS) for inspecting tube-like structures from the inside of the tubes. The improved design deploys a rotor with rotor blades and a slotted stator located close to the emitting face of the transducer, to direct the flow of water such that air bubbles are carried away from a zone immediately in front of the transducer emitting face. Inspection accuracy and efficiency is significantly improved when air bubbles are effectively removed. | 05-19-2011 |
20100100344 | USER DESIGNATED MEASUREMENT DISPLAY SYSTEM AND METHOD FOR NDT/NDI WITH HIGH RATE INPUT DATA - A user configured measurement display system and method for a non-destructive testing device and instrument (NDT/NDI) with high input data rate is disclosed. The system and the method provide the means for NDT/NDI instruments display measurement values that satisfies user designated measurement criterion occurring during any measurement time intervals (MTIs). The present disclosure overcomes the shortcomings of conventional ways of picking and displaying measurement values at fixed MTIs, by which the values truly satisfying the measurement criterion that occurs at random MTIs (other than scheduled MTIs) are often skipped. | 04-22-2010 |