OC APPLICATIONS RESEARCH LLC Patent applications |

Patent application number | Title | Published |

20110035566 | HASHING AND SERIAL DECODING TECHNIQUES - A technique for generating a list of all N-bit unsigned binary numbers by starting with an initial number less than some power of 2, successively multiplying the number by that power of 2 and adding the largest non-negative number less than that power of 2 such that the new number is not a duplicate of any of those already generated, and using the resulting lists to generate efficient hashing and serial decoding hardware and software. | 02-10-2011 |

20100162046 | ON-CHIP SERVICE PROCESSOR - An integrated circuit is described that includes a stored program processor for test and debug of user-definable logic plus external interface between the test/debug circuits and the component pins. The external interface may be via an existing test interface or a separate serial or parallel port. Test and debug circuits may contain scan strings that may be used to observe states in user-definable logic or be used to provide pseudo-random bit sequences to user-definable logic. Test and debug circuits may also contain an on-chip logic analyzer for capturing sequences of logic states in user-definable circuits. Test and debug circuits may be designed to observe states in user-definable circuits during the normal system operation of said user-definable circuits. | 06-24-2010 |

20080320271 | Hashing and Serial Decoding Techniques - A technique for generating a list of all N-bit unsigned binary numbers by starting with an initial number less than some power of 2, successively multiplying the number by that power of 2 and adding the largest non-negative number less than that power of 2 such that the new number is not a duplicate of any of those already generated, and using the resulting lists to generate efficient hashing and serial decoding hardware and software. | 12-25-2008 |

20080244342 | SCAN STRING SEGMENTATION FOR DIGITAL TEST COMPRESSION - One may use a new technique to determine the placement of exclusive-ors in each scan string of a chip to achieve improved test vector compression, and one may combine this technique with methods to minimize the overhead of the exclusive-or logic, to eliminate clock enable logic for multiple scan strings, to minimize the changes to existing test logic insertion and scan string reordering, and to minimize the test vector compression computation time. | 10-02-2008 |