20130305088 | ELECTRONIC DEVICE AND TEST CARD THEREOF - A testing card includes a power interface, a plurality of serial ports connected to a plurality of test instruments. The microprocessor includes a processing unit having been burnt with a plurality of test programs, the processing unit is configured to execute one of the test programs according a user selection and generate a test command, and a serial ports management unit configured to convert the test command into a control signal, and send the control signal to a corresponding test instrument via the corresponding one of the serial port to control the test instrument to test a target device. An electronic device using the test card is also provided. | 11-14-2013 |