Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
Helmut Fischer GmbH Institut fur Elektronik und Messtechnik Patent applications | ||
Patent application number | Title | Published |
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20140203802 | MEASURING PROBE FOR MEASURING THE THICKNESS OF THIN LAYERS, AND METHOD FOR THE PRODUCTION OF A SENSOR ELEMENT FOR THE MEASURING PROBE - The invention relates to a measuring probe for measuring the thickness of thin layers with a housing ( | 07-24-2014 |