Applied Vision Company, LLC Patent applications |
Patent application number | Title | Published |
20110193953 | SYSTEM AND METHOD FOR ESTIMATING THE HEIGHT OF AN OBJECT USING TOMOSYNTHESIS-LIKE TECHNIQUES - Systems and methods to estimate the height profile of an object using tomosynthesis-like techniques. A plurality of raw images of an object to be characterized are acquired, where the plurality of raw images are representative of a plurality of spatial shifts of an imaging device relative to the object to be characterized. The raw images are processed to generate composite images, where each composite image corresponds to a unique image shift between spatially adjacent raw images. A volatility parameter value is calculated within a neighborhood of a same image pixel location for each composite image. The composite image having the largest volatility parameter value for the image pixel location is determined. A unique image shift, corresponding to the composite image having the largest volatility parameter value, is transformed into a height value representative of a height dimension of the image pixel location. | 08-11-2011 |
20100290665 | SYSTEM AND METHOD FOR DIMENSIONING OBJECTS USING STEREOSCOPIC IMAGING - A method and configuration to estimate the dimensions of a cuboid. The configuration includes two image acquisition units offset from each other with at least one of the units positioned at a defined acquisition height above a background surface. Image processing techniques are used to extract a perimeter of a top surface of the cuboid, placed on the background surface, from pairs of acquired images. A height estimation technique is used to calculate an absolute height of the cuboid. The absolute height of the cuboid is used, along with the extracted perimeter of the top surface of the cuboid, to calculate an absolute length and an absolute width of the cuboid. The height, length, and width may be used to calculate an estimated volume of the cuboid. | 11-18-2010 |
20100080442 | APPARATUS AND METHODS FOR CONTAINER INSPECTION - Apparatus, systems, and methods to recognize features on bottom surfaces of containers on a container production line, detect defects in the containers, and correlate the defects to specific production equipment of the container production line, based in part on the recognized features. The system includes imaging apparatus, programmable processing devices, and controllers. The methods include imaging techniques and estimation techniques. | 04-01-2010 |
20080292178 | APPARATUS AND METHODS FOR CONTAINER INSPECTION - Apparatus, systems, and methods to recognize features on bottom surfaces of containers on a container production line, detect defects in the containers, and correlate the defects to specific production equipment of the container production line, based in part on the recognized features. The system includes imaging apparatus, programmable processing devices, and encoders. The methods include synchronization techniques and correlation techniques. | 11-27-2008 |
20080291440 | APPARATUS AND METHODS FOR CONTAINER INSPECTION - Apparatus, systems, and methods to recognize features on bottom surfaces of containers on a container production line, detect defects in the containers, and correlate the defects to specific production equipment of the container production line, based in part on the recognized features. The system includes imaging apparatus, programmable processing devices, and controllers. The methods include imaging techniques and estimation techniques. | 11-27-2008 |
20080291439 | APPARATUS AND METHODS FOR CONTAINER INSPECTION - Apparatus, systems, and methods to recognize features on bottom surfaces of metal containers on a metal container production line, detect defects in the metal containers, and correlate the defects to specific production equipment of the metal container production line, based in part on the recognized features. The system includes imaging apparatus, programmable processing devices, and controllers. The methods include imaging techniques and estimation techniques. | 11-27-2008 |